TRIPLE INPUT NAND GATE This device contains four independent gate
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MILITARY DATA SHEET MN54F10-X
TRIPLE INPUT NAND GATE
This device contains four independent gates, each which performs logic NAND function. Original Creation Date: 03/07/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/07/96
Industry Part Number
54F10
Part Numbers
54F10DMQB 54F10FMQB 54F10LMQB
Prime
M010
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F10-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) -0.5V -0.5V +5.5V twice rated Iol(mA) Note Note Absolute maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs.
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F10-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: -55C 125C SYMBOL IBVI ICCH ICCL ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short-Circuit Current Input Clamp Diode Voltage Supply Current Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINL=0.0V, VINH=5.5V VCC=5.5V, VM=7.0V, VINL=0.0V, VINH=5.5V VCC=5.5V, VM=0.5V, VINH=5.5V VCC=4.5V, VIH=2.0V, IOL=20mA VCC=4.5V, VIL=0.8V, IOH=-1.0mA, VINH=5.5V VCC=5.5V, VINL=0.0V, VM=0.0V, VINH=5.5V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
PARAMETER
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS tpLH Propagation Delay VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C An/Bn/ An/Bn/ tpHL Propagation Delay VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C An/Bn/ An/Bn/ Note Note Note Note
Screen tested 100% each device -55C, +25C +125C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup periodically +125C -55C temperature, subgroups
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