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SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
Members Texas Instruments WidebusFamily State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Dissipation Protection Exceeds 2000 MIL-STD-883, Method 3015; Exceeds Using Machine Model Latch-Up Performance Exceeds JEDEC Standard JESD-17 Typical VOLP (Output Ground Bounce) 25°C Distributed Configuration Minimizes High-Speed Switching Noise Flow-Through Architecture Optimizes Layout High-Drive Outputs (-32-mA IOH, 64-mA IOL) Package Options Include Plastic 300-mil Shrink Small-Outline (DL), Thin Shrink Small-Outline (DGG), Thin Very Small-Outline (DGV) Packages 380-mil Fine-Pitch Ceramic Flat (WD) Package Using 25-mil Center-to-Center Spacings
SN54ABT16241 PACKAGE SN74ABT16241A DGG, DGV, PACKAGE (TOP VIEW)
description
SN54ABT16241 SN74ABT16241A 16-bit buffers line drivers designed specifically improve both performance density 3-state memory address drivers, clock drivers, bus-oriented receivers transmitters.
These devices used four 4-bit buffers, 8-bit buffers, 16-bit buffer. These devices provide true outputs complementary output-enable inputs. ensure high-impedance state during power power down, should tied through pullup resistor; minimum value resistor determined current-sinking capability driver. should tied through pulldown resistor; minimum value resistor determined current-sourcing capability driver. SN54ABT16241 characterized operation over full military temperature range -55°C 125°C. SN74ABT16241A characterized operation from -40°C 85°C.
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. Widebus EPIC-B trademarks Texas Instruments Incorporated.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
Copyright 1997, Texas Instruments Incorporated
POST OFFICE 655303
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SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
FUNCTION TABLES INPUTS 1OE, OUTPUTS
INPUTS 2OE,
OUTPUTS
logic symbol
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12.
POST OFFICE 655303
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SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
logic diagram (positive logic)
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, -0.5 Input voltage range, (see Note -0.5 Voltage range applied output high power-off state, -0.5 Current into output state, SN54ABT16241 SN74ABT16241A Input clamp current, Output clamp current, Package thermal impedance, (see Note package 89°C/W package 93°C/W package 94°C/W Storage temperature range, Tstg -65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output negative-voltage ratings exceeded input output clamp-current ratings observed. package thermal impedance calculated accordance with EIA/JEDEC JESD51.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
recommended operating conditions (see Note
SN54ABT16241 Supply voltage High-level input voltage Low-level input voltage Input voltage High-level output current Low-level output current Input transition rise fall rate Outputs enabled SN74ABT16241A UNIT ns/V
Operating free-air temperature NOTE Unused inputs must held high prevent them from floating.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS Vhys IOZH IOZL Ioff ICEX Data inputs Control inputs Outputs high Outputs high Outputs Outputs disabled -100 ±100 -180 0.05 -180 ±100 -180 0.05 0.55 0.55* 0.55 0.55 25°C -1.2 SN54ABT16241 -1.2 SN74ABT16241A -1.2 UNIT
Outputs enabled input Other inputs Outputs disabled input Other inputs
products compliant MIL-PRF-38535, this parameter does apply. typical values more than output should tested time, duration test should exceed second. This increase supply current each input that specified voltage level rather than GND.
POST OFFICE 655303
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SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
switching characteristics over recommended ranges supply voltage operating free-air temperature, (unless otherwise noted) (see Figure
SN54ABT16241 PARAMETER FROM (INPUT) (OUTPUT) 25°C tPLH tPHL tPZH tPZL tPHZ tPLZ UNIT
switching characteristics over recommended ranges supply voltage operating free-air temperature, (unless otherwise noted) (see Figure
SN74ABT16241A PARAMETER FROM (INPUT) (OUTPUT) 25°C tPLH tPHL tPZH tPZL tPHZ tPLZ UNIT
POST OFFICE 655303
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SN54ABT16241, SN74ABT16241A 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
PARAMETER MEASUREMENT INFORMATION
Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open
From Output Under Test (see Note
LOAD CIRCUIT Input VOLTAGE WAVEFORMS PULSE DURATION
Timing Input Data Input VOLTAGE WAVEFORMS SETUP HOLD TIMES Output Control tPZL Output Waveform (see Note Output Waveform Open (see Note tPZH VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING tPLZ tPHZ
Input tPLH Output tPHL tPHL tPLH Output VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS
NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments (TI) reserves right make changes products discontinue semiconductor product service without notice, advises customers obtain latest version relevant information verify, before placing orders, that information being relied current. warrants performance semiconductor products related software specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. Certain applications using semiconductor products involve potential risks death, personal injury, severe property environmental damage ("Critical Applications"). SEMICONDUCTOR PRODUCTS DESIGNED, INTENDED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT APPLICATIONS, DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. Inclusion products such applications understood fully risk customer. products such applications requires written approval appropriate officer. Questions concerning potential risk applications should directed through local sales office. order minimize risks associated with customer's applications, adequate design operating safeguards should provided customer minimize inherent procedural hazards. assumes liability applications assistance, customer product design, software performance, infringement patents services described herein. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used.
Copyright 1996, Texas Instruments Incorporated

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