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SYNCHRONOUS DRAM MODULE 168-pin, dual in-line memory module (DIMM
Top Searches for this datasheet128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM SYNCHRONOUS DRAM MODULE 168-pin, dual in-line memory module (DIMM) PC100- PC133-compliant Utilizes SDRAM components Unbuffered 128MB 256MB Single +3.3V power supply Fully synchronous; signals registered positive edge system clock Internal pipelined operation; column address changed every clock cycle Internal SDRAM banks hiding access/ precharge Programmable burst lengths: full page Auto Precharge, includes CONCURRENT AUTO PRECHARGE Auto Refresh Modes Self Refresh Mode: 64ms, 4,096-cycle refresh (15.625µs refresh interval) LVTTL-compatible inputs outputs Serial Presence-Detect (SPD) Gold edge contacts MT8LSDT1664A 128MB MT16LSDT3264A 256MB latest data sheet, please refer Micron® site: www.micron.com/products/modules Figure 168-Pin DIMM (MO-161) Standard 1.375in. (34.93mm) Profile 1.125in. (28.58mm) Options Package 168-pin DIMM (standard) 168-pin DIMM (lead-free) Frequency/CAS Latency MHz/CL MHz/CL MHz/CL Standard 1.375in. (34.93mm) Low-Profile 1.125in. (28.58mm)1 NOTE: Marking -13E -133 -10E Table Timing Parameters SETUP TIME HOLD TIME (READ) latency ACCESS TIME MODULE CLOCK MARKING FREQUENCY -13E -133 -10E 5.4ns 5.4ns 7.5ns Contact Micron product availability. Table Address Table 128MB 256MB (BA0, BA1) 128Mb (A0-A11) (A0-A9) (S0#, S2#; S1#, S3#) (BA0, BA1) 128Mb (A0-A11) (A0-A9) (S0#, S2#) Refresh Count Device Banks Device Configuration Addressing Column Addressing Module Ranks 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 ©2003, 2004 Micron Technology, Inc. rights reserved. PRODUCTS SPECIFICATIONS DISCUSSED HEREIN SUBJECT CHANGE MICRON WITHOUT NOTICE. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Part Numbers PART NUMBER MT8LSDT1664AG-13E_ MT8LSDT1664AY-13E_ MT8LSDT1664AG-133_ MT8LSDT1664AY-133_ MT8LSDT1664AG-10E_ MT8LSDT1664AY-10E_ MT16LSDT3264AG-13E_ MT16LSDT3264AY-13E_ MT16LSDT3264AG-133_ MT16LSDT3264AY-133_ MT16LSDT3264AG-10E_ MT16LSDT3264AY-10E_ NOTE: MODULE DENSITY 128MB 128MB 128MB 128MB 128MB 128MB 256MB 256MB 256MB 256MB 256MB 256MB CONFIGURATION SYSTEM SPEED designators component revision last characters each part number Consult factory current revision codes. Example: MT16LSDT3264AG-133B1. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Assignment (168-Pin DIMM Front) DQMB0 DQMB1 DQMB2 DQMB3 DQ16 DQ17 DQ18 DQ19 DQ20 CKE1 DQ21 DQ22 DQ23 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 Table Assignment (168-Pin DIMM Back) CKE0 DQMB6 DQMB7 CAS# DQMB4 DQMB5 RAS# DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 SYMBOL SYMBOL SYMBOL SYMBOL DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 SYMBOL SYMBOL SYMBOL SYMBOL DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 Figure 168-Pin DIMM Locations Front View Back View (Populated only 256MB module) Indicates Indicates 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Figure Functional Block Diagram 128MB DQMB0 DQMB1 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQMB2 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 DQMB3 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 RAS# CAS# CKE0 A0-A11 DQMB6 DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 DQMB7 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 DQMB4 DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 DQMB5 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 RAS#: SDRAMs CAS#: SDRAMs CKE0: SDRAMs WE#: SDRAMs A0-A11: SDRAMs BA0: SDRAMs BA1: SDRAMs 3.3pF CK1, 10pF SDRAMs SDRAMs NOTE: resistor values unless otherwise specified. industry standard, Micron modules utilize various component speed grades, referenced module part numbering guide www.micron.com/numberguide. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Standard modules following SDRAM devices: MT46LC16M8A2TG Lead-free modules following SDRAM devices: MT46LC16M8A2P Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Figure Functional Block Diagram 256MB DQMB0 DQMB1 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQMB2 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 DQMB3 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 DQMB4 DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 DQMB5 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 DQMB6 DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 DQMB7 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 CKE1 CKE0 CAS# RAS# A0-A11 CKE: SDRAMs U11-U14; U16-U19 CKE: SDRAMs U1-U4; U6-U9 CAS#: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 RAS#: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 WE#: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 A0-A11: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 BA0: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 BA1: SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 SDRAMs U1-U4; U6-U9; U11-U14; U16-U19 3.3pF 3.3pF NOTE: resistor values unless otherwise specified. industry standard, Micron modules utilize various component speed grades, referenced module part numbering guide www.micron.com/numberguide. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Standard modules following SDRAM devices: MT46LC16M8A2TG Lead-free modules following SDRAM devices: MT46LC16M8A2P Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Descriptions SYMBOL RAS#, CAS#, CK0-CK3 TYPE Input DESCRIPTION Command Inputs: RAS#, CAS#, (along with define command being entered. Clock: driven system clock. SDRAM input signals sampled positive edge also increments internal burst counter controls output registers. Clock Enable: CKE0 activate (HIGH) deactivate (LOW) signal. Deactivating clock provides PRECHARGE POWER-DOWN SELF REFRESH operation (all device banks idle), ACTIVE POWER-DOWN (row ACTIVE device bank) CLOCK SUSPEND operation (burst access progress). synchronous except after device enters power-down self refresh modes, where becomes asynchronous until after exiting same mode. input buffers, including disabled during power-down self refresh modes, providing standby power. Chip Select: enables (registered LOW) disables (registered HIGH) command decoder. commands masked when registered HIGH. considered part command code. Input/Output Mask: DQMB input mask signal write accesses output enable signal read accesses. Input data masked when DQMB sampled HIGH during WRITE cycle. output buffers placed High-Z state (two-clock latency) when DQMB sampled HIGH during READ cycle. Bank Address: define which device bank ACTIVE, READ, WRITE, PRECHARGE command being applied. Address Inputs: Provide address ACTIVE commands, column address auto precharge (A10) READ/WRITE commands, select location memory array respective device bank. sampled during PRECHARGE command determines whether PRECHARGE applies once device bank (A10 LOW, device bank selected BA0, BA1) device banks (A10 HIGH). address inputs also provide op-code during MODE REGISTER command. Serial Clock Presence-Detect: used synchronize presence-detect data transfer from module. Presence-Detect Address Inputs: These pins used configure presencedetect device. Data I/O: Data bus. numbers correlate with symbols; refer Assignment tables page more information NUMBERS 115, 125, Input CKE0, CKE1 Input 114, S0#-S3# Input 28-29, 46-47, 112- DQMB0- 113, 130-131 DQMB7 Input 117, 118, 119, 120, 121, BA0, A0-A11 Input Input 165-167 2-5, 7-11, 13-17, 19-20, 55-58, 65-67, 69-72, 86-89, 91-95, 97-101, 103-104, 139-142, 144, 149-151, 153-156, 158-161 SA0-SA2 DQ0- DQ63 Input Input Input/ Output Input/ Output Supply 102, 110, 124, 133, 143, 157, Serial Presence-Detect Data: bidirectional used transfer addresses data into data presence-detect portion module. Power Supply: +3.3V ±0.3V. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Descriptions SYMBOL TYPE Supply Ground. DESCRIPTION numbers correlate with symbols; refer Assignment tables page more information NUMBERS 107, 116, 127, 138, 148, 152, 50-53, 105, 106, 108, 109, 126, 132, 134-137, 145-147, Connected: These pins connected this module. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM General Description MT8LSDT1664A MT16LSDT3264A high-speed CMOS, dynamic random-access, 128MB 256MB memory modules organized configuration. These modules internally configured quad-bank SDRAMs with synchronous interface (all signals registered positive edge clock signals CK). Read write accesses SDRAM modules burst oriented; accesses start selected location continue programmed number locations programmed sequence. Accesses begin with registration ACTIVE command, which then followed READ WRITE command. address bits registered coincident with ACTIVE command used select device bank accessed (BA0, select device bank, A0-A11 select device row). address bits registered coincident with READ WRITE command used select starting column location burst access. modules provide programmable READ WRITE burst lengths locations, full page, with burst terminate option. AUTO PRECHARGE function enabled provide selftimed precharge that initiated burst sequence. SDRAM modules internal pipelined architecture achieve high-speed operation. This architecture compatible with rule prefetch architectures, also allows column address changed every clock cycle achieve highspeed, fully random access. Precharging device bank while accessing other three device banks will hide precharge cycles provide seamless, high-speed, random-access operation. SDRAM modules designed operate 3.3V, low-power memory systems. auto refresh mode provided, along with power-saving, power-down mode. inputs outputs LVTTL-compatible. SDRAM modules offer substantial advances DRAM operating performance, including ability synchronously burst data high data rate with automatic column-address generation, ability interleave between internal banks order hide precharge time capability randomly change column addresses each clock cycle during burst access. more information regarding SDRAM operation, refer 128Mb SDRAM component data sheets. Serial Presence-Detect Operation SDRAM modules incorporate serial presence-detect (SPD). function implemented using 2,048-bit EEPROM. This nonvolatile storage device contains bytes. first bytes programmed Micron identify module type various SDRAM organizations timing parameters. remaining bytes storage available customer. System READ/WRITE operations between master (system logic) slave EEPROM device (DIMM) occur standard using DIMM's (clock) (data) signals, together with (2:0), which provide eight unique DIMM/EEPROM addresses. Initialization SDRAMs must powered initialized predefined manner. Operational procedures other than those specified result undefined operation. Once power applied VDDQ (simultaneously) clock stable (stable clock defined signal cycling within timing constraints specified clock pin), SDRAM requires 100µs delay prior issuing command other than COMMAND INHIBIT Starting some point during this 100µs period continuing least through this period, Command Inhibit commands should applied. Once 100µs delay been satisfied with least Command Inhibit command having been applied, PRECHARGE command should applied. device banks must then precharged, thereby placing device banks idle state. Once idle state, AUTO refresh cycles must performed. After AUTO refresh cycles complete, SDRAM ready mode register programming. Because mode register will power unknown state, should loaded prior applying operational command. Mode Register Definition mode register used define specific mode operation SDRAM. This definition includes selection burst length, burst type, latency, operating mode write burst mode, shown Mode Register Definition Diagram. mode register programmed LOAD MODE REGISTER command will retain stored information until programmed again device loses power. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Mode register bits M0-M2 specify burst length, specifies type burst (sequential interleaved), M4-M6 specify latency, specify operating mode, specifies write burst mode, reserved future use. mode register must loaded when device banks idle, controller must wait specified time before initiating subsequent operation. Violating either these requirements will result unspecified operation. ordering accesses within burst determined burst length, burst type starting column address, shown Table Figure Mode Register Definition Diagram Address Mode Register (Mx) Reserved* Mode Latency Burst Length Burst Length Read write accesses SDRAM burst oriented, with burst length being programmable, shown Mode Register Definition Diagram. burst length determines maximum number column locations that accessed given READ WRITE command. Burst lengths locations available both sequential interleaved burst types, full-page burst available sequential type. full-page burst used conjunction with BURST TERMINATE command generate arbitrary burst lengths. Reserved states should used, unknown operation incompatibility with future versions result. When READ WRITE command issued, block columns equal burst length effectively selected. accesses that burst take place within this block, meaning that burst will wrap within block boundary reached, shown Burst Definition Table. block uniquely selected when burst length two; A2-A9 when burst length four; A3-A9 when burst length eight. remaining (least significant) address bit(s) (are) used select starting location within block. Full-page bursts wrap within page boundary reached, shown Table *Should program M11, ensure compatibility with future devices. Burst Length Reserved Reserved Reserved Full Page Reserved Reserved Reserved Reserved Burst Type Sequential Interleaved Latency Reserved Reserved Reserved Reserved Reserved Reserved M6-M0 Defined Operating Mode Standard Operation other states reserved Burst Type Accesses within given burst programmed either sequential interleaved; this referred burst type selected Write Burst Mode Programmed Burst Length Single Location Access 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Burst Definition ORDER ACCESSES WITHIN BURST ADDRESS BURST LENGTH STARTING COLUMN TYPE SEQUENTIAL 0-1-2-3 1-2-3-0 2-3-0-1 3-0-1-2 0-1-2-3-4-5-6-7 1-2-3-4-5-6-7-0 2-3-4-5-6-7-0-1 3-4-5-6-7-0-1-2 4-5-6-7-0-1-2-3 5-6-7-0-1-2-3-4 6-7-0-1-2-3-4-5 7-0-1-2-3-4-5-6 TYPE INTERLEAVED 0-1-2-3 1-0-3-2 2-3-0-1 3-2-1-0 0-1-2-3-4-5-6-7 1-0-3-2-5-4-7-6 2-3-0-1-6-7-4-5 3-2-1-0-7-6-5-4 4-5-6-7-0-1-2-3 5-4-7-6-1-0-3-2 6-7-4-5-2-3-0-1 7-6-5-4-3-2-1-0 Supported Figure Latency Diagram COMMAND READ DOUT Full Page A0-A9 (location 0-y) Latency COMMAND READ DOUT Latency DON'T CARE UNDEFINED Latency latency delay, clock cycles, between registration READ command availability first piece output data. latency three clocks. READ command registered clock edge latency clocks, data will available clock edge will start driving result clock edge cycle earlier provided that relevant access times met, data will valid clock edge example, assuming that clock cycle time such that relevant access times met, read command registered latency programmed clocks, will start driving after data will valid shown Latency Diagram. Latency Table indicates operating frequencies which each latency setting used. NOTE: full-page accesses: 1,024. burst length two, A1-A9 select block-oftwo burst; selects starting column within block. burst length four,A2-A9 select block-offour burst; A0-A1 select starting column within block. burst length eight, A3-A9 select block-ofeight burst; A0-A2 select starting column within block. full-page burst, full selected A0-A9 select starting column. Whenever boundary block reached within given sequence above, following access wraps within block. burst length one, A0-A9 select unique column accessed, mode register ignored. Operating Mode normal operating mode selected setting zero; other combinations values reserved future and/or test modes. programmed burst length applies both read write bursts. Reserved states should used unknown operation incompatibility with future versions result. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Test modes reserved states should used because unknown operation incompatibility with future versions result. Table Latency Table ALLOWABLE OPERATING CLOCK FREQUENCY (MHZ) Write Burst Mode When burst length programmed M0M2 applies both read write bursts; when programmed burst length applies read bursts, write accesses single-location (nonburst) accesses. SPEED -13E -133 -10E LATENCY LATENCY 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Commands Table SDRAM Commands DQMB Operation Truth Table provides quick reference available commands. This followed written description each command. more detailed description commands operations refer 128Mb component data sheets. Table SDRAM Commands DQMB Operation Truth Table NAME (FUNCTION) RAS# CAS# DQMB L/H8 L/H8 ADDR NOTES HIGH commands shown except SELF REFRESH COMMAND INHIBIT (NOP) OPERATION (NOP) ACTIVE (Select bank activate row) READ (Select bank column, start READ burst) WRITE (Select bank column, start WRITE burst) BURST TERMINATE PRECHARGE (Deactivate bank banks) AUTO refresh Self Refresh (Enter self refresh mode) LOAD MODE REGISTER Write Enable/Output Enable NOTE: Bank/Row Bank/Col Bank/Col Valid Active Code Op-code Active A0-A11provide device address, BA0, determine which device bank made active. A0-A9 provide device column address; HIGH enables auto precharge feature (nonpersistent), while disables auto precharge feature; BA0, determine which device bank being read from written LOW: BA0, determine which device bank being precharged. HIGH: device banks precharged BA0, "Don't Care." This command AUTO REFRESH HIGH, SELF REFRESH LOW. Internal refresh counter controls addressing; inputs I/Os "Don't Care" except CKE. A0-A11 define op-code written mode register. Activates deactivates during WRITEs (zero-clock delay) READs (two-clock delay). 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Absolute Maximum Ratings Stresses greater than those listed cause permanent damage device. This stress rating only, functional operation device these other conditions above those indicated operaVoltage VDD, VDDQ Supply Relative +4.6V Voltage Inputs, Pins Relative +4.6V tional sections this specification implied. Exposure absolute maximum rating conditions extended periods affect reliability. Operating Temperature TOPR (Commercial ambient) +65°C Storage Temperature (plastic) -55°C +150°C Table Electrical Characteristics Operating Conditions 128MB Notes: notes appear page VDD, VDDQ +3.3V ±0.3V PARAMETER/CONDITION SUPPLY VOLTAGE INPUT HIGH VOLTAGE: Logic inputs INPUT VOLTAGE: Logic inputs INPUT LEAKAGE CURRENT: input (All other pins under test OUTPUT LEAKAGE CURRENT: pins disabled; VOUT VDDQ OUTPUT LEVELS: Output High Voltage (IOUT -4mA) Output Voltage (IOUT 4mA) SYMBOL VDD, VDDQ Command Address Inputs, DQMB -0.3 UNITS NOTES Table Electrical Characteristics Operating Conditions 256MB Notes: notes appear page VDD, VDDQ +3.3V ±0.3V PARAMETER/CONDITION SUPPLY VOLTAGE INPUT HIGH VOLTAGE: Logic inputs INPUT VOLTAGE: Logic inputs INPUT LEAKAGE CURRENT: input (All other pins under test OUTPUT LEAKAGE CURRENT: pins disabled; VOUT VDDQ OUTPUT LEVELS: Output High Voltage (IOUT -4mA) Output Voltage (IOUT 4mA) SYMBOL VDD, VDDQ Command Address Inputs, DQMB -0.3 UNITS NOTES 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Specifications Conditions 128MB Notes: notes appear page VDD, VDDQ +3.3V ±0.3V; SDRAM components only PARAMETER/CONDITION OPERATING CURRENT: Active Mode; Burst READ WRITE; (MIN) STANDBY CURRENT: Power-Down Mode; device device banks idle; STANDBY CURRENT: Active Mode; HIGH; HIGH; device banks active after tRCD met; accesses progress OPERATING CURRENT: Burst Mode; Continuous burst; READ WRITE; device banks active tRFC tRFC (MIN) AUTO REFRESH CURRENT HIGH; HIGH 15.625µs SELF REFRESH CURRENT: 0.2V SYMBOL IDD1 IDD2 IDD3 -13E 1,280 -133 1,200 -10E 1,120 UNITS NOTES IDD4 IDD5 IDD6 IDD7 1,320 2,640 1,280 2,480 1,200 2,160 Table Specifications Conditions 256MB Notes: notes appear page VDD, VDDQ +3.3V ±0.3V; SDRAM components only PARAMETER/CONDITION OPERATING CURRENT: Active Mode; Burst READ WRITE; (MIN) STANDBY CURRENT: Power-Down Mode; device banks idle; STANDBY CURRENT: Active Mode; HIGH; HIGH; device banks active after tRCD met; accesses progress OPERATING CURRENT: Burst Mode; Continuous burst; READ WRITE; device banks active tRFC tRFC (MIN) AUTO REFRESH CURRENT tRFC 15.625µs HIGH; HIGH SELF REFRESH CURRENT: 0.2V SYMBOL IDD1a IDD2b IDD3a -13E 1,296 -133 1,216 -10E 1,136 UNITS NOTES IDD4a IDD5b IDD6b IDD7b 1,336 5,280 1,216 4,960 1,136 4,320 Value calculated module rank this operating condition, otherranks Power-Down Mode. Value calculated reflects module ranks this operating condition. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Capacitance 128MB PARAMETER Input Capacitance: Command Address Input Capacitance: Input Capacitance: Input Capacitance: Input Capacitance: DQMB Input/Output Capacitance: SYMBOL 13.3 30.4 17.3 15.2 30.4 UNITS Table Capacitance 256MB PARAMETER Input Capacitance: Command Address Input Capacitance: Input Capacitance: Input Capacitance: Input Capacitance: DQMB Input/Output Capacitance: SYMBOL 13.3 60.8 17.3 15.2 30.4 UNITS 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Electrical Characteristics Recommended Operating Conditions Notes: 5-9, notes appear page module timing parameters comply with PC100 PC133 design specs, based component parameters CHARACTERISTICS PARAMETER Access time from (pos. edge) Address hold time Address setup time high-level width low-level width Clock cycle time SYMBOL -13E -133 -10E UNITS NOTES hold time setup time CS#, RAS#, CAS#, WE#, hold time CS#, RAS#, CAS#, WE#, setup time Data-in hold time Data-in setup time Data-out high-impedance time Data-out low-impedance time Data-out hold time (load) Data-out hold time load) ACTIVE PRECHARGE command ACTIVE ACTIVE command period ACTIVE READ WRITE delay Refresh period (8,192 rows) AUTO REFRESH period PRECHARGE command period ACTIVE bank ACTIVE bank command Transition time Write recovery time AC(3) tAC(2) tCK(3) CK(2) tCKH tCKS tCMH tCMS tHZ(3) tHZ(2) tOHN tRAS tRCD tREF tRFC 120,000 120,000 120,000 Exit self refresh ACTIVE command tXSR 7.5ns 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Functional Characteristics (Notes: notes appear following parameter tables) PARAMETER READ/WRITE command READ/WRITE command clock disable power-down entry mode clock enable power-down exit setup mode input data delay data mask during WRITEs data high-impedance during READs WRITE command input data delay Data-in ACTIVE command Data-in precharge command Last data-in burst stop command Last data-in READ/WRITE command Last data-in precharge command LOAD MODE REGISTER command ACTIVE REFRESH command Data-out high-impedance from precharge command SYMBOL -13E -133 -10E UNITS NOTES CKED tPED tDQM tDPL tRDL tMRD tROH(3) tROH(2) 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Notes voltages referenced Vss. This parameter sampled. VDD, VDDQ +3.3V; MHz, 25°C; under test biased 1.4V. dependent output loading cycle rates. Specified values obtained with minimum cycle time outputs open. Enables on-chip refresh address counters. minimum specifications used only indicate cycle time which proper operation over full temperature range ensured (0°C +70°C). initial pause 100µs required after powerup, followed AUTO Refresh commands, before proper device operation ensured. (VDD VDDQ must powered simultaneously. VssQ must same potential.) AUTO Refresh command wake-ups should repeated time tREF refresh requirement exceeded. characteristics assume 1ns. addition meeting transition rate specification, clock must transit between between VIH) monotonic manner. Outputs measured 1.5V with equivalent load: 50pF defines time which output achieves open circuit condition; reference VOL. last valid data element will meet before going High-Z. timing tests have with timing referenced 1.5V crossover point. input transition time longer than then timing referenced (MAX) (MIN) longer 1.5V crossover point. Other input signals allowed transition more than once every clocks otherwise valid levels. specifications tested after device properly initialized. Timing actually specified tCKS; clock(s) specified reference only minimum cycle rate. Timing actually specified plus tRP; clock(s) specified reference only minimum cycle rate. Timing actually specified tWR. Required clocks specified JEDEC functionality dependent timing parameter. current will increase decrease proportionally according amount frequency alteration test condition. Address transitions average transition every clocks. must toggled minimum times during this period. Based 10ns -10E, 7.5ns -13E. overshoot: (MAX) VDDQ pulse width 3ns, pulse width cannot greater than third cycle rate. undershoot: (MIN) pulse width 3ns. clock frequency must remain constant (stable clock defined signal cycling within timing constraints specified clock pin) during access precharge states (READ, WRITE, including tWR, PRECHARGE commands). used reduce data rate. Auto precharge mode only. precharge timing budget (tRP) begins -13E; 7.5ns -133 -10E after first clock delay, after last WRITE executed. exceed limit precharge mode. Precharge mode only. JEDEC PC100 specify three clocks. -133/-13E with load 4.6ns guaranteed design. Parameter guaranteed design. -10E, 10ns; -133, 7.5ns; -13E, 7.5ns. HIGH during refresh command period (MIN) else LOW. Idd6 limit actually nominal value does result fail value. value tRAS used -13E speed grade module SPDs calculated from 45ns. Refer device data sheet timing waveforms. Leakage number reflects worst case leakage possible through module pin, what each memory device contributes. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Clock Data Conventions Data states line change only during LOW. state changes during HIGH reserved indicating start stop conditions shown Figure Data Validity, Figure Definition Start Stop). Acknowledge Acknowledge software convention used indicate successful data transfers. transmitting device, either master slave, will release after transmitting eight bits. During ninth clock cycle, receiver will pull line acknowledge that received eight bits data shown Figure Acknowledge Response From Receiver). device will always respond with acknowledge after recognition start condition slave address. both device WRITE operation have been selected, device will respond with acknowledge after receipt each subsequent eight-bit word. read mode device will transmit eight bits data, release line monitor line acknowledge. acknowledge detected stop condition generated master, slave will continue transmit data. acknowledge detected, slave will terminate further data transmissions await stop condition return standby power mode. Start Condition commands preceded start condition, which HIGH-to-LOW transition when HIGH. device continuously monitors lines start condition will respond command until this condition been met. Stop Condition communications terminated stop condition, which LOW-to-HIGH transition when HIGH. stop condition also used place device into standby power mode. Figure Data Validity Figure Definition Start Stop DATA STABLE DATA CHANGE DATA STABLE START STOP Figure Acknowledge Response From Receiver from Master Data Output from Transmitter Data Output from Receiver Acknowledge 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table EEPROM Device Select Code Most significant (b7) sent first SELECT CODE Memory Area Select Code (two arrays) Protection Register Select Code DEVICE TYPE IDENTIFIER CHIP ENABLE Table EEPROM Operating Modes MODE Current Address Read Random Address Read Sequential Read Byte Write Page Write BYTES INITIAL SEQUENCE START, Device Select, START, Device Select, "0", Address reSTART, Device Select, Similar Current Random Address Read START, Device Select, START, Device Select, Figure EEPROM Timing Diagram HIGH SU:STA HD:STA HD:DAT SU:DAT SU:STO UNDEFINED 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Serial Presence-Detect EEPROM Operating Conditions voltages referenced VSS; VDDSPD +2.3V +3.6V PARAMETER/CONDITION SUPPLY VOLTAGE INPUT HIGH VOLTAGE: Logic inputs INPUT VOLTAGE: Logic inputs OUTPUT VOLTAGE: IOUT INPUT LEAKAGE CURRENT: OUTPUT LEAKAGE CURRENT: VOUT STANDBY CURRENT: 0.3V; other inputs POWER SUPPLY CURRENT: clock frequency SYMBOL VDDSPD UNITS VDDSPD VDDSPD VDDSPD Table Serial Presence-Detect EEPROM Operating Conditions voltages referenced VSS; VDDSPD +2.3V +3.6V PARAMETER/CONDITION data-out valid Time must free before transition start Data-out hold time fall time Data-in hold time Start condition hold time Clock HIGH period Noise suppression time constant SCL, inputs Clock period rise time clock frequency Data-in setup time Start condition setup time Stop condition setup time WRITE cycle time NOTE: SYMBOL tBUF tHD:DAT tHD:STA tHIGH tLOW fSCL tSU:DAT tSU:STA tSU:STO tWRC UNITS NOTES avoid spurious START STOP conditions, minimum delay placed between falling rising edge SDA. This parameter sampled. reSTART condition, following WRITE cycle. EEPROM WRITE cycle time (tWRC) time from valid stop condition write sequence EEPROM internal erase/program cycle. During WRITE cycle, EEPROM interface circuit disabled, remains HIGH pull-up resistor, EEPROM does respond slave address. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Serial Presence-Detect Matrix "1"/"0": Serial Data, "driven HIGH"/"driven LOW" BYTE DESCRIPTION Number Bytes Used Micron Total Number Memory Bytes Memory Type Number Addresses Number Column Addresses Number Module Ranks Module Data Width Module Data Width (Continued) Module Voltage Interface Levels SDRAM Cycle Time, tCK, (CAS Latency ENTRY(VERSION) SDRAM LVTTL (-13E) (-133) (-10E) (-13E/-133) (-10E) NONPARITY 15.625µs/SELF NONE PAGE UNBUFFERED (13E) (-133/-10E) (-13E) (-133/-10E) MT8LSDT1664AG (-13E) (-133/-10E) (-13E) (-133) (-10E) (-13E) (-133/-10E) (-13E) (-133) (-10E) 128MB (-13E/-133) (-10E) MT16LSDT3264AG SDRAM Access From Clock, tAC, (CAS Latency Module Configuration Type Refresh Rate/type SDRAM Width (Primary SDRAM) Error-Checking SDRAM Data Width Minimum Clock Delay, tCCD Burst Lengths Supported Number Banks SDRAM Device Latencies Supported Latency Latency SDRAM Module Attributes SDRAM Device Attributes: General SDRAM Cycle Time, tCK, (CAS Latency SDRAM Access From Clock, tAC, (CAS Latency SDRAM Cycle Time, ,(CAS Latency SDRAM Access From Clock, tAC, (CAS Latency Minimum Precharge Time, Minimum Active Active, tRRD Minimum RAS# CAS# Delay, tRCD Minimum RAS# Pulse Width, tRAS (See note Module Rank Density Command Address Setup, 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Table Serial Presence-Detect Matrix "1"/"0": Serial Data, "driven HIGH"/"driven LOW" BYTE 36-40 DESCRIPTION Command Address Hold, Data Signal Input Setup, Data Signal Input Hold, Reserved Bytes Device Minimum Active/Auto-Refresh Time, ENTRY(VERSION) (-13E/-133) (-10E) (-13E/-133) (-10E) (-13E/-133) (-10E) 60ns (-13E) 66ns (-133) 70ns (-10E) REV.2.0 (-13E) (-133) (-10E) MICRON 00-12 MT8LSDT1664AG 00-0C Variable Data Variable Data Variable Data Variable Data Variable Data MT16LSDT3264AG 00-0C Variable Data Variable Data Variable Data Variable Data Variable Data 42-61 Reserved Bytes Revision Checksum Bytes 0-62 65-71 73-90 95-98 99-125 NOTE: Manufacturer's JEDEC Code Manufacturer's JEDEC Code (Cont.) Manufacturing Location Module Part Number (ASCII) Identification Code Identification Code (Continuted) Year Manufacture Week Manufacture Module Serial Number Manufacturer-Specific Data (RSVD) System Frequency Year Manufacture (-13E/-133, -10E) value tRAS used -13E module calculated from tRP. Actual device spec. vaule 37ns. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Figure 168-Pin DIMM Dimensions 128MB STANDARD FRONT VIEW 5.256 (133.50) 5.244 (133.20) 0.125 (3.18) 0.079 (2.00) (2X) 1.380 (35.05) 1.370 (34.80) 0.118 (3.00) (2X) 0.118 (3.00) 0.250 (6.35) 0.118 (3.00) 1.661 (42.18) 2.625 (66.68) 0.039 (1.00)R (2X) 4.550 (115.57) 0.039 (1.00) 0.050 (1.27) 0.700 (17.78) 0.128 (3.25) (2X) 0.118 (3.00) 0.054 (1.37) 0.046 (1.17) (PIN BACKSIDE) (PIN BACKSIDE) PROFILE FRONT VIEW 5.256 (133.50) 5.244 (133.20) 0.125 (3.18) 0.079 (2.00) (2X) 0.118 (3.00) (2X) 0.118 (3.00) 1.131 (28.73) 0.700 (17.78) 1.119 (28.42) 0.250 (6.35) 0.118 (3.00) 1.661 (42.18) 2.625 (66.68) 0.039 (1.00)R (2X) 4.550 (115.57) 0.039 (1.00) 0.050 (1.27) 0.128 (3.25) (2X) 0.118 (3.00) 0.054 (1.37) 0.046 (1.17) (PIN BACKSIDE) (PIN BACKSIDE) NOTE: dimensions inches (millimeters); typical where noted. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Figure 168-Pin DIMM Dimensions 256MB STANDARD 5.256 (133.50) 5.244 (133.20) 0.157 (3.99) FRONT VIEW 0.079 (2.00) (2X) 1.380 (35.05) 1.370 (34.80) 0.118 (3.00) (2X) 0.118 (3.00) 0.250 (6.35) 0.118 (3.00) 1.661 (42.18) 2.625 (66.68) 0.039 (1.00)R (2X) 4.550 (115.57) 0.039 (1.00) 0.050 (1.27) 0.700 (17.78) 0.128 (3.25) (2X) 0.118 (3.00) 0.054 (1.37) 0.046 (1.17) BACK VIEW PROFILE 5.256 (133.50) 5.244 (133.20) 0.157 (3.99) FRONT VIEW 0.079 (2.00) (2X) 1.131 (28.73) 0.700 (17.78) 1.119 (28.42) 0.118 (3.00) (2X) 0.118 (3.00) 0.250 (6.35) 0.118 (3.00) 1.661 (42.18) 2.625 (66.68) 0.039 (1.00)R (2X) 4.550 (115.57) 0.039 (1.00) 0.050 (1.27) 0.128 (3.25) (2X) 0.118 (3.00) 0.054 (1.37) 0.046 (1.17) BACK VIEW NOTE: dimensions inches (millimeters); typical where noted. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 128MB (x64, SR), 256MB (x64, 168-PIN SDRAM UDIMM Data Sheet Designation Released Mark): This data sheet contains minimum maximum limits specified over complete power supply temperature range production devices. Although considered final, these specifications subject change, further product development data characterization sometimes occur. 8000 Federal Way, P.O. Boise, 83707-0006, Tel: 208-368-3900 E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992 Micron, logo, Micron logo trademarks Micron Technology, Inc. other trademarks property their respective owners. 09005aef80bccbe7 SD8_16C16_32x64AG.fm Rev. 9/04 Micron Technology, Inc., reserves right change products specifications without notice. ©2003, 2004 Micron Technology, Inc. rights reserved. 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