OCTAL FLIP-FLOP WITH CLOCK ENABLE F377 eight edge-triggered, D-ty
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MILITARY DATA SHEET MN54F377-X
OCTAL FLIP-FLOP WITH CLOCK ENABLE
F377 eight edge-triggered, D-type flip-flops with individual inputs outputs. common buffered Clock (CP) input loads flip-flops simultaneously when Clock Enable (CE) LOW. register fully edge-triggered. state each input, setup time before LOW-to-HIGH clock transition, transferred corresponding flip-flop's output. input must stable only setup time prior LOW-to-HIGH clock transition predictable operation.
Industry Part Number
54F377
Part Numbers
54F377DMQB 54F377FMQB 54F377LMQB
Prime
M377
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F377-X
MILITARY DATA SHEET
Features
Ideal addressable register applications Clock enable address data synchronization applications Eight edge-triggered flip-flops Buffered common clock 'F273 master reset version 'F373 transparent latch version 'F374 TRI-STATE version
MN54F377-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note -30mA +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing Voltage (Min) 4000V Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F377-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI ICCL ICCH ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short Circuit Current Input Clamp Diode Voltage Supply Current Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V VCC=5.5V, VM=7.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIL=0.8V, IOL=20mA, VINH=5.5V VCC= 4.5V, VIH=2.0V, IOH=-1.0mA, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
MN54F377-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C NOTES PINNAME 10.5 UNIT SUBGROUPS
tpHL
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(H)(1)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(L)(1)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(H)(1)
Hold Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(L)(1) ts(H)(2)
Hold Time Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(L)(2)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(H)(2)
Hold Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(L)(2) tw(L/H)
Hold Time Pulse Width
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
fMAX
Maximum Clock Frequency
MN54F377-X
MILITARY DATA SHEET
Note Note Note Note Note
Screen tested 100% each device +25C, +125C -55C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup periodically +125C -55C temperature, subgroups GUARANTEED TESTED. (Design characterization data)
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