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REVISIONS DESCRIPTION Made technical changes Table Editorial changes throughout. Changes accordance with 5962-R268-92. package CDFP4-F16. boilerplate. Figure modified consistent with Table positive supply voltage specifications para. 1.4. DATE (YR-MO-DA) 92-01-27 92-08-04 98-02-04 98-08-12 98-10-20 APPROVED Monica Poelking Monica Poelking Raymond Monnin Raymond Monnin Raymond Monnin
original first page this drawing been replaced.
SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED David Queenan
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED Dicenzo
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216
APPROVED Robert Evans
MICROCIRCUIT, DIGITAL, TTL-TO-ECL
DRAWING APPROVAL DATE 87-11-24
TRANSLATOR, MONOLITHIC SILICON
AMSC
REVISION LEVEL
SIZE SHEET
CAGE CODE
67268
5962-87560
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E019-99
SCOPE Scope. This drawing describes device requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Part Identifying Number (PIN). complete shown following example: 5962-87560 Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3)
1.2.1 Device type(s). device type(s) identify circuit function follows: Device type Generic number 10H524 Circuit function Quad TTL-to-ECL translator
1.2.2 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP1-T16 CDIP2-T16 GDFP2-F16 CDFP3-F16 CDFP4-F16 CQCC1-N20 Terminals Package style Dual -in-line Flat package Flat-package Square chip carrier
1.2.3 Lead finish. lead finish specified MIL-PRF-38535, appendix Absolute maximum ratings. Positive supply voltage range Negative supply voltage range VEE) Total supply voltage range Input voltage range. Storage temperature range. Lead temperature (soldering, seconds). Junction temperature Maximum power dissipation Thermal resistance, junction-to-case (JC). Recommended operating conditions. Positive supply voltage range Negative supply voltage range EE). Case operating temperature range Minimum high level input voltage IH): +25EC. +125EC. -55EC. Maximum level input voltage minimum maximum -5.46 minimum -4.94 maximum -55EC +125EC -0.780 -0.650 -0.840 -1.950 -8.0 -5.2 -65EC +165EC +300EC +165EC MIL-STD-1835
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings (SMD's). Standard Microcircuit Drawings. Test Method Standard Microcircuits. Configuration Management. Interface Standard Microcircuit Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Product built this drawing that produced Qualified Manufacturer Listing (QML) certified qualified manufacturer manufacturer been granted transitional certification MIL-PRF-38535 processed product accordance with manufacturers approved program plan qualifying activity approval accordance with MIL-PRF-38535. This flow documented Quality Management (QM) plan make modifications requirements herein. These modifications shall affect form, fit, function device. These modifications shall affect described herein. "QML" certification mark accordance with MIL-PRF-38535 required identify when flow option used. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535, appendix herein. 3.2.1 Case outlines. case outlines shall accordance with 1.2.2 herein. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Truth table. truth table shall specified figure
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
3.2.4 Logic diagram. logic diagram shall specified figure 3.2.5 Test circuit switching waveforms. test circuit switching waveforms shall specified figure Electrical performance characteristics. Unless otherwise specified herein, electrical performance characteristics specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup described table Marking. Marking shall accordance with MIL-PRF-38535, appendix part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103 (see herein). packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. Certificate compliance. certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see herein). certificate compliance submitted DSCC-VA prior listing approved source supply shall affirm that manufacturer's product meets requirements MIL-PRF-38535, appendix requirements herein. Certificate conformance. certificate conformance required MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change. Notification change DSCC-VA shall required accordance with MIL-PRF-38535, appendix Verification review. DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. QUALITY ASSURANCE PROVISIONS Sampling inspection. Sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. Screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. following additional criteria shall apply: Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. +125EC, minimum. Interim final electrical test parameters shall specified table herein, except interim electrical parameter tests prior burn-in optional discretion manufacturer.
Quality conformance inspection. Quality conformance inspection shall accordance with method 5005 MIL-STD-883 including groups inspections. following additional criteria shall apply.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits
Unit
Cases High level output voltage
Quiescent tests Outputs terminated through VIHT VOLA +5.0 -5.46 +5.0 -5.46 Strobe -1.5 VILT -1.010 -0.860 -1.060 -1.950 -1.950 -1.950 -0.780 -0.650 -0.840 -1.580 -1.565 -1.610 -1.5 -1.010 -0.860 -1.060 -1.950 -1.950 -1.950 -0.780 -0.650 -0.840 -1.580 -1.565 -1.610
level output voltage
+5.0 -5.2
High level threshold output voltage level threshold output voltage Input clamping voltage
VOHA
AIN, BIN,
Input breakdown current
BVIN -5.46 +5.0
Forward bias input current
IINF
+5.0 -4.94
AIN, BIN,
-3.2
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits -12.8
Unit
Cases Forward bias input current IINF
Quiescent tests continued1/ +5.0 -4.94 Strobe
Reverse bias input current
+5.0 -5.46 +5.0 -5.46
AIN, BIN, CIN,
Strobe
Supply current negative
-5.46 +5.0
4.3.1c
Supply current high
ICCH
inputs +5.0 -5.46
Supply current
ICCL
Strobe +5.0 -5.46
Functional tests Cases
rapid tests -1.028 -0.879 -1.079 -1.950 -1.950 -1.950 -0.800 -0.671 -0.861 -1.586 -1.571 -1.616
High level output voltage
Outputs terminated through
level output voltage
+5.0 -5.2
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits
Unit
Cases High level threshold output voltage VOHA
rapid tests continued VIHT Outputs terminated through VOLA +5.0 -5.2 +5.0 -5.46 +5.0 -5.46 Strobe -1.5 VILT -1.028 -0.879 -1.079 -1.950 -1.950 -1.950 -0.800 -0.671 -0.861 -1.586 -1.571 -1.616 -1.5
level threshold output voltage
Input clamping voltage
AIN, BIN,
Input breakdown current Forward bias input current
IINF
BVIN -5.46 +5.0 -4.94 +5.0 -4.94
+5.0 AIN, BIN,
-3.2
Strobe
-12.8
Reverse bias input current
+5.0 -5.46 +5.0 -5.46
AIN, BIN,
Strobe
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits
Unit
Cases Supply current negative
rapid tests Continued -5.46 +5.0 rapid tests VILT -1.034 -0.886 -1.086 -1.950 -1.950 -1.950 -0.806 -0.678 -0.868 -1.588 -1.574 -1.619 -1.034 -0.886 -1.086 -1.950 -1.950 -1.950 -0.806 -0.678 -0.868 -1.588 -1.574 -1.619
Supply current high
ICCH
+5.0 inputs -5.46
Supply current
ICCH
+5.0 Strobe -5.46
Functional tests Case
4.3.1c
High level output voltage
Outputs terminated through
VIHT
level output voltage
+5.0 -5.2
High level threshold output voltage
VOHA
level threshold output voltage
VOLA
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits
Unit
Case Input clamping voltage
rapid tests Continued +5.0 -5.46 +5.0 -5.46 Strobe -1.5 AIN, BIN, -1.5
Input breakdown current
BVIN -5.46 +5.0
Forward bias input current
IINF
+5.0 -4.94 +5.0 -4.94
AIN, BIN,
-3.2
Strobe
-12.8
Reverse bias input current
+5.0 -5.46 +5.0 -5.46
AIN, BIN,
Strobe
Supply current negative
-5.46 +5.0
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C #+125°C unless otherwise specified
Test
Symbol
Group subgroups
Limits
Unit
Case Supply current high ICCH
Rapid tests continued +5.0 inputs -5.46
Supply current
ICCL
+5.0 Strobe -5.46
Functional tests Cases Transition time tTLH tTHL Propagation delay time, input output Propagation delay time, strobe output tPHH1 tPLL1 tPHL1 tPLH1 tPHH2 tPLL2 tPHL2 tPLH2 Functional tests
4.3.1c tests -2.94 +7.0 Load outputs through ground. +2.0 figure
0.45 0.55 0.50 0.50 0.55 0.85 0.55
4.3.1c
quiescent limits determined after device reached thermal equilibrium. This defined reading taken with device socket with LFPM +25° +125° -55° applicable) blowing unit transverse direction with power applied least minutes before reading taken. This method used theoretical limit establishment only. devices shall tested delta (rapid test) conditions specified herein. rapid test method equivalent method testing quiescent conditions. high level output current varies with temperature shall calculated using following formulas: VOH)/100 VOL)/100. rapid test forcing functions limits used testing. These limits determined each device type based power dissipation package type. rapid test (delta limits forcing functions skewed allowing rapid testing performed standard temperatures without addition delta T's. limits, although specified column, shall exceeded magnitude, maximum value.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outlines Terminal number connection
Terminal symbol
BOUT AOUT
DOUT COUT BOUT AOUT
BOUT AOUT
STROBE
STROBE
STROBE
DOUT COUT
DOUT COUT
FIGURE Terminal connections.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Strobe High level level Irrelevant
Input
FIGURE Truth table.
FIGURE Logic diagram.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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5962-87560
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NOTES:
ground located each scope channel input. input output cables scope equal lengths coaxial cable. (test jig) Unused outputs connected resistor ground. Pulse generator characteristics: MHz, (20% 80%), duty cycle 50%. FIGURE Test circuit switching waveforms.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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5962-87560
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TABLE Electrical test requirements. MIL-STD-883 test requirements Subgroups accordance with MIL-STD-883, method 5005, table 7*,9
Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group test requirements (method 5005) Groups end-point electrical parameters (method 5005) applies subgroup
4.3.1 Group inspection. Tests shall specified table herein. Subgroups table method 5005 MIL-STD-883 shall omitted. Subgroup shall include verification truth table specified figure herein.
4.3.2 Groups inspections. End-point electrical parameters shall specified table herein. Steady-state life test conditions, method 1005 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125EC, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535, appendix
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor-prepared specification drawing. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished accordance with MIL-STD-973 using Form 1692, Engineering Change Proposal. Record users. Military industrial users shall inform Defense Supply Center Columbus when system application requires configuration control applicable SMD. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. Comments. Comments this drawing should directed DSCC-VA, Columbus, Ohio 43216-5000, telephone (614) 692-0674. Approved sources supply. Approved sources supply listed MIL-HDBK-103. vendors listed MIL-HDBK103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87560
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 98-10-20 Approved sources supply 5962-87560 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-8756001EA 5962-8756001FA 5962-87560012A 5962-8756001XA
Vendor CAGE number 0EU86 0EU86 0EU86
Vendor similar AS10H524C16/883C 10H524/BFAJC AS10H524EC20/883C AS10H524F16/883C
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. longer available from approved source supply
Vendor CAGE number 0EU86
Vendor name address Austin Semiconductor Inc. 8701 Cross Park Austin, 78754-4566
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
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