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RADIATION HARDENED POWER MOSFET THRU-HOLE (T0-254AA) Part Number
Top Searches for this datasheet91564F RADIATION HARDENED POWER MOSFET THRU-HOLE (T0-254AA) Part Number IRHM7064 IRHM3064 IRHM4064 IRHM8064 Radiation Level 100K Rads (Si) 300K Rads (Si) 500K Rads (Si) 1000K Rads (Si) RDS(on) 0.021 0.021 0.021 0.030 35A* 35A* 35A* 35A* IRHM7064 JANSR2N7431 60V, N-CHANNEL REF:MIL-PRF-19500/663 RAD-Hard HEXFET TECHNOLOGY Part Number JANSR2N7431 JANSF2N7431 JANSG2N7431 JANSH2N7431 International Rectifier's RAD-Hard HEXFET technology provides high performance power MOSFETs space applications. This technology over decade proven performance reliability satellite applications. These devices have been characterized both Total Dose Single Event Effects (SEE). combination Rdson gate charge reduces power losses switching applications such converters motor control. These devices retain well established advantages MOSFETs such voltage control, fast switching, ease paralleling temperature stability electrical parameters. TO-254AA Features: Single Event Effect (SEE) Hardened RDS(on) Total Gate Charge Simple Drive Requirements Ease Paralleling Hermetically Sealed Ceramic Package Light Weight Absolute Maximum Ratings Parameter 12V, 25°C 12V, 100°C 25°C dv/dt Continuous Drain Current Continuous Drain Current Pulsed Drain Current Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction Storage Temperature Range Lead Temperature Weight *Current limited package footnotes refer last page Pre-Irradiation Units W/°C V/ns (0.063 in.(1.6mm) from case 10s) (Typical) www.irf.com 05/16/06 IRHM7064, JANSR2N7431 Pre-Irradiation Electrical Characteristics 25°C (Unless Otherwise Specified) Parameter BVDSS Drain-to-Source Breakdown Voltage Temperature Coefficient Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage Forward Transconductance IDSS Zero Gate Voltage Drain Current Units 0.056 0.021 -100 V/°C Test Conditions 1.0mA Reference 25°C, 1.0mA 12V, VGS, 1.0mA 15V, VDS= ,VGS=0V 48V, 125°C -20V =12V, =30V, =12V, 2.35 IGSS IGSS td(on) td(off) Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (`Miller') Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Measured from Drain lead (6mm /0.25in Total Inductance from package) Source lead (6mm /0.25in. from package) with Source wires internally bonded from Source Drain Ciss Input Capacitance Output Capacitance Reverse Transfer Capacitance 4900 2800 1.0MHz Source-Drain Diode Ratings Characteristics Parameter Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Units Test Conditions 25°C, 35A, 25°C, 35A, di/dt 100A/µs Intrinsic turn-on time negligible. Turn-on speed substantially controlled *Current limited package Thermal Resistance Parameter RthJC RthJA RthCS Junction-to-Case Junction-to-Ambient Case-to-Sink Units 0.50 0.21 °C/W Test Conditions Typical socket mount Note: Corresponding Spice Saber models available International Rectifier Website. footnotes refer last page www.irf.com Radiation Characteristics Pre-Irradiation IRHM7064, JANSR2N7431 International Rectifier Radiation Hardened MOSFETs tested verify their radiation hardness capability. hardness assurance program International Rectifier comprised radiation environments. Every manufacturing tested total ionizing dose (per notes using TO-3 package. Both pre- post-irradiation performance tested specified using same drive circuitry test conditions order provide direct comparison. Table Electrical Characteristics 25°C, Post Total Dose Irradiation Parameter BVDSS VGS(th) IGSS IGSS IDSS RDS(on) RDS(on) Drain-to-Source Breakdown Voltage Gate Threshold Voltage Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Zero Gate Voltage Drain Current Static Drain-to-Source On-State Resistance (TO-3) Static Drain-to-Source On-State Resistance (TO-254AA) Diode Forward Voltage 500K Rads(Si)1 1000K Rads (Si)2 Units Test Conditions 1.0mA 1.0mA VDS=48V, 12V, =35A 12V, =35A -100 0.021 0.021 1.25 -100 0.030 0.030 Part numbers IRHM7064 IRHM4064 (JANSG2N7431) Part number IRHM8064 (JANSH2N7431U) International Rectifier radiation hardened MOSFETs have been characterized heavy environment Single Event Effects (SEE). Single Event Effects characterization illustrated Fig. Table Table Single Event Effect Safe Operating Area (MeV/(mg/cm2)) 36.8 59.9 Energy (MeV) Range (µm) @VGS=0V @VGS=-5V @VGS=-10V @VGS=-15V 32.8 @VGS=-20V Single Event Effect, Safe Operating Area footnotes refer last page www.irf.com IRHM7064, JANSR2N7431 Pre-Irradiation 1000 Drain-to-Source Current Drain-to-Source Current 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V 1000 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V 20µs PULSE WIDTH 5.0V Drain-to-Source Voltage 5.0V 20µs PULSE WIDTH Drain-to-Source Voltage Typical Output Characteristics Typical Output Characteristics 1000 RDS(on) Drain-to-Source Resistance (Normalized) Drain-to-Source Current 20µs PULSE WIDTH Gate-to-Source Voltage Junction Temperature Typical Transfer Characteristics Normalized On-Resistance Temperature www.irf.com Pre-Irradiation IRHM7064, JANSR2N7431 10000 8000 Gate-to-Source Voltage 1MHz Ciss SHORTED Crss Coss Capacitance (pF) 6000 Ciss Coss 4000 2000 Crss TEST CIRCUIT FIGURE Drain-to-Source Voltage Total Gate Charge (nC) Typical Capacitance Drain-to-Source Voltage Typical Gate Charge Gate-to-Source Voltage 1000 1000 Reverse Drain Current OPERATION THIS AREA LIMITED RDS(on) Drain Current 100us Single Pulse 10ms 1000 ,Source-to-Drain Voltage Drain-to-Source Voltage Typical Source-Drain Diode Forward Voltage Maximum Safe Operating Area www.irf.com IRHM7064, JANSR2N7431 Pre-Irradiation LIMITED PACKAGE Drain Current D.U.T. Pulse Width Duty Factor 10a. Switching Time Test Circuit Case Temperature td(on) d(off) Maximum Drain Current Case Temperature 10b. Switching Time Waveforms Thermal Response thJC 0.50 0.20 0.10 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) Notes: Duty factor Peak thJC 0.0001 0.001 0.01 0.01 0.001 0.00001 Rectangular Pulse Duration (sec) Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com Pre-Irradiation IRHM7064, JANSR2N7431 1400 Single Pulse Avalanche Energy (mJ) BOTTOM 1200 1000 DRIVER D.U.T 0.01 12a. Unclamped Inductive Test Circuit V(BR)DSS Starting Junction Temperature 12c. Maximum Avalanche Energy Drain Current 12b. Unclamped Inductive Waveforms Current Regulator Same Type D.U.T. .2µF .3µF D.U.T. Charge Current Sampling Resistors 13a. Basic Gate Charge Waveform 13b. Gate Charge Test Circuit www.irf.com IRHM7064, JANSR2N7431 Pre-Irradiation Foot Notes: Repetitive Rating; Pulse width limited maximum junction temperature. 25V, starting 25°C, L=0.82mH Peak 35A, =12V 35A, di/dt 220A/µs, 60V, 150°C Pulse width Duty Cycle Total Dose Irradiation with Bias. volt applied during irradiation MIL-STD-750, method 1019, condition Total Dose Irradiation with Bias. volt applied during irradiation MlL-STD-750, method 1019, condition Case Outline Dimensions TO-254AA 0.12 [.005] 3.78 [.149] 3.53 [.139] 13.84 [.545] 13.59 [.535] 6.60 [.260] 6.32 [.249] 1.27 [.050] 1.02 [.040] 17.40 [.685] 16.89 [.665] 20.32 [.800] 20.07 [.790] 13.84 [.545] 13.59 [.535] 3.81 [.150] 1.14 [.045] 0.89 [.035] 0.36 [.014] ASSIGNMENTS DRAIN SOURCE GATE 3.81 [.150] 127(6 DIMENSIONING TOLERANCING ASME Y14.5M-1994. DIMENSIONS SHOWN MILLIMETERS [INCHES]. CONTROLLING DIMENSION: INCH. CONFORMS JEDEC OUTLINE TO-254AA. CAUTION BERYLLIA WARNING MIL-PRF-19500 Package containing beryllia shall ground, sandblasted, machined, have other operations performed them which will produce beryllia beryllium dust. Furthermore, beryllium oxide packages shall placed acids that will produce fumes containing beryllium. WORLD HEADQUARTERS: Kansas St., Segundo, California 90245, Tel: (310) 252-7105 LEOMINSTER Crawford St., Leominster, Massachusetts 01453, Tel: (978) 534-5776 Fax: (310) 252-7903 Visit www.irf.com sales contact information. Data specifications subject change without notice. 05/2006 www.irf.com Other recent searchesSOJ40 - SOJ40 SOJ40 Datasheet SA-110 - SA-110 SA-110 Datasheet MX98704 - MX98704 MX98704 Datasheet MCP1754 - MCP1754 MCP1754 Datasheet MCP1754S - MCP1754S MCP1754S Datasheet LTC1422 - LTC1422 LTC1422 Datasheet HD74HC149 - HD74HC149 HD74HC149 Datasheet HD74HC148 - HD74HC148 HD74HC148 Datasheet HD74HC138 - HD74HC138 HD74HC138 Datasheet APT75GT120JU3 - APT75GT120JU3 APT75GT120JU3 Datasheet
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