OCTAL D-TYPE LATCH WITH TRI-STATE OUTPUTS F573 high speed octal l
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MILITARY DATA SHEET MN54F573-X
OCTAL D-TYPE LATCH WITH TRI-STATE OUTPUTS
F573 high speed octal latch with buffered common Latch Enable (LE) buffered common Output Enable (OE) inputs. This device functionally indentical F373 different pinouts.
Industry Part Number
54F573
Part Numbers
54F573DMQB 54F573FMQB 54F573LMQB
Prime
M573
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F573-X
MILITARY DATA SHEET
Features
Inputs outputs Opposite Sides Package allowing easy Interface with Microprocessors Useful input Output Port Microprocessors Functionally identical F373 3-State outputs Interfacing
MN54F573-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing Voltage (Min) 4000V Note Note Absolute maximum ratings values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V Twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F573-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI VOH3 PARAMETER Input High Current Input HIGH Current Input Current Output Voltage Output HIGH Voltage Output HIGH Voltage Output Short-Circuit Current Input Clamp Diode Voltage Power Supply Current Output HIGH Leakage Current Output Leakage Current Output Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V VCC=5.5V, VM=7.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIL=0.8V, IOL=20mA, VINH=5.5V VCC=4.5V, VIH=2.0V, IOH=-1.0mA, VINH=5.5V, VINL=0.0V VCC=4.5V, VIH=2.0V, IOH=-3.0mA, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.0V, VINH=5.5V, VINL=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V VCC=5.5V, VM=2.7V, VIH=2.0V, VINL=0.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VIH=2.0V, VINH=5.5V NOTES PINNAME -0.6 UNIT -150 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS OUTPUTS
ICCZ ICEX IOZH IOZL
INPUTS OUTPUTS OUTPUTS OUTPUTS
-1.2
MN54F573-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH(1) PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C NOTES PINNAME 11.0 13.5 10.0 10.0 UNIT SUBGROUPS
tpHL(1)
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpLH(2)
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpHL(2)
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpZH
Output Enable Time
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpZL
Output Enable Time
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpHZ
Output Disable Time
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
tpLZ ts(H/L) th(H) th(L)
Output Disable Time Setup Time HIGH Hold Time HIGH
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
Hold Time
tw(H)
Pulse Width
VCC=5.0V @25C, VCC=4.5V 5.5V 55/125C
MN54F573-X
MILITARY DATA SHEET
(Continued)
Note Note Note Note Note Screen tested 100% each device +125 temperature, Subgroups Screen tested 100% each device temperature only, Subgroup Sample tested (Method 5005, Table each MFG. +125 temp., Subgroups Sample Tested (Method 5005, Table each MFG. Subgroup periodically +125 temp., Subgroups Guaranteed tested. (DESIGN CHARACTERIZATION DATA)
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