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TOSHIBA Photocoupler GaAAs Ired Photo TLP559 Digital Logic G


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TLP559
TOSHIBA Photocoupler GaAAs Ired Photo
TLP559
Digital Logic Ground Isolation Line Receiver Microprocessor System Interfaces Switching Power Supply Feedback Control Transistor Invertor
Unit
TOSHIBA TLP559 consists GaAAs high-output light emitting diode high speed detector chip photo diode-transistor. This unit 8-lead package. TLP559 internal base connection, faraday shield integrated photodetector chip provides effective common mode noise transient immunity. this suitable application noisy environmental condition. TOSHIBA Weight: 0.54g 11-10C4
Isolation voltage: 2500Vrms (min.) Switching speed: tpHL 0.3µs (typ.) tpLH 0.5µs (typ.) 1.9k) compatible recognized: UL1577, file No.E67349
Configuration (top view)
Shield N.C. Anode Cathode N.C. Emitter Collector N.C.
Schematic
Shield
2002-09-25
TLP559
Maximum Ratings 25°C)
Characteristic Forward current Pulse forward current Peak transient forward current Reverse voltage Diode power dissipation Output current Detector Peak output current Output voltage Supply voltage Output power dissipation Operating temperature range Storage temperature range Lead solder temperature (10s) Isolation voltage (AC, min., R.H. 60%) (Note (Note (Note (Note (Note (Note (Note Symbol IFPT Topr Tstg Tsol Rating -0.5~15 -0.5~15 -55~100 -55~125 2500 Unit Vrms
(Note Derate 0.8mA above 70°C. (Note duty cycle,1ms pulse width. Derate 1.6mA above 70°C. (Note Pulse width 1µs, 300pps. (Note Derate 0.9mW above 70°C. (Note Derate above 70°C. (Note Soldering portion lead: from body devise. (Note Device considered two-terminal device: Pins shorted together pins shorted together.
2002-09-25
TLP559
Electrical Characteristics 25°C)
Characteristic Forward voltage Forward voltage temperature coefficient Reverse current Capacitance between terminal Symbol Detector High level output current High level supply voltage Current transfer ratio Coupled level output voltage Resistance (input-output) Capacotance (input-output) ICCH 16mA 16mA 1MHz 0mA, 5.5V 0mA, 0mA, 15V, 70°C 0mA, 16mA, 4.5V 0.4V 16mA, 4.5V 2.4mA R.H. 60%, 500VDC 1MHz (Note (Note Test Condition Min.
Typ. 1.65 0.01
Max. 1.85
Unit
Switching Characteristics 25°CVCC
Characteristic Propagation delay time Propagation delay time Common mode transient immunity logic high output Common mode transient immunity logic high output Symbol tpHL tpLH 0mA, 400Vp-p 4.1k =16mA, 400Vp-p 4.1k 16mA, 1.9k 2000 10000 Test Circuit Test Condition Min. Typ. Max. Unit
(Note (Note
-2000 -10000
(Note maximum rate fall common mode voltage that sustained with output voltage logic state 0.8V). maximum rate rise common mode voltage that sustained with output voltage logic high state 2.0V). (Note Maximum electrostatic discharge voltage pins: 100V 200pF,
2002-09-25
TLP559
Test Circuit Switching Time Test Circuit
Pulse input PW=100µs Duty ratio=1 monitor Output monitor 1.5V tpHL tpLH 1.5V
Test Circuit Common Mode Noise Immunity Test Circuit
Pulse generator ZO=50
320(V) 320(V) (ms) (ms)
VCC=5V Output monitor (IF=0mA) (IF=16mA)
400V
0.8V
2002-09-25
TLP559
25°C -2.6
Forward voltage temperature coefficient
-2.4
(mA)
0.05 0.03 0.01
-2.2
Forward current
-2.0
-1.8
-1.6
-1.4
Forward voltage
Forward current
(mA)
0.4V 25°C
High level output current (µA)
(mA)
Output current
0.05 0.03
0.01
Ambient temperature
Forward current
(mA)
0.4V
Normalized 25°C 100°C
Current transfer ratio
-25°C
Normalized 16mA 4.5V 0.4V 25°C
Forward current
(mA)
Ambient temperature
2002-09-25
TLP559
30mA 25°C 25mA
(mA)
20mA 15mA
Output voltage
Output current
Ta=25 RL=2k 3.9k
10mA
IF=5mA
Output voltage
Forward current
(mA)
tpHL, tpLH
16mA 25°C
tpLH
Propagation delay time tpLH, tpHL (µs)
tpHL
Load resistance
2002-09-25
TLP559
RESTRICTIONS PRODUCT
000707EBC
TOSHIBA continually working improve quality reliability products. Nevertheless, semiconductor devices general malfunction fail their inherent electrical sensitivity vulnerability physical stress. responsibility buyer, when utilizing TOSHIBA products, comply with standards safety making safe design entire system, avoid situations which malfunction failure such TOSHIBA products could cause loss human life, bodily injury damage property. developing your designs, please ensure that TOSHIBA products used within specified operating ranges forth most recent TOSHIBA products specifications. Also, please keep mind precautions conditions forth "Handling Guide Semiconductor Devices," "TOSHIBA Semiconductor Reliability Handbook" etc. TOSHIBA products listed this document intended usage general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products neither intended warranted usage equipment that requires extraordinarily high quality and/or reliability malfunction failure which cause loss human life bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, types safety devices, etc. Unintended Usage TOSHIBA products listed this document shall made customer's risk. Gallium arsenide (GaAs) substance used products described this document. GaAs dust fumes toxic. break, pulverize product, chemicals dissolve them. When disposing products, follow appropriate regulations. dispose products with other industrial waste with domestic garbage.
products described this document subject foreign exchange foreign trade laws. information contained herein presented only guide applications products. responsibility assumed TOSHIBA CORPORATION infringements intelle MONIT
2002-09-25

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