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EPIC (Enhanced-Performance Implanted CMOS) 1-µm Process Package Option
Top Searches for this datasheetSN54AC241, SN74AC241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS EPIC (Enhanced-Performance Implanted CMOS) 1-µm Process Package Options Include Plastic Small-Outline (DW), Shrink Small-Outline (DB), Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK), Flat (W), Packages SN54AC241 PACKAGE SN74AC241 PACKAGE (TOP VIEW) description These octal buffers line drivers designed specifically improve performance density 3-state memory address drivers, clock drivers, bus-oriented receivers transmitters. 'AC241 organized 4-bit buffers/drivers with separate complementary output-enable (1OE 2OE) inputs. When high, device passes noninverted data from inputs outputs. When high low, outputs high-impedance state. SN54AC241 characterized operation over full military temperature range -55°C 125°C. SN74AC241 characterized operation from -40°C 85°C. SN54AC241 PACKAGE (TOP VIEW) FUNCTION TABLES INPUTS OUTPUT INPUTS OUTPUT Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. EPIC trademark Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters. POST OFFICE 655303 Copyright 1996, Texas Instruments Incorporated DALLAS, TEXAS 75265 SN54AC241, SN74AC241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS logic symbol This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. logic diagram (positive logic) absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, -0.5 Input voltage range, (see Note -0.5 Output voltage range, (see Note -0.5 Input clamp current, VCC) Output clamp current, VCC) Continuous output current, VCC) Continuous current through ±200 Maximum power dissipation 55°C still air) (see Note package package package package Storage temperature range, Tstg -65°C 150°C Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output voltage ratings exceeded input output current ratings observed. maximum package power dissipation calculated using junction temperature 150°C board trace length mils, except package, which trace length zero. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54AC241, SN74AC241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS recommended operating conditions (see Note SN54AC241 Supply voltage High-level input voltage High Low-level input voltage Input voltage Output voltage High-level output current High Low-level output current Input transition rise fall rate 3.15 3.85 1.35 1.65 SN74AC241 3.15 3.85 1.35 1.65 ns/V UNIT Operating free-air temperature NOTE Unused inputs must held high prevent them from floating. PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54AC241, SN74AC241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS Data inputs Control inputs GND, VI(OE) GND, ±0.1 ±0.1 ±0.25 0.36 0.36 0.36 1.65 1.65 ±2.5 2.56 3.86 4.86 25°C SN54AC241 3.85 3.85 0.44 0.44 0.44 SN74AC241 2.46 3.76 4.76 UNIT more than output should tested time, duration test should exceed switching characteristics over recommended operating (unless otherwise noted) (see Figure PARAMETER tPLH tPHL tPZH tPZL tPHZ tPLZ FROM (INPUT) (OUTPUT) free-air temperature SN74AC241 10.5 12.5 13.5 range, UNIT 25°C 12.5 12.5 SN54AC241 11.5 PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54AC241, SN74AC241 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS switching characteristics over recommended operating (unless otherwise noted) (see Figure PARAMETER tPLH tPHL tPZH tPZL tPHZ tPLZ FROM (INPUT) (OUTPUT) free-air temperature SN74AC241 10.5 10.5 range, UNIT 25°C SN54AC241 11.5 11.5 operating characteristics, 25°C PARAMETER Power dissipation capacitance buffer/driver TEST CONDITIONS UNIT PARAMETER MEASUREMENT INFORMATION From Output Under Test (see Note Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open LOAD CIRCUIT Output Control (low-level enabling) Output Waveform (see Note Output Waveform Open (see Note tPZL tPLZ tPHZ Input tPLH tPHL tPZH Output VOLTAGE WAVEFORMS VOLTAGE WAVEFORMS NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. Figure Load Circuit Voltage Waveforms PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. POST OFFICE 655303 DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments (TI) reserves right make changes products discontinue semiconductor product service without notice, advises customers obtain latest version relevant information verify, before placing orders, that information being relied current. warrants performance semiconductor products related software specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. Certain applications using semiconductor products involve potential risks death, personal injury, severe property environmental damage ("Critical Applications"). SEMICONDUCTOR PRODUCTS DESIGNED, INTENDED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT APPLICATIONS, DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. Inclusion products such applications understood fully risk customer. products such applications requires written approval appropriate officer. Questions concerning potential risk applications should directed through local sales office. order minimize risks associated with customer's applications, adequate design operating safeguards should provided customer minimize inherent procedural hazards. assumes liability applications assistance, customer product design, software performance, infringement patents services described herein. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. 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