memory inspection, quality cannot judged solely test external pins. nu

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memory inspection, quality cannot judged solely test external pins. nu

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Outline Testing Method
memory inspection, quality cannot judged solely test external pins. number elements such transistors which judged test very small part elements. proposed address patterns listed below inspect whether internal circuits functioning correctly. low, high Checker flag Stripe pattern Marching pattern Galloping Walking Ping-pong
These only representative samples testing options. There also patterns check mutual interference bits maximum power dissipation. Among listing, through called patterns, which check sequence N-bit memory with several consecutive cycles patterns. through called patterns, which need several cycles patterns check sequence N-bit memory. Serious problems arise using patterns large-capacity memory. example, inspection 1-Mbit memory with galloping pattern takes considerable time-about hours. rather simple effective methods, these patterns will find failures decoder circuits. Marching most simple powerful pattern check functions memories.
Marching Pattern
marching pattern, name indicates, pattern which sequentially replace throughout device. "march" into bits example, simple addressing 16-bit memory described below. Clear bits (see Figure Read from address check that read data Hereafter, read means "checking judging data." Write address (see Figure Read from address. Write address. Read from address.
Outline Testing Method
Write address (see Figure Repeat last address. Finally data will After data become repeat from through replacing with this method, address patterns necessary N-bit memory.
Figure Addressing Method 16-Bit Memory Marching Pattern

memory inspection, quality cannot judged solely test external pins. nu

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