DUAL POSITIVE EDGE-TRIGGERED FLIP-FLOP F109 consists high-speed,

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DUAL POSITIVE EDGE-TRIGGERED FLIP-FLOP F109 consists high-speed,

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MILITARY DATA SHEET MN54F109-X
DUAL POSITIVE EDGE-TRIGGERED FLIP-FLOP
F109 consists high-speed, completely independent transition clocked flip-flops. clocking operation independent rise fall times clock waveform. design allows operation flip-flop (refer data sheet) connecting inputs. Asynchronous Inputs: input sets HIGH level input sets level Clear independent clock Simultaneous makes both HIGH
Industry Part Number
54F109
Part Numbers
54F109DM 54F109DMQB 54F109FMQB 54F109LMQB
Prime
M109
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F109-X
MILITARY DATA SHEET
Features
Guaranteed 4000V minimum protection.
MN54F109-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) -0.5V -0.5V +5.5V twice rated Iol(mA) Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs.
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F109-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI IIL3 ICEX PARAMETER Input High Current Input High Current Input Current Input Current Output Voltage Output HIGH Voltage Short Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIH=2.0V, IOL=20mA, VINH=5.5V, VIL=0.8V VCC=4.5V, VIH=2.0V, IOH=-1.0mA, VINH=5.5V VCC=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V, VM=5.5V NOTES PINNAME -0.6 -1.8 UNIT -150 -1.2 17.0 SUBGROUPS
INPUTS INPUTS J,K, SET/CLR OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
MN54F109-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns, FIGS SYMBOL tpLH(1) PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C NOTES PINNAME Jn/Kn Jn/Kn Jn/Kn Jn/Kn 10.5 11.5 UNIT SUBGROUPS
Qn/Qn Qn/Qn
tpHL(1)
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
Qn/Qn Qn/Qn
tpLH(2) tpLH(2) tpHL(2) tpHL(2) ts(H) ts(L)
Propagation Delay CDn/SDn Qn/Qn Propagation Delay CDn/SDn Qn/Qn Propagation Delay CDn/SDn Qn/Qn Propagation Delay CDn/SDn Qn/Qn Setup Time (HIGH) Setup Time (LOW)
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(H/L) tw(H) tw(L) tREC fMAX
Hold Time LOW) Pulse Width (HIGH) Pulse Width (LOW) Pulse Width (LOW)
(HIGH
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR=1.0ns, TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR=1.0ns, TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR=1.0ns, TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C, TR=1.0ns, TF=1.0ns
Recovery Time Maximum Count Frequency Note Note Note Note Note
CDn/SDn
Screen tested 100% each device +25C, +125C -55C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup periodically +125C -55C temperature, subgroups Guaranteed tested. (DESIGN CHARACTERIZATION ONLY).

DUAL POSITIVE EDGE-TRIGGERED FLIP-FLOP F109 consists high-speed,

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