| The Datasheet Archive - 100 Million Datasheets from 7500 Manufacturers. |
GM71C16100C 16,777,216 WORDS CMOS DYNAMIC Features 16,7
Top Searches for this datasheetGM71C16100C generation dynamic organized 16,777,216 Bit. GM71C16100C realized higher density, higher performance various functions utilizing advanced CMOS process technology. GM71C16100C offers Fast Page Mode high speed access mode. Multiplexed address inputs permit GM71C16100C packaged standard 24(26) SOJ. package size provides high system densities compatible with widely available automated testing insertion equipment. System oriented features include single power supply 5V+/-10% tolerance, direct interfacing capability with high performance logic families such Schottky TTL. GM71C16100C 16,777,216 WORDS CMOS DYNAMIC Features 16,777,216 Words Fast Page Mode Capability Single Power Supply (5V+/-10%) Fast Access Time Cycle Time (Unit: tRAC GM71C16100C-5 GM71C16100C-6 GM71C16100C-7 tCAC Power Active 495/440/385mW (MAX) Standby 11mW (CMOS level MAX) Only Refresh, before Refresh, Hidden Refresh Capability inputs outputs Compatible 4096 Refresh Test function 16-bit parallel test mode Configuration 24(26) Dout (Top View) Semicon A0-A11 A0-A11 GM71C16100C Function Address Inputs Refresh Address Inputs Data Input Address Strobe Column Address Strobe DOUT Function Read/Write Enable Data Output Connection Power (+5V) Ground Ordering Information Type GM71C16100CJ-5 GM71C16100CJ-6 GM71C16100CJ-7 Access Time Package 24(26) Plastic Absolute Maximum Ratings* Symbol TSTG VIN/OUT IOUT Parameter Ambient Temperature under Bias Storage Temperature (Plastic) Voltage Relative Voltage Relative Short Circuit Output Current Power Dissipation Rating -1.0 -1.0 Unit Note: Operation above Absolute Maximum Ratings adversely affect device reliability. Recommended Operating Conditions 70C) Symbol Parameter Supply Voltage Input High Voltage Input Voltage -1.0 Unit Semicon Electrical Characteristics (VCC 5V+/-10%, 70C) Symbol ICC1 Parameter Output Level Output Level Voltage (IOUT -5mA) Output Level Output Level Voltage (IOUT 4.2mA) Operating Current Average Power Supply Operating Current (RAS, Cycling: min) GM71C16100C Unit Note ICC2 Standby Current (TTL) Power Supply Standby Current (RAS, VIH, DOUT High-Z) RAS-Only Refresh Current Average Power Supply Current RAS-Only Refresh Mode (RAS Cycling, VIH, min) Fast Page Mode Current Average Power Supply Current Fast Page Mode (RAS VIL, CAS, Address Cycling: min) Standby Current (CMOS) Power Supply Standby Current (RAS, CAS>=VCC-0.2V, DOUT High-Z) CAS-before-RAS Refresh Current (tRC min) ICC3 ICC4 ICC5 ICC6 ICC7 Standby Current DOUT Enable Input Leakage Current Input (0V<=VIN<=6V) Output Leakage Current (DOUT Disabled, 0V<=VOUT<=6V) IL(I) IL(O) Note: depends output load condition when device selected. ICC(max) specified output open condition. Address changed once less while VIL. Address changed once less while VIH. Semicon Capacitance (VCC 5V+/-10%, 25C) Symbol Parameter Input Capacitance (Address) Input Capacitance (Clocks) Output Capacitance (Data-Out) GM71C16100C Unit Note Note: Capacitance measured with Boonton Meter effective capacitance measuring method. disable DOUT. Characteristics (VCC 5V+/-10%, 70C, Notes Test Conditions Input rise fall times: Input timing reference levels: 0.8V, 2.4V Output timing reference levels: 0.4V, 2.4V Output timing reference levels: 0.4V, 2.4V Output load gate (Including scope jig) Read, Write, Read-Modify-Write Refresh Cycles (Common Parameters) Symbol Parameter Random Read Write Cycle Time Precharge Time Precharge Time Pulse Width Pulse Width Address Time Address Hold Time Column Address Set-up Time Column Address Hold Time Delay Time Column Address Delay Time Hold Time Hold Time Precharge Time Transition Time (Rise Fall) GM71C16100 GM71C16100 GM71C16100 10,000 10,000 Unit Note tRAS tCAS tASR tRAH tASC tCAH tRCD tRAD tRSH tCSH tCRP 10,000 10,000 10,000 10,000 Semicon Read Cycle Symbol Parameter Access Time from Access Time from Access Time from Address Read Command Setup Time Read Command Hold Time Read Command Hold Time Column Address Lead Time Column Address Lead Time Output Low-Z Output Data Hold Time Output Buffer Turn-off Time GM71C16100 GM71C16100 GM71C16100C GM71C16100 Unit Note 6,7,16 7,8,15 7,9,16 tRAC tCAC tRCS tRCH tRRH tRAL tCAL tCLZ tOFF Write Cycle Symbol Parameter Write Command Setup Time Write Command Hold Time Write Command Pulse Width Write Command Lead Time Write Command Lead Time Data-in Setup Time Data-in Hold Time GM71C16100 GM71C16100 GM71C16100 Unit Note tWCS tWCH tRWL tCWL Semicon Read- Modify-Write Cycle Symbol Parameter Read-Modify-Write Cycle Time Delay Time Delay Time Column Address Delay Time GM71C16100 GM71C16100 GM71C16100C GM71C16100 Unit Note tRWC tRWD tCWD tAWD Refresh Cycle Symbol Parameter Setup Time (CAS-before-RAS Refresh Cycle) Hold Time (CAS-before-RAS Refresh Cycle) Setup Time (CAS-before-RAS Refresh Cycle) Hold Time (CAS-before-RAS Refresh Cycle) Precharge Hold Time GM71C16100 GM71C16100 GM71C16100 Unit Note tCSR tCHR tWRP tWRH tRPC Fast Page Mode Cycle Symbol Parameter Fast Page Mode Cycle Time Fast Page Mode Pulse Width Access Time from Precharge Hold Time from Precharge GM71C16100 GM71C16100 GM71C16100 Unit Note 100,000 tRASP tACP tRHCP 100,000 100,000 7,15,16 Semicon Fast Page Mode Read-Modify-Write Cycle Symbol Parameter Fast Page Mode Read-Modify-Write Cycle Time Delay Time from Precharge GM71C16100C GM71C16100 GM71C16100 GM71C16100 Unit Note tPRWC tCPW Test Mode Cycle Symbol Parameter Test Mode Setup Time Test Mode Hold Time GM71C16100 GM71C16100 GM71C16100 Unit Note tWTS tWTH Notes: Measurements assume initial pause 200us required after power followed minimum eight initialization cycles (any combination cycles containing RAS-only refresh CAS-beforeRAS refresh). internal refresh counter used, minimum eight CAS-before-RAS refresh cycles required. Operation with tRCD(max) limit insures that tRAC(max) met, tRCD(max) specified reference point only; tRCD greater than specified tRCD(max) limit, then access time controlled exclusively tCAC. Operation with tRAD(max) limit insures that tRAC(max) met, tRAD(max) specified reference point only; tRAD greater than specified tRAD(max) limit, then access time controlled exclusively tAA. VIH(min) VIL(max) reference levels measuring timing input signals. Also, transition times measured between VIH(min) VIL(max). Assume that tRCD<=tRCD(max) tRAD<=tRAD(max). tRCD tRAD greater than maximum recommended value shown this table, tRAC exceeds value shown. Measured with load circuit equivalent loads Assume that tRCD>=tRCD(max) tRAD<=tRAD(max). Assume that tRCD<=tRCD(max) tRAD>=tRAD(max). Either tRCH tRRH must satisfied read cycles. Semicon GM71C16100C tOFF(max) tOEZ(max) define time which outputs achieve open circuit condition referenced output voltage levels. tWCS, tRWD, tCWD, tAWD tCPW restrictive operating parameters. They included data sheet electrical characteristics only; tWCS>=tWCS(min), cycles early write cycle data will remain open circuit (high impedance) throughout entire cycle; tRWD>=tRWD(min), tCWD>=tCWD(min), tAWD>=tAWD(min), tCWD>=tCWD(min), tAWD>= tAWD(min) tCPW>=tCPW(min), cycle read-modify-write data output will contain data read from selected cell; neither above sets conditions satisfied, condition data access time) indeterminate. These parameters referenced leading edge early write cycles leading edge delayed write read-modify-write cycles. tRASP defines pulse width fast page mode cycles. Access time determined longer tCAC tACP DRAM offers 16-bit time saving parallel test mode. Address CA1, CA10 CA11 don't care during test mode. Test mode performing WE-and-CAS-before-RAS (WCBR) cycle. 16-bit parallel test mode, data written into bits parallel read from Dout. bits equal (all 0s), data output high state during test mode read cycle, then device passed. they equal, data output state, then device failed. Refresh during test mode operation performed normal read cycles WCBR refresh cycles. test mode enter normal operation mode, perform either regular CAS-before-RAS refresh cycle RAS-only refresh cycle. test mode read cycle, value tRAC, tAA, tCAC tACP delayed specified value. These parameters should specified test mode cycles adding above value specified value this data sheet. Semicon Timing Waveforms tRAS GM71C16100C tCSH tRCD tCRP tRSH tCAS tRAD tRAL tCAL tASR ADDRESS tRAH tASC tCAH COLUMN tRRH tRCS tRCH tCAC tRAC tCLZ High-Z DOUT INVALID DOUT DOUT tOFF Don't care FIGURE READ CYCLE Semicon tRAS tRSH tRCD tCSH tCAS tCRP tASR ADDRESS tRAH tASC tCAH COLUMN tWCS tWCH High-Z** DOUT Don't care tWCS tWCS (min) FIGURE EARLY WRITE CYCLE GM71C16100C INVALID care FIGURE DELAYED WRITE CYCLE Semicon GM71C16100C tRWC tRAS tCRP tRCD tCAS tRAD tASR ADDRESS tRAH tASC tCAH COLUMN tRCS tRWD tCWD tAWD tCWL tRWL tCAC tRAC tCLZ DOUT INVALID DOUT DOUT tOFF Don't care FIGURE READ MODIFY WRITE CYCLE Semicon GM71C16100C tRAS tCRP tRPC tCRP tASR ADDRESS tRAH tOFF DOUT INVALID DOUT High-Z Don't care Don't care FIGURE ONLY REFRESH CYCLE Semicon GM71C16100C tRAS tRAS tRPC tCSR tCHR tRPC tCSR tCHR tCRP tWRP tWRH tWRP tWRH ADDRESS tOFF DOUT INVALID DOUT High-Z Don't care FIGURE BEFORE REFRESH CYCLE Semicon tRAS GM71C16100C tRAS tRAS tRCD tRSH tCHR tCRP tRAD tASR ADDRESS tRAL tCAH COLUMN tRAH tASC tWRP tRCS tRRH tCAC tWRH tWRP tWRH tRAC tCLZ DOUT High-Z INVALID DOUT DOUT tOFF Don't care FIGURE HIDDEN REFRESH CYCLE Semicon GM71C16100C tRASP tRHCP tRCD tCSH tCAS tCAS tRSH tCAS tCRP tRAL tRAD tASR ADDRESS tCAL tCAH COLUMN tCAL tASC tCAH tASC tRAH tASC tCAL tCAH COLUMN COLUMN tRCS tRCS tRRH tRCS tRCH tRCH tCAC tRCH tCAC tACP tOFF tOFF DOUT INVALID DOUT tCAC tACP tCLZ DOUT tRAC tCLZ DOUT High-Z INVALID DOUT DOUT tOFF INVALID DOUT Don't care FIGURE FAST PAGE MODE READ CYCLE Semicon GM71C16100C tRASP tRCD tCSH tCAS tCAS tRSH tCAS tCRP tASR ADDRESS tRAH tASC tCAH tASC tCAH tASC tCAH COLUMN COLUMN COLUMN tWCS tWCH tWCS tWCH tWCS tWCH High-Z** DOUT Don't care tWCS tWCS (min) FIGURE FAST PAGE MODE EARLY WRITE CYCLE Semicon GM71C16100C tRASP tRCD tCSH tCAS tCAS tRSH tCAS tCRP tRWL tASR ADDRESS tRAH tASC tCAH tASC tCAH tASC tCAH COLUMN COLUMN COLUMN tRCS tCWL tRCS tCWL tRCS tCWL tCLZ High-Z DOUT tOFF INVALID DOUT tCLZ tOFF INVALID DOUT tCLZ tOFF INVALID DOUT Don't care FIGURE FAST PAGE MODE DELAYED WRITE CYCLE Semicon GM71C16100C tRASP tRCD tPRWC tCAS tCAS tRSH tCAS tCRP tRAD tASR ADDRESS tRAH tASC tCAH COLUMN tASC tCAH tASC tCAH COLUMN COLUMN tRCS tRWD tAWD tCWL tRCS tAWD tRCS tCWL tAWD tCWD tCPW tRWL tCWL tCWD tCWD tCPW tCAC tRAC tCLZ High-Z DOUT INVALID DOUT tOFF DOUT tCAC tOFF DOUT tCAC tACP tCLZ DOUT tACP tCLZ tOFF INVALID DOUT INVALID DOUT Don't care FIGURE FAST PAGE MODE READ MODIFY WRITE CYCLE Semicon GM71C16100C Cycle*** Test Mode Cycle Reset Cycle*,*** Normal Mode RAS-only refresh Don't care Address, Don't care FIGURE TEST MODE CYCLE tRAS tRPC tCSR tCHR tRPC tCRP tWTS tWTH ADDRESS tOFF High-Z DOUT INVALID DOUT Don't care FIGURE TEST MODE CYCLE Semicon Test Mode Reset Cycle GM71C16100C tRAS tCSR tCHR tRPC tCRP tRPC tWRP tWRH ADDRESS tOFF DOUT INVALID DOUT High-Z FIGURE CAS-BEFORE-RAS REFRESH CYCLE Don't care tRAS tCRP tRPC tASR ADDRESS tRAH tOFF DOUT INVALID DOUT High-Z Don't care FIGURE ONLY REFRESH CYCLE Semicon Package Dimension 24(26) GM71C16100C Unit: Inches (mm) 0.025(0.64) 0.305(7.75) 0.295(7.49) 0.329(8.38) 0.340(8.64) 0.260(6.60) 0.275(6.99) 0.085(2.16) 0.661(16.80) 0.669(17.00) 0.128(3.25) 0.147(3.75) 0.050(1.27) 0.015(0.38) 0.020(0.50) 0.026(0.66) 0.032(0.81) Other recent searchesuPD78P058FY - uPD78P058FY uPD78P058FY Datasheet TSD14W - TSD14W TSD14W Datasheet STS14N3LLH5 - STS14N3LLH5 STS14N3LLH5 Datasheet PF658-06 - PF658-06 PF658-06 Datasheet NJM2768 - NJM2768 NJM2768 Datasheet HN7G08FE - HN7G08FE HN7G08FE Datasheet AO4413A - AO4413A AO4413A Datasheet AO4413AL - AO4413AL AO4413AL Datasheet A1252WR-SF-XPD01 - A1252WR-SF-XPD01 A1252WR-SF-XPD01 Datasheet
Privacy Policy | Disclaimer |