93-03-02 Frye 00-09-07 03-05-01 Monnin Raymond Monnin
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REVISIONS DESCRIPTION vendors, CAGE 24355 CAGE 17856. device type Make changes 1.2.1, 1.3, 1.4, table figure figure Editorial changes throughout. Remove vendor, CAGE 24355 from device types device type Table changes. Editorial changes throughout. Update boilerplate class -rrp Update current requirements. Editorial changes throughout. DATE (YR-MO-DA) 89-11-09 APPROVED Frye
93-03-02
Frye
00-09-07 03-05-01
Monnin Raymond Monnin
SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED Rick Officer
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED Charles Besore APPROVED Michael Frye DRAWING APPROVAL DATE 87-01-30
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 http://www.dscc.dla.mil
MICROCIRCUIT, LINEAR, CMOS, HIGH SPEED QUAD SPST ANALOG SWITCH, MONOLITHIC SILICON
AMSC
REVISION LEVEL
SIZE SHEET
CAGE CODE
67268
5962-86716
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E370-03
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following examples. device classes 5962 86716
Federal stock class designator
designator (see 1.2.1)
Device type (see 1.2.2)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
Drawing number
device class 5962 86716
Federal stock class designator
designator (see 1.2.1)
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device types. device types identify circuit function follows: Device type Generic number HI201HS DG271 ADG201HST Circuit function High speed quad SPST CMOS analog switch High speed quad SPST CMOS analog switch High speed quad SPST CMOS analog switch
1.2.3 Device class designator. device class designator single letter identifying product assurance level listed below. Since device class designator been added after original issuance this drawing, device classes designators will included will marked device. Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
1.2.4 Case outlines. case outlines designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP1-T16 CDIP2-T16 CQCC1-N20 Terminals Package style Dual-in-line Square leadless chip carrier
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class Absolute maximum ratings. Positive supply voltage ground): Device type Device types Negative supply voltage ground): Device type Device types Digital input voltage (VIN): Device types whichever comes first Device type whichever comes first Analog input voltage, switch (VS) whichever comes first Maximum power dissipation (PD): Device types Device type Maximum junction temperature (TJ) +150°C Lead temperature (soldering, seconds) +275°C Thermal resistance, junction-to-case (JC) MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 76°C/W Storage temperature range -65°C +150°C Peak current, (pulsed percent duty cycle max): Device type Device type Device type Continuous current, terminal (except Device type Device types Recommended operating conditions. Positive supply voltage (V+) Negative supply voltage (V-) Minimum high level input voltage (VIH): Device types Device type Maximum level input voltage (VIL) Ambient operating temperature range (TA) Ground (GND) -55°C +125°C
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. Unless otherwise specified, voltages referenced ground. Derate case mW/°C above +75°C. Derate case mW/°C above +75°C. Derate case mW/°C above +75°C. Derate case mW/°C above +75°C.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings. Standard Microcircuit Drawings. Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outlines. case outlines shall accordance with 1.2.4 herein. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Functional diagram. functional diagram shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full ambient operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table IIA. electrical tests each subgroup defined table
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified +25°C
Test
Symbol
Group subgroups
Device type
Limits
Unit
Analog signal range resistance RDS(ON) level input voltage High level input voltage Input leakage current (low) Channel leakage current ID(ON) Drain leakage current ID(OFF)
±100 ±100 ±100 ±100 ±100 ±100
Source leakage current
IS(OFF)
±500
under test other under test other under test other 16.5
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified under test other under test other under test 16.5 other Positive supply current switches switches switches Negative supply current IVIN switches switches switches Switch time figure figure figure Switch time tOFF figure figure figure footnotes table.
Test
Symbol
Group subgroups
Device type
Limits
Unit
Input leakage current (high)
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified MHz, +25°C Capacitance input switch Capacitance output switch isolation Crosstalk between channels Charge transfer error MHz, +25°C MHz, +25°C VISO
Test
Symbol
Group subgroups
Device type
Limits
Unit
Capacitance address
VGEN VP-P, kHz, +25°C +25°C VGEN VP-P, kHz,
VCTE
+25°C
limiting terms "min" (minimum) "max" (maximum) shall considered apply magnitudes only. Negative current shall defined conventional current flow device terminal. These parameters tested, shall guaranteed limits specified table herein. Test required applied forcing function. Subgroup (CA, CIS, measurements) shall measured only initial test after process design changes which affect capacitance. Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-PRF-38535, appendix Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
Device types Case outlines Terminal number
Terminal symbol VGND
NOTES: connection source drain interchangeable have been arbitrarily established.
FIGURE Terminal connections.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
FIGURE Functional diagram.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
NOTE: Rise time fall time
FIGURE Test circuit switching waveforms.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MILPRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein except where option MIL-PRF-38535 permits alternate in-line control testing. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection. Tests shall specified table herein. Subgroups table method 5005 MIL-STD-883 shall omitted.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
TABLE IIA. Electrical test requirements. Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) 1,2,3,9,10,11 Subgroups accordance with MIL-PRF-38535, table III) Device class 1,2,3,9, 1,2,3,4,7, 8,9,10,11 -Device class 1,2,3,4, 7,8,9,10,11 1,2,3,4,7, 8,9,10,11
Test requirements
1,2,3,4,7,8,9,10,11
applies subgroup Exclude delta from table delta measurement parameters.
Table IIB. hour burn-in group end-point electrical parameters. Parameter RDS(ON) ID(OFF) IS(ON) ID(ON) Device type Burn-in limit Life test limit Delta
4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MILSTD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MILSTD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). End-point electrical parameters shall specified table herein. device classes devices test vehicle shall subjected radiation hardness assured tests specified MIL-PRF-38535 level being tested. device class devices shall subjected radiation hardness assured tests specified MIL-PRF-38535, appendix level being tested. device classes must meet postirradiation end-point electrical parameter limits defined table +25°C ±5°C, after exposure, subgroups specified table herein. When specified purchase order contract, copy delta limits shall supplied.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractorprepared specification drawing. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. Comments. Comments this drawing should directed DSCC-VA, Columbus, Ohio 43216-5000, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-86716
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 03-05-01 Approved sources supply 5962-86716 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-86716012A 5962-86716012A 5962-8671601EA 5962-8671601EA 5962-86716022A 5962-8671602EA 5962-86716032A 5962-8671603EA 5962-8671603VEA
Vendor CAGE number 34371 17856 34371 17856 17856 17856 24355 24355
Vendor similar HI4-201HS/883 DG201HSAZ/883 HI1-201HS/833 DG201HSAK/883 DG271AZ/883 DG271AK/883 ADG201HSTE/883B ADG201HSTQ/883B ADG201HSTQ/QMLV
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from approved source.
STANDARD MICROCIRCUIT DRAWING BULLETIN Continued
Vendor CAGE number 34371
Vendor name address Intersil Corporation P.O. Melbourne, 32902-0883 Siliconix 2201 Laurelwood Road Santa Clara, 95054-1516 Analog Devices Industrial Park 9106 Norwood, 02062 Point contact: 1500 Space Park Drive P.O. 58020 Santa Clara, 95052-8020
17856
24355
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
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