QUAD INPUT NAND GATE This device contains four independent gates,
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MILITARY DATA SHEET MN54F00-X
QUAD INPUT NAND GATE
This device contains four independent gates, each which performs logic NAND function. Original Creation Date: 03/04/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/04/96
Industry Part Number
54F00
Part Numbers
54F00DMQB 54F00FMQB 54F00LMQB
Prime
M000
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F00-X
MILITARY DATA SHEET
Features
Guaranteed 4000V minimum protection.
MN54F00-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing VOltage (Min) 4000V Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F00-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI ICCH ICCL ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short-Circuit Current Input Clamp Diode Voltage Supply Current Supply Current Output High Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIH=2.0V, IOL=20mA, VINH=5.5V VCC=4.5V, VIL=0.8V, IOH=-1.0mA, VINH=5.5V VCC=5.5V, VINL=0.0V, VM=0.0V, VINH=5.5V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 10.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS tpLH Propagation Delay VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C An/Bn An/Bn tpHL Propagation Delay VCC=5.0V @25C VCC=4.5V 5.5V @-55/125C An/Bn An/Bn Note Note Note Note
Screen tested 100% each device -55C, +25C +125C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup +125C -55C temperatures, subgroups
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