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Table Contents QUALITY RELIABILITY .1-1 TECHNICAL REPORT
Intrinsic Floating Gate Charge Loss Mechanism .2-1
PROM/RPROM/EPROM RELIABILITY DATA SUMMARY .3-1 PSD/SYSTEM LOGIC RELIABILITY DATA SUMMARY .4-1 PROM/RPROM/EPROM RELIABILITY DATA
DEVICE
WS27C128L WS27C256L
PACKAGE
CERDIP (600 Mil) PDIP (600 Mil) CERDIP (600 Mil) PLCC PDIP (600 Mil) CERDIP (600 Mil) PLCC CERDIP (600 Mil) PLCC CERDIP (600 Mil) PLCC CERDIP (600 Mil) PLCC CERDIP (600 Mil) PLCC CLDCC PLCC CERDIP (300/600 Mil) CERDIP (300/600 Mil) PLCC PDIP (300 Mil) CERDIP (300/600 Mil)
PRODUCT DESCRIPTION
CMOS EPROM .5-1
CMOS EPROM .5-2
WS27C512L WS27C512LS WS27C010L WS27C010LS WS27C210L WS27C210LS WS57C43B WS57C43C WS57C45 WS57C49B
CMOS EPROM .5-3
CMOS EPROM .5-4
128K CMOS EPROM .5-6
128K CMOS EPROM .5-9
CMOS EPROM .5-13
CMOS EPROM .5-14
CMOS RPROM .5-16 CMOS RPROM .5-17
CMOS RPROM .5-19 CMOS RPROM .5-20
Table Contents
PROM/RPROM/EPROM RELIABILITY DATA (Cont.)
DEVICE
WS57C49C
PACKAGE
CERDIP (300 Mil) PDIP (300 Mil) PLCC CERDIP (300 Mil) CERDIP (300/600 Mil) PDIP (300 Mil) PLCC CERDIP (300/600 Mil) PLCC CERDIP (300 Mil) CERDIP (300 Mil) PDIP (300 Mil) CERDIP (600 Mil) CERDIP (600 Mil) CERDIP (600 Mil) CERDIP (600 Mil) CLCC PDIP (600 Mil) PLCC CERDIP (600 Mil) PLCC TSOP
PRODUCT DESCRIPTION
CMOS RPROM .5-22
WS57C51B WS57C51C
CMOS RPROM .5-26 CMOS RPROM .5-27
WS57C71C WS57C291B WS57C291C WS57C257 WS57C64F WS57C128FB WS57C256F
CMOS RPROM .5-30
CMOS RPROM .5-32 CMOS RPROM .5-33
CMOS EPROM .5-35 High Speed CMOS EPROM .5-36 High Speed CMOS EPROM .5-37 High Speed CMOS EPROM .5-37
WS57C010F
High Speed 128K CMOS EPROM .5-41
Table Contents
PSD/SYSTEM LOGIC RELIABILITY DATA
DEVICE
SAM448 PAC1000A PSD301
PACKAGE
PDIP (300 Mil) CPGA CLDCC PLCC TQFP CLDCC PLCC PLCC PQFP TQFP CLDCC PLCC PLCC TQFP PLCC (MCM FLASH) CLDCC PLCC TQFP PLCC CLDCC CPGA CPGA
PRODUCT DESCRIPTION
User-Configurable Microsequencer .6-1 User-Configurable Microcontroller .6-1 Field-Programmable Microcontroller Peripheral .6-2
PSD302 PSD303
Field-Programmable Microcontroller Peripheral .6-7
Field-Programmable Microcontroller Peripheral .6-10
PSD304 PSD402 PSD413F PSD503
Field-Programmable Microcontroller Peripheral .6-13
Field-Programmable Microcontroller Peripheral .6-15
Field-Programmable Microcontroller Peripheral .6-17 with Flash Memory Field-Programmable Microcontroller Peripheral .6-18
MAP168 PSD100 WS59032
Peripheral with Memory.6-21 Peripheral with Memory.6-22
High Speed 32-Bit CMOS Microprocessor Slice .6-23
SALES REPRESENTATIVES DISTRIBUTORS.7-1
Quality Reliability
Introduction
This Semi-Annual Reliability Summary presents reliability data available customers. data presented with test results each timepoint accompanying failure analysis where applicable. this manner, customer compute failure rate application. convenience, failure rates have been computed 55°C using method discussed pages committed serving customers with most reliable products available. From onset, products designed, manufactured tested rigorous standards which culminate devices that superior both performance reliability.
Reliability
Main Functions Reliability Are:
Reliability Engineering (RE)
assure that manufactured products reflect highest reliability standards measure this with in-house programs compare against these standards; provide technical assistance other engineering functions matters product reliability; prepare execute qualification plans revised designs, packages processes.
Reliability Test
provide suitable step/stress facilities in-house, appropriate vendor, purpose conducting qualifications quality conformance inspections.
Failure Analysis
provide maintain Failure Analysis function in-house, appropriate vendor, purpose investigating causes failures their systematic elimination from product. Eventually, devices enter wearout region where failures begin occur very rapidly again. mean time failure wearout years. established following Reliability Goals 55°C: Infant Mortality Intrinsic Failure Rate Wear Hours Hours Years 0.01% FITs MTTF Years
Reliability Goals
failure rate integrated circuit been classically described having "bathtub" curve (see Figure "bathtub" curve shows three main stages product's life: very high failure rate beginning, known infant mortality period, which normally represents first hours system. constant failure rate period, with relatively failures, known intrinsic failure rate useful life. This period represents next years more operation.
Reliability Summary 1997
FAILURE RATE
Figure Bathtub Curve
INFANT MORTALITY WEAR INTRINSIC TIME
Reliability Prediction
life expectancy integrated circuit accelerated both temperature voltage. WSI, both used extensively assessing product reliability.
Temperature
many years, temperature been known accelerator various types failure mechanisms. increasing temperature, observed that devices took less time fail. elevating temperature, long term reliability data collected relatively short time. Failure rate calculations based upon data collected from accelerated life testing. temperature dependence accelerating failures been shown exponential. acceleration factor between temperatures calculated using Arrhenius equation:
Each failure mechanism accelerated differently temperature. thermal activation energy constant which adjusts temperature dependence various failure mechanisms. following activation energies used each failure mechanism:
Failure Mechanism
Oxide Defects Masking Defects Assembly Defects Bulk Silicon Defects Electromigration Charge Loss (Intrinsic) Contamination
Activation Energy
Voltage
Oxide defects more highly accelerated voltage than temperature (note activation energy oxide defects). obtain higher acceleration oxide defects during lifetest, supply voltage increased volts when possible. increasing supply voltage, additional acceleration obtained oxide defects.
Application Junction Temperature Accelerated Stress Junction Temperature 8.62 10-5 eV/°K Thermal Activation Energy
Reliability Summary 1997
Failure Rate Calculations
Failure rate calculations based summary life test results. Typically, failure rate calculated family devices manufactured given process. calculate failure rate, acceleration factor between accelerated stress temperature application temperature must calculated each activation energy. Junction temperatures used rather than ambient temperatures. junction temperature temperature surface heat generated device itself. junction temperature product power dissipation multiplied thermal resistance package. then added ambient temperature. (JA) (P); where (ICC) (VCC) next step calculate number accelerated device hours from lifetest data. number device hours product sample size multiplied
hours lifetest. equivalent device hours each activation energy calculated multiplying device hours acceleration factor. failure rate each activation energy computed dividing total number failures with same activation energy equivalent device hours. Typically confidence level used calculating failure rates. total failure rate summation failure rates each activation energy. failure rate expressed FITs which number failures device hours: Failure Rate
F(Ea, UCL) FITs A(Ea,
F(Ea, UCL) 1.049 (Failures with same 1.0305 A(Ea, Acceleration Factor Device Hours
Product Reliability
ElectroStatic Discharge Sensitivity (ESDS)
products tested ESDS accordance with Method 3015 MIL-STD-883. Typical inputs fail around 3,000 volts outputs fail range 3,000 5,000 volts. Testing performed products when changes occur that influence ESDS device (i.e., redesign, process, etc.).
Qualifications
processes, major process changes, design rules must pass reliability qualification. three lots used depending reliability risk involved. Qualification requires minimum 1000-hour life test 125°C. EPROMs stressed dynamically 150°C with overvoltage condition volts. (The overvoltage accelerates oxide defects additional 55x.) Qualifications place heavy emphasis first hours (infant mortality) life test. Larger sample sizes used initially with number decreasing qualification progresses. Logic EPROM products same processes with Logic products lacking some steps EPROM products. peripheral circuitry EPROM, decoders, I/Os, etc., have identical design rules Logic products. Every reliability evaluation EPROM product also evaluates Logic product line. EPROMs subjected special qualification requirements study data retention characteristics EPROM cell. These devices programmed with 100% zero pattern then baked 225°C 1000 hours. These tests performed insure that reliability goals have been met.
Latch-Up
Latch-up condition that occurs excessive current (spikes) circuit periphery creates large potential that triggers parasitic inherent CMOS processes. Latch-up destructive device. reduce latch-up, employs epitaxial layer above resistivity substrate. This diverts current substrate, away from active circuitry, reducing lateral potential which triggers latch-up. products tested latch-up between -1.0 +7.0 volts with currents forced pin.
Reliability Summary 1997
Product Reliability (Cont.)
Qualifications (Cont.)
Other tests include Temperature Cycle from -65°C +150°C 1000 cycles. addition, plastic packaged products must pass hours Pressure PSIG.
EPROM Programming
Electrical charge loss major cause programming failure. Program Disturb charge transfer from floating gate line. This charge loss mechanism occurs during programming high electrical fields present. Failure occurs when already programmed cell loses charge other cells, with same line, being programmed. This failure mechanism result oxide defects edge floating gate. Erase electrical charge loss word line. Erase result defects oxide between floating gate word line above. Like Program Disturb, Erase occurs during programming when already programmed cell losses charge adjacent cells same word line programmed. split gate EPROM matured point that programmability customer 99.9%. Product Assurance data collected over 5000 units showed programmability 99.98%. most recent Program/Erase cycling data fails cycles. focusing eliminating Program Disturb Erase, threshold programmed EPROM cell consistently well above volts. This provides additional operating margin reliability.
EPROMs
Because EPROMs floating gate storage cell, they have unique reliability considerations. Data retention related ability store charge floating gate EPROM cell. Charge loss shift threshold EPROM cell from programmed state unprogrammed state, i.e., from logical Charge loss result defects oxide surrounding floating gate. These defects occur during wafer processing generally affect single array. been shown that defective bits this type lose their charge very rapidly with high temperature. this reason, they effectively screened with high temperature bake.
EPROM Screening
Data retention screening performed EPROM products. Screening wafer level that higher temperatures used without fear affecting solderability packaged unit. screen consists programming each device 100% then baking wafers hours 225°C. After bake, 100% pattern verified. Charge also flow electrically floating gate. Charge gain charge transfer from either word line line floating gate such that unprogrammed device becomes programmed. date, charge gain been observed EPROM.
Process Reliability
utilizes Class wafer facilities wafer processing. Most processing performed robots, reducing human factors such contamination handling from contributing reliability failures. Photolithography performed using stateof-the-art steppers which eliminate marginal mask defects from becoming reliability hazards. Passivation cracks metal shifting double layer metal devices minimized even large through planarization process.
Intrinsic Floating Gate Charge Loss Mechanism
Termer WSI, Inc. J.M. Caywood Consultant
Experiments reported charge loss from floating gate memory cells. loss phenomena similar what been reported intrinsic charge loss. step physical model involving Fowler-Nordheim assisted tunneling into traps followed Poole-Frenkel emission proposed current. Characterization dependence shows excellent agreement between model experiment.
Intrinsic Floating Gate Charge Loss Mechanism
Introduction
Some reliability hazards common large class semiconductor devices (e.g. metal corrosion plastic packages) while some hazards specific certain technologies. example, alpha particle induced soft error rates range DRAMs poly load SRAMs; these rates range from SRAMs with cells, have been shown <~0.1 floating gate memories.1,2 other hand floating gate memories subject data retention failures. Several mechanisms have been identified which lead loss data EPROMs. These include ionic contamination, oxide defects, "intrinsic" charge loss.3 Contamination, which introduces mobile positively charged ions into oxide cause data loss because mobile ions diffuse drift negatively charged floating gates neutralize charge there induction. Typically, this mechanism manifests itself single failing initially, often near edge array, followed fairly quickly other adjacent bits failing contamination spreads. apparent activation energy been associated with ionic contamination. Oxide defects allow electrons leak onto floating gate leading charge gain charge loss. These defects overwhelmingly appear single isolated bits. apparent activation energy been shown apply these failures. "intrinsic" charge loss mechanism well understood. Data loss from this mechanism usually appears only after long times temperatures well excess typical operating storage temperatures. failures appear initially single bits, after longer times more failing bits appear scattered randomly about array. apparent activation energy ~1.4 been reported this mechanism. Despite these various failure mechanisms, experiments usually show retention failure rates EPROMs over year operating life.
Description Observations
keeping with good practice, program conduct initial reliability qualifications products which followed long term monitoring assure continual maintenance high reliability products. These monitors include retention tests dynamic life tests well various package related tests. program established study nature units that failed various retention tests during qualifications monitors identify what improvements, any, were possible. These units were collected over wide range wafer lots establish broad sampling phenomenon.
been observed that failures consisted single charge loss. failing bits were located randomly within array. further observed that failing units were into extended retention test, increasing number bits would seen lose their charge that these bits would located randomly throughout arrays. Moreover, after long enough time high enough temperature, essentially units tested would exhibit charge loss from more bits. These observations suggested that phenomenon being observed inherent product. questions were: product degrading over time, would product lose data under normal operating life.
Reliability Summary 1997
Experimental Results
answer first question number dropouts from retention monitor were collected, reprogrammed, tested again. cumulative failure fraction
these monitor dropouts versus time monitor compared same quantity retest Figure
CUMMULATIVE FAILURES
Figure Cumulative Fallout Time Retention Test
225°C RETENTION TEST
TIME (HOURS) 1000 First Test Second Test
Cumulative fallout versus time retention test same units successive tests.
identity units maintained tests. Comparison units falling each readout showed that same units were falling within same readout times tests. These results show that product deteriorating over time. anything, retention better second retention test than first. order discover temperature dependence retention failures, groups units were selected randomly, programmed, tested retention various temperatures. number product units included each temperature group typically several hundred. After time fail curves each temperature were established, time failure plotted versus inverse temperature. result shown Figure least squares data shown figure corresponds apparent activation energy 1.32
experiments were then carried discover voltage dependence leakage phenomenon. voltage floating gate depends upon charge floating gate voltage coupled onto gate drain floating gate control gate floating gate capacitors. Since increasing voltage control gate, increases floating gate voltage, VFG, control gate voltage necessary switch cell from state state used monitor charge floating gate. floating gate discharges, voltage necessary switch output, VTPX, deceases. Thus, leakage current, given Ctot
Ctot
VTPX
where Ctot total floating gate capacitance, control gate floating gate coupling ratio.
Reliability Summary 1997
Figure Time Failure Inverse Temperature
TIME (HOURS)
275°C 1000
250°C
225°C
200°C
1.32
(1/°K)
Experimental Results (Cont.)
first experiments sought find whether drain voltage control gate voltage effect leakage current. might have been expected from bake experiments, charge loss could only observed high temperature; voltage experiments were carried 150°C. Moreover, obtain units which contain bits which were leaky enough that measurement times were short enough convenient, screen reject units were used. Bits which were known have high charge loss rates were biased under various conditions. Periodically, VTPX would measured track change floating gate charge. Changes line bias voltage were observed have effect leakage rate. charge loss exhibited when biased with control gate voltages shown Figure initial latency period, seen before leakage current begins decline, artifact measurement technique. These experiments were conducted memory arrays. test software measured lowest value VTPX array. However, there reason with high leakage rate high temperatures program weakly and, fact, leaky programmed better than many other bits; hence, VTPX leaky measured only after
enough time passed that become lowest value array. seen, control gate bias voltage significant effect leakage rate. That leakage rate strongly dependent upon control gate bias independent drain bias indicates that leakage path through interpoly oxide (i.e. oxide between floating gate control gate). This suggests plotting leakage current versus voltage across interpoly oxide, VFC. Now, VFG) RCF) VTPX approximated
Ctot
data Figure replotted curve where VTPX approximated average value between values which used equation above. resulting plot shown Figure Note that points which fall three distinct curves Figure have collapsed onto approximately same curve. also clear that current depends voltage superlinear manner.
Reliability Summary 1997
Figure
150°C
VTPX (VOLTS)
TIME (MINUTES) Discharge curves stressed 150°C various control gate biases.
Figure
LEAKAGE CURRENT (ATTOAMPS)
INTERPOLY VOLTAGE (VOLTS) Relationship between interpoly voltage leakage current.
Reliability Summary 1997
Physical Model
data point toward model which there conduction through interpoly oxide with activation energy superlinear current-voltage relationship. reproducibility leakage rate relationship point strongly toward electronic ionic conduction. However, electronic mechanism unlikely either thermionic emission over potential barrier between conduction bands silicon SiO2 Fowler-Nordheim tunneling through this barrier from conduction band SiO2 conduction band.4-6 former ruled because barrier height reasonably well established about latter because tunneling very weak temperature dependence.7 Figure illustrates model which explain observations. This model assumes that electron first tunnels into positively charged trap then thermally excited from trap into conduction band SiO2. tunneling enhanced field lowering potential barrier. electric field also lowers barrier thermal emission from trap described Frenkel resulting Poole-Frenkel emission.8,9 field enhanced texture polysilicon
surface since well established that texture surface enhances electric field near surface thus FowlerNordheim tunneling from surface.10 leakage current according this model should given HMFN
where initial states tunneling, final states tunneling, initial states Poole-Frenkel emission, final states Poole-Frenkel emission, HMFN appropriate Hamiltonians. initial tunneling states occupied states conduction band; final states tunneling unoccupied trap states; initial states Poole-Frenkel emission occupied trap states; final states emission conduction band states SiO2. tunneling take place, initial final states must same potential. initial states have distribution energy because thermal excitation traps differing energies because variations local environment which occur because amorphous nature SiO2.
Figure
CONDUCTION BAND
VALENCE BAND
Illustration step process electron reach conduction band involving tunneling into positively charged trap followed thermal emission into SiO2 conduction band.
Reliability Summary 1997
Physical Model (Cont.)
Thus traps which match potential initial states will somewhat varying distances from Si/SiO2 interface coupled different Hamiltonians. notation used here that Dirac implies summation over states.11 Similar comments apply Poole-Frenkel transition term. Only unlikely event that traps half filled will both processes important. traps mostly empty, Poole-Frenkel emission emptying traps much faster than tunneling filling them, process will show voltage temperature dependence rate limiting step, tunneling. other hand, tunneling fills traps much faster than PooleFrenkel emission empty them, traps will mostly occupied, current will show voltage temperature dependence Poole-Frenkel emission. this case which proposed explain observations. this case current should follow equation
According this model plot leakage current versus square root interpoly voltage should result straight line. Figure shows such plot. Note that data from three different bias voltages clustered around same straight line. This line least squares data. agreement between theory experiment very satisfactory. further check, slope line should give Poole-Frenkel factor. calculated value PF/kT 0.0246 (V/cm)-1/2 150°C where taken equal 1.5.12 value given least squares Figure 0.0237 (V/cm)-1/2 when calculated nominal interpoly oxide thickness. That measured theoretical slopes agree well most satisfying. excellent agreement between experiment theory indicates that this model essentially correct. Moreover, suggests that "intrinsic leakage" observed other workers have similar origin.3,13 difference leakage rates reported different observers would, this model, result difference density positively charged traps. should emphasized passing that currents reported this work very small themselves. units currents Figure attoamperes. attoampere electrons second.
where depth trap below conduction band edge, PooleFrenkel factor, electric field strength, Boltzmann's constant, absolute temperature. given
where electronic charge, permittivity free space, high frequency dielectric constant SiO2.
Reliability Summary 1997
LEAKAGE CURRENT (ATTOAMPS)
Figure Leakage Current Square Root Interpoly Voltage
150°C
INTERPOLY VOLTAGE (VOLTS)
diagonal line across figure least squares data.
Reliability Data
been shown that charge loss studied this report repeatable, non-destructive phenomenon. This phenomenon been characterized shown dependent upon both temperature voltage. Screens were established based this knowledge; then data collected screened material evaluate efficacy screens. Tables show results lots screened material which were subjected high temperature retention storage dynamic life tests. storage test carried 225°C; dynamic life test carried 150°C with equal
storage test, failures observed hours which corresponds years 125°C 3000 years 70°C. first failures observed hours which corresponds 18.7 years 125°C 9000 years 70°C. Analysis results Table show that charge loss mechanism contributes failure rate 55°C failure rate 70°C. Another viewing data that first failures were observed hour read out. This equivalent 3600 years 55°C years 70°C
Reliability Summary 1997
Table High Temperature Storage Life
Stress Condition HTSL 225°C Hours 0/146 0/120 Hours 5/146 7/120
Read Outs Hours 13/141 4/113 Hours 1000 Hours 12/128 12/109 6/116 2/97
failures were random single failures type studied this report.
Table Dynamic High Temperature Life Test
Stress Condition DHTL 150°C/6.0 Hours 0/146 0/120
Read Outs Hours 4/118 0/102 1000 Hours 0/114 1/102
five failures reported were random single retention failures studied this report. units lost from test, were result electrical overstress; result broken lead.
Summary
Single charge loss failures which occur random locations have been studied. been shown that these failures repeatable degrade more rapidly repeated tests. mechanism demonstrated possess apparent activation energy ~1.3 strongly dependent electric field. results quantitatively model
step discharge process which electrons floating gate first tunnel positively charged traps interpoly oxide then escape from traps Poole-Frenkel emission. Reliability studies indicate that screened material, this mechanism contributes failure rate 55°C UCL.
References
Neal Mielke Reliability Comparison FLOTOX Textured-Polysilicon 2PROMs. 25th Annual Proc. Rel. Phys., 85-92 (1987). J.M. Caywood B.L. Prickett. Radiation-Induced Soft Errors Floating Gate Memories. 21st Annual Proc. Rel. Phys., 167-72 (1983). R.E. Shiner Data Retention EPROMs. Proc. 18th Annual Proc. Rel. Phys., 238-43 (1980). C.A. Mead. Electron Transport Mechanisms Thin Insulating Films. Phys., Rev. 128, 2088-93 (1962). R.H. Fowler Nordheim. Electron Emission Intense Electric Fields. Proc. Royal Soc., London, Ser. 119, 173-81 (1928). Lenzlinger E.H. Snow. Fowler-Nordheim Tunneling into Thermally Grown SiO2. Appl. Phys. 278-83 (1969). R.J. Powell. Interface Barrier Energy Determination from Voltage Dependence Photoinjected Currents. Appl. Phys. 2424-32 (1970). Frenkel. Pre-Breakdown Phenomena Insulators Electronic Semiconductors. Phys., Rev. 647-8 (1938); Frenkel, Exptl. Theoret. Phys. (USSR) 1893 (1938). John Simmons. Poole-Frenkel Effect Schottky Effect Metal-Insulator-Metal Systems. Phys. Rev. 155, 657-60 (1967). R.K. Ellis Electron Tunneling Non-planar Floating Gate Memory Structure. IEDM Tech. Digest, 749-52 (1982). P.A.M. Dirac. Principles Quantum Mechanics. Edition, Oxford University Press, London (1958). Bruce Billings Optics American Institute Physics Handbook. 6-27, McGraw-Hill, York (1972). J.M. Caywood NOVRAM Reliability Report; RR-502A. Xicor Data Book, 8/1-22 (1988).
2-10
PROM/RPROM/EPROM Reliability Data Summary
Introduction
summary data below consists PROM/RPROM/EPROM family data added together each stress condition. Therefore, total failure rate represents family product. individual device data, please turn Reliability Data section where each device family listed individually.
DYNAMIC HIGH TEMPERATURE LIFE
STRESS CONDITIONS 125°C/5.5 125°C/6.0 125°C/6.5 150°C/6.0 150°C/6.5 HOURS 0/388 0/2380 0/105 0/2895 0/1447 HOURS 0/388 1/2380(E) 0/105 0/2895 0/1447 HOURS 0/388 0/2379 0/105 0/2895 3/1447(C) 1000 HOURS 0/388 0/2192 2/105(A) 2/2827(B) 3/1444(D) TOTAL DEVICE HOURS 388,000 2,285,668 105,000 2,861,000 1,445,500 VOLT. ACC. FACTOR* 1.749 3.014 1.749 3.014
*Derated 5.5V single charge loss mechanism.
2-Single Charge Loss,1.32 2-Single Charge Loss, 1.32 1-ICC STB, 1-Oxide Defect, 2-Single Charge Loss, 1.32 2-Single Charge Loss, 1.32 1-Bit Line Short,
ACTIVATION ENERGY (Ea) 1.32
TEMP. ACC. FACTOR* 3682 125°C 35781 150°C 22.43 125°C 53.07 150°C
ACCELERATED DEVICE HOURS 1.731E+10 3.349E+11 1.055E+08 4.968E+08 3.528E+11
FAILURES
FAILURE RATE (60% UCL) 0.03 6.94 6.96
*Derated 55°C single charge loss mechanism. Total Failure Rate: 6.96 5.5V; Upper Confidence Level)
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data Summary (Cont.)
HIGH TEMPERATURE STORAGE LIFE
STRESS CONDITIONS 140°C 150°C 225°C 250°C HOURS 0/2186 0/157 0/3033 0/231 HOURS 0/2186 0/157 2/3033* 0/231 HOURS 0/2186 0/157 2/2954* 0/231 HOURS 0/2186 0/52 8/2770* 1000 HOURS 1/2005* 0/52 9/2347* TOTAL DEVICE HOURS 2,095,500 69,640 2,518,100 38,808
*NOTE:
failures single charge loss.
ACTIVATION ENERGY (Ea)
STRESS TEMP. 140°C
TEMP. ACC. FACTOR* 1.489E+04 3.578E+04 8.345E+06 3.629E+07
ACCELERATED DEVICE HOURS 3.120E+10 2.492E+09 2.101E+13 1.408E+12 2.24556E+13
FAILURES
FAILURE RATE (60% UCL) 0.001
1.32
150°C 225°C 250°C
0.001
*Derated 55°C single charge loss mechanism. Total Failure Rate: 0.001 Upper Confidence Level)
TEMPERATURE CYCLE (AIR AIR)
STRESS CONDITIONS -65°C/+150°C -65°C/+150°C DEVICE PACKAGE CERDIP PLASTIC CYCLES 0/3186 2/2895* CYCLES 0/3166 1/2893* 1000 CYCLES 2/3166* 1/2892* 0/156 2000 CYCLES
*NOTE:
failures single charge loss.
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data Summary (Cont.)
THERMAL SHOCK (OIL OIL)
STRESS CONDITIONS -65°C/+150°C DEVICE PACKAGE PLASTIC CYCLES 0/234 CYCLES 0/234
PRESSURE
STRESS CONDITIONS 121°C/15 PSIG HOURS 1/1710 HOURS 0/1475 HOURS 4/1475*
*NOTE:
failures single charge loss.
TEMPERATURE HUMIDITY BIAS
STRESS CONDITIONS 85°C R.H. /5.25V HOURS 0/208 HOURS 0/208 HOURS 0/208 1000 HOURS 0/208
PSD/System Logic Reliability Data Summary
Introduction
summary data below consists PSD/System Logic family data added together each stress condition. Therefore, total failure rate represents family product. individual device data, please turn Reliability Data section where each device family listed individually.
DYNAMIC HIGH TEMPERATURE LIFE
STRESS CONDITIONS 125°C/6.0 150°C/6.0 150°C/6.5 HOURS 0/3388 0/1526 0/514 HOURS 1/3388** 0/1526 0/514 HOURS 0/3387 0/1525 0/514 1000 HOURS 0/3387 0/1447 0/105 TOTAL DEVICE HOURS 3,387,168 1,486,168 309,500 VOLT. ACC. FACTOR* 1.749 1.749 3.014
*Derated 5.5V single charge loss mechanism. **NOTE:
failures single charge loss.
ACTIVATION ENERGY (Ea) 1.32
TEMP. ACC. FACTOR* 3682 125°C 35781 150°C
ACCELERATED DEVICE HOURS 2.181E+10 1.264E+11
FAILURES
FAILURE RATE (60% UCL) 0.01
*Derated 55°C single charge loss mechanism. Total Failure Rate: 0.01 5.5V; Upper Confidence Level)
HIGH TEMPERATURE STORAGE LIFE
STRESS CONDITIONS 140°C 225°C 250°C HOURS 0/2648 0/1427 0/105 HOURS 0/2648 1/1427* 0/105 HOURS 0/2648 0/1426 0/105 HOURS 1/2648* 1/1426* 0/105 1000 HOURS 1/2390* 0/1199 0/105 TOTAL DEVICE HOURS 2,519,000 1,312,572 105,000
*NOTE:
failures single charge loss.
ACTIVATION ENERGY (Ea)
STRESS TEMP. 140°C
TEMP. ACC. FACTOR* 1.489E+04 8.345E+06 3.651E+07
ACCELERATED DEVICE HOURS 3.751E+10 1.095E+13 3.834E+12
FAILURES
FAILURE RATE (60% UCL)
1.32
225°C 250°C
0.0004
*Derated 55°C single charge loss mechanism. Total Failure Rate: 0.0004 Upper Confidence Level)
Reliability Summary 1997
PSD/System Logic Reliability Data Summary (Cont.)
TEMPERATURE CYCLE (AIR AIR)
STRESS CONDITIONS -65°C/+150°C -65°C/+150°C 0°C/+100°C DEVICE PACKAGE CERDIP PLASTIC PLASTIC CYCLES 0/1312 0/2834 0/78 CYCLES 0/1312 0/2640 0/78 CYCLES 0/1196 0/2524 0/78 1000 CYCLES 0/1196 0/2446
THERMAL SHOCK (OIL OIL)
STRESS CONDITIONS -65°C/+150°C DEVICE PACKAGE PLASTIC CYCLES 0/827 CYCLES 0/130
PRESSURE
STRESS CONDITIONS 121°C/15 PSIG HOURS 0/1616 HOURS 0/1412 HOURS 0/1360
HIGHLY ACCELERATED STRESS TEST
STRESS CONDITIONS 130°C R.H. 5.25V HOURS 0/220 HOURS 0/52
TEMPERATURE HUMIDITY BIAS
STRESS CONDITIONS 85°C R.H. /5.25V HOURS 0/695 HOURS 0/695 HOURS 0/695 1000 HOURS 0/695
PROM/RPROM/EPROM Reliability Data
WS27C128L (CERDIP)
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 89-308-1B NUMBER 89-2207-AB PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 8931 (68,590 YRS) 0/105 (160,040 YRS) 0/105 (476,310 YRS) 1/105(A)
TOTAL DEVICE HOURS 52,500 NUMBER PROJECT NUMBER 89-303-1B
READOUT
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report), @225°C bake equivalent 160,040 years derated 55°C.
WS27C128L (PDIP)
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-211-1C NUMBER 89-1614-BA PROCESS MA123 PACKAGE TYPE 28-Pin PDIP DATE CODE 8921 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15PSI)
PROJECT NUMBER 89-211-1D NUMBER 89-1614-BA PROCESS MA123 PACKAGE TYPE 28-Pin PDIP DATE CODE 8921 HOURS 0/105 HOURS 0/105 HOURS 0/105
TOTAL DEVICE HOURS 25,200
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C256L (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150°C/6.5V)
PROJECT NUMBER 89-303-2A NUMBER 89-0602-AB PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 8909 (686 YRS) 0/104 (2,042 YRS) 0/104 1000 (4,084 YRS) 0/104
TOTAL DEVICE HOURS 104,000
DYNAMIC HIGH TEMPERATURE LIFE (150°C/6.0V)
PROJECT NUMBER 90-220-1A NUMBER 90-3112-AC PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 9033 (686 YRS) 0/102 (2,042 YRS) 0/102 1000 (4,084 YRS) 0/102
TOTAL DEVICE HOURS 102,000
WS27C256L (PLCC)
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-208-3A NUMBER 88-4623 PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 8908 CYCLES 0/65 CYCLES 0/65 1000 CYCLES 0/65
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C256L (PDIP)
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-211-2D NUMBER 89-1810-AC PROCESS MA123 PACKAGE TYPE 28-Pin PDIP DATE CODE 8921 CYCLES 1/78(A) CYCLES 0/77 1000 CYCLES 0/77
NUMBER
PROJECT NUMBER 89-211-2D
READOUT CYCLES
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
PRESSURE (121 °C/15PSI)
PROJECT NUMBER 89-211-2C NUMBER 89-1810-AC PROCESS MA123 PACKAGE TYPE 28-Pin PDIP DATE CODE 8921 HOURS 1/105(A) HOURS 0/104 HOURS 1/104(B)
TOTAL DEVICE HOURS 25,056 NUMBER PROJECT NUMBER 89-211-2C 89-211-2C
READOUT
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
WS27C512L (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-305-2A 89-306-2A NUMBER 89-1615-AA 89-1416-AB PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 8918 8921 (686 YRS) 0/93 0/100 0/193 (2,042 YRS) 0/93 0/100 0/193 1000 (4,084 YRS) 0/93 0/100 0/193
TOTAL DEVICE HOURS 193,000
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C512L (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 90-231-1A NUMBER 90-3263-AA PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9038 YRS) 0/110 (210 YRS) 0/110
TOTAL DEVICE HOURS 55,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 90-231-1B NUMBER 90-3263-AA PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9038 (122 YRS) 0/104 (286 YRS) 0/104 (850 YRS) 0/104
TOTAL DEVICE HOURS 52,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-216-1D 90-231-1C NUMBER 89-4113-AA 90-3263-AA PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 8943 9038 CYCLES 0/50 0/78 0/128 CYCLES 0/50 0/78 0/128 1000 CYCLES 0/50 0/78 0/128
WS27C512LS (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 91-205-1A NUMBER 91-0819-AA PROCESS CE120B PACKAGE TYPE 28-Pin CDIP DATE CODE 9110 (686 YRS) 0/67 (2,042 YRS) 0/67
TOTAL DEVICE HOURS 33,500
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 91-205-1B NUMBER 91-0819-AA PROCESS CE120B PACKAGE TYPE 28-Pin CDIP DATE CODE 9110 1000 (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 0/77 0/77 0/77 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-205-1C NUMBER 91-0819-AA PROCESS CE120B PACKAGE TYPE 28-Pin CDIP DATE CODE 9110 CYCLES 0/77 CYCLES 0/77 1000 CYCLES 0/77
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C512LS (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-211-1A NUMBER 91-1314-AB PROCESS CE120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 YRS) 0/69 (210 YRS) 0/69 1000 (420 YRS) 0/69
TOTAL DEVICE HOURS 69,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-211-1B NUMBER 91-1314-AB PROCESS CE120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-211-1C NUMBER 91-1314-AB PROCESS CE120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121 °C/15PSI)
PROJECT NUMBER 91-211-1D NUMBER 91-1314-AB PROCESS CE120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 HOURS 0/52 HOURS 0/52 HOURS 1/52
TOTAL DEVICE HOURS 12,480
NUMBER
PROJECT NUMBER 91-211-1D
READOUT Hours
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010L (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/5.5V)
PROJECT NUMBER 89-209-1A 89-311-1A NUMBER 89-0812-AA MA123 89-4130-AA PROCESS PACKAGE TYPE 32-Pin CDIP DATE CODE 8916 8944 YRS) 0/52 0/105 0/157 YRS) 0/52 0/105 0/157 (210 YRS) 0/52 0/105 0/157 1000 (420 YRS) 0/52 0/105 0/157
TOTAL DEVICE HOURS 157,000
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-209-1C 89-210-1A 89-214-1A 90-300-1A NUMBER 89-0812-AA 89-1214-AB 89-2501-AA 89-5117-AA MA123 32-Pin CDIP PROCESS PACKAGE TYPE DATE CODE 8916 8916 8927 9003 (196 YRS) 0/52 0/104 0/105 0/105 0/366 (686 YRS) 0/52 0/104 0/105 0/105 0/366 (2,042 YRS) 0/52 0/104 1/105(A) 1/105(C) 2/366 1000 (4,084YRS) 0/52 0/104 1/104(B) 0/104 1/364
TOTAL DEVICE HOURS 365,000
NUMBER
PROJECT NUMBER 89-214-1A 89-214-1A 90-300-1A
READOUT Hours 1000 Hours Hours
QUANTITY
MODE SBCL* SBCL* ICC_STB
MECHANISM Trap Assistant Overcurrent
CAUSE Intrinsic Charge Loss Oxide Defect
COMMENTS Technical Report
*According =1.32 (per technical report),
@150°C bake equivalent years derated 55°C.
HIGH TEMPERATURE STORAGE LIFE (150
PROJECT NUMBER 89-209-1B NUMBER 89-0812-AA PROCESS MA123 PACKAGE TYPE 32-Pin CDIP DATE CODE 8916 (294 YRS) 0/52 (686 YRS) 0/52 (2,042 YRS) 0/52 1000 (4,084 YRS) 0/52
TOTAL DEVICE HOURS 52,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-300-1B NUMBER 89-5117-AA PROCESS MA123 PACKAGE TYPE 32-Pin CDIP DATE CODE 9003 (68,590 YRS) 0/105 (160,040 YRS) 0/105
TOTAL DEVICE HOURS 17,640
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010L (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.5V)
PROJECT NUMBER 90-210-1A NUMBER 89-5202-AA PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9002 YRS) 0/105 (210 YRS) 0/105 1000 (420 YRS) 2/105(A)
TOTAL DEVICE HOURS 105,000 NUMBER PROJECT NUMBER 90-210-1A
READOUT 1000 Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report), 1000 @125°C bake equivalent years derated 55°C.
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 90-210-1B NUMBER 89-5202-AA PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9002 (122 YRS) 0/105 (286 YRS) 0/105 (850 YRS) 0/105 1000 (1700 YRS) 1/105(A)
TOTAL DEVICE HOURS 105,000 NUMBER PROJECT NUMBER 90-210-1B
READOUT 1000 Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
1000 @140°C bake equivalent 1700 years derated 55°C.
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010L (PLCC) (cont.) TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-208-1A 89-208-2A 90-210-1C NUMBER 89-1209-AA 89-1210-AB 89-5202-AA MA123 32-Pin PLCC PROCESS PACKAGE TYPE DATE CODE 8916 8916 9002 CYCLES 0/65 1/65(A) 0/78 1/208 NUMBER PROJECT NUMBER 89-208-2A 89-210-1C CYCLES 0/65 0/64 1/78(B) 1/207 1000 CYCLES 0/65 0/64 0/77 0/206
READOUT Cycles Cycles
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
PRESSURE (121 °C/15PSI)
PROJECT NUMBER 89-208-1B 89-208-2B 90-210-1D NUMBER 89-1209-AA 89-1210-AB 89-5202-AA MA123 32-Pin PLCC ROCESS PACKAGE TYPE DATE CODE 8916 8916 9002 HOURS 0/65 0/65 0/52 0/182
TOTAL DEVICE HOURS 17,472
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010LS (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 90-200-1A NUMBER 89-5121-AA PROCESS CE120B PACKAGE TYPE 32-Pin CDIP DATE CODE 9005 (686 YRS) 0/63 (2,042 YRS) 0/63 1000 (4,084 YRS) 0/63
TOTAL DEVICE HOURS 63,000
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-228-2A NUMBER NA24900404 PROCESS CE120DLM PACKAGE TYPE 32-Pin CDIP DATE CODE 9250 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/5.5V)
PROJECT NUMBER NUMBER 4999 5200 10200 CE120B 32-Pin CDIP PROCESS PACKAGE TYPE DATE CODE 9031 9031 9031 YRS) 0/77 0/77 0/77 0/231 (210 YRS) 0/77 0/77 0/77 0/231 1000 (420 YRS) 0/77 0/77 0/77 0/231
TOTAL DEVICE HOURS 231,000
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010LS (CERDIP) (cont.) HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 32-Pin CDIP DATE CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) 9005 9250 0/105 0/77 0/182 0/105 0/77 0/182 1/105(A) 0/77 1/182 0/77 0/77 1000 (4,084 YRS)
90-200-1B 89-5121-AA
92-228-2B NA24900404 120DLM TOTAL DEVICE HOURS 129,500 NUMBER PROJECT NUMBER 90-200-1B
READOUT Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 160,040 years derated 55°C.
HIGH TEMPERATURE STORAGE LIFE (250
PROJECT NUMBER NUMBER 4999 5200 10200 CE120B PROCESS PACKAGE TYPE 32-Pin CDIP DATE CODE 9031 9031 9031 (298,270 YRS) 0/77 0/77 0/77 0/231 (695,970 YRS) 0/77 0/77 0/77 0/231
TOTAL DEVICE HOURS 38,808
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-200-1C 92-228-2C NUMBER 89-5121-AA NA24900404 4999 5200 10200 PROCESS CE120B CE120DLM CE120B CE120B CE120B 32-Pin CDIP PACKAGE TYPE DATE CODE 9005 9250 9031 9031 9031 CYCLES 0/78 0/78 0/77 0/77 0/77 0/387 CYCLES 0/78 0/78 0/77 0/77 0/77 0/387 1000 CYCLES 0/78 0/78 0/77 0/77 0/77 0/387
5-10
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010LS (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-203-1A 91-203-2A 91-203-3A 91-203-4A 92-228-1A NUMBER 90-4701-AA-3 90-4701-AA-3 90-4701-AA-2 90-4701-AA NA24900403 PROCESS 120B 120B 120B 120B 120DLM 32-Pin PLCC PACKAGE TYPE DATE CODE 9102 9102 9102 9102 9250 YRS) 0/76 0/76 0/76 0/77 0/77 0/382 (210 YRS) 0/76 0/76 0/76 0/77 0/77 0/382 1000 (420 YRS) 0/76 0/76 0/76 0/77 0/77 0/382
TOTAL DEVICE HOURS 382,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-203-1B 91-203-2B 91-203-3B 91-203-4B 92-228-1B NUMBER 90-4701-AA-3 90-4701-AA-3 90-4701-AA-2 90-4701-AA PROCESS 120B 120B 120B 120B 32-Pin PLCC PACKAGE TYPE DATE CODE 9102 9102 9102 9102 9250 (122 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 TOTAL DEVICE HOURS 385,000 (286 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 (850 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 1000 (1,700 YRS) 0/77 0/77 0/77 0/77 0/77 0/385
NA24900403 120DLM
5-11
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C010LS (PLCC) (Cont.) TEMPERATURE CYCLE (AIR AIR) (-65
PROJECT NUMBER 91-203-1C 91-203-2C 91-203-3C 91-203-4C 92-228-1C NUMBER 90-4701-AA-3 90-4701-AA-3 90-4701-AA-2 90-4701-AA NA24900403 PROCESS 120B 120B 120B 120B 120DLM 32-Pin PLCC PACKAGE TYPE DATE CODE 9102 9102 9102 9102 9250 CYCLES 0/52 0/78 0/78 0/52 0/78 0/338 CYCLES 0/52 0/78 0/78 0/52 0/78 0/338 1000 CYCLES 0/52 0/78 0/78 0/52 0/78 0/338
PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 91-203-1D 91-203-2D 91-203-3D 91-203-4D 92-228-1D NUMBER 90-4701-AA-3 90-4701-AA-3 90-4701-AA-2 90-4701-AA NA24900403 PROCESS 120B 120B 120B 120B 120DLM 32-Pin PLCC PACKAGE TYPE DATE CODE 9102 9102 9102 9102 9250 HOURS 0/52 0/52 0/52 0/21 0/52 0/229 HOURS 0/52 0/52 0/52 0/21 0/52 0/229 HOURS 0/52 0/52 0/52 0/21 0/52 0/229
TOTAL DEVICE HOURS 54,960
5-12
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C210L (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 90-301-1A NUMBER 89-4913-AB PROCESS MA123 PACKAGE TYPE 40-Pin CDIP DATE CODE 9016 (196 YRS) 0/104 (686 YRS) 0/104 (2,042 YRS) 0/104 1000 (4,084 YRS) 2/104(A)(B)
TOTAL DEVICE HOURS 104,000 NUMBER PROJECT NUMBER 90-301-1A 90-301-1A READOUT 1000 Hours 1000 Hours QUANTITY MODE MECHANISM CAUSE COMMENTS
SBCL* Trap Assistant Intrinsic Charge Loss Technical Report Line Short Defect Short
*According =1.32 (per technical report),
1000 @150°C bake equivalent 4084 years derated 55°C.
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-301-1B NUMBER 89-4913-AB PROCESS MA123 PACKAGE TYPE 40-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9016 0/105 0/105 3/105(A) 1/102(B)
TOTAL DEVICE HOURS 103,500 NUMBER PROJECT NUMBER 90-301-1B 90-301-1B READOUT Hours 1000 Hours QUANTITY MODE MECHANISM CAUSE COMMENTS
SBCL*
Trap Assistant
Intrinsic Charge Loss
Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 160,040 years derated 55°C.
WS27C210L (PLCC)
HIGH TEMPERATURE STORAGE LIFE (150
PROJECT NUMBER 90-204-1E NUMBER 90-1302-AA PROCESS MA123 PACKAGE TYPE 44-Pin PLCC DATE CODE 9016 (294 YRS) 0/105 (686 YRS) 0/105
TOTAL DEVICE HOURS 17,640
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 89-215-1C 90-202-1D NUMBER 89-3410-AB 89-4976-AA PROCESS MA123 PACKAGE TYPE 44-Pin PLCC DATE CODE 8935 9005 CYCLES 0/50 0/78 0/128 CYCLES 0/50 0/78 0/128 1000 CYCLES 0/50 0/78 0/128
5-13
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C210LS (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-218-1A NUMBER NA21206201 PROCESS CE120B PACKAGE TYPE 44-Pin CLDCC DATE CODE 9224 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS CE120B PACKAGE TYPE 44-Pin CLDCC DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9224 0/77 0/77 0/77 0/77
92-218-1B NA21206201
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-218-1C NUMBER NA21206201 PROCESS CE120B PACKAGE TYPE 44-Pin CLDCC DATE CODE 9224 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
5-14
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS27C210LS (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-215-1A NUMBER 91-2601-AA PROCESS 120B PACKAGE TYPE 44-Pin PLCC DATE CODE 9128 YRS) 0/52 (210 YRS) 0/52 1000 (420 YRS) 0/52
TOTAL DEVICE HOURS 52,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-215-1B NUMBER 91-2601-AA PROCESS 120B PACKAGE TYPE 44-Pin PLCC DATE CODE 9128 (122 YRS) 0/52 (286 YRS) 0/52 (850 YRS) 0/52 1000 (1700 YRS) 0/52
TOTAL DEVICE HOURS 52,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-215-1C NUMBER 91-2601-AA PROCESS 120B PACKAGE TYPE 44-Pin PLCC DATE CODE 9128 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121 °C/15 PSI)
PROJECT
NUMBER 91-215-1D NUMBER 91-2601-AA PROCESS 120B PACKAGE TYPE 44-Pin PLCC DATE CODE 9128
HOURS
0/52
TOTAL DEVICE HOURS 4,992
5-15
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C43B (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-308-2A NUMBER 89-2205-AA PROCESS MB122 PACKAGE TYPE 24-Pin CDIP 24-Pin CDIP 24-Pin CDIP DATE CODE 8929 (196 YRS) 0/104 (686 YRS) 0/104 (2,042 YRS) 0/104 1000 (4,084 YRS) 0/104
89-312-2A
89-4033-AB
MB122
8946
0/105
0/105
0/105
0/105
90-301-2A
89-4988-AB
MB122
9007
0/103 0/312
0/103 0/312
0/103 0/312
0/103 0/312
TOTAL DEVICE HOURS 312,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-301-2B NUMBER 89-4988-AB PROCESS MB122 PACKAGE TYPE 24-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9007 0/105 0/105 1/105(A) 1/104(B)
TOTAL DEVICE HOURS 104,500
NUMBER
PROJECT NUMBER 90-301-2B 90-301-2B
READOUT Hours 1000 Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 160,040 years derated 55°C.
5-16
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C43C (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-304-1A NUMBER NA22600618 PROCESS 120B PACKAGE TYPE 24-Pin CDIP 24-Pin CDIP DATE CODE 9229 (686 YRS) 0/76 (2,042 YRS) 0/76 1000 (4,084 YRS) 0/76
96-301-1A
N546013006
120B
9604
0/77 0/153
0/77 0/153
0/77 0/153
TOTAL DEVICE HOURS 153,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 24-Pin CDIP 24-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9136 0/77 0/77 0/77 0/77
92-304-1B NA22600618
96-301-1B N546013006
120B
9604
0/77 0/154
0/77 0/154
0/77 0/154
0/77 0/154
TOTAL DEVICE HOURS 154,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-304-1C 96-301-1C NUMBER NA22600618 N546013006 PROCESS 120B 120B PACKAGE TYPE 24-Pin CDIP 24-Pin CDIP DATE CODE 9136 9604 CYCLES 0/78 0/78 0/156 CYCLES 0/78 0/78 0/156 1000 CYCLES 0/78 0/78 0/156
5-17
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C43C (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 92-307-1A NUMBER NA22800822 PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9238 YRS) 1/75(A) (210 YRS) 0/74 1000 (420 YRS) 0/74
TOTAL DEVICE HOURS 74,168
NUMBER
PROJECT NUMBER 92-307-1A
READOUT
QUANTITY
MODE
MECHANISM Oxide Breakdown
CAUSE
COMMENTS
Hours
Short
Oxide Defect
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9238 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1700 YRS) 0/77
92-307-1B NA22800822
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-307-1C NUMBER NA22800822 PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9238 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 92-307-1D NUMBER NA22800822 PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9238 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
TEMPERATURE HUMIDITY BIAS (85°C R.H. /5.25V)
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9238 HOURS 0/52 HOURS 0/52 HOURS 0/52 1000 HOURS 0/52
92-307-1F NA22800822
TOTAL DEVICE HOURS 52,000
5-18
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C45 (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-214-1A 91-214-2A NUMBER 91-1717-BA 91-1722-AA PROCESS MB122 PACKAGE TYPE 24-Pin PDIP DATE CODE 9124 9122 YRS) 0/77 0/77 0/154 (210 YRS) 0/77 0/77 0/154 1000 (420 YRS) 0/77 0/77 0/154
TOTAL DEVICE HOURS 154,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-214-1B NUMBER 91-1717-BA PROCESS MB122 PACKAGE TYPE 24-Pin PDIP DATE CODE 9124 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-214-1C 91-214-2C NUMBER 91-1717-BA 91-1717-BA PROCESS MB122 PACKAGE TYPE 24-Pin PDIP DATE CODE 9124 9122 CYCLES 0/78 0/78 0/156 CYCLES 0/78 0/78 0/156 1000 CYCLES 0/78 0/78 0/156
PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 91-214-1D 91-214-2D NUMBER 91-1717-BA 91-1717-BA PROCESS MB122 PACKAGE TYPE 24-Pin PDIP DATE CODE 9124 9122 HOURS 0/52 0/52 0/104 HOURS 0/52 0/52 0/104 HOURS 0/52 0/52 0/104
TOTAL DEVICE HOURS 24,960
5-19
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49B (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-301-2A NUMBER 88-3223-AA PROCESS MB122 PACKAGE TYPE 24-Pin CDIP 24-Pin CDIP DATE CODE 8842 (196 YRS) 0/105 (686 YRS) 0/105 (2,042 YRS) 0/105 1000 (4,084 YRS) 0/105
89-311-2A
89-4414-AA
MB122
8951
0/102 0/207
0/102 0/207
1/102(A) 1/207
0/101 0/206
TOTAL DEVICE HOURS 206,500 NUMBER PROJECT NUMBER 89-311-2A READOUT Hours QUANTITY MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@150°C bake equivalent years derated 55°C.
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-239-1A 90-242-1A 90-243-1A NUMBER 90-2911-E2 90-2911-E5 90-2911-E6 MB122 24-Pin CDIP 9043 PROCESS PACKAGE TYPE DATE CODE (686 YRS) 0/52 0/53 0/53 0/158 (2,042 YRS) 0/52 0/53 0/53 0/158 1000 (4,084 YRS) 0/52 0/53 0/53 0/158
TOTAL DEVICE HOURS 158,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-238-1B 90-240-1B 90-241-1B 90-242-1B 90-243-1B NUMBER 90-2911-E1 90-2911-E3 90-2911-E4 90-2911-E5 90-2911-E6 MB122 24-Pin CDIP 9043 PROCESS PACKAGE TYPE DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 0/52 0/52 0/53 0/53 0/53 0/263 0/52 0/52 0/53 0/53 0/53 0/263 0/52 0/52 0/53 0/53 0/53 0/263 0/52 1/52(A) 1/53(B) 0/53 0/53 2/263
TOTAL DEVICE HOURS 263,000 NUMBER PROJECT NUMBER 90-240-1B 90-241-1B
READOUT 1000 Hours 1000 Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 476,310 years derated 55°C.
5-20
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49B (CERDIP) (Cont.)
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-238-1C 90-239-1C 90-241-1C 90-242-1C 90-243-1C NUMBER 90-2911-E1 90-2911-E2 90-2911-E4 90-2911-E5 90-2911-E6 MB122 24-Pin CDIP 9043 PROCESS PACKAGE TYPE DATE CODE CYCLES 0/52 0/52 0/52 0/52 0/52 0/260 CYCLES 0/52 0/52 0/52 0/52 0/52 0/260 1000 CYCLES 0/52 0/52 1/52(A) 0/52 0/52 1/260
NUMBER
PROJECT NUMBER 90-241-1C
READOUT
QUANTITY
MODE
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
1000 Cycles
SBCL
5-21
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49C (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 91-224-1A 92-216-1A 96-207-1A NUMBER 91-3306-AA NA21802502 S611017008 PROCESS 120B 120B MA123 PACKAGE TYPE 24-Pin CDIP DATE CODE 9136 9220 9630 (686 YRS) 0/77 0/77 0/77 0/231 (2,042 YRS) 0/77 0/77 0/77 0/231 1000 (4,084 YRS) 0/77 0/77 0/77 0/231
TOTAL DEVICE HOURS 231,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 91-224-1B 92-216-1B 96-207-1B NUMBER 91-3306-AA NA21802502 S611017008 PROCESS 120B 120B MA1234 PACKAGE TYPE 24-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9136 9220 9630 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231
TOTAL DEVICE HOURS 231,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-224-1C 92-216-1C 96-207-1C NUMBER 91-3306-AA NA21802502 S611017008 PROCESS 120B 120B MA123 PACKAGE TYPE 24-Pin CDIP DATE CODE 9136 9220 9630 CYCLES 0/78 0/78 0/78 0/234 CYCLES 0/78 0/78 0/78 0/234 1000 CYCLES 0/78 0/78 0/78 0/234
5-22
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49C (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-303-1A 93-303-2A 93-303-3A NUMBER N333005-A N333005-B N333005-C PROCESS 120B 120B 120B 24-Pin PDIP PACKAGE TYPE DATE CODE 9346 9346 9346 YRS) 0/105 0/105 0/105 0/315 TOTAL DEVICE HOURS 315,000 (210 YRS) 0/105 0/105 0/105 0/315 1000 (420 YRS) 0/105 0/105 0/105 0/315
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 93-303-2B 93-303-3B NUMBER N333005-B N333005-C PROCESS 120B 120B PACKAGE TYPE 24-Pin PDIP DATE CODE 9346 9346 (122 YRS) 0/77 0/77 0/154 (286 YRS) 0/77 0/77 0/154 (850 YRS) 0/77 0/77 0/154 1000 (1700 YRS) 0/77 0/77 0/154
TOTAL DEVICE HOURS 154,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-303-1C 93-303-2C 93-303-3C NUMBER N333005-A N333005-B N333005-C PROCESS 120B 120B 120B 24-Pin PDIP PACKAGE TYPE DATE CODE 9346 9346 9346 CYCLES 0/78 0/78 0/78 0/234 CYCLES 0/78 0/78 0/78 0/234 1000 CYCLES 0/78 0/78 0/78 0/234
THERMAL SHOCK (OIL OIL) (-65 +150
PROJECT NUMBER 93-303-1C* 93-303-2C* 93-303-3C* NUMBER N333005-A N333005-B N333005-C ROCESS 120B 120B 120B 24-Pin PDIP PACKAGE TYPE DATE CODE 9346 9346 9346 CYCLES 0/78 0/78 0/78 0/234
5-23
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49C (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 92-219-1A 92-306-1A 92-309-1A 92-309-2A 96-207-2A NUMBER NA21802504 NA22800807 NA24100804 NA24100805 S611017009 PROCESS 120B 120B 120B 120B MA123 28-Pin PLCC PACKAGE TYPE DATE CODE 9225 9236 9245 9245 9632 YRS) 0/77 0/75 0/77 0/77 0/77 0/383 (210 YRS) 0/77 0/75 0/77 0/77 0/77 0/383 0/77 0/77 0/306 1000 (420 YRS) 0/77 0/75
TOTAL DEVICE HOURS 344,500
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER 92-219-1B 92-306-1B 92-309-1B 92-309-2B 96-207-2B NUMBER NA21802504 NA22800807 NA24100804 NA24100805 S611017009 PROCESS 120B 120B 120B 120B MA123 28-Pin PLCC PACKAGE TYPE DATE CODE 9225 9236 9245 9245 9632 (122 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 (286 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 (850 YRS) 0/77 0/77 0/77 0/77 0/77 0/385 1000 (1,700 YRS) 0/77 0/77 0/77 0/77 0/77 0/385
TOTAL DEVICE HOURS 385,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-219-1C 92-306-1C 92-309-1C 92-309-2C 96-207-2C NUMBER NA21802504 NA22800807 NA24100804 NA24100805 S611017009 PROCESS 120B 120B 120B 120B MA123 28-Pin PLCC PACKAGE TYPE DATE CODE 9225 9236 9245 9245 9632 CYCLES 0/78 0/78 0/78 0/78 0/78 0/390 CYCLES 0/78 0/78 0/78 0/78 0/78 0/390 1000 CYCLES 0/78 0/78 0/78 0/78 0/78 0/390 0/78 0/78 0/78 0/234 2000 CYCLES
5-24
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C49C (PLCC) (Cont.) PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 92-219-1D 92-306-1D 92-309-1D 92-309-2D 96-207-2D NUMBER NA21802504 NA22800807 NA24100804 NA24100805 S611017009 PROCESS 120B 120B 120B 120B MA123 28-Pin PLCC PACKAGE TYPE DATE CODE 9225 9236 9245 9245 9632 HOURS 0/52 0/52 0/52 0/52 0/52 0/260 HOURS 0/52 0/52 0/52 0/52 0/52 0/260 HOURS 0/52 0/52 0/52 0/52 0/52 0/260
TOTAL DEVICE HOURS 62,400
TEMPERATURE HUMIDITY BIAS R.H. /5.25V)
PROJECT NUMBER 92-306-1F NUMBER NA22800807 PROCESS 120B PACKAGE TYPE 28-Pin PLCC DATE CODE 9236 HOURS 0/78 HOURS 0/78 HOURS 0/78 1000 HOURS 0/78
TOTAL DEVICE HOURS 78,000
5-25
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C51B (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-232-1A 90-233-1A 90-234-1A 90-235-1A 90-237-1A NUMBER 90-3017-E7 90-3017-E8 90-3017-E9 90-3017-E10 90-3017-E12 MB122 28-Pin CDIP PROCESS PACKAGE TYPE DATE CODE 9043 9043 9043 9042 9042 (686 YRS) 0/52 0/52 0/52 0/53 0/53 0/262 (2,042 YRS) 0/52 0/52 0/52 0/53 0/53 0/262 1000 (4,084 YRS) 0/52 0/52 0/52 0/53 0/53 0/262
TOTAL DEVICE HOURS 262,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-233-1B 90-237-1B NUMBER 90-3017-E8 90-3017-E12 MB122 PROCESS PACKAGE DATE 1000 TYPE CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 28-Pin CDIP 9043 9042 0/52 0/53 0/105 TOTAL DEVICE HOURS 104,500 0/52 0/53 0/105 1/52(A) 0/53 1/105 0/51 2/53(B) 2/104
NUMBER
PROJECT NUMBER 90-233-1B 90-237-1B
READOUT Hours 1000 Hours
QUANTITY
MODE
MECHANISM
CAUSE
COMMENTS
SBCL
Trap Assistant
Intrinsic Charge Loss
Technical Report
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-232-1C 90-233-1C 90-234-1C 90-235-1C 90-236-1C 90-237-1C NUMBER 90-3017-E7 90-3017-E8 90-3017-E9 90-3017-E10 90-3017-E11 90-3017-E12 MB122 28-Pin CDIP PROCESS PACKAGE TYPE DATE CODE 9043 9043 9043 9042 9042 9042 CYCLES 0/52 0/52 0/52 0/52 0/52 0/52 0/312 CYCLES 0/52 0/52 0/52 0/52 0/52 0/52 0/312 1000 CYCLES 0/52 0/52 0/52 0/52 0/52 0/52 0/312
5-26
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C51C (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-224-1A 93-213-2A 93-214-1A 93-214-2A 94-203-1A NUMBER 90-2704-AA N321005002 S313009005 S313009007 S315005001 PROCESS MA123 120B MA123 MA123 MA123 28-Pin CDIP PACKAGE TYPE 28-Pin CDIP DATE CODE 9028 9322 9318 9318 9404 (196 YRS) 0/105 0/77 0/64 0/77 0/77 0/400 TOTAL DEVICE HOURS 400,000 (686 YRS) 0/105 0/77 0/64 0/77 0/77 0/400 (2,042 YRS) 0/105 0/77 0/64 0/77 0/77 0/400 1000 (4,084 YRS) 0/105 0/77 0/64 0/77 0/77 0/400
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-224-1B NUMBER 90-2704-AA PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9028 1/105(B) 0/104 0/104 0/104
93-213-2B N321005002 93-214-1B S313009005 93-214-2B S313009007 94-203-1B S315005001
120B MA123 MA123 MA123 28-Pin CDIP
9322 9318 9318 9404
0/77 0/77 0/77 0/77 1/413
0/77 0/77 0/77 1/77(C) 1/412
0/77 0/77 1/77(A) 0/76 1/411
0/77 0/77 0/76 0/76 0/410
TOTAL DEVICE HOURS 410,740 NUMBER PROJECT NUMBER 93-214-2B 90-224-1B 94-203-1B
READOUT Hours Hours Hours
QUANTITY
MODE SBCL* SBCL* SBCL*
MECHANISM
CAUSE
COMMENTS
Trap Assistant
Intrinsic Charge Loss
Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 68,590 years derated 55°C.
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-224-1C NUMBER 90-2704-AA PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 9028 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
93-214-1C 93-214-2C 94-203-1C
S313009005 S313009007 S315005001
MA123 MA123 MA123 28-Pin CDIP
9318 9318 9404
0/78 0/78 0/78 0/312
0/78 0/78 0/78 0/312
0/78 0/78 0/78 0/312
5-27
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C51C (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-213-1A NUMBER N321005001 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9326 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9326 (122 YRS) 0/77 (266 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
93-213-1B N321005001
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-213-1C NUMBER N321005001 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9326 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 93-213-1D NUMBER N321005001 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9326 HOURS 0/51 HOURS 0/51 HOURS 0/51
TOTAL DEVICE HOURS 12,240
5-28
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C51C (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-206-1A NUMBER 90-3507-AB PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-206-1B NUMBER 90-3507-AB PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-206-1C NUMBER 90-3507-AB PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 91-206-1D NUMBER 90-3507-AB PROCESS MA123 PACKAGE TYPE 32-Pin PLCC DATE CODE 9120 HOURS 0/52 HOURS 0/52 HOURS 1/52(A)
TOTAL DEVICE HOURS 12,480
NUMBER
PROJECT NUMBER 91-206-1D
READOUT
QUANTITY
MODE
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
Hours
SBCL
5-29
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C71C (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-218-1A 91-221-1A 91-228-2A 92-227-1A 93-300-1A NUMBER 90-2219-AF 90-4912-AB 90-5122-BC NA23701002 NA30201102 PROCESS MA123 MA123 MA123 120B 120B 28-Pin CDIP PACKAGE TYPE 28-Pin CDIP DATE CODE 9027 9128 9141 9239 9308 (686 YRS) 0/105 0/77 0/77 0/75 0/77 0/411 TOTAL DEVICE HOURS 182,000 (2,042 YRS) 0/105 0/77 0/77 0/75 0/77 0/411 1000 (4,084 YRS) 1/105(A) 0/77 0/77 0/75 0/77 1/411
NUMBER
PROJECT NUMBER 90-218-1A
READOUT 1000 Hours
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 91-228-2B NUMBER 90-5122-BC PROCESS MA123 120B 120B 28-Pin CDIP PACKAGE TYPE DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9141 9239 9308 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231 0/77 0/77 0/77 0/231
92-227-1B NA23701002 93-300-1B NA30201102
TOTAL DEVICE HOURS 231,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-218-1C NUMBER 90-2219-AF PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 9027 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
91-221-1C 91-228-2C 92-227-1C 93-300-1C
90-4912-AB 90-5122-BC NA23701002 NA30201102
MA123 MA123 120B 120B 28-Pin CDIP
9128 9141 9239 9308
0/78 0/78 0/78 0/78 0/390
0/78 0/78 0/78 0/78 0/390
0/78 0/78 0/78 0/78 0/390
5-30
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C71C (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-209-1A 92-220-1A NUMBER 91-0330-AA NA22800902 PROCESS MA123 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9117 9230 YRS) 0/72 0/77 0/149 TOTAL DEVICE HOURS 149,000 (210 YRS) 0/72 0/77 0/149 1000 (420 YRS) 0/72 0/77 0/149
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-209-1B 92-220-1B NUMBER 91-0330-AA NA22800902 PROCESS MA123 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9117 9230 (122 YRS) 0/77 0/77 0/154 TOTAL DEVICE HOURS 115,500 (286 YRS) 0/77 0/77 0/154 (850 YRS) 0/77 0/77 0/154 0/77 0/77 1000 (1700 YRS)
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-209-1C 92-220-1C NUMBER 91-0330-AA NA22800902 PROCESS MA123 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9117 9230 CYCLES 0/78 0/78 0/156 CYCLES 0/78 0/78 0/156 1000 CYCLES 1/78(A) 0/78 1/156
NUMBER
PROJECT NUMBER 91-209-1C
READOUT 1000 Cycles
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
PRESSURE (121 °C/15 PSI)
PROJECT NUMBER 91-209-1D 92-220-1D NUMBER 91-0330-AA NA22800902 PROCESS MA123 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9117 9230 HOURS 0/52 0/52 0/104 HOURS 0/52 0/52 0/104 HOURS 0/52 1/52(A) 1/104
TOTAL DEVICE HOURS 24,960
NUMBER
PROJECT NUMBER 92-220-1D
READOUT Hours
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
5-31
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C291B (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-309-2A NUMBER 89-3307-AA PROCESS MB122 PACKAGE TYPE 24-Pin CDIP DATE CODE 8935 (196 YRS) 0/98 (686 YRS) 0/98 (2,042 YRS) 0/98 1000 (4,084 YRS) 0/98
TOTAL DEVICE HOURS 98,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 89-309-2B 90-302-2B NUMBER 89-3307-AA 89-5017-AA PROCESS MB122 PACKAGE TYPE 24-Pin CDIP DATE CODE 8935 9006 (22,860 YRS) (68,590 YRS) (160,040 YRS) (476,310 YRS) 0/105 0/103 0/208 0/105 0/103 0/208 1/105(A) 0/103 1/208 0/104 0/103 0/207
TOTAL DEVICE HOURS 103,668
NUMBER
PROJECT NUMBER 89-309-2B
READOUT Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 68,590 years derated 55°C.
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-302-2A NUMBER 89-5107-AA PROCESS MB122 PACKAGE TYPE 24-Pin CDIP DATE CODE 9006 (686 YRS) 0/105 (2,042 YRS) 0/105 1000 (4,084 YRS) 0/105
TOTAL DEVICE HOURS 105,000
5-32
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C291C (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-224-1A 96-205-2A NUMBER NA23401511 S611017002 PROCESS 120B MA123 PACKAGE TYPE 24-Pin CDIP DATE CODE 9237 9626 (686 YRS) 0/75 0/77 0/152 (2,042 YRS) 0/75 0/77 0/152 1000 (4,084 YRS) 0/75 0/77 0/152
TOTAL DEVICE HOURS 152,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS 120B MA123 PACKAGE TYPE 24-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9237 9626 0/77 0/77 0/154 0/77 0/77 0/154 0/77 0/77 0/154 0/77 0/77 0/154
92-224-1B NA23401511 96-205-2B S611017002
TOTAL DEVICE HOURS 154,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-224-1C 96-205-2C NUMBER NA23401511 S611017002 PROCESS 120B MA123 PACKAGE TYPE 24-Pin CDIP DATE CODE 9237 9626 CYCLES 0/78 0/78 0/156 CYCLES 0/78 0/78 0/156 1000 CYCLES 0/78 0/78 0/156
5-33
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C291C (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-202-1A 95-300-1A 96-205-1A NUMBER NA23401525 N438006003 S611017003 PROCESS 120B 120B MA123 24-Pin PDIP PACKAGE TYPE DATE CODE 9245 9441 9632 YRS) 0/77 0/77 0/77 0/231 (210 YRS) 0/77 0/77 0/77 0/231 1000 (420 YRS) 0/77 0/77 0/77 0/231
TOTAL DEVICE HOURS 231,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120B 120B MA123 24-Pin PDIP PACKAGE TYPE DATE CODE 9245 9441 9632 (122 YRS) 0/77 0/77 0/77 0/231 TOTAL DEVICE HOURS 231,000 (286 YRS) 0/77 0/77 0/77 0/231 (850 YRS) 0/77 0/77 0/77 0/231 1000 (1,700 YRS) 0/77 0/77 0/77 0/231
93-202-1B NA23401525 95-300-1B N438006003 96-205-1B S611017003
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-202-1C 95-300-1C 96-205-1C NUMBER NA23401525 N438006003 S611017003 PROCESS 120B 120B MA123 PACKAGE TYPE 24-Pin PDIP DATE CODE 9245 9441 9632 CYCLES 0/78 0/78 0/78 0/231 CYCLES 0/78 0/78 0/78 0/231 1000 CYCLES 0/78 0/78 0/78 0/231
PRESSURE (121°C/15 PSI)
PROJECT NUMBER 93-202-1D 95-300-1D 96-205-1D NUMBER NA23401525 N438006003 S611017003 PROCESS 120B 120B MA123 PACKAGE TYPE 24-Pin PDIP DATE CODE 9245 9441 9632 HOURS 0/52 0/52 0/52 0/156 HOURS 0/52 0/52 0/52 0/156 HOURS 0/52 0/52 0/52 0/156
TOTAL DEVICE HOURS 37,440
5-34
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C257 (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-225-1A 90-226-1A NUMBER 90-4996-AC 90-4996-AA PROCESS MB122 PACKAGE TYPE 40-Pin CDIP DATE CODE 9032 (686 YRS) 0/105 0/105 0/210 (2,042 YRS) 0/105 0/105 0/210 1000 (4,084 YRS) 1/105(A) 0/105 1/210
TOTAL DEVICE HOURS 210,000
NUMBER
PROJECT NUMBER 90-225-1A
READOUT 1000 Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report), @150°C bake equivalent years derated 55°C.
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-226-1B NUMBER 90-4996-AA PROCESS MB122 PACKAGE TYPE 40-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9032 1/105(A) 0/104 0/104 2/104(B)
TOTAL DEVICE HOURS 104,072
NUMBER
PROJECT NUMBER 90-226-1 90-226-1
READOUT Hours 1000 Hours
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-225-1C 90-226-1C 90-227-1C NUMBER 90-4996-AC 90-4996-AA 90-4996-AB MB122 40-Pin CDIP PROCESS PACKAGE TYPE DATE CODE 9032 9032 9035 CYCLES 0/96 0/105 0/105 0/306 CYCLES 0/96 0/105 0/105 0/306 1000 CYCLES 0/96 0/105 0/105 0/306
5-35
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C64F (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-221-1A NUMBER 90-2253-AC PROCESS MA122 PACKAGE TYPE 28-Pin CDIP DATE CODE 9028 (686 YRS) 0/105 (2,042 YRS) 0/105 1000 (4,084 YRS) 0/105
TOTAL DEVICE HOURS 105,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-222-1B NUMBER 90-2253-AA PROCESS MA122 PACKAGE TYPE 28-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9028 0/105 0/105 0/105 1/105(A)
TOTAL DEVICE HOURS 105,000
NUMBER
PROJECT NUMBER 90-222-1B
READOUT
QUANTITY
MODE
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
1000 Hours
SBCL*
*According =1.32 (per technical report),
@225°C bake equivalent 476,310 years derated 55°C.
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-221-1C 90-223-1C NUMBER 90-2253-AC 90-2253-AB PROCESS MA122 PACKAGE TYPE 28-Pin CDIP DATE CODE 9028 CYCLES 0/105 0/84 0/189 CYCLES 0/105 0/84 0/189 1000 CYCLES 1/105(A) 0/84 1/189
NUMBER
PROJECT NUMBER 90-221-1C
READOUT 1000 Cycles
QUANTITY
MODE SBCL
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
5-36
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C128FB (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-209-1A NUMBER RW211005 PROCESS MA123 PACKAGE TYPE 28-Pin CDIP DATE CODE 9212 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
WS57C256F (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-221-1A NUMBER NA22501202 PROCESS 120B PACKAGE TYPE 28-Pin CDIP DATE CODE 9230 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 28-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9230 0/77 0/77 0/77 0/77
92-221-1B NA22501202
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-221-1C NUMBER NA22501202 PROCESS 120B PACKAGE TYPE 28-Pin CDIP DATE CODE 9230 CYCLES 0/76 CYCLES 0/76 1000 CYCLES 0/76
5-37
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C256F (CLCC)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 91-231-1A NUMBER 90-5122-BA PROCESS MA123 PACKAGE TYPE 32-Pin CLCC DATE CODE 9143 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (225°C)
PROJECT NUMBER 91-231-1B NUMBER 90-5122-BA PROCESS MA123 PACKAGE TYPE 32-Pin CLCC DATE CODE 9143 (22,860 YRS) 0/77 (68,590 YRS) 0/77
TOTAL DEVICE HOURS 5,544
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-231-1C NUMBER 90-5122-BA PROCESS MA123 PACKAGE TYPE 32-Pin CLCC DATE CODE 9143 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
5-38
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C256F (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-206-1A NUMBER NA30704802 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9313 YRS) 0/76 (210 YRS) 0/76 1000 (420 YRS) 0/76
TOTAL DEVICE HOURS 76,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9313 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
93-206-1B NA30704802
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-206-1C NUMBER NA30704802 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9313 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSI)
PROJECT NUMBER 93-206-1D NUMBER NA30704802 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9313 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
TEMPERATURE HUMIDITY BIAS R.H. /5.25V)
PROJECT NUMBER 93-206-1F NUMBER NA30704802 PROCESS 120B PACKAGE TYPE 28-Pin PDIP DATE CODE 9313 HOURS 0/78 HOURS 0/78 HOURS 0/78 1000 HOURS 0/78
TOTAL DEVICE HOURS 52,000
5-39
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C256F (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-301-1A NUMBER NA30200812 PROCESS 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9306 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9306 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
93-301-1B NA30200812
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-301-1C NUMBER NA30200812 PROCESS 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9306 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 93-301-1D NUMBER NA30200812 PROCESS 120B PACKAGE TYPE 32-Pin PLCC DATE CODE 9306 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
5-40
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C010F (CERDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 94-204-1A 94-204-4A NUMBER N407040005 N407041006 PROCESS CE080DLM CE080DLM PACKAGE TYPE 32-Pin CDIP DATE CODE 9417 9424 (686 YRS) 0/77 0/76 0/153 (2,042 YRS) 0/77 0/76 0/153 1000 (4,084 YRS) 0/77 0/76 0/153
TOTAL DEVICE HOURS 153,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER NUMBER PROCESS PACKAGE TYPE 32-Pin CDIP DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9417 9424 0/77 0/77 0/154 0/77 0/77 0/154 0/77 0/77 0/154 0/77 0/77 0/154
94-204-1B N407040005 CE080DLM 94-204-4B N407041006 CE080DLM TOTAL DEVICE HOURS 154,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 94-204-1C 94-204-4C NUMBER N407040005 N407041006 PROCESS CE080DLM CE080DLM PACKAGE TYPE 32-Pin CDIP DATE CODE 9417 9424 CYCLES 0/77 0/78 0/155 CYCLES 0/77 0/78 0/155 1000 CYCLES 0/77 0/78 0/155
5-41
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C010F (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 94-204-2A 94-204-3A NUMBER N407040004 N407041004 PROCESS CE080DLM CE080DLM PACKAGE TYPE 32-Pin PLCC DATE CODE 9418 9424 YRS) 0/76 0/75 0/151 (210 YRS) 0/76 0/75 0/151 1000 (420 YRS) 0/76 0/75 0/151
TOTAL DEVICE HOURS 151,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS PACKAGE TYPE 32-Pin PLCC DATE CODE 9418 9424 (122 YRS) 0/77 0/77 0/154 (286 YRS) 0/77 0/77 0/154 (850 YRS) 0/77 0/77 0/154 1000 (1,700 YRS) 0/77 0/77 0/154
94-204-2B N407040004 CE080DLM 94-204-3B N407041004 CE080DLM TOTAL DEVICE HOURS 154,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 94-204-2C 94-204-3C NUMBER N407040004 N407041004 PROCESS CE080DLM CE080DLM PACKAGE TYPE 32-Pin PLCC DATE CODE 9418 9424 CYCLES 0/78 0/78 0/156 CYCLES 0/78 0/78 0/156 1000 CYCLES 0/78 0/78 0/156
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 94-204-2D 94-204-3D NUMBER N407040004 N407041004 PROCESS CE080DLM CE080DLM PACKAGE TYPE 32-Pin PLCC DATE CODE 9418 9424 HOURS 0/51 0/52 0/103 HOURS 0/51 0/52 0/103 HOURS 0/51 0/52 0/103
TOTAL DEVICE HOURS 24,720
5-42
Reliability Summary 1997
PROM/RPROM/EPROM Reliability Data (Cont.)
WS57C010F (TSOP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 95-304-1A NUMBER N451007012 PROCESS CE080DLM PACKAGE TYPE 32-Pin TSOP DATE CODE 9517 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 95-304-1C NUMBER N451007012 PROCESS CE080DLM PACKAGE TYPE 32-Pin TSOP DATE CODE 9517 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 95-304-1D NUMBER N451007012 PROCESS CE080DLM PACKAGE TYPE 32-Pin TSOP DATE CODE 9517 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
5-43
PSD/System Logic Reliability Data
SAM448 (PDIP)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 89-217-1A NUMBER 89-0611-AC PROCESS MB122 PACKAGE TYPE 28-Pin PDIP DATE CODE 8927 (686 YRS) 0/105 (2,042 YRS) 0/105 1000 (4,084 YRS) 0/105
TOTAL DEVICE HOURS 105,000
PAC1000A (CPGA)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.5V)
PROJECT NUMBER 90-206-1A 90-217-1A 91-201-1A 91-212-1A 91-212-2A NUMBER 90-1109-AA 90-2401-AA 90-3842-AA 91-0639-AQ 91-1803-AA MA223 88-Pin CPGA PROCESS PACKAGE TYPE DATE CODE 9015 9027 9047 9118 9124 (196 YRS) 0/105 0/105 0/77 0/45 0/77 0/402 (686 YRS) 0/105 0/105 0/77 0/45 0/77 0/402 (2,042 YRS) 0/105 0/105 0/77 0/45 0/77 0/402
TOTAL DEVICE HOURS 201,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-201-1B 91-212-1B NUMBER 90-3842-AA 91-0639-AQ PROCESS MA223 PACKAGE TYPE 88-Pin CPGA DATE CODE 9047 9118 (68,590 YRS) 0/77 0/45 0/122 (160,040 YRS) 0/77 0/45 0/122 (476,310 YRS) 0/77 0/45 0/122
TOTAL DEVICE HOURS 61,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-201-1C 90-217-1C 91-212-1C NUMBER 90-3842-AA 90-2401-AA 91-0639-AQ MA223 88-Pin CPGA PROCESS PACKAGE TYPE DATE CODE 9047 9027 9118 CYCLES 0/78 0/78 0/52 0/208 CYCLES 0/78 0/78 0/52 0/208 1000 CYCLES 0/78 0/78 0/52 0/208
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD301 (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 90-203-1A 90-209-1A 92-226-2A 92-226-3A 92-300-1A 94-207-1A 95-205-2A NUMBER PSD301 90-0916 NA23502303 NA23600302 NA148010-03 N429022005 N450023011 PROCESS MA123 MA123 CE120DLM CE120DLM 120B CE080DLM CE080DLM 44-Pin CLDCC PACKAGE TYPE DATE CODE 9015 9021 9239 9239 9152 9442 9514 (686 YRS) 0/98 0/158 0/77 0/76 0/77 0/77 0/116 0/679 TOTAL DEVICE HOURS 677,668 (2,042 YRS) 0/98 0/158 0/76 0/76 0/77 0/77 0/116 0/678 1000 (4,084 YRS) 0/98 0/158 0/75 0/76 0/77 0/77 0/116 0/677
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 90-203-1B 92-226-2B 92-226-3B 94-207-1B NUMBER PSD301 PROCESS MA123 44-Pin CLDCC PACKAGE DATE 1000 TYPE CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9015 9239 9239 9152 9442 0/105 0/77 0/77 0/77 1/77(B) 1/413 TOTAL DEVICE HOURS 359,572 0/105 0/77 0/77 0/77 0/76 0/412 1/105(A) 0/77 0/77 0/77 0/76 1/412 0/77 0/77 0/77 0/76 0/307
NA23502303 CE120DLM NA23600302 CE120DLM CE120B N429022005 CE080DLM
92-300-1B NA148010-03
NUMBER
PROJECT NUMBER 90-203-1B 94-207-1B
READOUT Hours Hours
QUANTITY
MODE SBCL* SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@225°C bake equivalent 68,590 years derated 55°C.
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 90-209-1C 92-226-2C 92-226-3C 95-204-1C 95-205-2C NUMBER 90-0916 NA23502303 NA23600302 N451001006 N450023011 PROCESS MA123 CE120DLM CE120DLM CE120DLM CE080DLM 44-Pin CLDCC PACKAGE TYPE DATE CODE 9021 9239 9239 9509 9514 CYCLES 0/52 0/78 0/78 0/78 0/116 0/402 CYCLES 0/52 0/78 0/78 0/78 0/116 0/402 0/286 0/286 CYCLES 0/52 0/78 0/78 0/78 1000 CYCLES 0/52 0/78 0/78 0/78
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD301 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 90-208-1A 91-202-1A 91-223-1A 92-200-1A 92-210-1A 92-211-1A 92-213-1A 92-225-3A 92-301-1A 93-210-2A 93-215-1A 93-219-1A 93-220-1A 93-302-1A 93-302-2A 94-302-1A 95-205-1A 95-210-1A 96-204-1A 96-208-1A 96-208-2A 96-208-3A NUMBER 90-0916-AB 91-0301-AA 91-3802-AA NA148010-01 NA21001402 NA21001202 NA21501201 NA23600303 NA21501302 N315021001-P N315013002 N310022001 N334004004 NA30501403 N306010001 N421005002 N450023010 N520024002 N6110160044 N618008001 N618008004 N618008006 PROCESS MA123 MA123 120B 120B 120B 120B 120B 120DLM 120B 120B 120DLM 120B 120DLM 120B 120B 120DLM 080DLM 080DLM 080DLM 080DLM 080DLM 080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9021 9106 9140 9152 9212 9212 9217 9239 9217 9325 9325 9324 9337 9319 9320 9430 9515 9537 9625 9636 9636 9636 YRS) 1/77(A) 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/69 0/116 0/62 0/77 0/75 0/77 0/77 0/116 0/77 0/77 0/77 0/77 0/77 1/1747 TOTAL DEVICE HOURS 1,746,168 (210 YRS) 0/76 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/69 0/116 0/62 0/77 0/75 0/77 0/77 0/116 0/77 0/77 0/77 0/77 0/77 0/1746 1000 (420 YRS) 0/76 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/69 0/116 0/62 0/77 0/75 0/77 0/77 0/116 0/77 0/77 0/77 0/77 0/77 0/1746
NUMBER
PROJECT NUMBER 90-208-1A
READOUT Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@125°C bake equivalent years derated 55°C.
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD301 (PLCC) (Cont.) HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 90-208-1B 90-214-1B 91-202-1B 91-223-1B 92-200-1B 92-225-2B 93-210-2B 93-219-1B 93-220-1B 94-302-1B 95-303-1B 95-210-1B 96-204-1B NUMBER 90-0916-AB 90-2244-AB 91-0301-AA 91-3802-AA NA148010-01 NA23402305 N315021001-P N310022001 N334004004 N421005002 N523017002 N520024002 N6110160044 PROCESS MA123 MA123 MA123 120B 120B 120DLM 120B 120B 120DLM 120DLM 080DLM 120DLM 120DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9021 9027 9106 9140 9152 9241 9325 9324 9337 9430 9540 9537 9625 (122 YRS) 0/77 0/104 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/1259 TOTAL DEVICE HOURS 1,130,000 NUMBER PROJECT NUMBER 90-208-1B (286 YRS) 0/77 0/104 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/1259 (850 YRS) 1/77(A) 0/104 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 1/1257 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/1001 1000 (1700 YRS)
READOUT Hours
QUANTITY
MODE SBCL*
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
*According =1.32 (per technical report),
@140°C bake equivalent years derated 55°C.
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 91-202-1C 91-223-1C 92-200-1C 92-213-1C 92-225-2C 92-301-1C 93-210-2C 93-215-1C 93-219-1C 94-302-1C 95-303-1C 95-205-1C 95-210-1C 96-204-1C NUMBER 91-0301-AA 91-3802-AA NA148010-01 NA21501201 NA23402305 NA21501302 N315021001-P N315013002 N310022001 N421005002 N523017002 N450023010 N520024002 PROCESS MA123 120B 120B 120B 120DLM 120B 120B 120DLM 120B 120DLM 080DLM 080DLM 080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9106 9140 9152 9217 9241 9217 9325 9325 9324 9430 9540 9515 9537 9625 CYCLES 0/78 0/78 0/78 0/78 0/78 0/78 0/78 0/116 0/78 0/78 0/78 0/116 0/78 0/78 0/1220 0/78 0/78 0/78 0/116 0/78 0/78 0/1104 0/78 0/78 0/988 0/78 0/78 0/988 0/78 0/78 0/78 0/78 0/78 0/78 CYCLES 0/78 0/78 0/78 0/78 0/78 0/78 0/78 CYCLES 0/78 0/78 0/78 0/78 0/78 0/78 0/78 1000 CYCLES 0/78 0/78 0/78 0/78 0/78 0/78 0/78
N6110160044 080DLM
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD301 (PLCC) (Cont.) THERMAL SHOCK (OIL OIL) (-65 +150
PROJECT NUMBER 93-302-5C* 93-302-4C* 93-302-1C* 93-302-2C* NUMBER N307051002 N306010001 NA30501403 N306010001 PROCESS 120B 120B 120B 120B PACKAGE TYPE DATE CODE 9320 9320 9319 9320 CYCLES 0/78 0/78 0/52 0/78 0/286 CYCLES
44-Pin PLCC
0/52 0/78 0/130
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 91-202-1D 91-223-1D 92-200-1D 92-213-1D 92-225-2D 92-301-1D 93-210-2D 93-215-1D 93-219-1D 94-302-1D 94-205-1D 95-210-1D 96-204-1D NUMBER 91-0301-AA 91-3802-AA NA148010-01 NA21501201 NA23402305 NA21501302 N315021001-P N315013002 N310022001 N421005002 N450023010 N520024002 N6110160044 PROCESS MA123 120B 120B 120B 120DLM 120B 120B 120DLM 120B 120DLM 080DLM 080DLM 080DLM PACKAGE TYPE DATE CODE 9106 9140 9152 9217 9241 9217 9325 9325 9324 9430 9515 9537 9625 HOURS 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/76 0/52 0/52 0/76 0/52 0/52 0/724 TOTAL DEVICE HOURS 210,336 HOURS 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/52 0/572 HOURS 0/52 0/52 0/52 0/52 0/52 0/52 0/52
44-Pin PLCC
0/52 0/52 0/52 0/520
HIGHLY ACCELERATED STRESS TEST (131 °C/85% R.H./5.25V)
PROJECT NUMBER
91-202-1E
NUMBER
91-0301-AA
PROCESS
MA123 080DLM
PACKAGE TYPE
44-Pin PLCC
DATE
CODE
9106 9518
HOURS
0/52 0/52
95-302-1E
N508001006
TOTAL DEVICE HOURS 5,200
TEMPERATURE HUMIDITY BIAS °C/85% R.H./5.25V)
PROJECT NUMBER 91-202-1F 93-302-1F 93-302-2F 93-302-4F NUMBER 91-0301-AA NA30501403 N306010001 N306010001 PROCESS MA123 120B 120B 120B 44-Pin PLCC PACKAGE TYPE DATE CODE 9106 9319 9320 9320 HOURS 0/52 0/52 0/52 0/77 0/233 TOTAL DEVICE HOURS 233,000 HOURS 0/52 0/52 0/52 0/77 0/233 HOURS 0/52 0/52 0/52 0/77 0/233 1000 HOURS 0/52 0/52 0/52 0/77 0/233
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD301 (TQFP)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 93-208-1A NUMBER NA30201603 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9310 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 93-208-1B NUMBER NA30201603 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9310 (122 YRS) 0/52 (286 YRS) 0/52 (850 YRS) 0/52 1000 (1,700 YRS) 0/52
TOTAL DEVICE HOURS 52,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-208-1C NUMBER NA30201603 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9310 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER
93-208-1D
NUMBER
NA30201603
PROCESS
120DLM
PACKAGE TYPE 44-Pin TQFP
DATE
CODE
9310
HOURS
0/52
TOTAL DEVICE HOURS 4,992
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD302 (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150 °C/6.0V)
PROJECT NUMBER 92-208-1A 93-201-1A 94-303-2A 95-207-2A 96-202-2A NUMBER NA21101905 NA30301701 N429014003 N508003009 N508003009 PROCESS 120B 120DLM 120DLM 080DLM 080DLM 44-Pin CLDCC PACKAGE TYPE DATE CODE 9213 9304 9437 9519 9627 (686 YRS) 0/77 0/77 0/72 0/77 0/77 0/385 TOTAL DEVICE HOURS 385,000 (2,042 YRS) 0/77 0/77 0/72 0/77 0/77 0/385 1000 (4,084 YRS) 0/77 0/77 0/72 0/77 0/77 0/385
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 93-201-1B 92-208-1B 95-207-2B 96-202-2B NUMBER PROCESS PACKAGE TYPE DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9304 44-Pin CLDCC 9213 9519 9627 0/77 0/77 0/77 0/77 0/308 TOTAL DEVICE HOURS 308,000 0/77 0/77 0/77 0/77 0/308 0/77 0/77 0/77 0/77 0/308 0/77 0/77 0/77 0/77 0/308
NA30301701 CE120DLM NA21101905 CE120B
N508003009 080DLM N508003009 080DLM
HIGH TEMPERATURE STORAGE LIFE (250°C)
PROJECT NUMBER 94-303-2B NUMBER PROCESS PACKAGE DATE 1000 TYPE CODE (298,270 YRS) (695,970 YRS) (2071339 YRS) (4142678 YRS) 44-Pin CLDCC 9437 0/105 0/105 0/105 0/105
N429014003 CE120DLM
TOTAL DEVICE HOURS 105,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-208-1C 94-303-2C 95-207-2C 96-202-2C NUMBER NA21101905 N429014003 N508003009 N508003009 PROCESS CE120B CE120DLM 080DLM 080DLM 44-Pin CLDCC PACKAGE TYPE DATE CODE 9213 9437 9519 9627 CYCLES 0/78 0/105 0/78 0/78 0/339 CYCLES 0/78 0/105 0/78 0/78 0/339 1000 CYCLES 0/78 0/105 0/78 0/78 0/339
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD302 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 92-202-1A 93-203-1A 93-211-1A 93-302-3A 94-208-1A 94-303-1A 95-207-1A2 96-202-1A NUMBER NA15004003 NA30600704 NA30900102 NA25201101 N43400804 N429014002 N516003002 N6100220 PROCESS CE120B CE120DLM CE120DLM CE120B CE120DLM CE120DLM CE080DLM CE080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9205 9308 9314 9304 9445 9437 9526 9618 YRS) 0/77 0/77 0/77 0/75 0/77 0/77 0/77 0/77 0/616 TOTAL DEVICE HOURS 616,000 (210 YRS) 0/77 0/77 0/77 0/75 0/77 0/77 0/77 0/77 0/616 1000 (420 YRS) 0/77 0/77 0/77 0/75 0/77 0/77 0/77 0/77 0/616
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER 93-203-1B 94-208-1B 94-300-1B 94-303-1B 95-207-1B 96-202-1B NUMBER PROCESS PACKAGE TYPE DATE CODE 9308 9445 44-Pin PLCC 9403 9437 9519 9618 (122 YRS) 0/77 0/77 0/77 0/77 0/77 0/77 0/462 TOTAL DEVICE HOURS 462,000 (286 YRS) 0/77 0/77 0/77 0/77 0/77 0/77 0/462 (850 YRS) 0/77 0/77 0/77 0/77 0/77 0/77 0/462 1000 (1,700 YRS) 0/77 0/77 0/77 0/77 0/77 0/77 0/462
NA30600704 CE120DLM N43400804 CE120DLM
N326009001 CE120DLM N429014002 CE120DLM N508003006 CE080DLM N6100220 CE080DLM
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-203-1C 93-211-1C 94-208-1C 94-303-1C 96-300-1C 95-207-1C 96-202-1C NUMBER NA30600704 NA30900102 N43400804 N429014002 N551004003 N508003006 N6100220 PROCESS 120DLM 120DLM 120DLM 120DLM CE080DLM CE080DLM CE080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9308 9314 9445 9437 9609 9519 9618 CYCLES 0/78 0/78 0/78 0/78 0/78 0/78 0/78 0/546 0/78 0/78 0/468 0/78 0/78 0/468 CYCLES 0/78 0/78 0/78 0/78 1000 CYCLES 0/78 0/78 0/78 0/78
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD302 (PLCC) (Cont.) PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 93-203-1D 93-211-1D 94-208-1D 94-300-1D 94-303-1D 95-207-1D 96-202-1D NUMBER NA30600704 NA30900102 N43400804 N326009001 N429014002 N508003006 N6100220 PROCESS CE120DLM CE120DLM CE120DLM CE120DLM CE120DLM CE080DLM CE080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9308 9314 9445 9403 9437 9519 9618 HOURS 0/52 0/52 0/52 0/38 0/52 0/52 0/52 0/350 HOURS 0/52 0/52 0/52 0/38 0/52 0/52 0/52 0/350 HOURS 0/52 0/52 0/52 0/38 0/52 0/52 0/52 0/350
TOTAL DEVICE HOURS 84,000
HIGHLY ACCELERATED STRESS TEST (131°C/85% R.H./5.25V)
PROJECT NUMBER 96-300-1E NUMBER N551004003 ROCESS CE080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9609 0/78
TOTAL DEVICE HOURS 3,900
TEMPERATURE HUMIDITY BIAS R.H. /5.25V)
PROJECT NUMBER 93-302-3F 94-300-1F1 94-300-1F2 94-301-1F2 94-301-2F2 94-301-3F2 NUMBER NA25201101 N326009001 N326009001 N410010004 N421021 N433013001 PROCESS 120B CE120DLM CE120DLM CE120DLM CE120DLM CE120DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9304 9403 9403 9417 9428 9442 HOURS 0/77 0/77 0/76 0/77 0/77 0/77 0/461 TOTAL DEVICE HOURS 461,000 HOURS 0/77 0/77 0/76 0/77 0/77 0/77 0/461 HOURS 0/77 0/77 0/76 0/77 0/77 0/77 0/461 1000 HOURS 0/77 0/77 0/76 0/77 0/77 0/77 0/461
COND W/85°C/85% R.H., REFLOW SIMULATIONS; COND W/48 25°C R.H., REFLOW SIMULATIONS.
THERMAL SHOCK (OIL OIL) (-65 +150
PROJECT NUMBER 93-302-3C* 94-301-1C* 94-301-2C* 94-301-3K 95-301-1K 95-301-2K 96-300-1K NUMBER NA25201101 N410010004 N421021 N433013001 N448003015 N508003011 N551004003 ROCESS CE120B CE120DLM CE120DLM CE120DLM CE080DLM CE080DLM CE080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9304 9417 9428 9442 9509 9521 9442 CYCLES 0/78 0/77 0/77 0/77 0/77 0/77 0/78 0/541
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD303 (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150°C/6.0V)
PROJECT NUMBER 96-203-1A NUMBER N613032003 PROCESS CE080DLM PACKAGE TYPE 44-Pin CLDCC DATE CODE 9625 (686 YRS) 0/77 0/77 TOTAL DEVICE HOURS 77,000 (2,042 YRS) 0/77 0/77 1000 (4,084 YRS) 0/77 0/77
HIGH TEMPERATURE STORAGE LIFE (225°C)
PROJECT NUMBER 96-203-1B NUMBER PACKAGE DATE 1000 PROCESS TYPE CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 44-Pin CLDCC 9625 0/77 0/77 0/77 0/77
N613032003 CE080DLM
0/77 TOTAL DEVICE HOURS 77,000
0/77
0/77
0/77
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 96-203-1C NUMBER N613032003 PROCESS CE080DLM PACKAGE TYPE 44-Pin CLDCC DATE CODE 9625 CYCLES 0/78 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
6-10
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD303 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 92-214-1A 92-303-1A 95-209-2A 96-203-2A NUMBER NA21501402 NA22500702 N511016002 N613032002 PROCESS 120B 120B 080DLM 080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9217 9229 9330 9626 YRS) 0/77 0/77 0/77 0/77 0/308 TOTAL DEVICE HOURS 308,000 (210 YRS) 0/77 0/77 0/77 0/77 0/308 1000 (420 YRS) 0/77 0/77 0/77 0/77 0/308
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 92-217-1B 92-303-1B 95-209-2B 96-203-2B NUMBER NA21501420 NA22500702 N511016002 N613032002 PROCESS 120B 120B 080DLM 080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9222 9229 9330 9626 (122 YRS) 0/77 0/77 0/77 0/77 0/308 TOTAL DEVICE HOURS 308,000 (286 YRS) 0/77 0/77 0/77 0/77 0/308 (850 YRS) 0/77 0/77 0/77 0/77 0/308 1000 (1,700 YRS) 0/77 0/77 0/77 0/77 0/308
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 92-303-1C 95-209-2C 96-203-2C NUMBER NA22500702 N511016002 N613032002 PROCESS 120B 080DLM 080DLM 44-Pin PLCC PACKAGE TYPE DATE CODE 9229 9330 9626 CYCLES 0/78 0/78 0/78 0/234 CYCLES 0/78 0/78 0/78 0/234 1000 CYCLES 0/78 0/78 0/78 0/234
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 92-303-1D 95-209-2D 96-203-2D NUMBER NA22500702 N511016002 N613032002 PROCESS 120B 080DLM 080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9229 9330 9626 HOURS 0/52 0/52 0/52 0/156 TOTAL DEVICE HOURS 37,440 HOURS 0/52 0/52 0/52 0/156 HOURS 0/52 0/52 0/52 0/156
6-11
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD303 (PQFP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 93-209-1A NUMBER PROCESS PACKAGE TYPE 52-Pin PQFP DATE CODE 9321 YRS) 0/65 (210 YRS) 0/65 1000 (420 YRS) 0/65
NA319002002 120DLM
TOTAL DEVICE HOURS 65,000
PSD303 (TQFP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 94-205-1A NUMBER N407003005 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9422 YRS) 0/73 (210 YRS) 0/73 1000 (420 YRS) 0/73
TOTAL DEVICE HOURS 73,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 120DLM PACKAGE DATE TYPE CODE 44-Pin TQFP 9422 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
94-205-1B N407003005
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 94-205-1C NUMBER N407003005 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9422 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 94-205-1D NUMBER N407003005 PROCESS 120DLM PACKAGE TYPE 44-Pin TQFP DATE CODE 9422 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
6-12
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD304 (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150°C/6.0V)
PROJECT NUMBER 96-200-1A NUMBER N551001003 PROCESS CE080DLM PACKAGE TYPE 44-Pin CLDCC DATE CODE 9613 (686 YRS) 0/77 0/77 TOTAL DEVICE HOURS 77,000 (2,042 YRS) 0/77 0/77 1000 (4,084 YRS) 0/77 0/77
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 96-200-1B NUMBER PROCESS PACKAGE TYPE 44-Pin CLDCC DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9613 0/77 0/77 TOTAL DEVICE HOURS 77,000 0/77 0/77 0/77 0/77 0/77 0/77
N551001003 CE080DLM
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 96-200-1C NUMBER N551001003 PROCESS CE080DLM PACKAGE TYPE 44-Pin CLDCC DATE CODE 9613 CYCLES 0/78 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
6-13
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD304 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 96-200-2A NUMBER N551001004 PROCESS 080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9616 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 96-200-2B NUMBER N551001004 PROCESS 080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9616 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 96-200-2C NUMBER N551001004 PROCESS 080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9616 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 96-200-2D NUMBER N551001004 PROCESS 080DLM PACKAGE TYPE 44-Pin PLCC DATE CODE 9616 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
6-14
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD402 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 95-211-1A NUMBER N511015003 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9527 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 95-211-1B NUMBER N511015003 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9527 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 95-211-1C NUMBER N511015003 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9527 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 95-211-1D NUMBER N511015003 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9527 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
6-15
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD402 (TQFP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 96-201-1A NUMBER N543007003 PROCESS 080DLM PACKAGE TYPE 80-Pin TQFP DATE CODE 9607 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS 080DLM PACKAGE DATE TYPE CODE 80-Pin TQFP 9607 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
96-201-1B N543007003
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 96-201-1C NUMBER N543007003 PROCESS 080DLM PACKAGE TYPE 80-Pin TQFP DATE CODE 9607 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
6-16
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD413F (PLCC FLASH)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 96-209-1A NUMBER N613034 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9642 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 96-209-1B NUMBER N613034 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9642 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-0°C +100
PROJECT NUMBER 96-209-1C NUMBER N613034 PROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9642 CYCLES 0/78 CYCLES 0/78
HIGHLY ACCELERATED STRESS TEST (131°C/85% R.H./5.25V)
PROJECT NUMBER 96-209-1E NUMBER N613034 ROCESS 080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9642 0/38
TOTAL DEVICE HOURS 1,900
6-17
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD503 (CLDCC)
DYNAMIC HIGH TEMPERATURE LIFE (150°C/6.0V)
PROJECT NUMBER 94-202-1A NUMBER N339070003 PROCESS CE120DLM PACKAGE TYPE 68-Pin CLDCC DATE CODE 9403 (686 YRS) 0/77 (2,042 YRS) 0/77 1000 (4,084 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (225
PROJECT NUMBER 93-205-1B 93-205-2B 94-202-1B 95-200-1B NUMBER PROCESS PACKAGE TYPE DATE 1000 CODE (68,590 YRS) (160,040 YRS) (476,310 YRS) (952,620 YRS) 9310 68-Pin CLDCC 9315 9403 9430 0/52 0/77 0/77 0/77 0/283 TOTAL DEVICE HOURS 283,000 0/52 0/77 0/77 0/77 0/283 0/52 0/77 0/77 0/77 0/283 0/52 0/77 0/77 0/77 0/283
NA30800101 CE120DLM N312007005 CE120DLM N339070003 CE120DLM N417038006 CE080DLM
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 93-205-2C 94-202-1C NUMBER N312007005 N339070003 PROCESS CE120DLM CE120DLM PACKAGE TYPE 68-Pin CLDCC DATE CODE 9315 9403 CYCLES 0/78 0/76 0/154 CYCLES 0/78 0/76 0/154 1000 CYCLES 0/78 0/76 0/154
6-18
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD503 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 95-202-1A NUMBER N417038007 PROCESS CE080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9430 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 95-202-1C NUMBER N417038007 PROCESS CE080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9430 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 95-202-1D NUMBER N417038007 PROCESS CE080DLM PACKAGE TYPE 68-Pin PLCC DATE CODE 9430 HOURS 0/22 HOURS 0/22 HOURS 0/22
TOTAL DEVICE HOURS 5,280
6-19
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
PSD503 (TQFP)
DYNAMIC HIGH TEMPERATURE LIFE (125°C/6.0V)
PROJECT NUMBER 94-206-1A NUMBER N421031003 PROCESS CE120DLM PACKAGE TYPE 80-Pin TQFP DATE CODE 9435 YRS) 0/77 (210 YRS) 0/77 1000 (420 YRS) 0/77
TOTAL DEVICE HOURS 77,000
HIGH TEMPERATURE STORAGE LIFE (140°C)
PROJECT NUMBER NUMBER PROCESS CE120DLM PACKAGE DATE TYPE CODE 80-Pin TQFP 9435 (122 YRS) 0/77 (286 YRS) 0/77 (850 YRS) 0/77 1000 (1,700 YRS) 0/77
94-206-1B N421031003
TOTAL DEVICE HOURS 77,000
TEMPERATURE CYCLE (AIR AIR) (-65 +150
PROJECT NUMBER 94-206-1C NUMBER N421031003 PROCESS CE120DLM PACKAGE TYPE 80-Pin TQFP DATE CODE 9435 CYCLES 0/78 CYCLES 0/78 1000 CYCLES 0/78
PRESSURE (121°C/15 PSIG)
PROJECT NUMBER 94-206-1D NUMBER N421031003 PROCESS 120DLM PACKAGE TYPE 80-Pin TQFP DATE CODE 9435 HOURS 0/52 HOURS 0/52 HOURS 0/52
TOTAL DEVICE HOURS 12,480
6-20
Reliability Summary 1997
PSD/System Logic Reliability Data (Cont.)
MAP168 (PLCC)
DYNAMIC HIGH TEMPERATURE LIFE (125 °C/6.0V)
PROJECT NUMBER 91-222-1A 91-227-1A NUMBER 91-3126-AA 91-3127-AA PROCESS MB122 PACKAGE TYPE 44-Pin PLCC DATE CODE 9134 9139 YRS) 0/77 0/77 0/154 TOTAL DEVICE HOURS 154,000 (210 YRS) 0/77 0/77 0/154 1000 (420 YRS) 0/77 0/77 0/154
HIGH TEMPERATURE STORAGE LIFE (140
PROJECT NUMBER 91-222-1B 91-227-1B NUMBER 91-3126-AA 91-3127-AA PROCESS MB122 PACKAGE TYPE 44-Pin PLCC DATE CODE 9134 9139 (122 YRS) 0/77 0/77 0/154 (286 YRS) 0/77 0/77 0/154 (850 YRS) 0/77 0/77 0/154 1000 (1700 YRS) 0/77 1/77(A) 1/154
TOTAL DEVICE HOURS 154,000
NUMBER
PROJECT NUMBER 91-227-1B
READOUT
QUANTITY
MODE
MECHANISM Trap Assistant
CAUSE Intrinsic Charge Loss
COMMENTS Technical Report
1000 Hours
SBCL*
*According =1.32 (per technical report),
@140°C bake eq
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