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SST39WF400A SST39WF400A1.8V (x16) memory FEATURES: Orga
Top Searches for this datasheetMbit (x16) Multi-Purpose Flash SST39WF400A SST39WF400A1.8V (x16) memory FEATURES: Organized 256K Single Voltage Read Write Operations 1.65-1.95V Superior Reliability Endurance: 100,000 Cycles (typical) Greater than years Data Retention Power Consumption (typical values MHz) Active Current: (typical) Standby Current: (typical) Sector-Erase Capability Uniform KWord sectors Block-Erase Capability Uniform KWord blocks Fast Read Access Time Latched Address Data Fast Erase Word-Program Sector-Erase Time: (typical) Block-Erase Time: (typical) Chip-Erase Time: (typical) Word-Program Time: (typical) Automatic Write Timing Internal Generation End-of-Write Detection Toggle Data# Polling CMOS Compatibility JEDEC Standard Flash EEPROM Pinouts command sets Packages Available 48-ball TFBGA (6mm 8mm) 48-ball WFBGA (4mm 6mm) Micro-Package 48-bump XFLGA (4mm 6mm) Micro-Package PRODUCT DESCRIPTION SST39WF400A device 256K CMOS MultiPurpose Flash (MPF) manufactured with SST's proprietary, high performance CMOS SuperFlash technology. split-gate cell design thick-oxide tunneling injector attain better reliability manufacturability compared with alternate approaches. SST39WF400A writes (Program Erase) with 1.65-1.95V power supply. This device conforms JEDEC standard assignments memories. Featuring high-performance Word-Program, SST39WF400A device provides typical Word-Program time µsec. device uses Toggle Data# Polling detect completion Program Erase operation. protect against inadvertent writes, on-chip hardware software data protection schemes. Designed, manufactured, tested wide spectrum applications, this device offered with guaranteed typical endurance 100,000 cycles. Data retention rated greater than years. SST39WF400A device suited applications that require convenient economical updating program, configuration, data memory. system applications, significantly improves performance reliability, while lowering power consumption. inherently uses less energy ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 during Erase Program than alternative flash technologies. When programming flash device, total energy consumed function applied voltage, current, time application. Since given voltage range, SuperFlash technology uses less current program shorter erase time, total energy consumed during Erase Program operation less than alternative flash technologies. These devices also improve flexibility while lowering cost program, data, configuration storage applications. SuperFlash technology provides fixed Erase Program times, independent number Erase/Program cycles that have occurred. Therefore system software hardware does have modified de-rated necessary with alternative flash technologies, whose Erase Program times increase with accumulated Erase/Program cycles. meet surface mount requirements, SST39WF400A offered both 48-ball TFBGA package 48-ball Micro-Packages. Figures assignments. logo SuperFlash registered trademarks Silicon Storage Technology, Inc. trademark Silicon Storage Technology, Inc. These specifications subject change without notice. Mbit Multi-Purpose Flash SST39WF400A Device Operation Commands used initiate memory operation functions device. Commands written device using standard microprocessor write sequences. command written asserting while keeping low. address latched falling edge CE#, whichever occurs last. data latched rising edge CE#, whichever occurs first. Read Read operation SST39WF400A controlled OE#, both have system obtain data from outputs. used device selection. When high, chip deselected only standby power consumed. output control used gate data from output pins. data high impedance state when either high. Refer Read cycle timing diagram further details (Figure operation initiated executing six-byte command sequence with Block-Erase command (50H) block address (BA) last cycle. sector block address latched falling edge sixth pulse, while command (30H 50H) latched rising edge sixth pulse. internal Erase operation begins after sixth pulse. End-ofErase operation determined using either Data# Polling Toggle methods. Figures timing waveforms. commands issued during Sectoror Block-Erase operation ignored. Chip-Erase Operation SST39WF400A provides Chip-Erase operation, which allows user erase entire memory array state. This useful when entire device must quickly erased. Chip-Erase operation initiated executing sixbyte command sequence with Chip-Erase command (10H) address 5555H last byte sequence. Erase operation begins with rising edge sixth CE#, whichever occurs first. During Erase operation, only valid read Toggle Data# Polling. Table command sequence, Figure timing diagram, Figure flowchart. commands issued during Chip-Erase operation ignored. Word-Program Operation SST39WF400A programmed word-by-word basis. Before programming, sector where word exists must fully erased. Program operation accomplished three steps. first step three-byte load sequence Software Data Protection. second step load word address word data. During Word-Program operation, addresses latched falling edge either WE#, whichever occurs last. data latched rising edge either WE#, whichever occurs first. third step internal Program operation which initiated after rising edge fourth CE#, whichever occurs first. Program operation, once initiated, will completed within Figures controlled Program operation timing diagrams Figure flowcharts. During Program operation, only valid reads Data# Polling Toggle Bit. During internal Program operation, host free perform additional tasks. commands issued during internal Program operation ignored. Write Operation Status Detection SST39WF400A provides software means detect completion write (Program Erase) cycle, order optimize system write cycle time. software detection includes status bits: Data# Polling (DQ7) Toggle (DQ6). End-of-Write detection mode enabled after rising edge WE#, which initiates internal Program Erase operation. actual completion nonvolatile Write asynchronous with system; therefore, either Data# Polling Toggle read simultaneous with completion Write cycle. this occurs, system possibly erroneous result, i.e., valid data appear conflict with either DQ6. order prevent spurious rejection, erroneous result occurs, software routine should include loop read accessed location additional times. both Reads valid, then device completed Write cycle, otherwise rejection valid. Sector/Block-Erase Operation Sector- Block-) Erase operation allows system erase device sector-by-sector block-byblock) basis. SST39WF400A offers both Sector-Erase Block-Erase mode. sector architecture based uniform sector size KWord. Block-Erase mode based uniform block size KWord. SectorErase operation initiated executing six-byte command sequence with Sector-Erase command (30H) sector address (SA) last cycle. Block-Erase ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data# Polling (DQ7) When SST39WF400A internal Program operation, attempt read will produce complement true data. Once Program operation completed, will produce true data. Note that even though have valid data immediately following completion internal Write operation, remaining data outputs still invalid: valid data entire data will appear subsequent successive Read cycles after interval During internal Erase operation, attempt read will produce `0'. Once internal Erase operation completed, will produce `1'. Data# Polling valid after rising edge fourth CE#) pulse Program operation. Sector-, Block- Chip-Erase, Data# Polling valid after rising edge sixth CE#) pulse. Figure Data# Polling timing diagram Figure flowchart. Software Data Protection (SDP) SST39WF400A provides JEDEC approved Software Data Protection scheme data alteration operations, i.e., Program Erase. Program operation requires inclusion three-byte sequence. three-byte load sequence used initiate Program operation, providing optimal protection from inadvertent Write operations, e.g., during system power-up power-down. Erase operation requires inclusion six-byte sequence. This group devices shipped with Software Data Protection permanently enabled. Table specific software command codes. During command sequence, invalid commands will abort device Read mode within TRC. contents DQ15DQ8 VIH, other value, during command sequence. Common Flash Memory Interface (CFI) Toggle (DQ6) During internal Program Erase operation, consecutive attempts read will produce alternating i.e., toggling between When internal Program Erase operation completed, will stop toggling. device then ready next operation. Toggle valid after rising edge fourth CE#) pulse Program operation. Sector-, Block- Chip-Erase, Toggle valid after rising edge sixth CE#) pulse. Figure Toggle timing diagram Figure flowchart. SST39WF400A also contains information describe characteristics device. order enter Query mode, system must write three-byte sequence, same Software Entry command with (CFI Query command) address 5555H last byte sequence. Once device enters Query mode, system read data addresses given Tables through system must write Exit command return Read mode from Query mode. Data Protection SST39WF400A provides both hardware software features protect nonvolatile data from inadvertent writes. Hardware Data Protection Noise/Glitch Protection: pulse less than will initiate write cycle. Power Up/Down Detection: Write operation inhibited when less than 1.0V. Write Inhibit Mode: Forcing low, high, high will inhibit Write operation. This prevents inadvertent writes during power-up power-down. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Product Identification Product Identification mode identifies devices SST39WF400A manufacturer SST. This mode accessed software operations. Users Software Product Identification operation identify part (i.e., using device when using multiple manufacturers same socket. details, Table software operation, Figure Software Entry Read timing diagram, Figure Software Entry command sequence flowchart. TABLE PRODUCT IDENTIFICATION TABLE Address Manufacturer's Device SST39WF400A 0001H 272FH T1.0 1220 Product Identification Mode Exit/ Mode Exit order return standard Read mode, Software Product Identification mode must exited. Exit accomplished issuing Software Exit command sequence, which returns device Read mode. This command also used reset device Read mode after inadvertent transient condition that apparently causes device behave abnormally, e.g., read correctly. Please note that Software Exit/ Exit command ignored during internal Program Erase operation. Table software command codes, Figure timing waveform, Figure flowchart. Data 00BFH 0000H FUNCTIONAL BLOCK DIAGRAM X-Decoder SuperFlash Memory Memory Address Address Buffer Latches Y-Decoder DQ15 1220 B1.0 Control Logic Buffers Data Latches ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A VIEW (balls facing down) SST39WF400A DQ15 DQ14 DQ13 DQ12 1220 48-tfbga P01.0 DQ10 DQ11 FIGURE ASSIGNMENTS 48-BALL TFBGA VIEW (balls facing down) SST39WF400A 1220 48-wfbga-xflga P03_4.0 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 FIGURE ASSIGNMENTS 48-BALL WFBGA 48-BUMP XFLGA ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data Sheet TABLE DESCRIPTION Symbol AMS1-A0 DQ15-DQ0 Name Address Inputs Data Input/output Functions provide memory addresses. During Sector-Erase AMS-A11 address lines will select sector. During Block-Erase AMS-A15 address lines will select block. output data during Read cycles receive input data during Write cycles. Data internally latched during Write cycle. outputs tri-state when high. activate device when low. gate data output buffers. control Write operations. provide power supply voltage: Unconnected pins. T2.0 1220 Chip Enable Output Enable Write Enable Power Supply Ground Connection 1.65-1.95V SST39WF400A Most significant address SST39WF400A TABLE OPERATION MODES SELECTION Mode Read Program Erase Standby Write Inhibit Product Identification Software Mode Table T3.0 1220 DOUT High High DOUT High DOUT Address Sector Block address, Chip-Erase VIH, other value. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data Sheet TABLE SOFTWARE COMMAND SEQUENCE Command Sequence Word-Program Sector-Erase Block-Erase Chip-Erase Query Entry5 Software Exit Exit7/ Write Cycle Addr1 5555H 5555H 5555H 5555H 5555H 5555H Data2 2AAAH 5555H T4.0 1220 Write Cycle Addr1 2AAAH 2AAAH 2AAAH 2AAAH 2AAAH 2AAAH Data2 Write Cycle Addr1 5555H 5555H 5555H 5555H 5555H 5555H Data2 Write Cycle Addr1 5555H 5555H 5555H Data2 Data Write Cycle Addr1 2AAAH 2AAAH 2AAAH Data2 Write Cycle Addr1 SAX4 Data2 5555H Software Entry5,6 5555H Software Exit7/ Exit Address format A14-A0 (Hex), Addresses AMS-A15 VIH, other value, Command sequence. Most significant address SST39WF400A DQ15-DQ8 VIH, other value, Command sequence Program word address Sector-Erase; uses AMS-A11 address lines Block-Erase; uses AMS-A15 address lines device does remain Software Product mode powered down. With AMS-A1 Manufacturer's 00BFH, read with SST39WF400A Device 272FH, read with Both Software Exit operations equivalent TABLE QUERY IDENTIFICATION STRING1 SST39WF400A Address Data 0051H 0052H 0059H 0001H 0007H 0000H 0000H 0000H 0000H 0000H 0000H Data Query Unique ASCII string "QRY" Primary command Address Primary Extended Table Alternate command (00H none exists) Address Alternate extended Table (00H none exits) T5.0 1220 Refer publication more details. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data Sheet TABLE SYSTEM INTERFACE INFORMATION SST39WF400A Address Data 0016H 0020H 0000H 0000H 0005H 0000H 0005H 0007H 0001H 0000H 0001H 0001H Data (Program/Erase) DQ7-DQ4: Volts, DQ3-DQ0: millivolts (Program/Erase) DQ7-DQ4: Volts, DQ3-DQ0: millivolts (00H pin) (00H pin) Typical time Word-Program Typical time size buffer program (00H supported) Typical time individual Sector/Block-Erase Typical time Chip-Erase Maximum time Word-Program times typical Maximum time buffer program times typical Maximum time individual Sector/Block-Erase times typical Maximum time Chip-Erase times typical T6.0 1220 TABLE DEVICE GEOMETRY INFORMATION SST39WF400A Address Data 0013H 0001H 0000H 0000H 0000H 0002H 007FH 0000H 0010H 0000H 0007H 0000H 0000H 0001H Data Device size Byte (13H KByte) Flash Device Interface description; 0001H x16-only asynchronous interface Maximum number byte multi-byte write (00H supported) Number Erase Sector/Block sizes supported device Sector Information Number sectors; 256B sector size) sectors (007FH 127) Bytes KByte/sector (0010H Block Information Number blocks; 256B block size) blocks (0007H Bytes KByte/block (0100H 256) T7.0 1220 ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data Sheet Absolute Maximum Stress Ratings (Applied conditions greater than those listed under "Absolute Maximum Stress Ratings" cause permanent damage device. This stress rating only functional operation device these conditions conditions greater than those defined operational sections this data sheet implied. Exposure absolute maximum stress rating conditions affect device reliability.) Temperature Under Bias -55°C +125°C Storage Temperature -65°C +150°C Voltage Ground Potential -0.5V VDD+0.5V Transient Voltage (<20 Ground Potential -2.0V VDD+2.0V Voltage Ground Potential -0.5V Package Power Dissipation Capability 25°C) 1.0W Surface Mount Lead Soldering Temperature Seconds) 240°C Output Short Circuit Current1 Outputs shorted more than second. more than output shorted time. OPERATING RANGE Range Commercial Industrial Ambient Temp +70°C -40°C +85°C 1.65-1.95V 1.65-1.95V CONDITIONS TEST Input Rise/Fall Time Output Load Figures ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Data Sheet TABLE OPERATING CHARACTERISTICS 1.65-1.95V1 Limits Symbol Parameter Power Supply Current Read Program Erase Standby Current Input Leakage Current Output Leakage Current Input Voltage Input High Voltage Output Voltage Output High Voltage VDD-0.1 0.8VDD 0.2VDD Units Test Conditions Address input=VILT/VIHT, MHz, VDD=VDD CE#=VIL, OE#=WE#=VIH, I/Os open CE#=WE#=VIL, OE#=VIH CE#=VDD, VDD=VDD VIN=GND VDD, VDD=VDD VOUT=GND VDD, VDD=VDD VDD=VDD VDD=VDD IOL=100 VDD=VDD IOH=-100 VDD=VDD T8.2 1220 Typical conditions Active Current shown front page data sheet average values 25°C (room temperature), 1.8V. 100% tested. maximum 39WF400A commercial grade devices. maximum 39WF400A industrial grade devices. 39WF400A commercial industrial devices, typical TABLE RECOMMENDED SYSTEM POWER-UP TIMINGS Symbol TPU-READ1 TPU-WRITE Parameter Power-up Read Operation Power-up Program/Erase Operation Minimum Units T9.0 1220 This parameter measured only initial qualification after design process change that could affect this parameter. TABLE CAPACITANCE 25°C, MHz, other pins open) Parameter CI/O1 Description Capacitance Input Capacitance Test Condition VI/O Maximum T10.0 1220 This parameter measured only initial qualification after design process change that could affect this parameter. TABLE RELIABILITY CHARACTERISTICS Symbol NEND TDR1 ILTH1 Parameter Endurance Data Retention Latch Minimum Specification 10,000 Units Cycles Years Test Method JEDEC Standard A117 JEDEC Standard A103 JEDEC Standard T11.0 1220 This parameter measured only initial qualification after design process change that could affect this parameter. NEND endurance rating qualified 10,000 cycle minimum whole device. sector- block-level rating would result higher minimum specification. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A CHARACTERISTICS TABLE READ CYCLE TIMING PARAMETERS 1.70-1.95V 1.65-1.95V SST39WF400A-90 Symbol TCLZ2 TOLZ2 TCHZ2 TOHZ2 TOH2 Parameter Read Cycle Time Chip Enable Access Time Address Access Time Output Enable Access Time Active Output Active Output High High-Z Output High High-Z Output Output Hold from Address Change SST39WF400A-100 Units T12.2 1220 parts will ONLY support voltage range 1.70-1.95V. This parameter measured only initial qualification after design process change that could affect this parameter. TABLE PROGRAM/ERASE CYCLE TIMING PARAMETERS Symbol TOES TOEH TWPH1 TCPH1 TDH1 TIDA1 TSCE Parameter Word-Program Time Address Setup Time Address Hold Time Setup Time Hold Time High Setup Time High Hold Time Pulse Width Pulse Width Pulse Width High Pulse Width High Data Setup Time Data Hold Time Software Access Exit Time Sector-Erase Block-Erase Chip-Erase Units T13.0 1220 This parameter measured only initial qualification after design process change that could affect this parameter. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A ADDRESS AMS-0 TOLZ TOHZ DQ15-0 HIGH-Z TCLZ DATA VALID TCHZ HIGH-Z DATA VALID 1220 F03.1 Note: Most significant address SST39WF400A FIGURE READ CYCLE TIMING DIAGRAM INTERNAL PROGRAM OPERATION STARTS ADDRESS AMS-0 5555 DQ15-0 XXAA XX55 XXA0 DATA WORD (ADDR/DATA) TWPH 2AAA 5555 ADDR 1220 F04.1 Note: Most significant address SST39WF400A VIH, other value. FIGURE CONTROLLED PROGRAM CYCLE TIMING DIAGRAM ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A INTERNAL PROGRAM OPERATION STARTS ADDRESS AMS-0 5555 DQ15-0 XXAA XX55 XXA0 DATA WORD (ADDR/DATA) TCPH 2AAA 5555 ADDR 1220 F05.1 Note: Most significant address SST39WF400A VIH, other value. FIGURE CONTROLLED PROGRAM CYCLE TIMING DIAGRAM ADDRESS AMS-0 TOEH TOES DATA DATA# DATA# DATA 1220 F06.1 Note: Most significant address SST39WF400A FIGURE DATA# POLLING TIMING DIAGRAM ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A ADDRESS AMS-0 TOEH TOES READ CYCLES WITH SAME OUTPUTS 1220 F07.1 Note: Most significant address SST39WF400A FIGURE TOGGLE TIMING DIAGRAM SIX-BYTE CODE CHIP-ERASE ADDRESS AMS-0 5555 2AAA 5555 5555 2AAA 5555 TSCE DQ15-0 XXAA XX55 XX80 XXAA XX55 XX10 1220 F08.1 Note: This device also supports controlled Chip-Erase operation signals interchangeable long minimum timings met. (See Table Most significant address SST39WF400A VIH, other value. FIGURE CONTROLLED CHIP-ERASE TIMING DIAGRAM ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A SIX-BYTE CODE BLOCK-ERASE ADDRESS AMS-0 5555 2AAA 5555 5555 2AAA DQ15-0 XXAA XX55 XX80 XXAA XX55 XX50 1220 F09.1 Note: This device also supports controlled Block-Erase operation signals interchangeable long minimum timings met. (See Table Most significant address SST39WF400A VIH, other value. FIGURE CONTROLLED BLOCK-ERASE TIMING DIAGRAM SIX-BYTE CODE SECTOR-ERASE ADDRESS AMS-0 5555 2AAA 5555 5555 2AAA DQ15-0 XXAA XX55 XX80 XXAA XX55 XX30 1220 F10.1 Note: This device also supports controlled Sector-Erase operation signals interchangeable long minimum timings met. (See Table Most significant address SST39WF400A VIH, other value. FIGURE CONTROLLED SECTOR-ERASE TIMING DIAGRAM ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A THREE-BYTE SEQUENCE SOFTWARE ENTRY ADDRESS A14-0 5555 2AAA 5555 0000 0001 TWPH DQ15-0 XXAA XX55 XX90 00BF Device 1220 F11.1 TIDA Note: Device 272FH SST39WF400A VIH, other value. FIGURE SOFTWARE ENTRY READ THREE-BYTE SEQUENCE QUERY ENTRY ADDRESS A14-0 5555 2AAA 5555 TWPH DQ15-0 XXAA XX55 XX98 1220 F12.1 TIDA Note: VIH, other value. FIGURE QUERY ENTRY READ ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A THREE-BYTE SEQUENCE SOFTWARE EXIT RESET ADDRESS A14-0 5555 2AAA 5555 DQ15-0 XXAA XX55 XXF0 TIDA 1220 F13.1 Note: VIH, other value. FIGURE SOFTWARE EXIT/CFI EXIT ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A VIHT INPUT REFERENCE POINTS OUTPUT VILT 1220 F14.0 test inputs driven VIHT (VDD) logic VILT (VSS) logic "0". Measurement reference points inputs outputs (0.5 VDD) (0.5 VDD). Input rise fall times (10% 90%) Note: VINPUT Test VOUTPUT Test VIHT VINPUT HIGH Test VILT VINPUT Test FIGURE INPUT/OUTPUT REFERENCE WAVEFORMS TESTER 1220 F15.1 FIGURE TEST LOAD EXAMPLE ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Start Load data: XXAAH Address: 5555H Load data: XX55H Address: 2AAAH Load data: XXA0H Address: 5555H Load Word Address/Word Data Wait Program (TBP, Data# Polling bit, Toggle operation) Program Completed Note: VIH, other value. 1220 F16.0 FIGURE WORD-PROGRAM ALGORITHM ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Internal Timer Program/Erase Initiated Toggle Program/Erase Initiated Data# Polling Program/Erase Initiated Wait TBP, TSCE, Read word Read Program/Erase Completed Read same word true data? Does match? Program/Erase Completed Program/Erase Completed 1220 F17.0 FIGURE WAIT OPTIONS ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Query Entry Command Sequence Software Entry Command Sequence Software Exit/CFI Exit Command Sequence Load data: XXAAH Address: 5555H Load data: XXAAH Address: 5555H Load data: XXAAH Address: 5555H Load data: XXF0H Address: Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Wait TIDA Load data: XX98H Address: 5555H Load data: XX90H Address: 5555H Load data: XXF0H Address: 5555H Return normal operation Wait TIDA Wait TIDA Wait TIDA Read data Read Software Return normal operation 1220 F18.0 Note: VIH, other value. FIGURE SOFTWARE ID/CFI COMMAND FLOWCHARTS ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A Chip-Erase Command Sequence Load data: XXAAH Address: 5555H Sector-Erase Command Sequence Load data: XXAAH Address: 5555H Block-Erase Command Sequence Load data: XXAAH Address: 5555H Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Load data: XX80H Address: 5555H Load data: XX80H Address: 5555H Load data: XX80H Address: 5555H Load data: XXAAH Address: 5555H Load data: XXAAH Address: 5555H Load data: XXAAH Address: 5555H Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Load data: XX55H Address: 2AAAH Load data: XX10H Address: 5555H Load data: XX30H Address: Load data: XX50H Address: Wait TSCE Wait Wait Chip erased FFFFH Sector erased FFFFH Block erased FFFFH Note: VIH, other value. 1220 F19.0 FIGURE ERASE COMMAND SEQUENCE ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A PRODUCT ORDERING INFORMATION 400A XXXX Environmental Attribute non-Pb Package Modifier leads balls balls bumps possible positions) Package Type TFBGA (0.8mm pitch, 8mm) XFLGA (0.5mm pitch, 6mm) WFBGA (0.5mm pitch, 6mm) Temperature Range Commercial +70°C Industrial -40°C +85°C Minimum Endurance 10,000 cycles Read Access Speed Device Density Mbit Voltage 1.65-1.95V Product Series Multi-Purpose Flash Valid combinations SST39WF400A SST39WF400A-90-4C-B3K SST39WF400A-90-4C-B3KE SST39WF400A-90-4I-B3K SST39WF400A-90-4I-B3KE SST39WF400A-100-4I-B3K SST39WF400A-100-4I-B3KE SST39WF400A-90-4C-C1Q SST39WF400A-90-4C-C1QE SST39WF400A-90-4I-C1Q SST39WF400A-90-4I-C1QE SST39WF400A-100-4I-C1Q SST39WF400A-100-4I-C1QE SST39WF400A-90-4C-M1Q SST39WF400A-90-4C-M1QE SST39WF400A-90-4I-M1Q SST39WF400A-90-4I-M1QE SST39WF400A-100-4I-M1Q SST39WF400A-100-4I-M1QE Note: Valid combinations those products mass production will mass production. Consult your sales representative confirm availability valid combinations determine availability combinations. ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A PACKAGING DIAGRAMS VIEW 8.00 0.20 BOTTOM VIEW 5.60 0.80 0.45 0.05 (48X) 0.80 CORNER 4.00 6.00 0.20 SIDE VIEW 1.10 0.10 CORNER SEATING PLANE 0.35 0.05 0.12 Note: Complies with JEDEC Publication MO-210, variant 'AB-1', although some dimensions more stringent. linear dimensions millimeters. Coplanarity: 0.12 Ball opening size 0.38 0.05 48-tfbga-B3K-6x8-450mic-4 48-BALL THIN-PROFILE, FINE-PITCH BALL GRID ARRAY (TFBGA) PACKAGE CODE: ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A VIEW 6.00 0.08 BOTTOM VIEW 5.00 0.50 0.32 0.05 (48X) 4.00 0.08 2.50 0.50 CORNER INDICATOR 0.63 0.10 DETAIL SIDE VIEW 0.08 SEATING PLANE 0.20 0.06 Note: Although many dimensions similar those JEDEC Publication MO-225, this specific package registered. linear dimensions millimeters. Coplanarity: 0.08 ball present position gold-colored indicator present. 48-wfbga-M1Q-4x6-32mic-5 Ball opening size 0.29 0.05 48-BALL VERY-VERY-THIN-PROFILE, FINE-PITCH BALL GRID ARRAY (WFBGA) PACKAGE CODE: VIEW 6.00 0.08 BOTTOM VIEW 5.00 0.50 0.29 0.05 (48X) 4.00 0.08 2.50 0.50 CORNER INDICATOR 0.52 max. 0.473 nom. DETAIL SIDE VIEW 0.08 SEATING PLANE 0.04 0.025/ 0.015 Note: Although many dimensions similar those JEDEC Publication MO-222, this specific package registered. linear dimensions millimeters. Coplanarity: 0.08 48-xflga-C1Q-4x6-29mic-5 bump present position gold-colored indicator present. 48-BUMP EXTREMELY-THIN-PROFILE, FINE-PITCH LAND GRID ARRAY (XFLGA) PACKAGE CODE: ©2004 Silicon Storage Technology, Inc. S71220-05-000 6/04 Mbit Multi-Purpose Flash SST39WF400A TABLE REVISION HISTORY Number Description Date 2003 2003 2003 2003 2003 2004 Initial release Added speed parts Output leakage current changed from Table page Removed "Typical" column from Table page Added commercial temperature range MPNs packages 2004 Data Book Updated B3K, M1Q, package diagrams Added footnote parameter Table page Silicon Storage Technology, Inc. 1171 Sonora Court Sunnyvale, 94086 Telephone 408-735-9110 408-735-9036 www.SuperFlash.com www.sst.com ©2004 Silicon Storage Technology, Inc. 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