OCTAL D-TYPE FLIP-FLOP WITH TRI-STATE OUTPUTS F534 high speed, lo

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OCTAL D-TYPE FLIP-FLOP WITH TRI-STATE OUTPUTS F534 high speed, lo

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MILITARY DATA SHEET MN54F534-X
OCTAL D-TYPE FLIP-FLOP WITH TRI-STATE OUTPUTS
F534 high speed, low-power octal D-type flip-flop featuring separate D-type inputs each flip-flop TRI-STATE outputs bus-oriented applications. buffered Clock (CP) Output Enable (OE) common flip-flops. F534 same F374 except that outputs inverted.
Industry Part Number
54F534
Part Numbers
54F534DMQB 54F534FMQB 54F534LMQB
Prime
M534
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F534-X
MILITARY DATA SHEET
Features
Edge-Triggered D-type inputs Buffered Positive Edge Triggered Clock 3-State Output Oriented Applications
MN54F534-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature -65C +150C Ambient Temperature under Bias -55C +125C Junction Temperature under Bias -55C +175C Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note -30mA +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) Last Passing Voltage (Min) 4000V Note Note Absolute maximum ratings values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. -0.5V -0.5V +5.5V twice rated Iol(mA)
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F534-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI VOH3 ICCZ ICEX IOZH IOZL PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Output HIGH Voltage Short-Circuit Current Input Clamp Diode Voltage Power Supply Current Output HIGH Leakage Current Output Leakage Current Output Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V VCC=5.5V, VM=7.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIL=0.8V, IOL=20mA, VIH=2.0V, VINH=5.5V, VINL=0.0V VCC=4.5V, VIL=0.8V, IOH=-1.0mA VCC=4.5V, VIL=0.8V, IOH3=-3.0mA, VINH=5.5V VCC=5.5V, VINH=5.5V, VM=0.0V, VINL=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINH=5.5V, VINL=0.0V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS
MN54F534-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH PARAMETER Propagation Delay CONDITIONS VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C NOTES PINNAME 10.5 11.0 11.5 14.0 10.0 UNIT SUBGROUPS
tpHL
Propagation Delay
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C
tpZH
Output Enable
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C
tpZL
Output Enable
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C
tpHZ
Output Disable
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C
tpLZ
Output Disable
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C
ts(H) ts(L)
Setup Time Setup Time
VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns VCC=5.0V 25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns
th(H) th(L)
Hold Time Hold Time
tw(H) tw(L) fMAX
Pulse Width Pulse Width Maximum Clock Frequency
MN54F534-X
MILITARY DATA SHEET
(Continued)
Note Note Note Note Note Screen tested 100% each device +125 temperature, Subgroups Screen tested 100% each device temperature only, Subgroup Sample tested (Method 5005, Table each MFG. +125 temp., Subgroups Sample Tested (Method 5005, Table each MFG. Subgroup periodically +125 temp., Subgroups Guaranteed tested. (DESIGN CHARACTERIZATION DATA)

OCTAL D-TYPE FLIP-FLOP WITH TRI-STATE OUTPUTS F534 high speed, lo

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