class devices case outline Replace vendor CAGE number 06665 with 24355
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REVISIONS DESCRIPTION Make change 1.3. vendor CAGE numbers 01295 07933. accordance with N.O.R. 5962-R259-92. DATE (YR-MO-DA) 92-09-24 APPROVED FRYE
class devices case outline Replace vendor CAGE number 06665 with 24355. Make change test editorial changes throughout. Redrawn.
97-06-09
MONNIN
Make change dimensions specified case
97-12-17
MONNIN
radiation hardness assurance requirements.
98-06-17
MONNIN
device type with radiation hardness requirements.
98-10-29
MONNIN
Make change table IIB. Drawing updated reflect current requirements. Delete figure make change 3.2.4.
99-02-10 02-08-08
MONNIN MONNIN
ORIGINAL FIRST SHEET THIS DRAWING BEEN REPLACED. SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED JOSEPH KERBY
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED DAVID JOHNSON
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 http://www.dscc.dla.mil
APPROVED MICHAEL FRYE
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
DRAWING APPROVAL DATE 88-04-24
AMSC
REVISION LEVEL
SIZE SHEET
CAGE CODE
67268
5962-87739
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E527-02
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following examples. device classes 5962 Federal stock class designator designator (see 1.2.1) Drawing number device class 5962 Federal stock class designator designator (see 1.2.1) Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number LM139A LM139 Circuit function Quad voltage comparator Quad voltage comparator 87739 Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) 87739 Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish (see 1.2.5)
1.2.3 Device class designator. device class designator single letter identifying product assurance level listed below. Since device class designator been added after original issuance this drawing, device classes designators will included will marked device. Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
1.2.4 Case outlines. case outlines designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP1-T14 CDIP2-T14 GDFP1-F14 CDFP2-F14 GDFP1-G14 CQCC1-N20 Terminals Package style Dual-in-line Flat pack Flat pack with gull wing leads Square leadless chip carrier
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class Absolute maximum ratings. Supply voltage range (VS) Input voltage range -0.3 Input current (VIN -0.3 Maximum power dissipation (PD) Sink current Lead temperature (soldering seconds) Storage temperature range Junction temperature (TJ) approximately 300°C -65°C +150°C 150°C
Thermal resistance, junction-to- case (JC): Cases MIL-STD-1835 Case 23°C/W Recommended operating conditions. Supply voltage (VS) Ambient operating temperature range (TA) -55°C +125°C Radiation features. Maximum total dose available (dose rate rads (Si) Krads (Si) APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation.
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. Derate above 100°C ambient, mW/°C. These parts dose rate sensitive space environment demonstrate enhanced dose rate effects. Radiation point limits noted parameters guaranteed only conditions specified MIL-STD-883, method 1019, condition
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings. Standard Microcircuit Drawings. Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outlines. case outlines shall accordance with 1.2.4 herein. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Logic diagram. logic diagram shall specified figure 3.2.4 Radiation exposure circuit. radiation exposure circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. Electrical performance characteristics post irradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics post irradiation parameter limits specified table shall apply over full ambient operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table IIA. electrical tests each subgroup defined table
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified M,D,P,L,R M,D,P,L,R Input offset current +IIN -IIN with output linear range M,D,P,L,R Input bias current +IIN -IIN with output linear range M,D,P,L,R Input common-mode voltage range Voltage gain VICR
Test
Symbol
Group subgroups 1,2,3
Device type
Limits ±2.0 ±4.0 ±3.0
Unit
Input offset voltage
±5.0 ±9.0 ±6.0
±100
±100 ±300 ±100
V/mV
Output sink current
ISINK
-VIN +VIN +25°C
Saturation voltage
VSAT
-VIN +VIN ISINK -VIN +VIN M,D,P,L,R
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified +VIN -VIN M,D,P,L,R Supply current M,D,P,L,R Input voltage common mode rejection ratio Power supply rejection ratio Response time CMRR PSRR tRLH input step, +25°C tRHL overdrive, +25°C Devices supplied this drawing have been characterized through levels irradiation. However, this device only tested level. Post irradiation values identical unless otherwise specified table When performing post irradiation electrical measurements level, +25°C. These parts dose rate sensitive space environment demonstrate enhanced dose rate effects. Radiation point limits noted parameters guaranteed only conditions specified MIL-STD-883, method 1019, condition This parameter tested post irradiation. Guaranteed, tested, limits specified table herein. 1,2,3 1,2,3
Test
Symbol
Group subgroups 1,2,3
Device type
Limits
Unit
Output leakage current
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
Device types Case outlines Terminal number
Terminal symbol OUTPUT OUTPUT -INPUT +INPUT -INPUT +INPUT -INPUT +INPUT -INPUT +INPUT OUTPUT OUTPUT OUTPUT OUTPUT -INPUT +INPUT -INPUT +INPUT -INPUT +INPUT -INPUT +INPUT OUTPUT OUTPUT
connection
FIGURE Terminal connections.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
FIGURE Logic diagram.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
FIGURE Radiation exposure circuit.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-PRF-38535, appendix Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
TABLE IIA. Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) 1,2,3,4,5,6,9 1,2,3,4,5,6,9 1,2,3 1,2,3 1,2,3,4, 5,6,9 1,2,3,4,5,6,9 1,2,3 1,2,3 -Subgroups accordance with MIL-PRF-38535, table III) Device class 1,2,3, 4,5,6,9 1,2,3,4,5,6,9 1,2,3 1,2,3 Device class
applies subgroup Delta limits specified table shall required where specified, delta limits shall computed with reference previous interim electrical parameters. TABLE IIB. hours group operating life deltas. Test Symbol Device types Input offset voltage Input bias current -100 Limits Delta ±1.5 ±2.0 Units
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection. Tests shall specified table herein. Subgroups table method 5005 MIL-STD-883 shall omitted.
4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). levels device classes shall specified MIL-PRF-38535. End-point electrical parameters shall specified table herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall performed accordance with MIL-STD-883 method 1019, condition specified herein. 4.4.4.1.1 Accelerated aging test. Accelerated aging tests shall performed devices requiring level greater than rads(Si). post-anneal end-point electrical parameter limits shall specified table herein shall pre-irradiation end-point electrical parameter limit 25°C ±5°C. Testing shall performed initial qualification after design process changes which affect response device. 4.4.4.2 Dose rate burnout. When required customer test shall performed devices, SEC, approved test structures technology qualifications after design process changes which effect capability process. Dose rate burnout shall performed accordance with test method 1023 MIL-STD-883 specified herein. PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor-prepared specification drawing. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. Comments. Comments this drawing should directed DSCC-VA, Columbus, Ohio 43216-5000, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-87739
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 02-08-08 Approved sources supply 5962-87739 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-8773901CA
Vendor CAGE number 01295 27014
Vendor similar LM139AJB LM139AJ-SMD LM139AD/883 PM-139AY/883 LM139AWB LM139AW-SMD LM139AWG-SMD LM139AFKB LM139AE-SMD PM-139ARC/883 PM139AY/QMLV PM139AM/QMLV PM139ARC/QMLV
5962-8773901DA
01295 27014
5962-8773901XA 5962-87739012A
27014 01295 27014
5962-8773901VCA 5962-8773901VDA 5962-8773901V2A
24355 24355 24355
STANDARD MICROCIRCUIT DRAWING BULLETIN CONTINUED
Standard microcircuit drawing 5962R8773901VCA 5962R8773901VDA 5962R8773901V2A 5962R8773902VCA 5962R8773902VDA 5962R8773902V2A
Vendor CAGE number 24355 24355 24355 24355 24355 24355
Vendor similar PM139AY/QMLR PM139AM/QMLR PM139ARC/QMLR PM139Y/QMLR PM139M/QMLR PM139RC/QMLR
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from approved source supply. Vendor CAGE number 01295 Vendor name address Texas Instruments, Incorporated Semiconductor Group 8505 Forest Lane P.O. 660199 Dallas, 75243 Point contact: U.S. Highway South P.O. Sherman, 75090-9493 Analog Devices, Incorporated Route Industrial Park 9106 Norwood, 02062 Point contact: 1500 Space Park Drive P.O. 58020 Santa Clara, 95050-8020 National Semiconductor Corporation 2900 Semiconductor Drive P.O. 58090 Santa Clara, 95052-8090
24355
27014
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
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