March 1988 CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual

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March 1988 CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual

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CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual 4-Input NAND Gate
March 1988
CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual 4-Input NAND Gate
These NAND gates monolithic complementary (CMOS) integrated circuits P-channel enhancement mode transistors provide symmetrical circuit with output swings essentially equal supply voltage This results high noise immunity over wide supply voltage range power other than that caused leakage current consumed during static conditions inputs protected against static discharge latching conditions
Features
Wide supply voltage range power High noise immunity
(typ (typ
Applications
Automotive Data terminals Instrumentation Medical Electronics
Alarm system Industrial controls Remote metering Computers
Connection Diagrams
CD4002 Dual-In-Line Package CD4012 Dual-In-Line Package
5940
5940
View Order Number CD4002 CD4012
View
C1995 National Semiconductor Corporation
5940
RRD-B30M105 Printed
Absolute Maximum Ratings (Note Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications
Voltage Operating Temperature Range CD4002M CD4012M CD4002C CD4012C
Storage Temperature Range (TS) Power Dissipation (PD) Dual-In-Line Small Outline Operating Range (VDD) Lead Temperature (TL) (Soldering seconds) CD4012M Limits
Electrical Characteristics CD4002M
Symbol Parameter Quiescent Device Current Conditions
Units
Quiescent Device Dissipation Package Output Voltage Level Output Voltage High Level Noise Immunity (All Inputs) Noise Immunity (All Inputs) Output Drive Current N-Channel (4002) (Note Output Drive Current P-Channel (4002) (Note Output Drive Current N-Channel (4012) (Note Output Drive Current P-Channel (4012) (Note Input Current
Note ``Absolute Maximum Ratings'' those values beyond which safety device cannot guaranteed Except ``Operating Temperature Range'' they meant imply that devices should operated these limits table ``Electrical Characteristics'' provides conditions actual device operation Note tested output time
Electrical Characteristics CD4002C
Symbol Parameter Quiescent Device Current Conditions
CD4012C Limits
Units
Quiescent Device Dissipation Package Output Voltage Level Output Voltage High Level Noise Immunity (All Inputs) Noise Immunity (All Inputs) Output Drive Current N-Channel (4002) (Note Output Drive Current N-Channel (4012) (Note Output Drive Current P-Channel (4002) (Note Output Drive Current P-Channel (4012) (Note Input Current
Note ``Absolute Maximum Ratings'' those values beyond which safety device cannot guaranteed Except ``Operating Temperature Range'' they meant imply that devices should operated these limits table ``Electrical Characteristics'' provides conditions actual device operation Note tested output time
Electrical Characteristics input rise fall times Typical temperature coefficient values
Symbol CD4002M tPHL tPLH tTHL tTLH CD4002C tPHL TPLH tTHL tTLH Propagation Delay Time High Level Propagation Delay Time High Level Transition Time High Level Transition Time High Level Input Capacitance Input Propagation Delay Time High Level Propagation Delay Time High Level Transition Time High Level Transition Time High Level Input Capacitance Input Parameter Conditions Units
Parameters guaranteed correlated testing
Electrical Characteristics input rise fall times Typical temperature coefficient values
Symbol CD4012M tPHL tPLH tTHL tTLH CD4012C tPHL TPLH tTHL tTLH Propagation Delay Time High Level Propagation Delay Time High Level Transition Time High Level Transition Time High Level Input Capacitance Input Propagation Delay Time High Level Propagation Delay Time High Level Transition Time High Level Transition Time High Level Input Capacitance Input Parameter Conditions Units
Parameters guaranteed correlated testing Note ``Absolute Maximum Ratings'' those values beyond which safety device cannot guaranteed Except ``Operating Temperature Range'' they meant imply that devices should operated these limits table ``Electrical Characteristics'' provides conditions actual device operation
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package Order Number CD4002MJ CD4002CJ CD4012MJ CD4012CJ Package Number J14A
CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual 4-Input NAND Gate
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package Order Number CD4002MN CD4002CN CD4012MN CD4012CN Package Number N14A
LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
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National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

March 1988 CD4002M CD4002C Dual 4-Input Gate CD4012M CD4012C Dual

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