Radiation Hardened CMOS Analog Switches HS-3XXRH/883S family anal

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Radiation Hardened CMOS Analog Switches HS-3XXRH/883S family anal

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HS-302RH/883S, HS-303RH/883S, HS-306RH/883S, HS-307RH/883S, HS-384RH/883S, HS-390RH/883S
Radiation Hardened CMOS Analog Switches
HS-3XXRH/883S family analog switches monolithic devices fabricated using Radiation Hardened CMOS technology Intersil dielectric isolation process latch-up free operation. Improved total dose hardness obtained layout (thin oxide tabs extending channel stop) processing (hardened gate oxide). These switches offer low-resistance switching performance analog voltages supply rails. "ON" resistance stays reasonably constant over full range operating voltage current. "ON" resistance also stays reasonably constant when exposed radiation, being typically pre-rad post 100K RAD-Si. devices provide break-before-make switching. devices this switch series differentiated type switch action, pinout digital logic levels. HS-302/ 303/384/390RH/883S switches have digital inputs while HS-306/307RH/883S switches have digital inputs. devices available Ceramic Flatpack SBDIP packages. HS-3XXRH/883S switches directly replace HI-3XX series devices.
September 1995
Features
This Circuit Processed Accordance Mil-Std883 Fully Conformant Under Provisions Paragraph 1.2.1. Radiation Hardened Functional Total Dose Exceeds Compatible with Intersil HI-3XX Series Analog Switches Analog Signal Range Leakage Latch Versions Digital Systems Operating Power Military Temperature Range -55oC +125oC
Applications
Sample Hold i.e. Leakage Switching Gain Switching i.e. Resistance Switched Capacitor Filters Level Switching Circuits Satellites Nuclear Reactor Controls Military Environments
Functional Diagram
Ordering Information
PART NUMBER HS1-302RH/883S HS9-302RH/883S HS1-302RH/Sample HS9-302RH/Sample HS1-303RH/883S HS9-303RH/883S HS1-303RH/Sample HS9-303RH/Sample HS1-306RH/883S Note HS9-306RH/883S Note TEMPERATURE RANGE -55oC +125oC -55oC +125oC +25oC +25oC -55oC +125oC -55oC +125oC +25oC +25oC -55oC +125oC -55oC +125oC SCREENING LEVEL Intersil /883 Class Equivalent Intersil /883 Class Equivalent Sample Sample Intersil /883 Class Equivalent Intersil /883 Class Equivalent Sample Sample Intersil /883 Class Equivalent Intersil /883 Class Equivalent PACKAGE Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack
CAUTION: These devices sensitive electrostatic discharge; follow proper Handling Procedures. 1-888-INTERSIL 321-724-7143 Intersil (and design) trademark Intersil Americas Inc. Copyright Intersil Americas Inc. 2002. Rights Reserved
Spec Number
518526 FN3067.1
HS-3XXRH/883S Ordering Information
PART NUMBER HS1-306RH/Sample (Note HS9-306RH/Sample (Note HS1-307RH/883S HS9-307RH/883S HS1-307RH/Sample HS9-307RH/Sample HS1-384RH/883S (Note HS9-384RH/883S (Note HS1-384RH/Sample (Note HS9-384RH/Sample (Note HS1-390RH/883S HS9-390RH/883S HS1-390RH/Sample HS9-390RH/Sample NOTE: recommended design. (Continued) TEMPERATURE RANGE +25oC +25oC -55oC +125oC -55oC +125oC +25oC +25oC -55oC +125oC -55oC +125oC +25oC +25oC -55oC +125oC -55oC +125oC +25oC +25oC SCREENING LEVEL Sample Sample Intersil /883 Class Equivalent Intersil /883 Class Equivalent Sample Sample Intersil /883 Class Equivalent Intersil /883 Class Equivalent Sample Sample Intersil /883 Class Equivalent Intersil /883 Class Equivalent Sample Sample PACKAGE Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack Lead SBDIP Lead Ceramic Flatpack
Pinouts (Switch States Logic Inputs)
LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T14 VIEW DUAL DPST HS-302RH/883S HS-306RH/883S
LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T16 VIEW DUAL DPST HS-384RH/883S
DUAL SPDT HS-303RH/883S HS-307RH/883S
DUAL SPDT HS-390RH/883S
LOGIC
SWITCH
LOGIC
LOGIC
SWITCH
LOGIC
Spec Number
518526
HS-3XXRH/883S Pinouts (Switch States Logic Inputs)
(Continued)
LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDIP3-F14 VIEW DUAL DPST HS-302RH/883S HS-306RH/883S
DUAL SPDT HS-303RH/883S HS-307RH/883S
LOGIC
SWITCH
LOGIC
LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDIP4-F16 VIEW DUAL DPST HS-384RH/883S
VGND
DUAL SPDT HS-390RH/883S
VGND
LOGIC
SWITCH
LOGIC
Spec Number
518526
Specifications HS-3XXRH/883S
Absolute Maximum Ratings
Supply Voltage Between +44V +VSUPPLY Ground +22V -VSUPPLY Ground. -22V Analog Input Overvoltages: +VSUPPLY +1.5V -VSUPPLY 1.5V Digital Input Overvoltage: +VSUPPLY -VSUPPLY Peak Current, Pulsed 1ms, Duty Cycle 40mA Continuous Current 10mA Storage Temperature Range -65oC +150oC Junction Temperature. +175oC Lead Temperature (soldering 10s) +300oC
Reliability Information
Thermal Resistance Lead SBDIP Package. 70oC/W 19oC/W Lead Ceramic Flatpack Package 105oC/W 17oC/W Lead SBDIP Package. 19oC/W Lead Ceramic Flatpack Package 105oC/W 17oC/W Maximum Package Power Dissipation +125 Ambient Lead SBDIP Package. 0.71W Lead Ceramic Flatpack Package 0.48W Lead SBDIP Package. 0.71W Lead Ceramic Flatpack Package .0.48 device power exceeds package dissipation capability, provide heat sinking derate linearly following rate: Lead SBDIP Package. 14.3mW/oC Lead Ceramic Flatpack Package 9.5mW/oC Lead SBDIP Package. 14.3mW/oC Lead Ceramic Flatpack Package 9.5mW/oC
CAUTION: Stresses above those listed "Absolute Maximum Ratings" cause permanent damage device. This stress only rating operation device these other conditions above those indicated operational sections this specification implied.
Operating Conditions
Operating Supply Voltage VSupply) ±15V Operating Temperature Range -55oC +125oC
TABLE HS-302RH/303RH/384RH/390RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +4.0V, 0.8V GROUP SUBGROUPS -RDS -10V, 10mA, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 +14V, S1/S2/S3/S4 -14V, S1/S2/S3/S4 Channels 0.8V Leakage Current Into Source Terminal "Off" Switch +IS(OFF) -IS(OFF) Leakage Current into Drain Terminal "Off" Switch +ID(OFF) -ID(OFF) Leakage Current from "On" Driver Into Switch (Drain Source) +ID(ON) -ID(ON) Level Input Address Current High Level Input Address Current Channels 4.0V LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC -100 -100 -100 -100 -100 -100 UNITS
PARAMETER "Switch Resistance
SYMBOL +RDS
CONDITIONS 10V, -10mA, S1/S2/S3/S4
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE HS-302RH/303RH/384RH/390RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +4.0V, 0.8V (Continued) GROUP SUBGROUPS 4.0V 4.0V, Negative Supply Current I(-) Channels 0.8V 4.0V 4.0V, LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC -100 -100 UNITS
PARAMETER Positive Supply Current
SYMBOL I(+)
CONDITIONS Channels 0.8V
TABLE HS-306RH/307RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +11.0V, 3.5V GROUP SUBGROUPS +RDS -10V, 10mA, S1/S2/S3/S4 Leakage Current Into Source Terminal "Off" Switch +IS(OFF) +14V, -14V, S1/S2/S3/S4 -IS(OFF) -14V, +14V, S1/S2/S3/S4 Leakage Current into Drain Terminal "Off" Switch +ID(OFF) -14V, +14V, S1/S2/S3/S4 -ID(OFF) +14V, -14V, S1/S2/S3/S4 Leakage Current from "On" Driver Into Switch (Drain Source) +ID(ON) +14V, S1/S2/S3/S4 -ID(ON) -14V, S1/S2/S3/S4 Level Input Address Current Channels 3.5V High Level Input Address Current Channels LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC -100 -100 -100 -100 -100 -100 UNITS
PARAMETER "Switch Resistance
SYMBOL +RDS
CONDITIONS 10V, -10mA, S1/S2/S3/S4
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE HS-306RH/307RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +11.0V, 3.5V (Continued) GROUP SUBGROUPS Channels Negative Supply Current I(-) Channels Channels LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC -100 -100 UNITS
PARAMETER Positive Supply Current
SYMBOL I(+)
CONDITIONS Channels
TABLE HS-302RH/303RH/384RH/390RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +4.0V, GROUP SUBGROUPS 300, Switch Turn "Off" Time TOFF 300, LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC UNITS
PARAMETER Break-Before-Make Time Delay (HS-303RH 390RH Only) Switch Turn "On" Time
SYMBOL TOPEN
CONDITIONS 300, +3V,
TABLE HS-306RH/307RH/883S ELECTRICAL PERFORMANCE CHARACTERISTICS Device Guaranteed 100% Tested. Unless Otherwise Specified: -15V, +15V, +15.0V, GROUP SUBGROUPS 300, Switch Turn "Off" Time TOFF 300, LIMITS TEMPERATURE +25oC -55oC +125oC +25oC -55oC +125oC +25oC -55oC +125oC UNITS
PARAMETER Break-Before-Make Time Delay (HS-307RH Only) Switch Turn "On" Time
SYMBOL TOPEN
CONDITIONS 300,
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS (NOTE Unless Otherwise Specified: HS-302RH/303RH/384RH/390RH/883S -15V, +15V, +4.0V, HS-306RH/307RH/883S -15V, +15V, +15.0V, (NOTE CONDITIONS Measured Source Measured Drain VGEN 1Vp-p, 1MHz VGEN 1Vp-p, 1MHz GND, 0.01µF LIMITS TEMPERATURE +25oC +25o
PARAMETER Switch Input Capacitance Driver Input Capacitance
SYMBOL CIS(OFF)
UNITS
Switch Output Isolation Crosstalk Charge Transfer
VISO VCTE
+25oC +25o
NOTE:1. Parameters listed Table controlled design process parameters directly tested final production. These parameters characterized upon initial design release, upon design changes. These parameters guaranteed characterization based upon data from multiple production runs which reflect within variation.
TABLE HS-302RH/303RH/384RH/390RH/883S POST 100K (Si) ELECTRICAL CHARACTERISTICS Tested Mil-Std-883. Unless Otherwise Specified: HS-302RH/303RH/384RH/390RH/883S -15V, +15V, +4.0V, 0.8V LIMITS PARAMETER "Switch Resistance SYMBOL +RDS -RDS Leakage Current Into Source Terminal "Off" Switch Leakage Current into Drain Terminal "Off" Switch Leakage Current from "On" Driver Into Switch (Drain Source) Positive Supply Current +IS(OFF) -IS(OFF) +ID(OFF) -ID(OFF) -ID(ON) -ID(ON) I(+) CONDITIONS 10V, -10mA, S1/S2/S3/S4 -10V, 10mA, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 +14V, S1/S2/S3/S4 -14V, S1/S2/S3/S4 Channels 0.8V 4.0V 4.0V, Negative Supply Current I(-) Channels 0.8V 4.0V 4.0V, High Level Address Current Level Address Current Break-Before-Make Time Delay (HS-303RH/883S HS390RH/883S Only) Switch Turn-On Time Switch Turn-Off Time NOTES: 5.0V TOPEN Channels High Channels 300, +3V, (Note TEMPERATURE +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC
-100 -100 -100 -100 -100 -100 -100 -100
UNITS
TOFF
300, +3V, (Note 300, +3V, (Note
+25oC +25oC
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE HS-306/307RH/883S POST 100K (Si) ELECTRICAL CHARACTERISTICS Tested Mil-Std-883. Unless Otherwise Specified: HS-306RH/307RH/883S -15V, +15V, +11.0V, 3.5V LIMITS PARAMETER "Switch Resistance SYMBOL +RDS -RDS Leakage Current Into Source Terminal "Off" Switch Leakage Current into Drain Terminal "Off" Switch Leakage Current from "On" Driver Into Switch (Drain Source) Positive Supply Current +IS(OFF) -IS(OFF) +ID(OFF) -ID(OFF) -ID(ON) -ID(ON) I(+) CONDITIONS 10V, -10mA, S1/S2/S3/S4 -10V, 10mA, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 +14V, S1/S2/S3/S4 -14V, S1/S2/S3/S4 Channels Channels Negative Supply Current I(-) Channels Channels High Level Address Current Level Address Current Break-Before-Make Time Delay (HS-307RH/883S Only) Switch Turn-On Time Switch Turn-Off Time NOTE: TOPEN TOFF Channels High Channels 300, +3V, (Note 300, +3V, (Note 300, +3V, (Note TEMPERATURE +25o
-100 -100 -100 -100 -100 -100 -100 -100
UNITS
+25oC +25o
+25oC +25o
+25oC +25oC +25oC +25oC +25oC +25oC +25oC
TABLE HS-302RH/303RH/384RH/390RH/883S POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS Guaranteed, Mil-Std-883. Unless Otherwise Specified: -15V, +15V, +4.0V, 0.8V GROUP SUBGROUPS LIMITS TEMPERATURE +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC UNITS
PARAMETER "Switch Resistance
SYMBOL +RDS
CONDITIONS 10V, -10mA, S1/S2/S3/S4 -10V, 10mA, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 +14V, S1/S2/S3/S4 -14V, S1/S2/S3/S4
-RDS
Leakage Current Into Source Terminal "Off" Switch Leakage Current into Drain Terminal "Off" Switch Leakage Current from "On" Driver Into Switch (Drain Source)
+IS(OFF)
-IS(OFF)
+ID(OFF)
-ID(OFF)
+ID(ON) -ID(ON)
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE HS-302RH/303RH/384RH/390RH/883S POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS Guaranteed, Mil-Std-883. Unless Otherwise Specified: -15V, +15V, +4.0V, 0.8V (Continued) GROUP SUBGROUPS LIMITS TEMPERATURE +25oC +25oC +25oC +25oC +25oC +25oC -100 UNITS
PARAMETER Level Input Address Current High Level Input Address Current Positive Supply Current
SYMBOL
CONDITIONS Channels 0.8V
Channels 4.0V
-100
I(+)
Channels 0.8V 4.0V 4.0V,
-0.1
Negative Supply Current
I(-)
Channels 0.8V 4.0V 4.0V,
TABLE HS-306RH/307RH/883S POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS Guaranteed, Mil-Std-883. Unless Otherwise Specified: -15V, +15V, +11.0V, 3.5V LIMITS PARAMETER "Switch Resistance SYMBOL +RDS CONDITIONS 10V, -10mA, S1/S2/S3/S4 -10V, 10mA, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 -14V, +14V, S1/S2/S3/S4 +14V, -14V, S1/S2/S3/S4 +14V, S1/S2/S3/S4 -14V, S1/S2/S3/S4 Channels 3.5V GROUP SUBGROUPS TEMPERATURE +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC +25oC UNITS
-RDS
Leakage Current Into Source Terminal "Off" Switch
+IS(OFF)
-IS(OFF)
Leakage Current into Drain Terminal "Off" Switch
+ID(OFF)
-ID(OFF)
Leakage Current from "On" Driver Into Switch (Drain Source) Level Input Address Current High Level Input Address Current Positive Supply Current
+ID(ON) -ID(ON)
-100
Channels
-100
I(+)
Channels Channels
Negative Supply Current
I(-)
Channels Channels
Spec Number
518526
Specifications HS-3XXRH/883S
TABLE APPLICABLE SUBGROUPS GROUP SUBGROUPS CONFORMANCE GROUPS Initial Test Interim Test Final Test Group (Note Group Subgroup Subgroup Group Group Subgroup NOTES: Alternate Group testing accordance with Method 5005 MIL-STD-883 exercised. Table parameters on.y. METHOD 100%/5004 100%/5004 100%/5004 100%/5004 Sample/5005 Sample/5005 Sample/5005 Sample/5005 Sample/5005 TESTED Deltas Deltas Deltas Deltas, (Note RECORDED (Note Deltas, (Note
Spec Number
518526
Intersil Space Level Product Flow
Wafer Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, Samples/Wafer, Rejects 100% Nondestructive Bond Pull, Method 2023 Sample Wire Bond Pull Monitor, Method 2011 Sample Shear Monitor, Method 2019 2027 100% Internal Visual Inspection, Method 2010, Condition 100% Temperature Cycle, Method 1010, Condition Cycles 100% Constant Acceleration, Method 2001, Condition Method 5004 100% PIND, Method 2020, Condition 100% External Visual 100% Serialization 100% Initial Electrical Test (T0) 100% Static Burn-In Condition 72hrs. min., +125oC min.
NOTES: Failures from subgroup deltas used calculating PDA. maximum allowable with more than failures from subgroup Radiographic (X-Ray) inspection performed point after serialization allowed Method 5004. Alternate Group testing performed allowed MIL-STD-883, Method 5005. Data Package Contents: Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Date Code, Intersil Part Number, Number, Quantity). Wafer Acceptance Report (Method 5007). Includes reproductions photos with percent step coverage. GAMMA Radiation Report. Contains Cover page, disposition, Dose, Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read Record data file Intersil. X-Ray report film. Includes penetrometer measurements. Screening, Electrical, Group attributes (Screening attributes begin after package seal). Serial Number Sheet (Good units serial number number). Variables Data (All Delta operations). Data identified serial number. Data header includes number date test. (See Table Group attributes and/or Generic data. Certificate Conformance part shipping invoice part Data Book. Certificate Conformance signed authorized Quality Representative.
100% Interim Electrical Test (T1) 100% Delta Calculation (T0-T1) 100% PDA, Method 5004 (Note 100% Dynamic Burn-In, Condition hrs., +125oC Equivalent, Method 1015 100% Interim Electrical Test (T2) 100% Delta Calculation (T0-T2) 100% PDA, Method 5004 (Note 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% Radiographic, Method 2012 (Note 100% External Visual, Method 2009 Sample Group Method 5005 (Note Sample Group Method 5005 Sample Group Method 5005 100% Data Package Generation (Note
Intersil U.S. products manufactured, assembled tested utilizing ISO9000 quality systems. Intersil Corporation's quality certifications viewed www.intersil.com/design/quality
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NORTH AMERICA Intersil Corporation 7585 Irvine Center Drive Suite Irvine, 92618 TEL: (949) 341-7000 FAX: (949) 341-7123 Intersil Corporation 2401 Palm Palm Bay, 32905 TEL: (321) 724-7000 FAX: (321) 724-7946 EUROPE Intersil Europe Sarl Ave. William Graisse, 1006 Lausanne Switzerland TEL: 6140560 FAX: 6140579 ASIA Intersil Corporation Unit 1804 18/F Guangdong Water Building Austin Road TST, Kowloon Hong Kong TEL: +852 2723 6339 FAX: +852 2730 1433
Spec Number
518526
Irradiation Circuits
HS-302RH/303RH/883S HS-384RH/390RH/883S NOTES: 1/4W +15V -15V irradiation testing performed package. NOTES:
HS-306RH/307RH/883S 1/4W +15V -15V +12V irradiation testing performed package.
Burn-In Circuits
STATIC CONFIGURATION HS-302RH/303RH/306RH/307RH/883S NOTES: 1/4W position) 0.01µF minimum (per position) 0.1µF minimum IN4002 equivalent) +15.5V 0.5V, -15.5V 0.5V +15.5V 0.5V 306RH/307RH +5.5V 0.5V 302RH/303RH NOTES:
STATIC CONFIGURATION HS-384RH/390RH/883S 1/4W position) 0.01µF minimum (per position) 0.1µF minimum IN4002 equivalent) +15.5V 0.5V, -15.5V 0.5V +5.5V 0.5V
Spec Number
518526
Burn-In Circuits
(Continued)
DYNAMIC CONFIGURATION HS-302RH/303RH/883S NOTES: 1/4W position) 0.01µF minimum (per position) 0.1µF minimum IN4002 equivalent) 100kHz square wave, duty cycle, 0.8V max., 5.5V 0.5V +15.5V 0.5V, -15.5V 0.5V NOTES:
DYNAMIC CONFIGURATION HS-306RH/307RH/883S 1/4W position) 0.01µF minimum (per position) 0.1µF minimum IN4002 equivalent) 100kHz square wave, duty cycle, 0.8V max., +15.5V 0.5V, -15.5V 0.5V
DYNAMIC CONFIGURATION HS-384RH/390RH/883S NOTES: 1/4W position) 0.01µF minimum (per position) 0.1µF minimum IN4002 equivalent) 100kHz square wave, duty cycle, 0.8V max., +5.5V ±0.5V +15.5V 0.5V, -15.5V 0.5V
Spec Number
518526
Test Circuits
SWITCH TYPE HS-302RH/303RH/384RH/390RH/883S HS-306RH/307RH/883S
+15V LOGIC INPUT V-15V SWITCH OUTPUT LOGIC INPUT SWITCH OUTPUT tOFF
VINH
LOGIC SWITCH VINH
FIGURE SWITCHING TEST CIRCUIT (tON, tOFF)
SWITCH TYPE HS-303RH/390RH/883S HS-307RH/883S
+15V LOGIC INPUT V-15V
VINH
LOGIC SWITCH LOGIC INPUT VINH
SWITCH OUTPUT
tBBM
tBBM
FIGURE BREAK-BEFORE-MAKE TEST CIRCUIT (tBBM)
ID(OFF)
IS(OFF) ±14V
±10V
10mA
FIGURE RESISTANCE TEST CIRCUIT (RON)
10mA ID(ON) ±14V
FIGURE LEAKAGE CURRENT TEST CIRCUIT (IDON)
FIGURE LEAKAGE CURRENT TEST CIRCUIT (ISOFF, IDOFF)
Spec Number
518526
Metallization Topology
DIMENSIONS: Size: 2130 1930µm Thickness: mils METALLIZATION: Type: Back: Gold GLASSIVATION: Type: SiO2 Thickness: WORST CASE CURRENT DENSITY: 1.732e05 A/cm2 SUBSTRATE POTENTIAL: Unbiased PROCESS: Linear Metal Gate CMOS
Metallization Mask Layout
HS-302RH/303RH/306RH/307RH/883S
HS-384RH/390RH/883S
VGND
Spec Number
518526

Radiation Hardened CMOS Analog Switches HS-3XXRH/883S family anal

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