OCTAL D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS F374 high-speed, powe
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MILITARY DATA SHEET MN54F374-X
OCTAL D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS
F374 high-speed, power octal D-type flip flop featuring separate D-type inputs each flip-flop 3-state outputs bus-oriented applications. buffered Clock (CP) Output Enable (OE) common flip-flops.
Industry Part Number
54F374
Part Numbers
54F374DMQB 54F374FMQB 54F374LMQB
Prime
M374
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F374-X
MILITARY DATA SHEET
Features
Edge-triggered D-Type Inputs Buffered Positive Edge-Triggered Clock 3-State Outputs Bus-Oriented Applications
MN54F374-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note -30mA +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing Voltage (Min) 4000V Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F374-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI VOH3 ICCZ ICEX IOZH IOZL PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Output HIGH Voltage Short Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current Output Leakage Current Output Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=4.5V VCC=5.5V, VM=7.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIL=0.8V, IOL=20mA VCC= 4.5V, VIH=2.0V, IOH=-1.0mA, VINH=5.5V, VINL=0.0V VCC=4.5V, VIH=2.0V, IOH=-3.0mA, VINH=5.5V, VINL=0.8V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINH=5.5V VCC=5.5V, VINH=5.5V, VM=5.5V, VINL=0.0V VCC=5.5V, VM=2.7V, VIH=2.0V, VINL=0.0V VCC=5.5V, VM=0.5V, VIH=2.0V, VINH=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS
MN54F374-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C NOTES PINNAME 10.5 11.0 11.5 14.0 10.0 UNIT SUBGROUPS
tpHL
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tpZH
Output Enable Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tpZL
Output Enable Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tpHZ
Output Disable Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tpLZ
Output Disable Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(H)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(L) th(H) th(L)
Setup Time Setup Time Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
tw(H) tw(L)
Pulse Width Pulse Width
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns
MN54F374-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS(Continued)
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL fMAX PARAMETER Maximum Clock Frequency Note Note Note Note Note CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns NOTES PINNAME UNIT SUBGROUPS
Screen tested 100% each device +25C, +125C -55C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Smaple tested (Method 5005, Table each MFG. +25C subgroup periodically +125C -55C temperature, subgroups GUARANTEED TESTED. (Design Characterization Data)
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