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SN54HC688, SN74HC688 8-BIT IDENTITY COMPARATORS
Compare 8-Bit Words Package Options Include Plastic Small-Outline (DW) Ceramic Flat Packages, Ceramic Chip Carriers (FK), Standard Plastic Ceramic 300-mil DIPs
SN54HC688 PACKAGE SN74HC688 PACKAGE (TOP VIEW)
description
These identity comparators perform comparisons 8-bit binary words. output-enable (OE) input used force output high level. SN54HC688 characterized operation over full military temperature range -55°C 125°C. SN74HC688 characterized operation from -40°C 85°C.
FUNCTION TABLE INPUTS DATA OUTPUT
SN54HC688 PACKAGE (TOP VIEW)
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
Copyright 1997, Texas Instruments Incorporated
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC688, SN74HC688 8-BIT IDENTITY COMPARATORS
logic symbol
COMP
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12.
logic diagram (positive logic)
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC688, SN74HC688 8-BIT IDENTITY COMPARATORS
absolute maximum ratings over operating free-air temperature range
Supply voltage range, -0.5 Input clamp current, VCC) (see Note Output clamp current, VCC) (see Note Continuous output current, VCC) Continuous current through Package thermal impedance, (see Note package 97°C/W package 67°C/W Storage temperature range, Tstg -65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output voltage ratings exceeded input output current ratings observed. package thermal impedance calculated accordance with JESD except through-hole packages, which trace length zero.
recommended operating conditions
SN54HC688 Supply voltage High-level voltage High input Low-level input voltage Input voltage Output voltage Input transition time (rise fall) Operating free-air temperature 3.15 1.35 1000 SN74HC688 3.15 1.35 1000 UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC688, SN74HC688 8-BIT IDENTITY COMPARATORS
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS -5.2 3.98 5.48 25°C 1.998 4.499 5.999 0.002 0.001 0.001 0.17 0.15 ±0.1 0.26 0.26 ±100 SN54HC688 ±1000 SN74HC688 3.84 5.34 0.33 0.33 ±1000 UNIT
switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure
PARAMETER FROM (INPUT) (OUTPUT) 25°C SN54HC688 SN74HC688 UNIT
operating characteristics, 25°C
PARAMETER Power dissipation capacitance TEST CONDITIONS load UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC688, SN74HC688 8-BIT IDENTITY COMPARATORS
PARAMETER MEASUREMENT INFORMATION
From Output Under Test Test Point (see Note In-Phase Output Input tPLH tPHL Out-of-Phase Output Input tPLH tPHL
LOAD CIRCUIT
VOLTAGE WAVEFORM INPUT RISE FALL TIMES
VOLTAGE WAVEFORMS PROPAGATION DELAY OUTPUT TRANSITION TIMES
NOTES: includes probe test-fixture capacitance. Phase relationships between waveforms were chosen arbitrarily. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. tPLH tPHL same tpd.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments (TI) reserves right make changes products discontinue semiconductor product service without notice, advises customers obtain latest version relevant information verify, before placing orders, that information being relied current. warrants performance semiconductor products related software specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. Certain applications using semiconductor products involve potential risks death, personal injury, severe property environmental damage ("Critical Applications"). SEMICONDUCTOR PRODUCTS DESIGNED, INTENDED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT APPLICATIONS, DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. Inclusion products such applications understood fully risk customer. products such applications requires written approval appropriate officer. Questions concerning potential risk applications should directed through local sales office. order minimize risks associated with customer's applications, adequate design operating safeguards should provided customer minimize inherent procedural hazards. assumes liability applications assistance, customer product design, software performance, infringement patents services described herein. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used.
Copyright 1996, Texas Instruments Incorporated

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