Drawing updated reflect current requirements. 03-02-20 MONNI
|
|
|
Top Searches for this datasheet
REVISIONS DESCRIPTION Make change subgroup device class group section specified table IIA. DATE (YR-MO-DA) 99-07-30 APPROVED MONNIN
Drawing updated reflect current requirements.
03-02-20
MONNIN
SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED RICK OFFICER
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED RAJESH PITHADIA
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 http://www.dscc.dla.mil
APPROVED RAYMOND MONNIN
DRAWING APPROVAL DATE 98-10-08
MICROCIRCUIT, LINEAR, RADIATION HARDENED, ULTRA-LOW OFFSET VOLTAGE OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
SIZE SHEET CAGE CODE
AMSC
REVISION LEVEL
67268
5962-98639
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E498-02
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following example: 5962 98639
Federal stock class designator
designator (see 1.2.1)
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number OP07A Circuit function Radiation hardened, single ultra offset operational amplifier
1.2.3 Device class designator. device class designator single letter identifying product assurance level follows: Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator MACY1-X8 GDFP1-F10 CDFP2-F10 GDIP1-T8 CDIP2-T8 CQCC1-N20 Terminals Package style Flat pack Dual-in-line Square leadless chip carrier
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
Absolute maximum ratings. Supply voltage (VS). ±22.0 Input voltage (VIN). ±22.0 Differential input voltage Internal power dissipation (PD) Output short circuit duration Indefinite Lead temperature (soldering, seconds). +300°C Junction temperature (TJ) +150°C Storage temperature range -65°C +150°C Thermal resistance, junction-to-case (JC) MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Cases +150°C/W Case +119°C/W Case +110°C/W Recommended operating conditions. Supply voltage range (VS). ±4.5 Ambient operating temperature range (TA). -55°C +125°C Radiation features. Maximum total dose available (dose rate rads (Si)/s) krads APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings). Standard Microcircuit Drawings. Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. supply voltage less than absolute maximum input voltage equal supply voltage.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outline(s). case outline(s) shall accordance with 1.2.4 herein. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Radiation exposure circuit. radiation exposure circuit shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full ambient operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table IIA. electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-PRF-38535, appendix Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified
Test
Symbol
Group subgroups
Device type
Limits +400 +0.6 +125
Unit
Input offset voltage
M,D,P,L,R Input offset voltage temperature sensitivity Input bias current +IIB
-400 -0.6 -125
µV/°C
Input offset current
M,D,P,L,R
M,D,P,L,R Power supply rejection ratio +PSRR
µV/V
-PSRR
PSRR
±4.5
Common mode rejection ratio
CMRR
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified
Test
Symbol
Group subgroups
Device type
Limits
Unit
Adjustment short circuit current
+VIO -VIO
-0.5
Output short circuit current
+IOS
-IOS
Supply current
M,D,P,L,R 1,2,3
Output voltage swing (minimum)
Open loop voltage gain (single ended)
+AVS
VOUT
-AVS
VOUT
VOUT M,D,P,L,R
Slew rate
+SR,
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified frequency input noise voltage inherent warm-up drift device type testing shall occur sooner than five minutes after application power. Devices supplied this drawing have been characterized through levels irradiation. However, this device only tested level. Post irradiation values identical unless otherwise specified table When performing post irradiation electrical measurements level, +25°C. This parameter tested post irradiation. Continuous short circuit limits considerably less than indicated test limits since maximum power dissipation cannot exceeded. QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein. Enpp
Test
Symbol
Group subgroups
Device type
Limits
Unit
Input noise voltage density
µVPP
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
Device type Case outlines Terminal number
TRIM -INPUT +INPUT OUTPUT TRIM
Terminal symbol TRIM -INPUT +INPUT OUTPUT TRIM
TRIM -INPUT +INPUT OUTPUT TRIM
connection
FIGURE Terminal connections.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
FIGURE Radiation exposure circuit.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
TABLE IIA. Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) 1,2,3,4 1,2,3,4,5,6 1,2,3,4 1,2,3,4,5,6 -Subgroups accordance with MIL-PRF-38535, table III) Device class 1,2,3,4 1,2,3,4,5,6 Device class
applies subgroup table delta measurement parameters.
TABLE IIB. hour burn-in group end-point electrical parameters. +25°C) Parameter +IIB -IIB Device type -135 Limits +135 Delta Units
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4).
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection. Tests shall specified table herein.
Subgroups table method 5005 MIL-STD-883 shall omitted. 4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). levels device classes shall specified MIL-PRF-38535. End-point electrical parameters shall specified table herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall performed accordance with MIL-STD-883 method 1019, condition specified herein. 4.4.4.1.1 Accelerated aging test. Accelerated aging tests shall performed devices requiring level greater than rads(Si). post-anneal end-point electrical parameter limits shall specified table herein shall pre-irradiation end-point electrical parameter limit 25°C ±5°C. Testing shall performed initial qualification after design process changes which affect response device. 4.4.4.2 Dose rate burnout. When required customer test shall performed devices, SEC, approved test structures technology qualifications after design process changes which effect capability process. Dose rate burnout shall performed accordance with test method 1023 MIL-STD-883 specified herein. PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor prepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. Comments. Comments this drawing should directed DSCC-VA Columbus, Ohio 43216-5000, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-98639
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 03-02-20 Approved sources supply 5962-98639 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962R9863901VGA 5962R9863901VHA 5962R9863901VPA 5962R9863901V2A
Vendor CAGE number 24355 24355 24355 24355
Vendor similar OP07AJ/QMLR OP07AL/QMLR OP07AZ/QMLR OP07ARC/QMLR
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed, contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. Vendor CAGE number 24355 Vendor name address Analog Devices Industrial Park P.O. 9106 Norwood, 02062 Point contact: 1500 Space Park Drive P.O. 58020 Santa Clara, 95050-8020
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
Other recent searches
MHL9318N - MHL9318N MHL9318N Datasheet
MC145013 - MC145013 MC145013 Datasheet
MC10125 - MC10125 MC10125 Datasheet
LCX011AM - LCX011AM LCX011AM Datasheet
HVM14S - HVM14S HVM14S Datasheet
D51E6TA7512 - D51E6TA7512 D51E6TA7512 Datasheet
BAT54CWPbF - BAT54CWPbF BAT54CWPbF Datasheet
2SJ668 - 2SJ668 2SJ668 Datasheet
2SD882U-P - 2SD882U-P 2SD882U-P Datasheet
Privacy Policy | Disclaimer
© 2012 Datasheet Archive
