Power, Radiation Hardened Programmable Operational Amplifier Pino
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HS-3530RH
Power, Radiation Hardened Programmable Operational Amplifier
Pinout
LEAD METAL PACKAGE (CAN) MIL-STD-1835 MACY1-X8 VIEW
ISET OFFSET NULL INVERTING INPUT
Features
Radiation Environment Neutron Fluence 1012 n/cm2 10KeV) Gamma Rate (Si)/s Gamma Dose (Si) Wide Range Programming Slew Rate 0.06 3V/µs Gain Bandwidth 100kHz 5.0MHz Wide Range Programming Power Supply Range ±3.0V ±15V Supply Current 10µA 1.2mA Dielectrically Isolated Device Islands Short Circuit Protection
OUTPUT
NON-INVERTING INPUT
OFFSET NULL
NOTE: Case tied
Description
HS-3530RH Power Operational Amplifier which internally compensated monolithic device offering wide range performance specifications. Parameters such power dissipation, slew rate, bandwidth, noise input parameters programmed selecting external resistor current source. Supply voltages used with little degradation performance. HS-3530RH been specifically designed meet exposure space radiation environments. Operation from -55oC +125oC guaranteed. major advantage HS-3530RH that operating characteristics remain virtually constant over wide supply range (±3V ±15V), allowing amplifier offer maximum performance almost system, including battery operated equipment. primary application this device active filtering conditioning wide variety signals that differ frequency amplitude. Also, modulating current, used designs such current controlled oscillators/modulators, sample hold circuits variable active filters.
Functional Diagram
OFFSET NULL ISET OFFSET NULL
Ordering Information
PART NUMBER HS2-3530RH-8 HS2-3530RH-Q HS2-3530RH/SAMPLE TEMPERATURE RANGE -55oC +125oC -55oC +125oC +25oC PACKAGE Lead Metal Lead Metal Lead Metal
CAUTION: These devices sensitive electrostatic discharge; follow proper Handling Procedures. http://www.intersil.com 407-727-9207 Copyright Intersil Corporation 1999
Spec Number File Number
518079 3024.2
Specifications HS-3530RH
Absolute Maximum Ratings
Voltage Between Terminals Differential Input Voltage Voltage Either Input Terminal VISET (Current ISET) 500µA VSET (Voltage ISET). -2.0V) VSET Output Short Circuit Duration (Note Indefinite Junction Temperature (TJ) +175oC Storage Temperature Range -65oC +150oC Rating. <2000V Lead Temperature (Soldering 10s) 275oC
Reliability Information
Thermal Resistance Metal Package 160oC/W 70oC/W Maximum Package Power Dissipation +125oC Ambient: Metal Package 0.31W device power exceeds package dissipation capability, provide heat sinking derate linearly following rate: Metal Package 6.3mW/oC
CAUTION: Stresses above those listed "Absolute Maximum Ratings" cause permanent damage device. This stress only rating operation device these other conditions above those indicated operational sections this specification implied.
Operating Conditions
Operating Temperature Range -55oC +125oC Operating Supply Voltage ±15V VINcm
TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested Supply Voltage ±15V, RSOURCE 100, RLOAD 500k, VOUT Unless Otherwise Specified. GROUP SUBGROUP Note Note Input Offset Current Note Large Signal Voltage Gain +AVOL VOUT +10V Note VOUT -10V Note +5V, +10V -20V, VOUT -5V, +20V -10V, VOUT Note -VOUT Note Output Current +IOUT -IOUT ISET 1.5µA TEMPERATURE +25oC +125oC, -55oC 12.5 10.5 0.25 -12.5 -10.5 -0.25 ISET 15µA 12.5 10.5 -12.5 -10.5 -2.5 UNITS kV/V kV/V kV/V kV/V
PARAMETER Input Offset Voltage Input Bias Current
SYMBOL
CONDITIONS
+25oC +125oC,
-55oC +25oC +125oC,
-55oC +25oC +125oC,
-55oC +25oC +125oC, -55oC
-AVOL
+25oC +125oC, -55oC
Common Mode Rejection Ratio
+CMRR
+25oC +125oC, -55oC
-CMRR
+25oC +125oC, -55oC +25oC +125oC, -55oC
Output Voltage Swing
+VOUT
+25oC +125oC, -55oC
+25oC +25oC
Spec Number
518079
Specifications HS-3530RH
TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) Device Tested Supply Voltage ±15V, RSOURCE 100, RLOAD 500k, VOUT Unless Otherwise Specified. GROUP SUBGROUP -ICC IOUT Power Supply Rejection Ratio +PSRR VSUP +10V, -15V +20V, -15V VSUP +15V, -10V +15V, -20V ISET 1.5µA TEMPERATURE +25oC +125oC, -55oC ISET 15µA -150 -160 UNITS
PARAMETER Quiescent Power Supply Current
SYMBOL +ICC
CONDITIONS IOUT
+25oC +125oC, -55oC
+25oC +125oC, -55oC +25oC +125oC, -55oC
-PSRR
NOTES: ISET 1.5µA, ISET 15µA. Temperature performed Intersil product flow only. TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested Supply Voltage ±3V, RSOURCE 100, RLOAD 500k, VOUT Unless Otherwise Specified. GROUP SUBGROUP +AVOL VOUT Note VOUT Note +1.5V +1.5V, -4.5V VOUT -1.5V -1.5V +4.5V, -1.5V VOUT +1.5V Note -VOUT Note Quiescent Power Supply Current +ICC IOUT -ICC IOUT Power Supply Rejection Ratio +PSRR VSUP 1.5V +3V, +4.5V, VSUP 1.5V +3V, +3V, -4.5V ISET 1.5µA TEMPERATURE +25oC +125oC, -55oC +25oC +125oC, -55oC -2.0 -2.0 ISET 15µA -150 -160 -2.0 -2.0 UNITS kV/V kV/V kV/V kV/V
PARAMETER Input Offset Voltage Large Signal Voltage Gain
SYMBOL
CONDITIONS
-AVOL
+25oC +125oC, -55oC +25oC +125oC, -55oC
Common Mode Rejection Ratio
+CMRR
-CMRR
+25oC +125oC, -55oC
Output Voltage Swing
+VOUT
+25oC +125oC, -55oC +25oC +125oC, -55oC
+25oC +125oC, -55oC +25oC +125oC, -55oC
+25oC +125oC, -55oC +25oC +125oC, -55oC
-PSRR
NOTE: ISET 1.5µA, ISET 15µA.
Spec Number
518079
Specifications HS-3530RH
TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested 100pF, AVCL 75k, Unless Otherwise Specified. GROUP SUBGROUP ISET 1.5µA TEMPERATURE ISET 15µA UNITS
PARAMETER VSUPPLY ±15V Slew Rate Note
SYMBOL
CONDITIONS
VOUT -10V +10V VOUT +10V -10V VOUT +400mV VOUT -400mV VOUT +400mV VOUT -400mV
+25oC +25oC +25oC +25oC +25oC +25oC
0.025 0.025
0.25 0.25
V/µs V/µs
Rise Fall Time Overshoot VSUPPLY Slew Rate Note
VOUT VOUT
+25oC +25oC
0.01 0.01
V/µs V/µs
TABLE ELECTRICAL PERFORMANCE CHARACTERISTICS Device Characterized RSOURCE 100pF, AVCL Unless Otherwise Specified. ISET 1.5µA PARAMETER VSUPPLY ±15V Differential Input Resistance Full Power Bandwidth Minimum Closed Loop Stable Gain Output Resistance Quiescent Power Consumption Output Short-Circuit Current Gain Bandwidth Product VSUPPLY Gain Bandwidth Product NOTES: Parameters listed Table controlled design process parameters directly tested final production. These parameters characterized upon initial design release, upon design changes. These parameters guaranteed characterization based upon data from multiple production runs which reflect within variation. Full Power Bandwidth guarantee based Slew Rate measurement using FPBW Slew Rate/(2VPEAK). Quiescent Power Consumption based upon Quiescent Supply Current test maximum. load outputs). Caution: Continuous long-duration short-circuit operation degrade operating life device. GBWP AVCL 10V/V 200mV, 10kHz +25oC FPBW CLSG ROUT IOSC GBWP VPEAK 50pF Open Loop VOUT IOUT VOUT AVCL 10V/V 200mV, 10kHz +25oC +25oC -55oC +125oC +25oC -55oC +125oC SYMBOL CONDITIONS NOTES TEMPERATURE ISET 15µA UNITS
+25oC +25oC
Spec Number
518079
Specifications HS-3530RH
TABLE POST ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER Open Loop Voltage Gain Input Offset Voltage SYMBOL AVOL CONDITIONS VSUPPLY ±15V ISET 15µA VSUPPLY ±15V ISET 15µA TEMPERATURE +25oC +25oC UNITS kV/V
TABLE BURN-IN DELTA PARAMETERS GROUP SUBGROUPS +25oC) PARAMETER IBIAS DELTA LIMIT ±0.5mV ±30nA
TABLE APPLICABLE SUBGROUPS GROUP SUBGROUPS CONFORMANCE GROUP Initial Test Interim Test Final Test Group (Note Subgroup Subgroup Group Group Group Subgroup NOTES: Alternate Group testing accordance with MIL-STD-883 method 5005 exercised. Table parameters only MIL-STD-883 METHOD 100% 5004 100% 5004 100% 5004 100% 5004 Sample 5005 Sample 5005 Sample 5005 Sample 5005 Sample 5005 Sample 5005 RECORDED (Note (Note (Note RECORDED
TESTED
TESTED
Spec Number
518079
HS-3530RH Intersil Space Level Product Flow
Wafer Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, Samples/Wafer, Rejects 100% Nondestructive Bond Pull, Method 2023 Sample Wire Bond Pull Monitor, Method 2011 Sample Shear Monitor, Method 2019 2027 100% Internal Visual Inspection, Method 2010, Condition 100% Temperature Cycle, Method 1010, Condition Cycles 100% Constant Acceleration, Method 2001, Condition Method 5004 100% PIND, Method 2020, Condition 100% External Visual 100% Serialization
NOTES: Failures from subgroup deltas used calculating PDA. maximum allowable Radiographic (X-Ray) inspection performed point after serialization allowed Method 5004. Alternate Group testing performed allowed MIL-STD-883, Method 5005. Group inspections optional will performed unless required P.O. When required, P.O. should include separate line items Group test, Group samples, Group test Group samples. Group Generic Data, defined MIL-I-38535, optional will supplied unless required P.O. When required, P.O. should include separate line item Group generic data. Generic data guaranteed available therefore available cases. Data Package Contents: Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Date Code, Intersil Part Number, Number, Quantity). Wafer Acceptance Report (Method 5007). Includes reproductions photos with percent step coverage. GAMMA Radiation Report. Contains Cover page, disposition, Dose, Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read Record data file Intersil. X-Ray report film. Includes penetrometer measurements. Screening, Electrical, Group attributes (Screening attributes begin after package seal). Serial Number Sheet (Good units serial number number). Variables Data (All Delta operations). Data identified serial number. Data header includes number date test. Group attributes and/or Generic data included when required P.O. Certificate Conformance part shipping invoice part Data Book. Certificate Conformance signed authorized Quality Representative.
100% Initial Electrical Test (T0) 100% Static Burn-In, Condition Hours, +125oC Equivalent, Method 1015 100% Interim Electrical Test (T1) 100% Delta Calculation (T0-T1) 100% PDA, Method 5004 (Note 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% Radiographic (X-Ray), Method 2012 (Note 100% External Visual, Method 2009 Sample Group Method 5005 (Note Sample Group Method 5005 (Note Sample Group Method 5005 (Notes 100% Data Package Generation (Note
Spec Number
518079
HS-3530RH Intersil Space Level Product Flow
GAMMA Radiation Verification (Each Wafer) Method 1019, Samples/Wafer, Rejects Periodic- Wire Bond Pull Monitor, Method 2011 Periodic- Shear Monitor, Method 2019 2027 100% Internal Visual Inspection, Method 2010, Condition 100% Temperature Cycle, Method 1010, Condition Cycles 100% Constant Acceleration, Method 2001, Condition Method 5004 100% External Visual 100% Initial Electrical Test 100% Static Burn-In, Condition Hours, +125oC Equivalent, Method 1015 100% Interim Electrical Test 100% PDA, Method 5004 (Note 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% External Visual, Method 2009 Sample Group Method 5005 (Note Sample Group Method 5005 (Note Sample Group Method 5005 (Notes Sample Group Method 5005 (Notes 100% Data Package Generation (Note
NOTES: Failures from subgroup used calculating PDA. maximum allowable Alternate Group testing performed allowed MIL-STD-883, Method 5005. Group inspections optional will performed unless required P.O. When required, P.O. should include separate line items Group test, Group samples, Group test Group samples Group test Group samples. Group and/or Generic Data, defined MIL-I-38535, optional will supplied unless required P.O. When required, P.O. should include separate line item Group generic data and/or generic data. Generic data guaranteed available therefore available cases. Data Package Contents: Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Date Code, Intersil Part Number, Number, Quantity). GAMMA Radiation Report. Contains Cover page, disposition, Dose, Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read Record data file Intersil. Screening, Electrical, Group attributes (Screening attributes begin after package seal). Group attributes and/or Generic data included when required P.O. Certificate Conformance part shipping invoice part Data Book. Certificate Conformance signed authorized Quality Representative.
Spec Number
518079
HS-3530RH Test Circuit
ACOUT +VCC 500K OPEN OPEN -VEE EOUT 100pF LOOP STABILITY, VALUE CAPACITOR PREVENT OSCILLATION
500K OPEN
Includes Stray Capacitance Resistors Capacitors (µF)
Simplified Transient Response/Slew Rate Circuit
100pF VINN RSET VOUT
Burn-In Circuit
Irradiation Circuit
+15V OUTPUT 0.01µF -15V ISET 0.01µF
Spec Number
518079
HS-3530RH Typical Performance Curves
1000 SUPPLY CURRENT (µA) BIAS CURRENT (nA)
PRE-RAD
VSUPPLY ±15V VSUPPLY
VSUPPLY ±15V
CURRENT (µA)
CURRENT (µA)
FIGURE INPUT BIAS CURRENT CURRENT
FIGURE PRERAD POSITIVE SUPPLY CURRENT
200K GAIN-BANDWIDTH PRODUCT (MHz)
100K AVOL (V/V)
VSUPPLY ±15V VSUPPLY
CURRENT (µA)
CURRENT (µA)
FIGURE PRERAD LARGE SIGNAL VOLTAGE GAIN ISET
FIGURE GAIN BANDWIDTH PRODUCT CURRENT
SLEW RATE (V/µs) VP-P SLEW RATE ISET 15µA PRE-RAD 0.01 CURRENT (µA) VSUPPLY +25oC ISET 1.5µA
VSUPPLY ±15V VSUPPLY
RLOAD
100K
FIGURE SLEW RATE CURRENT
FIGURE OUTPUT VOLTAGE SWING LOAD RESISTANCE
Spec Number
518079
HS-3530RH Typical Performance Curves
(Continued)
200K VSUPPLY ±15V
BIAS CURRENT (nA) AVOL (V/V) ISET 15µA PRE-RAD
100K
VSUPPLY
ISET 15µA ISET 1.5µA
VSUPPLY ±15V TEMPERATURE (oC)
TEMPERATURE (oC)
FIGURE INPUT BIAS CURRENT TEMPERATURE
FIGURE OPEN LOOP VOLTAGE GAIN TEMPERATURE
Schematic
Q39A Q39B
INQ9 27pF
VOS1
VOS2
Spec Number
518079
HS-3530RH Metallization Topology
DIMENSIONS: 11.5mils (1370 1700 290µm) METALLIZATION: Type: Thickness: GLASSIVATION: Type: SiO2 Thickness: ATTACH: Temperature: Metal 420oC (Max) WORST CASE CURRENT DENSITY: 0.544 A/cm2 2.5mA SUBSTRATE POTENTIAL (POWERED UP): TRANSISTOR COUNT: PROCESS: Complimentary Bipolar
Metallization Mask Layout
HS-3530RH OFFSET NULL
PACKAGE)
ISET
OFFSET NULL OUTPUT
Spec Number
518079
HS-3530RH
Intersil semiconductor products manufactured, assembled tested under ISO9000 quality systems certification.
Intersil products sold description only. Intersil Corporation reserves right make changes circuit design and/or specifications time without notice. Accordingly, reader cautioned verify that data sheets current before placing orders. Information furnished Intersil believed accurate reliable. However, responsibility assumed Intersil subsidiaries use; infringements patents other rights third parties which result from use. license granted implication otherwise under patent patent rights Intersil subsidiaries.
information regarding Intersil Corporation products, site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA Intersil Corporation 883, Mail Stop 53-204 Melbourne, 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil Mercure Center 100, Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05 ASIA Intersil (Taiwan) Ltd. Taiwan Limited 7F-6, Hsing North Road Taipei, Taiwan Republic China TEL: (886) 2716 9310 FAX: (886) 2715 3029
Spec Number
518079
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