FLIP-FLOP WITH MASTER RESET F174 high speed flip-flop. device use
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MILITARY DATA SHEET MN54F174-X
FLIP-FLOP WITH MASTER RESET
F174 high speed flip-flop. device used primarily 6-bit edge-triggered storage register. information inputs transferred storage during HIGH clock transition. device Master Reset simultaneously clear flip-flops. Original Creation Date: 05/13/96 Last Update Date: 07/30/96 Last Major Revision Date: 05/13/96
Industry Part Number
54F174
Part Numbers
54F174DM 54F174DMQB 54F174FMQB 54F174LMQB
Prime
M174
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F174-X
MILITARY DATA SHEET
Features
Edge-Triggered D-Type Inputs Buffered Positive Edge-Triggered Clock Asynchronous Common Reset
MN54F174-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing Voltage (Min) 4000V Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F174-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V VCC=5.5V, VM=7.0V VCC=5.5V, VM=0.5V VCC=4.5V, VIL=0.8V, IOL=20mA, VINH=5.5V, VINL=0.0V VCC=4.5V, VIH=2.0V, IOH=-1.0mA, VINL=0.0V, VINH=5.5V VCC=5.5V, VINH=5.5V, VM=0.0V, VINL=0.0V VCC=4.5V, IM=-18mA VCC=5.5V, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
MN54F174-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH(1) PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C NOTES PINNAME 10.0 10.0 12.0 14.0 16.0 UNIT SUBGROUPS
tpHL(1)
Propagation Delay
VCC= 5.0V @25C, VCC=4.5V 5.5V @-55/125C
tpHL(2)
Propagation Delay
VCC= 5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(H/L)
Setup Time
VCC= 5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(H/L)
Hold Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tw(H)
Pulse Width
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tw(L)
Pulse Width
Pulse Width
tREC
Recovery Time
fMAX
Maximum Count Frequency Note Note Note Note Note
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR/TF=1.0ns
Screen tested 100% each device +25C, +125C -55C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup periodically +125C -55C temperature, subgroups GUARANTEED TESTED. (Design Characterization data)
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