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Compare 8-Bit Words Package Options Include Plastic Small-Outline (DW)
Top Searches for this datasheetSN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS Compare 8-Bit Words Package Options Include Plastic Small-Outline (DW) Ceramic Flat Packages, Ceramic Chip Carriers (FK), Standard Plastic Ceramic 300-mil DIPs SN54HC684 PACKAGE SN74HC684 PACKAGE (TOP VIEW) description These magnitude comparators perform comparisons 8-bit binary words. These devices provide outputs. SN54HC684 characterized operation over full military temperature range -55°C 125°C. SN74HC684 characterized operation from -40°C 85°C. FUNCTION TABLE DATA INPUTS OUTPUTS SN54HC684 PACKAGE (TOP VIEW) Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. Copyright 1997, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters. POST OFFICE 655303 DALLAS, TEXAS 75265 function generated applying 2-input NAND gate. SN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS logic symbol COMP This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS logic diagram (positive logic) POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS absolute maximum ratings over operating free-air temperature range Supply voltage range, -0.5 Input voltage range, (see Note -0.5 Output voltage range, (see Note -0.5 Input clamp current, VCC) Output clamp current, VCC) Continuous output current, VCC) Continuous current through Package thermal impedance, (see Note package 97°C/W package 67°C/W Storage temperature range, Tstg -65°C 150°C Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output voltage ratings exceeded input output current ratings observed. package thermal impedance calculated accordance with JESD except through-hole packages, which trace length zero. recommended operating conditions SN54HC684 Supply voltage High-level voltage High input Low-level input voltage Input voltage Output voltage Input transition times (rise fall) Operating free-air temperature 3.15 1.35 1000 SN74HC684 3.15 1.35 1000 UNIT PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS -5.2 3.98 5.48 25°C 1.998 4.499 5.999 4.30 5.80 0.002 0.001 0.001 0.17 0.15 -0.1 0.26 0.26 -100 SN54HC684 1000 -1000 SN74HC684 3.84 5.34 0.33 0.33 1000 -1000 UNIT switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure PARAMETER FROM (INPUT) (OUTPUT) 25°C SN54HC684 SN74HC684 UNIT operating characteristics, 25°C PARAMETER Power dissipation capacitance TEST CONDITIONS load UNIT PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC684, SN74HC684 8-BIT MAGNITUDE COMPARATORS PARAMETER MEASUREMENT INFORMATION From Output Under Test Test Point (see Note In-Phase Output Input tPLH tPHL Out-of-Phase Output Input tPLH tPHL LOAD CIRCUIT VOLTAGE WAVEFORM INPUT RISE FALL TIMES VOLTAGE WAVEFORMS PROPAGATION DELAY OUTPUT TRANSITION TIMES NOTES: includes probe test-fixture capacitance. Phase relationships between waveforms were chosen arbitrarily. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments (TI) reserves right make changes products discontinue semiconductor product service without notice, advises customers obtain latest version relevant information verify, before placing orders, that information being relied current. warrants performance semiconductor products related software specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. Certain applications using semiconductor products involve potential risks death, personal injury, severe property environmental damage ("Critical Applications"). SEMICONDUCTOR PRODUCTS DESIGNED, INTENDED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT APPLICATIONS, DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. Inclusion products such applications understood fully risk customer. products such applications requires written approval appropriate officer. Questions concerning potential risk applications should directed through local sales office. order minimize risks associated with customer's applications, adequate design operating safeguards should provided customer minimize inherent procedural hazards. assumes liability applications assistance, customer product design, software performance, infringement patents services described herein. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. 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