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AK2573A 125M 156M Laser Diode Driver Features chip 125M 156M


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[AK2573A]
AK2573A
125M 156M Laser Diode Driver
Features chip 125M 156M Laser Diode Driver (LDD) Digital (APC_FF APC_FB) Programmable laser BIAS modulation current controlled on-chip temperature sensor (APC_FF) Digital feedback circuit (APC current output DACs, I-DAC1: 85mA sink modulation current I-DAC2: 54mA sink BIAS current TXFAULT detection 1kbit Field (EEPROM) (Small Form-factor Pluggable) support I2Ccompatible digital Duty adjustment Power failure alarm (OPTALM), Over current alarm (CURRALM), Temperature alarm (TEMPALM), Data alarm (DATAALM) TXFAULT failure alarm BIAS modulation current monitors 0.0095) Single 3.3V 0.2V operation Applications STM-1 OC-3 (156Mbps) Optical Interface Module TS-1000 (125Mbps) Optical Interface Module Description AK2573A 1chip (Laser Diode Driver) (Auto Power Control) laser direct modulation application. contains 156M LDD, programmable duty adjustment, BIAS modulation currents, digital feedback circuit, BIAS modulation current monitors, failure alarms, I2Cinterface, EEPROM storing characteristics user information, TXFAULT detection application. AK2573A functions; (Feed-forward) (Feedback). supplies programmed current response temperature. provides stable auto power control function with internal digital feedback algorithm. program operational functions through I2Ccompatible interface stored on-chip EEPROM. Ordering Information Product Number AK2573AVB Block Diagram
DATAP DATAN DATA (LVPECL) Selecter DUTY_ DRIVER
BCC++ (7mm 7mm)
I2Cis trademark Philips Corporation.
IMODN IMOD Imod
CLKP CLKN
(LVPECL)
I-DAC1
0.0095
MODMON
TEMPSENS
EEPROM
I-DAC2
Ibias IBIAS
0.0095
TEMPMON
BIASMON DATAALM OPTALM PDGAIN BIAS (12k) SDA* WP** BIAS_GEN PDIN CURRALM TEMPALM TXFAULT* Digital
Monitor
PDMON
SHUTDOWN CONTROL
TXDIS1 TXDIS2 Open Drain Pull-up
<MS0189-E-01>
2004/5
ASAHI KASEI Contents
[AK2573A]
Description Absolute Maximum Rating Recommend Operation Conditions Electrical Cghracteristics Power Consumption EEPROM Digital Input Output Characteristics I2CI/F Character LVPECL I-DAC1 I-DAC2 Duty Cycle Adjustment Current Monitor PDGAIN DACAPC BIASGEN Temperature Sensor Power Reset On-chip Oscillator OPTALM Detect Level TXDIS Release Time Package Information Circuit Description Parameter Nortation Parameter Definition Operation Overview Driver DATA/CLK (LVPECL) LVPECL Input (DATAP/DATAN/CLKP/CLKN) Duty Adjustment APC_FF Function APC_FB Function 4.2.1 PDGAIN 4.2.2 DACAPC 4.2.3 Example Setting Temperature Sensor (TEMPSENS) Current Monitor Alarm OPTALM CURRALM TEMPALM DATAALM TXFAULT Shutdown Shutdown Operation <MS0189-E-01> -22004/5
[AK2573A]
Temperature Compensation between Shutdown Request Release Power-up/down Timing Delay Time TXFAULT Detection with OPTALM Power Initialization Procedure without Shutdown Request (TXDIS=L) Power Initialization Procedure with Shutdown Request (TXDIS=H) TXDIS Timing during Normal Operation TXFAULT Detection Reset with Recovery TXFAULT Detection Reset without Recovery I2CI/F Memory Read Write Operation 8.2.1 Byte Write 8.2.2 Page Write 8.2.3 Current Address Read 8.2.4 Random Read 8.2.5 Sequential Read 8.2.6 Data Change 8.2.7 Start Stop Condition EEPROM Register Operation Mode Self-running Mode Adjustment Mode EEPROM Mode MODE Control Operation Mode Protection Module Adjustment Example Circuit Example
<MS0189-E-01>
2004/5
[AK2573A]
Description symbol shows below. Analog input, Ai_l: LVPECL input, Analog output Digital input, Di_pu: Digital input with pulled-up resistor, Digital output, Dio: Digital input output, Do_od: Digital output (open drain), Dio_od: Didital input output (open drain) PWR: Power PIN# Symbol DATAP DATAN CLKP CLKN Function Connection. Connect leave open. Positive LVPECL data input. Input Inpedance Negative LVPECL data input. Input Indedance latched data with clock. direct data. Positive LVPECL clock input. Connect when ="L". Negative LVPECL clock input. Connect leave open when "L". Write Protect. Internally pulled-up with (typ). sets device address 101000 only user area EEPROM access read-only. sets device address 1010 full EEPROM access read/write. more information, Table 9-1. Disable. disable BIAS current. TXDIS1 TXDIS2 ORed internally. 4.7k more externally pulled-up pulled-down. Power supply digital circuit. Fault detection output (Open drain). Connect with 4.7k resistor. when detect TEMPALM, CURRALM, OPTALM DATAALM. When RE_SFP=1 detect ALM, TXFAULT kept until receiving disable request TXDIS1 TXDIS2. Connection. Connect leave open. Serial data input output (Open drain). Connect with 4.7k resistor. Ai_l Ai_l Ai_l Ai_l Di_pu Remark
leave open
TXDIS1 TXDIS2 DVDD TXFAULT
leave open
Do_od
load 100pF
Dio_od
DVSS DATAALM OPTALM CURRALM
Serial clock input. data (SDA) shifted rising edge shifted falling edge SCL. digital circuit. Connection. Connect leave open. Sets alarm when detects sequential data input. detection time 4.5us (typ). polarity with EEPROM. Sets alarm when detects monitor current drop. polarity with EEPROM. Sets alarm when detects over current I-DAC1 I-DAC2. Alarm level every polarity with EEPROM.
Load 100pF leave open leave open
Load 30pF Load 30pF Load 30pF
<MS0189-E-01>
2004/5
ASAHI KASEI Description (Continued) PIN# Symbol Function TEMPALM Sets alarm when detects over temperature. polarity with EEPROM. TEMPMON Temperature sensor monitor output.
[AK2573A]
Remark Load 30pF load 30pF load
BIAS PDMON
BIAS reference internal circuit. Connect with resistor. PDIN regulated output. Adjust PDGAIN PDMON (typ).
load 30pF load
AVSS AVDD PDIN VSSBI IBIAS VSSBI VSSMD IMOD
IMODN VSSMD VDDMD VDDDR VSSDR BIASMON MODMON TEST1 TEST2 TEST3 TEST4 TEST5 TEST6
analog circuit. Power supply analog circuit. Connect power supply through (R=10, C=1uF recommended). Monitor voltage input. Monitor current converted voltage with resistor capacitor that 1kHz 10kHz cut-off frequency. BIAS current drive circuit. BIAS current output. Sinks 54mA (typ) current. BIAS current adjusted with I-DAC2. IBIAS voltage should (VDD 1.8V) more. BIAS current drive circuit. current drive circuit. Positive current output. Sinks 85mA (typ) current when input data "H". current adjusted with I-DAC1. IMOD voltage should (VDD 1.8V) more. Negative current output. Sinks current when input data "L". current drive circuit. Power supply current circuit. Connection. Connect leave open Power supply driver circuit. driver circuit. BIAS monitor current output. Sources 0.0095 times current I-DAC2 (BIAS) current. BIASMON voltage should 1.3V less. Monitor current output. Sources 0.0095 times current I-DAC1 (modulation) current. BIASMON voltage should 1.3V less. Test input. Connect normal operation Test input. Connect normal operation Test input. Connect normal operation Test input. Connect normal operation Test input. Connect normal operation Test input. Leave open normal operation.
Connect VSS.
Leave open
Center should connected good electrical performance radiation heat.
<MS0189-E-01>
2004/5
ASAHI KASEI Absolute Maximum Rating Item Symbol Unit Supply Voltage -0.3 Input voltage -0.3 Input Current Storage Temperature TSTG Stress beyond "Absolute Maximum Range" cause permanent damage device. Note Except Data retention. Data retention prescribed section- EEPROM. Recommended Operation Conditions Item Operating Ambient Power Supply Symbol VDD1 VDD2 Unit
[AK2573A]
Remarks Reference Voltage Except Except Note
Remarks Except AVDD AVDD ReferenceVoltage
Electrical Characteristics Power Consumption Item Symbol Unit Remarks Supply Current (All VDD) IDD1 Note Supply Current (All VDD) IDD2 Note Supply Current (AVDD only) IDD3 Note Note without BIAS modulation current Note I-DAC1 I-DAC2 Gain PDGAIN 0dB, PDIN Note DATAP CLKP "L", DATAN =CLKN Note 155.52Mbps, Note I-DAC1 I-DAC2 (Full code), Gain PDGAIN 0dB, PDIN EEPROM Item Endurance Data retention
10000
Unit Remarks Write Cycle Note Year Junction Temperature
Note This parameter characterized 100% tested. Important Notice: factory adjusted data stored advance address location (Device Address A6h, Address 60h) offset on-chip temperature sensor. such excess temperature stress applied AK2573A which exceeds guaranteed EEPROM data retention conditions (for years 85C), important read pre-determined value advamce re-write same data back into EEPROM after exposure excess temperature environment. Even exposure time shorter than retention time, accelerated temperature stress tests (such baking) performed, recommended read pre-set data first re-write after test. Access un-used address locations functionally guaranteed. Refer section- EEPROM map.
<MS0189-E-01>
2004/5
ASAHI KASEI Digital Input Output Characteristics Item Symbol Input High Level Input Level Output High Level 0.9VDD Output Level Input Leakage Current Input Leakage Current Note except DATAP, DATAN, CLKP CLKN pins. Note TXFAULT pins Note except TXFAULT pins
[AK2573A]
Unit
Conditions Note -0.2mA (Note 0.2mA (Note except
I2CI/F Characteristics Symbol Parameter tSCL Clock Frequency, tLOW Clock Pulse Width thigh Clock Pulse Width High Noise Suppression Time Clock Data Valid tBUF Time Before Transmission tHD.STA Start Hold Time tSU.STA Start Setup Time tHD.DAT Data Hold Time tSU.DAT Data Setup Time Input Rise Time Input Fall Time tSU.STO Stop Setup Time SDATA Hold Time Write Cycle Time Note This parameter characterized 100% tested.
tSU.STA tHD.STA tHD.DAT tSU.DAT tSU.STO
Unit
Remark
Note Note
(IN) tBUF
(OUT)
LVPECL Item Symbol Single-ended Input Voltage Swing Vamp Common Voltage Vcom 0.5*VDD BIAS Voltage Vbias 0.6*VDD Input Impedance Set-up Time Hold Time Note This parameter characterized 100% tested.
Unit
Remarks
SEL="H" Note
<MS0189-E-01>
2004/5
[AK2573A]
Vamp Vcom CLKP/CLKN DATAP/DATAN (CLKP CLKN) DATA (DATAP DATAN)
I-DAC1 Item Resolution Output Current with Full Code Output Current with Full Code Current Supply with Shutdown Current Step Current Step I-DAC2 Item Resolution Output Current with Full Code Output Current with Full Code Current Supply with Shutdown Current Step Current Step
Condition IMOD 1.3V IMOD 1.3V IMOD IMOD 1.3V IMOD 1.3V IMOD 1.3V
Unit Remark RE_DAC1_GAIN RE_DAC1_GAIN TXDISx
0.333 0.169
RE_DAC1_GAIN RE_DAC1_GAIN Code
Condition IMOD 1.3V IMOD 1.3V IMOD IMOD 1.3V IMOD 1.3V IMOD 1.3V
Unit Remark RE_DAC2_GAIN RE_DAC2_GAIN TXDISx
0.212 0.106
RE_DAC2_GAIN RE_DAC2_GAIN Code
Duty Cycle Adjustment Item Maximum Pulse Extended Pulse Extended Step Pulse Extended Stability
0.03
Unit
Remarks Note Steps Ta=-40 VDDDR=3.13.5V, 0.3ns Extended (Note
Note This parameter characterized 100% tested. Current Monitor Item Condition MODMON MODMON 1.3V I-DAC1 Gain Full Code BIASMON BIASMON 1.3V I-DAC2 Gain Full Code
0.008 0.008
0.0095 0.0095
0.011 0.011
Unit
Remark
<MS0189-E-01>
2004/5
ASAHI KASEI PDGAIN Item PDIN Input Range PDGAIN Gain Error DACAPC Item Maximum Output Voltage Minimum Output Voltage BIASGEN Item BIAS Voltage
[AK2573A]
PDMON=1V±10% PDINPDMON
0.08 -0.5
+0.5
Unit
Remark
Condition Test Mode Test Mode Test Mode
1.135 0.752
1.195 0.792
1.255 0.832
Unit
Remark
Condition
Unit
Remark
Temperature Sensor Item Condition Voltage Slope TEMPMON Voltage -12.14 Offset Adjustment Target Note This parameter characterized 100% tested. Item Resolution Maximum Input Voltage Minimum Input Voltage Power Reset Item Detect Voltage
-11.56 1.215
-10.98
Unit
Remark Note-1
Condition
2.09 -1/2
2.31 +1/2
Unit
Remark
Condition
Unit
Remark
On-chip Oscillator Item Condition Clock Frequency Test Mode
2.15
Unit
Remark
OPTALM Detect Level Condition OPTALM Detect Level Setting, PDGAIN=0dB Setting, PDGAIN=0dB Setting, PDGAIN=0dB Setting, PDGAIN=0dB
1/3.2 1/4.3 1/6.4 1/7.5
1/2.8 1/3.7 1/5.6 1/6.5
Unit
Remark
TXDIS Release Time Item Condition TXDIS Release Time Note This parameter characterized 100% tested.
Unit
Remark Note
<MS0189-E-01>
2004/5
ASAHI KASEI Package Information Package Type: BCC++ Marking Information: PIN#1 Indication: Logo: Marking Code: AK2573AVB Date Code: YYWWXXX digit)
[AK2573A]
AK2573AVB YYWWXXX
Package Outline
7.0±0.1 0.5±0.1
0.09MIN
5.5±0.06 7.0±0.1 6.15
0.45±0.06 0.45±0.06
6.15
Part
Part 0.4±0.06 0.45±0.06
Part
0.80
0.05
0.075±0.025
0.14
C0.2
0.3±0.06
0.45±0.06
<MS0189-E-01>
-10-
2004/5
ASAHI KASEI Circuit Description
[AK2573A]
Parameter Notation Parameter Definition AK2573A Circuit Description, order distinguish various pre-set parameter sources from EEPROM, Registers Device pins, "Identifier Main name" notation used shown Table 1-1. ease operational description, small letters sometimes expresses internal signals. Table Parameter Definitions Identifier Register EEPROM Ether both Register /and EEPROM BLOCK Internal Node None None Main Name REGISTER name (All Capital) EEPROM name (All Capital)) REGISTER EEPROM name (All Capital) name (All Capital) BLOCK name (All Capital)) signal name (small letter) Example R_APC_FB R_DAC1 Indicates EEPROM E_PDGAIN E_DAC1_FF_TC Indicates either register RE_DAC1_GAIN EEPROM RE_APC_TRGT P_PDMON I-DAC1 APC_COMP Remark Indicates register
Operation Overview AK2573A primary functions; 125M 156M Laser diode driver part, (Automatic Power Control) part which supplies adequate bias current modulation current Laser Diode, Control part control operation modes AK2573A operation. There operation modes AK2573A. Since each adjusting function controlled through I2CInterface, realizes automatic parameter adjustment. Self-running Mode Self-running mode ready normal operation after adjustments completed. this mode, temperature detection, EEPROM access feeding current automatically performed using on-chip oscillator. AK2573A works this mode after power-on. Adjustment Mode Adjustment mode designed training characteristics. AK2573A operates according register settings through I2CI/F. EEPROM Mode EEPROM mode used storing characteristics EEPROM I2CI/F.
<MS0189-E-01>
-11-
2004/5
[AK2573A]
Driver illustrates block diagram driver function. AK2573A current DACs, I-DAC1 I-DAC2. I-DAC1 modulation current I-DAC2 bias current. Table show I-DAC1, I-DAC2 characteristics. Driver Block Diagram
IBIAS AK2573A I-DAC2 Ibias
IMOD
IMODN
Driver Imod I-DAC1
I-DAC1 (Table 2-1) RE_DAC1_ GAIN I-DAC2 (Table 2-2) RE_DAC2_ GAIN
DAC1_GAIN
Output current Output Current Current step Full code (typ) Range (typ) (typ) 0.333 0.169
DAC2_GAIN
Output current Output Current Current step Full code (typ) Range (typ) (typ) 0.212 0.106
I-DAC1 I-DAC2 Common Characteristics Resolution: 8bit DNL: code DATA (LVPECL) AK2573A supports direct data latched data input (see Table 3-1). Connect CLKP VSS, connect CLKN leave open when ="L". Table Data input (CMOS)
Direct data Latched data with clock
<MS0189-E-01>
-12-
2004/5
[AK2573A]
LVPECL Input (DATAP DATAN CLKP CLKN) Table shows LVPECL input characteristics. AK2573A LVPECL input, which biased with more inpedance respectively, supports both coupling. illustrates LVPECL input with coupling Fig3-3 illustrates with coupling respectively. Table LVPEL Interface characteristics Item Symbol Single-ended Input Voltage |Vamp| Swing Common Voltage Vcom 0.5*VDD BIAS Voltage Vbias 0.6*VDD Input Impedance Set-up Time Hold Time Note This parameter characterized 100% tested. DATA Input Level
Vamp Vcom CLKP/CLKN DATAP/DATAN
Unit
Remarks
Note
LVPECL input with coupling
AK2573A Vbias
Fig3-3 LVPECL input with coupling
AK2573A
0.01uF more
DATAP CLKP DATAN CLKN
DATAP DATAN CLKP CLKN
Vbias
0.01uF more
Vbias
Set-up Hold Time
DATA (DATAP DATAN) (CLKP CLKN)
<MS0189-E-01>
-13-
2004/5
[AK2573A]
Duty Adjustment AK2573A supplies programmed duty adjustment response temperature from on-chip temperature sensor (every Duty data stored E_DUTY_TC, Table more information). Write same data into E_DUTY_TC constant duty adjustment. Table show characteristics duty adjustment function. Table Duty Adjustment characteristics Item Symbol Maximum Pulse Extended Pulse Extended Step Tstep Pulse Extended Stability Tsta 0.03 Unit Remarks Note Steps Ta=-40 VDD=3.1 3.5V, 0.3ns Extended (Note
Note This parameter characterized 100% tested. Table Pulse Extended R_DUTY Pulse Extended (typ) [ns] 0.03 0.06 0.90 0.93
Remark
AK2573A functions, (Feed-forward) (Feedback). supplies programmed current response temperature from on-chip temperature sensor. APC_FB provides stable power control function using digital feedback algorithm. APC_FF APC_FB user programmable. Fig4-1 illustrates block diagram. Block Diagram
Polarity (RE_ALM_POL) Temperature (RE_TEMPALM) TEMP Gain (RE_DAC1_GAIN) (R_DAC1_FF) TEMPSN R_TEMP EEPROM K_DAC1 _FBRT Operation (RE_APC_FB_SET) TEMPMON Operation (RE_APC_FF_SET) K_DAC2 _FBRT R_DAC2 0.0095 Feedback (R_APC_FB) ALMPolarity (RE_ALM_POL) R_DAC1 R_DAC2 Over current (RE_CURRALM) Polarity (RE_ALM_POL) OPTALM OPTALM Reference (optalm_ref) OPTALM BIASMON R_DAC1 Imod I-DAC1 Driver IMODN I-DAC1 (R_DAC1_FB) I-DAC2 (R_DAC2_FB) 0.0095 MODMO Gain (RE_DAC2_GAIN) Ibias IBIAS (R_DAC2_FF) I-DAC2 TEMPALM
RE_TEMP_OFFSET
IMOD
Initial setting (RE_APC_INIT_SET) PDMON
Monitor PDIN
PDGAIN (RE_PDGAIN) APC_ COMP
Digital Filter apc_comp_out
CURR
CURRALM
PDGAIN
OPTALM (RE_OPTALM_)
Target (RE_APC_TRGT)
DAC_APC
vapc_ref
<MS0189-E-01>
-14-
2004/5
[AK2573A]
APC_FF Function illustrates functions. operation follows: Analog digital conversion voltage bit) that reflects temperature every temperature detection period (128ms typ). Read current data (address indicated data) from EEPROM this value I-DACs. current data over temperature each EEPROM address, compensated current supplied automatically. this function, current data should stored EEPROM advance. temperature sensor cover-40 EEPROM prepared with steps. function
(7bit) Addressing with R_TEMP R_TEMP EEPROM R_DAC1_FF
TEMPSENS
I-DAC1
Driver Current
TEMPSENS charatcteristics Voltage
Address
Data R_DAC2_FF
I-DAC2 BIAS Current
Memory I-DAC1 Temperature
Memory I-DAC2
APC_FB Function shows APC_FB functions. operates follows: APC_COMP compares vapc_ref. digital filter calculates compensation current (R_APC_FB) equalize with vapc_ref keep power constant. vapc_ref (RE_APC_TRGT) changed over temperature automatically. Temperature compensation procedure same (data DAC_APC read EEPROM response temperature). stable operation, cut-off frequency should 1kHz 10kHz. function
TEMPSENS R_TEMP EEPROM initial valuein response temperature power-on accelerate power-up sequence Monitor PDMON PDIN PDGAIN APC_ COMP comp_out R_DACx I-DAC
512kHz(typ)
Digital Filter R_APC_FB
Electrical volume Monitor
RE_APC_TRGT
DAC_APC
vapc_ref
<MS0189-E-01>
-15-
2004/5
[AK2573A]
4.2.1 PDGAIN monitor current converted average voltage with input PDIN. PDIN voltage gained PDGAIN monitored PDMON. PDGAIN should adjusted PDMON typ. gain range PDGAIN -8.0dB 23.5dB with 0.5dB steps (6-bits). PDGAIN I2Cinterface. Table shows PDIN input range Table shows relationship between PDGAIN EEPROM setting. Table PDIN input range Parameter PDIN Input range Table PDGAIN RE_PDGAIN_SET 000000 000001 111110 (62) 111111 (63) 0.08V 2.5V Remark
Gain (typ) [dB] 23.5 23.0 -7.5 -8.0
Remark 0.5dB step
4.2.2 DACAPC DACAPC generates reference voltage (vapc_ref). AK2573A supplies programmed reference response temperature from on-chip temperature sensor (every reference data stored E_APC_TRGT_TC, Table more information). Write same data into E_APC_TRGT_TC constant reference. Table shows relationship between reference voltage (vapc_ref) EEPROM setting. Table DACAPC E_APC_TRGT_TC (R_APC_TRGT) 00000(0) 01111 (15) 10000 (16) 10001 (17) 11111 (31) DACAPC (vapc_ref) (typ) 0.792 0.987 1.013 1.195 Remark 13mV step
4.2.3 Example Setting Table shows typical setting function (APC_FF APC_FB). combination RE_APC_FF RE_APC_FB. shows EEPROM area current (E_DAC1_TC) BIAS current (E_DAC2_TC). data should stored E_DAC1_TC E_DAC2_TC determined RE_APC_FF RE_APC_FB. Table shows combination function. RE_APC_FF 2bit data assigned I-DAC APC_FF operation. I-DAC2 I-DAC1. RE_APC_FB 2bit data assigned I-DAC APC_FB operation. I-DAC2 I-DAC1. case RE_APC_FB=11(binary), AK2573A "Dual Feedback" (see 4-9, 4-10 Table 4-6).
<MS0189-E-01>
-16-
2004/5
[AK2573A]
Table Example combination RE_APC_ RE_APC_ BIAS Remarks Reference FF_SET FB_SET (I-DAC2) (I-DAC1) initial value according temperature accelerate power time. initial value according temperature accelerate power time. Both BIAS current detrmined APC_FF. APC_FB work. FF+FB Both BIAS current detrmined APC_FF. APC_FB aging. FF+FB Both BIAS current detrmined APC_FF. APC_FB BIAS aging. FF+FB Dual Feedback function. BIAS current determined APC_FB. current determined APC_FF APC_FB. initial value APC_FB according temperature accelerate power time. FF+FB Dual Feedback function. 4-10 current determined APC_FB. BIAS current determined APC_FF APC_FB. initial value APC_FB according temperature accelerate power time. Prohibit Prohibit RE_APC_FF_SET (Register EEPROM) composed 2-bits. shows BIAS (I-DAC2) shows (I-DAC1), indicates Feed-forward function selected. RE_APC_FB_SET (Register EEPROM) composed 2-bits. shows BIAS (I-DAC2) shows (I-DAC2), indicates Feedback function selected. example-1 (MOD=FF, BIAS=FB)
R_DAC1_FF I-DAC1 R_APC_FB R_DAC1_FB R_DAC1 85/255 G_DAC1 Imod R_APC_FB RE_DAC1_GAIN
example-2 (MOD=FB, BIAS=FF)
R_DAC1_FF R_DAC1_FB R_APC_FB R_DAC1 RE_DAC1_GAIN I-DAC1 85/255 G_DAC1 Imod
I-DAC2 R_DAC2_FB R_APC_FB R_DAC2 54/255 G_DAC2 Ibias R_DAC2_FB R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1 R_DAC1_FF R_DAC2 R_DAC2_FB R_APC_FB
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
R_DAC1 R_DAC1_FB R_APC_FB R_DAC2 R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
example-3 (MOD=FF, BIAS=FF)
R_DAC1_FF I-DAC1 R_APC_FB R_DAC1_FB R_DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
I-DAC2 R_DAC2_FB R_DAC2 54/255 G_DAC2 Ibias
R_DAC1 R_DAC1_FF R_DAC2 R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
<MS0189-E-01>
-17-
2004/5
ASAHI KASEI example-4 (MOD=FF+FB, BIAS=FF)
R_DAC1_FF R_DAC1_FB R_APC_FB I-DAC1 R_DAC1 85/255 G_DAC1 Imod R_APC_FB R_DAC1_FB R_DAC1 RE_DAC1_GAIN
[AK2573A] example-5 (MOD=FF, BIAS=FF+FB)
R_DAC1_FF I-DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
R_APC_FB
I-DAC2 R_DAC2_FB R_DAC2 54/255 G_DAC2 Ibias R_DAC2_FB R_APC_FB R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1_FB R_APC_FB R_DAC1 R_DAC1_FF R_DAC1_FB R_DAC2 R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
R_DAC2_FB R_APC_FB R_DAC1 R_DAC1_FF R_DAC2 R_DAC2_FF R_DAC2_FB
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
example-6 (MOD=FF+FB, BIAS=FB)
R_DAC1_FBRT (E_DAC_FBRT_FIX) R_DAC1_FF I-DAC1 R_APC_FB K_DAC1_ FBRT R_DAC1_FB R_DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
4-10 example-7 (MOD=FB, BIAS=FF+FB)
R_DAC1_FF R_APC_FB R_DAC1_FB R_APC_FB R_DAC1 RE_DAC1_GAIN I-DAC1 85/255 G_DAC1 Imod
I-DAC2 R_DAC2_FB R_APC_FB R_DAC2 54/255 G_DAC2 Ibias
R_DAC2_FBRT (E_DAC_FBRT_FIX) K_DAC2_ FBRT R_DAC2_FB R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1_FB K_DAC1_FBRT R_APC_FB R_DAC2_FF R_DAC1 R_DAC1_FF R_DAC1_FB R_DAC2 R_DAC2_FB R_APC_FB
RE_DAC2_GAIN G_DAC1/G_DAC2
R_DAC2_FB K_DAC2_FBRT R_APC_FB R_DAC1 R_DAC1_FB R_APC_FB R_DAC2 R_DAC2_FF R_DAC2_FB
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2
Table EEPROM Assignments typical operation RE_APC_ RE_APC_ RE_APC_ E_DAC2_TC E_DAC1_TC I-DAC2 FF_SET FB_SET INIT_SET (BIAS) E_DAC1_FF_TC E_APC_INIT_TC E_DAC1_FF_TC E_DAC2_FF_TC E_DAC2_FF_TC E_APC_INIT_TC E_DAC2_FF_TC E_DAC1_FF_TC E_DAC2_FF_TC E_DAC1_FF_TC E_DAC2_FF_TC E_DAC1_FF_TC FF+FB E_DAC1_FF_TC E_APC_INIT_TC E_DAC1_FF_TC E_DAC2_FF_TC FF+FB E_DAC2_FF_TC E_APC_INIT_TC FF+FB Prohibit E_DAC1_FF_TC: I-DAC1 current data (temperature compensated) E_DAC2_FF_TC: I-DAC2 current data (temperature compensated) E_APC_INIT_TC: R_APC_FB initial data (temperature compensated) Table Operation
RE_APC_ FB_SET RE_APC_ FF_SET K_DAC1_FBRT R_DAC1_FBRT*1.25/64/G_DAC1 K_DAC2_FBRT R_DAC2_FBRT/32/G_DAC2 Remark
I-DAC1 (MOD) FF+FB FF+FB FF+FB
BIAS Prohibit R_DAC1_FBRT=E_DAC_FBRT R_DAC2_FBRT=E_DAC_FBRT Prohibit
<MS0189-E-01>
-18-
2004/5
ASAHI KASEI Table EEPROM assignment (Self-running mode)
RE_APC_ RE_APC FB_SET _FF_SET RE_APC_ INIT_SET R_DAC1_FF E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC E_DAC1_TC R_DAC2_FF E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC R_APC Initial setting R_APC_FB E_DAC1_TC E_DAC1_TC E_DAC2_TC E_DAC2_TC E_DAC2_TC E_DAC1_TC K_DAC1 _FBRT Table Table K_DAC2_ FBRT Table Table (R_DAC1) BIAS (R_DAC2) E_DAC1 FB_INIT FB_INIT FB_INIT E_DAC2 FB_INIT FB_INIT FB_INIT
[AK2573A]
Remarks
Prohibit
Prohibit
Table EEPROM assignment (Adjustment mode)
RE_APC_ FB_SET RE_APC_ FF_SET RE_APC_ INIT_SET R_DAC1_FF R_DAC2_FF R_APC_ R_DAC1_ FBRT R_DAC2_ FBRT K_DAC1_ FBRT Table K_DAC2_ FBRT Table (R_DAC1) BIAS (R_DAC2) Remarks
Prohibit
Prohibit
<MS0189-E-01>
-19-
2004/5
[AK2573A]
Temperature Sensor (TEMPSENS) 4-11 shows on-chip temperature sensor characteristics Table shows relationship between detected temperature code. 4-11 On-chip Temperature Sensor Characteristics
On-chip Temperature sensor characteristics
Output voltage
Temperature [°C]
Slope: -11.56mV/ (typ) V(t) -0.01156 1.62 (typ) AD_code int( V(t) +0.5) int(-0.667*t 94.0) Temperature step AD_code=1LSB: 1.49/LSB
Temperature sensor detects junction temperature, ambient temperature.
<MS0189-E-01>
-20-
2004/5
ASAHI KASEI Table code detected temperature [typ] code code Temp Temp 140.1 92.2 138.6 90.7 137.1 89.2 135.6 87.7 134.1 86.2 132.6 84.7 131.1 83.2 129.6 81.7 128.2 80.2 126.7 78.7 125.2 77.2 123.7 75.7 122.2 74.2 120.7 72.7 119.2 71.2 117.7 69.7 116.2 68.2 114.7 66.7 113.2 65.2 111.7 63.7 110.2 62.2 108.7 60.7 107.2 59.2 105.7 57.7 104.2 56.2 102.7 54.7 101.2 53.2 99.7 51.7 98.2 50.2 96.7 48.7 95.2 47.2 93.7 45.7
[AK2573A]
code
Temp 44.2 42.7 41.2 39.7 38.2 36.7 35.2 33.7 32.2 30.7 29.2 27.7 26.3 24.8 23.3 21.8 20.3 18.8 17.3 15.8 14.3 12.8 11.3 -0.7 -2.2
code
Temp -3.7 -5.2 -6.7 -8.2 -9.7 -11.2 -12.7 -14.2 -15.7 -17.2 -18.7 -20.2 -21.7 -23.2 -24.7 -26.2 -27.7 -29.2 -30.7 -32.2 -33.7 -35.2 -36.7 -38.2 -39.7 -41.2 -42.7 -44.2 -45.7 -47.2 -48.7 -50.2
Current Monitor AK2573A current BIAS current monitor, MODMON BIASMON respectively. MODMON 0.0095 times I-DAC1 output (source type) BIASMON 0.0095 times -DAC2 output (source type).
<MS0189-E-01>
-21-
2004/5
ASAHI KASEI Alarm AK2573A alarm functions shown Table 5-1. Table Alarm function Detection condition OPTALM When monitor current below OPTALM level. CURRALM When R_DAC1 R_DAC2 beyond CURRALM level equal full code. TEMPALM When detected temperature beyond TEMPALM level. DATAALM When detected sequential data input (4.5us typical). TXFAULT When more alarm detected. Note include delay time CPD.
[AK2573A]
Polarity Detected Time Programmable (typ) (Note Programmable every 125us (typ) Programmable every 128ms (typ) Programmable 4.5us (typ) depends detected
OPTALM OPTALM level (optalm_ref) selectable among 1/3, 1/4, reference voltage (vapc_ref) RE_OPTALM. OPTALM detected when optalm_ref. keeps R_APC_FB during OPTALM detection the"Self running mode". CURRALM CURRALM detected when R_DAC1(MSB 4bit) R_CURRALM_DAC1 R_DAC2(MSB 4bit) R_CURRALM_DAC2 R_CURRALM_DAC1 every CURRALM clear when receiving disable request (TX_DIS1 TX_DIS2 "H"). TEMPALM TEMPALM detected when R_TEMP R_TEMPALM. R_TEMP negative slope compared temperature, TEMPALM detected when detected temperature beyond R_TEMPALM. DATAALM DATAALM detected when input DATA fixed more than 4.5us (typ). keeps R_APC_FB during DATAALM detection the"Self running mode". DATAALM detection ignored when RE_DATAALM_MASK= "1". TXFAULT TXFAULT function shown Table Table TXFAULT RE_SFP Shutdown request (TXDIS
ORed
TXFAULT ORed (Hold) (Hold)
I-DAC output Normal Operation Normal Operation Shutdown Normal Operation Shutdown Shutdown
<MS0189-E-01>
-22-
2004/5
ASAHI KASEI RE_SFP operation when OPTALM, CURRALM, TEMPALM DATAALM detected when detected.
[AK2573A]
RE_SFP=1 operation Support TX_FAULT (Small Form-factor Pluggable) requirement. hold when detected OPTALM, CURRALM, TEMPALM DATAALM into shutdown mode. Reset when TXDIS1 TXDIS2 "L". Refer Shutdown" more information. During "Adjustment mode", TXFAULT detection ignored. Shutdown Shutdown Operation shows shutdown operation. AK2573A supports (Small Form-factor Pluggable) requirement. Shutdown Operation TXDIS1 TXDIS2 RE_SFP TXFAULT Operation Shutdown Shutdown Normal Operation Normal Operation Shutdown Remarks Shutdown with Shutdown with
TXFAULT Operation
Shutdown Condition Function Operation I-DAC1 output High-Z (0mA output) APC_FF Normal Operation. APC_FB Keep data shutdown request. Normal Operation TXFAULT R_SFP=0: Normal Operation R_SFP=1: Keep data shutdown request.
Remarks
Temperature Comparison between Shutdown Request Release AK2573A keeps temperature data shutdown request compares with temperature release request avoid over-current conditions When AK2573A detects temperature difference between shutdown request release request, data initial values response temperature release request. temperaturedifference programmable. When AK2573A does detect temperature difference,it keeps data, resulting faster operation. This function works release request follows: (ABS(R_TEMP_STDW R_TEMP)) R_TEMP_WIN) R_APC_FB reset initial value response R_TEMP where, R_TEMP_STDW temperature shutdown request R_TEMP temperature release request R_TEMP_WIN temperature difference (user programmable) continues operate during shutdown fast performance when release request received. However, I-DAC current stays 0mA.
<MS0189-E-01>
-23-
2004/5
ASAHI KASEI Table Operation shutdown release RE_SFP TXFAULT RE_TEMP_ Temp Difference Shutdown request result
[AK2573A]
R_APC_FB Initial value Hold data Initial value Initial value Hold data Initial value Initial value
Remark
Power-up down Timing Delay Time TXFAULT Detection with OPTALM correspond delay time caused moniter average current, delay time TXFAULT detection with OPTALM when RE_SFP="1" (SFP support). AK2573A delay time when RE_SFP="1": normal delay accelerated delay. Accelerated delay selected when both I-DAC1 I-DAC2 APC_FF APC_FB with initial value setting. Table shows delay time TXFAULT detection with OPTALM illustrated block diagram. Note: When accelerated delay selected with RE_SFP="1", APC_FF data initial data APC_FB should suitable, otherwise AK2573A might into shutdown detection OPTALM after delay time. APC_FB Block Diagram
Feedback (R_APC_FB)
Monitor PDIN
PDGAIN (R_PDGAIN)
APC_ COMP
Digital Filter
PDGAIN
OPTALM Level (R_OPTALM)
TX_FAULT Control
Detection reset OPTALM vary with cut-off frequency
Terget (R_APC_TRGT
DAC_APC
vapc_ref
OPTALM OPTALM reference (opalm_ref)
Table Delay time TXFAULT detection with OPTALM RE_SFP R_TIMER_ R_APC_ R_APC_ Delay Time TXFAULT Remarks OPTALM INIT_SET FF_SET detection with OPTALM disable TXFAULT detection (typ) (typ) (typ) Acceleration power-up (typ)
<MS0189-E-01>
-24-
2004/5
ASAHI KASEI Power Initialization Procedure without Shutdown Request (TXDIS=L)
[AK2573A]
TXDIS
Current initial setting
TXFAULT with OPTALM enable accelerated delay time selected)
Normal Operation
initial procedure operation Power Reset TXFAULT enable without OPTALM) TXFAULT with OPTALM enable
t_init: 160ms (typ)
Power Initialization Procedure with Shutdown request (TXDIS=H)
TXDIS
TXFAULT with OPTALM enable accelerated delay time selected)
current
initial setting
initial procedure
Normal Operation
Power Reset
operation TXFAULT enable without OPTALM) TXFAULT with OPTALM enable
t_init: 160ms (typ)
<MS0189-E-01>
-25-
2004/5
ASAHI KASEI TXDIS Timing during Normal Operation
10us (min) TXDIS
[AK2573A]
TXFAULT TXFAULT enable (without OPTALM) TXFAULT disable current t_off: 10us (max) t_on: (max) TXFAULT enable OPTALM)
Temperature detection Normal Initialize Procedure: 160ms (typ) Acceleration Procedure: (max)
TXFAULT Detection Reset with Recovery
TXDIS FAULT
t_reset: 10us (min)
TXFAULT Acceleration selected current
Depends detected (see Table 5-1)
Feedback Power-up Sequence t_init: 160ms (max)
<MS0189-E-01>
-26-
2004/5
ASAHI KASEI TXFAULT Detection Reset without Recovery
[AK2573A]
TXDIS
t_reset: 10us (min)
FAULT
TXFAULT
current
Depends detected (see Table 5-1)
t_fault TX_FAULT with OPTALM Accelerated delay time selected: (typ) Normal delay time sekected: 160ms (typ)
<MS0189-E-01>
-27-
2004/5
[AK2573A]
I2CI/F Memory Table shows EEPROM Register address map. Accessto memory (EEPROM registers) done I2CI/F format. (Write Protect) limit access memory shown Table 8-2. Table Memory Device Address Device Address-1 1010 1010 1010 1010 1010 1010 1010 1010 1010 Device Address-2 Address 00000000 01111111 10000000 11111111 00000000 11111111 00000000 11111111 00000000 01111111 10000000 11111111 00000000 00011001 00011010 11111110 11111111 Data User Area (EEPROM, 1kbit) memory memory Adjustment data (EEPROM, 3kbit) memory Registers memory AK2573A Operation mode change
Table Memory access limitation with Item Device Address 1010xxx (Note when receive device address EEPROM Register Full access Access Operating mode Full Page Write byte (without registers) Sequential Read from 00000000000 01111111111 Registers Access Random access only Note During EEPROM Write operation, generated.
1010000 when receive device address User area only (read only) Self runnig mode only from 00000000 01111111
<MS0189-E-01>
-28-
2004/5
ASAHI KASEI Read/Write Operation 8.2.1 Byte Write
[AK2573A]
Device Address-1
Device Address-2 Address (MSB First)
Data (MSB First)
8.2.2 Page Write AK2573A capable 16-byte page write.
Device Address-1
Device Address-2 Address (MSB First)
Data (Address)
Data (Address
Data (Address
8.2.3 Current Address Read internal address counter maintains last address accessed during last read write operation, incremented one. roll over address changed setting. Refer Table detail.
Device Address-1
Device Address-2 Data (MSB First)
8.2.4 Random Read random read requires "dummy" byte write sequence specified "Address". After receive from AK2573A, perform "current address read" (see 8.2.2).
Device Address-1
Device Address-2
Address (MSB First)
Device Address-1
Device Address-2 Data (MSB First)
Dummy Write
Don't care when WP="H"
8.2.5 Sequential Read Sequential read initiated ether"Current Address Read" "Random Read". After issuing either them, AK2573A continues output data each received.
Device Address-2 Data-1 (MSB First)
Data-2
Data-n
<MS0189-E-01>
-29-
2004/5
[AK2573A]
8.2.6 Data Change normally pulled high with 4.7k 10k. Data change only during time period. Data changes during high periods will indicate start stop condition.
Data Stable Data Change
8.2.7 Start Stop Condition Start Condition: high-to-low transition with high start condition that must precede other command. Stop Condition: high-to-low transition with high stop condition.
START STOP
<MS0189-E-01>
-30-
2004/5
ASAHI KASEI EEPROM EEPROM memory shown Table 8-3, 8-5. EEPROM access islimited with Operation mode (refer Table 9-1, more information). "L": Full access "H": User area only with read only
[AK2573A]
(Note) factory adjusted data stored advance address (Device Address2 011, Address=60h) offset on-chip temperature sensor. such excess temperature stress applied this device which exceeds guaranteed EEPROM data retention conditions years 85), important read pre-determined value advance re-write same data back into EEPROM after exposure excess temperature environment. Even exposure time shorter than retention time, accelerated temperature stress tests (such baking) performed, recommended read pre-set data first re-write after tests. Table EEPROM Address Device Address DATA (D7-D0) Address User Area (1kbit) (127) (128) Memory (255) (255) h(0) E_DAC1_TC Temperature data I-DAC1 (1kbit) h(127) (128) E_DAC2_TC Temperature data I-DAC2 (1kbit) (255) E_DUTY_TC (5bit) Temperature data Duty Adjustment (256bit) 1Fh(31) (32) E_APC_TRGT_TC (5bit) Temperature data reference (R_APC_TARGT) (256bit) (63) (64) 4bit: E_CURRALM_DAC1_TC 4bit: E_CURRALM_DAC2_TC Temperature data CURRALM (95) (256bit) (96) Adjustment data (256bit) (255)
Initial Value
Remark
Addressing with R_TEMP (1.5 step) Addressing with R_TEMP (1.5 step) Addressing with 5bit R_TEMP step) Addressing with 5bit R_TEMP step) Addressing with 5bit R_TEMP step)
Table
<MS0189-E-01>
-31-
2004/5
ASAHI KASEI Table Adjustment Data Area (Device Address-2 011) Address EEPROM Function E_VRFTRIM[7:4] Oscillator Frequency E_TEMP_OFFSET[3:0] Temperature sensor offset E_APC_FF_SET[7:6] Setting E_APC_FB_SET[5:4] Setting E_APC_INIT_SET[3] Initial Setting E_SFP[2] E_DAC1_GAIN[1] E_DAC2_GAIN[0] E_TEMP_DET[5] E_TIMER_OPTALM[4] E_ALM_POL[3] E_OPTALM[1:0] E_TEMP_WIN[6:0] E_DAC_FBRT_FIX[6:0] Setting I-DAC1 Gain I-DAC2 Gain
[AK2573A]
Temperature compensation shutdown release ON/OFF Delay time TXFAULT detection with OPTALM Polarity OPTALM Reference Level
E_DATAALM_MASK[0] E_PDGAIN[5:0] E_TEMPALM[6:0]
Temperature Difference Detection Level Dual Feedback Ratio DATAALM mask PDGAIN TEMPALM Level
Initial Value Remark Factory Setting Factory Setting Table Table Initial Setting Initial Setting Support Support Gain Gain Gain Gain 160ms 1/3, 1/6, section section DATAALM Valid DATAALM Invalid Table Table
Table EEPROM (Adjustment Data Area) Address VREFTRIM APC_FF_SET APC_FB_SET TEMP_
APC_ INIT_SET TIMER_ ALM_ OPTALM TEMP_WIN DAC_FBRT_FIX
TEMP_OFFSET DAC1_ DAC2_ GAIN GAIN OPTALM
DATAALM_ MASK PDGAIN
TEMPALM Reserved (for Test)
<MS0189-E-01>
-32-
2004/5
[AK2573A]
Register Register memory shown Table 8-7. Register access limited with Operation mode (refer 9-1, more information). Table Register (Device Address A8h) Address Register Function R_VRFTRIM[7:4] Oscillator Frequency R_TEMP_OFFSET[3:0] Temperature sensor offset R_APC_FF_SET[7:6] Setting R_APC_FB_SET[5:4] Setting R_APC_INIT_SET[3] Initial Setting R_SFP[2] R_DAC1_GAIN[1] R_DAC2_GAIN[0] R_TEMP_DET[5] R_TIMER_OPTALM[4] R_ALM_POL[3] R_OPTALM[1:0] R_TEMP_WIN[6:0] R_DAC1_FBRT[6:0] R_DATAALM_MASK[0] R_DAC2_FBRT[6:0] R_PDGAIN[5:0] R_TEMPALM[6:0] R_TEMP[6:0] R_TEMP_STDW[6:0] R_DAC1_FF[7:0] R_DAC2_FF[7:0] R_APC_FB[8:0] R_DAC1_FB[8:0] R_DAC2_FB[8:0] R_DAC1[7:0] R_DAC2[7:0] R_APC_TRGT[4:0] R_CURRALM_DAC1[7:4] R_CURRALM_DAC2[3:0] R_DUTY[4:0] Test MSA(SFP) Setting I-DAC1 Gain I-DAC2 Gain Type Remark
Temperature compensation shutdown release ON/OFF Delay time TXFAULT detection with OPTALM Polarity OPTALM Reference Level Temperature Difference Detection Level Ratio I-DAC1 DATAALM Mask Ratio I-DAC2 PDGAIN TEMPALM Level Detected Temperature Temperature Shutdown request I-DAC1 I-DAC2 I-DAC1 I-DAC2 I-DAC1 I-DAC2 Reference CURRALM I-DAC1 CURRALM I-DAC2 Duty Adjust Test
Table Table initial Setting Initial Setting Support Support Gain Gain Gain Gain 160ms 1/3, 1/6, section
section DATAALM Valid DATAALM Invalid section Table Table R/(W) Table R/(W) section R/(W) R/(W) R/(W) R/(W) R/(W) Note Note Note Note Note Note Note Table section section
18h1Dh Note data format read write IC(8bit) shown 8-1. Note R_DAC1 R_DAC1_FF R_DAC1_FB, R_DAC1>=0, Note R_DAC2 R_DAC2_FF R_DAC2_FB, R_DAC2
<MS0189-E-01>
-33-
2004/5
[AK2573A]
Note Read Only. R/(W): Read Write, Write data changed internal operation. R/W: Read/Write, Write data hold unless re-writing operation mode changing. adjustment would done registers. Data Type Unsigned, Signed (2's Complement) Table Register Address VREFTRIM APC_FF_SET APC_FB_SET TEMP_ TEMP_OFFSET DAC1_ DAC2_ GAIN GAIN OPTALM
APC_ INIT_SET TIMER_ ALM_ OPTALM TEMP_WIN DAC1_FBRT
DATAALM_ MASK DAC2_FBRT PDGAIN TEMPALM TEMP TEMP_STDW DAC1_FF DAC2_FF APC_FB (see 8-1)
DAC1_FB DAC2_FB DAC1 DAC2 CURRALM_DAC1 APC_TRGT CURRALM_DAC2 DUTY Reserved (for test)
<MS0189-E-01>
-34-
2004/5
ASAHI KASEI data format signed register
Register (9bit complement) Body (8bit)
[AK2573A]
Sign
Read Data Digital bit) (Sign Body (MSB 7bit) Write Data Digital bit) (Body 8bit, Negative Data written)
Operation Mode AK2573A operating modes: Self-running, Adjustment EEPROM mode. Self-running Mode Self-running mode ready normal operation after adjustments completed. this mode, temperature detection, EEPROM access feeding current automatically performed using on-chip oscillator. AK2573A works this mode after power-on. Adjustment Mode Adjustment mode designed training characteristics. AK2573A operates according register settings through I2CI/F. During adjustment mode, R_SFP should EEPROM Mode EEPROM mode used storing characteristics into EEPROM. MODE Control AK2573A operation modes changed through I2Cinterface. Table shows access limitation each operation mode Table shows command change operation mode. Note: I2Cinterface access prohibited after power-on mode transfer self-running mode. Table Access limitation each operation mode EEPROM Access Operation mode Read Write Self-running mode (WP="L") Adjustment mode (WP="L") EEPROM mode (WP="L") Self-running mode only (User Area Only) Table Operation mode change Device Address 1010100 1010100 1010100 Address 11111111 11111111 11111111 Data 10100000 10100111 10101110 Register Access Write (except mode-change command) (except mode-change command)
Read
Operation mode Self-running mode Adjustment mode EEPROM mode
Operation Mode Protection When "H", only self-running mode selected.
<MS0189-E-01>
-35-
2004/5
ASAHI KASEI Module Adjustment Example Table 10-1 shows module adjustment example.
[AK2573A]
Table 10-1 Module Adjustment Example Item Contents Adjustment mode Issues "Changing Adjustment mode command" (see Table 9-2) I2CI/F. setting R_SFP avoid TXFAULT detection adjustment mode. setting R_APC_FB_SET "00" R_APC_FF=11. BIAS current "Open Loop". current adjustment R_DAC1_GAIN R_DAC2_GAIN, then adjust R_APC_FF_DAC1 modulation current R_APC_FF_DAC2 BIAS current Duty adjustment Adjust R_DUTY duty power, necessary. After duty adjustment, tune BIAS current R_APC_FF_DAC1 necessary. PDGAIN adjustment Adjust R_PDGAIN PDMON step cannot measure PDMON voltage, step PDGAIN adjustment R_APC_TRGT=100000 R_PDGAIN=000000 (Gain=23.5dB). Then R_APC_FF_SET R_APC_FB_SET your configulation. adjusts output automatically. Adjust R_PDGAIN normal output. R_APC_TRGT adjustment fine tunning optical power. step-8. setting R_APC_TRGT "10000". R_APC_FB_SET according your configuration. target Adjust R_APC_TRGT tunning output. output adjusted adjustment automaticaaly according R_APC_TRGT. Read temperature data Read R_TEMP (on-chip temperature sensor detection temperature). Estimate temperature more temperature adjustment characteristics step with different temperature estimate current data look-up table. Single point adjustment Calculate current data look-up table with on-chip temperature sensor gain (-1.49/LSB), R_TEMP characteristics. Write adjustment data Make data EEPROM. EEPROM Issue mode change command EEPROM. Write adjustment data EEPROM. Read EEPROM data verify Self running mode Issue mode change command self-running. AK2573A operates temperature detection, feed current response temperature, feedback operation automatically according data EEPROM.
<MS0189-E-01>
-36-
2004/5
ASAHI KASEI Circuit Example Fig-A illustrates circuit example AK2573A. Fig-A Circuit Example
VSSMD IMODN IMODN VSSMD VSSBI IBIAS VSSBI AVDD IMOD IMOD IBIAS PDIN AVSS 3.3V 0.2V
[AK2573A]
Ferrite Bead (Murata BLM18BD102) (2**RPD*CPD) 1kHz10kHz 4.7k10k C12=C14=C16=C18=C20 0.01uF 0.001uF C11=C13=C15=C17=C19 0.1uF
VDDMD VDDDR VSSDR
PDMON BIAS TEMPMON
BIASMON MODMON TEST1 TEST2 TEST3 TEST4
AK2573AVB
TEMPALM CURRALM OPTALM DATAALM DVSS
Mod_def
TXDIS1
DATAP
CLKP
CLKN
DVDD
Open
DATAN
TXDIS2
TXFAULT
TEST5 TEST6
Mod_def
Tx_Fault LVPECL (see below)
full access: write protection: Open
Normal Operation with Open: Pull-down Shutdown Operation with Open: Pull-up Tx_Disable
LVPECL
DATA Only Coupling C101 R101 C102 DATAN CLKP Open CLKN Open R113 R114 DATAP DATA Only Coupling R111 R112 R124 R125 R126 CLKP DATA Coupling DATAP R122 R121 DATAP R123 DATAN CLKP CLKN
DATAN
R101 C101 C102 0.01uF
R111 R113 R112 R114
R127 R128
CLKN R121 R123 R125 R127 R122 R124 R126 R128
<MS0189-E-01>
-37-
2004/5
[AK2573A]
IMPORTANT NOTICE These products their specifications subject change without notice. Before considering application, consult Asahi Kasei Microsystems Co., Ltd. (AKM) sales office authorized distributor concerning their current status. assumes liability infringement patent, intellectual property, other right application information contained herein. export these products, devices systems containing them, require export license other official approval under regulations country export pertaining customs tariffs, currency exchange, strategic materials. products neither intended authorized critical components safety, life support, other hazard related device system, assumes responsibility relating such use, except with express written consent Representative Director AKM. used here: hazard related device system designed intended life support maintenance safety applications medicine, aerospace, nuclear energy, other fields, which failure function perform reasonably expected result loss life significant injury damage person property. critical component whose failure function perform reasonably expected result, whether directly indirectly, loss safety effectiveness device system containing which must therefore meet very high standards performance reliability. responsibility buyer distributor product distributes, disposes otherwise places product with third party notify that party advance above content conditions, buyer distributor agrees assume responsibility liability hold harmless from claims arising from said product absence such notification.
<MS0189-E-01>
-38-
2004/5

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