Fast Read Access Time Power CMOS Operation max. Standby max. Acti

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Fast Read Access Time Power CMOS Operation max. Standby max. Acti

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AT27C080
Fast Read Access Time Power CMOS Operation
max. Standby max. Active JEDEC Standard Packages Lead PLCC 32-Lead 600-mil PDIP Cerdip 32-Lead 450-mil SOIC (SOP) 32-Lead TSOP Supply High-Reliability CMOS Technology 2,000V Protection Latchup Immunity RapidProgramming Algorithm µs/byte (typical) CMOS Compatible Inputs Outputs Integrated Product Identification Code Industrial Commercial Temperature Ranges
8-Megabit Erasable CMOS EPROM AT27C080
Description
AT27C080 chip low-power, high-performance 8,388,608-bit ultraviolet erasable programmable read only memory (EPROM) organized bits. AT27C080 requires only power supply normal read mode operation. byte accessed less than eliminating need speed reducing WAIT states high-performance microprocessor systems. Atmel's scaled CMOS technology provides active power consumption fast programming. Power consumption typically active mode less than standby mode. (continued)
Configurations
Name Function Addresses Outputs Chip Enable Output Enable TSOP View Type
OE/VPP
CDIP, PDIP, SOIC View
OE/VPP
PLCC View
OE/VPP
0360F-B-7/97
AT27C080 available choice packages, including; one-time programmable (OTP) plastic PLCC, PDIP, SOIC (SOP), TSOP, well windowed ceramic Cerdip. devices feature two-line control (CE, give designers flexibility prevent contention. With dens byte torage capabi lity, AT27C080 allows firmware stored reliably accessed system without delays mass storage media. Atmel's 27C080 additional features ensure high quality efficient production use. RapidProgramming Algorithm reduces time required program part guarantees reliable programming. Programming time typically only µs/byte. Integrated Product Identification Code electronically identifies device manufacturer. This feature used industry standard programming equipment select proper programming algorithms voltages.
System Considerations
Switching between active standby conditions Chip Enable produce transient voltage excursions. Unless accommodated system design, these transients exceed data sheet limits, resulting device non-conformance. minimum, high frequency, inherent inductance, ceramic capacitor should utilized each device. This capacitor should connected between Ground terminals device, close device possible. Additionally, stabilize supply voltage level printed circuit boards with large EPROM arrays, bulk electrolytic capacitor should utilized, again connected between Ground terminals. This capacitor should positioned close possible point where power supply connected array.
Erasure Characteristics
entire memory array AT27C080 erased (all outputs read VOH) after exposure ultraviolet light wavelength Complete erasure assured after minimum minutes exposure using 12,000 µW/cm2 intensity lamps spaced inch away from chip. Minimum erase time lamps other intensity ratings calculated from minimum integrated erasure dose W.sec/cm2. prevent unintentional erasure, opaque label recommended cover clear window erasable EPROM that will subjected continuous flourescent indoor lighting sunlight.
AT27C080
AT27C080
Block Diagram
Absolute Maximum Ratings*
Temperature Under Bias .-55°C +125°C Storage Temperature.-65°C +150°C Voltage with Respect Ground .-2.0V +7.0V(1) Voltage with Respect Ground .-2.0V +14.0V(1) Supply Voltage with Respect Ground .-2.0V +14.0V(1) Integrated Erase Dose. 7258
Note: *NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions beyond those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect device reliability. Minimum voltage -0.6V which undershoot -2.0V pulses less than Maximum output voltage 0.75V which overshoot +7.0V pulses less than
Operating Modes
Mode/Pin Read Output Disable Standby Rapid Program Verify Inhibit Product Identification
Notes:
OE/VPP
Outputs DOUT High High DOUT High Identification Code
VH(3)
VIH. Refer Programming Characteristics. 12.0 0.5V. identifier bytes selected. inputs held (VIL), except which which toggled (VIL) select Manufacturer's Identification byte high (VIH) select Device Code byte.
Operating Conditions Read Operation
AT27C080 70°C -40°C 85°C 70°C -40°C 85°C 70°C -40°C 85°C
Operating Temperature (Case) Power Supply
Com. Ind.
70°C -40°C 85°C
Operating Characteristics Read Operation
Symbol Note: Parameter Input Load Current Output Leakage Current VCC(1) Standby Current Active Current Input Voltage Input High Voltage Output Voltage Output High Voltage -400 Condition (Com., Ind.) VOUT (Com., Ind.) ISB1 (CMOS), 0.3V ISB2 (TTL), 0.5V MHz, IOUT -0.6 ±1.0 ±5.0 Units
must applied simultaneously before VPP, removed simultaneously after OE/VPP.
Characteristics Read Operation
AT27C080
Symbol Parameter tACC(4)
(3)(4)
Units
Condition OE/VPP
Address Output Delay Output Delay Output Delay High Output Float, whichever occurred first Output Hold from Address, OE/VPP,whichever occurred first
tDF(2)(5) Note:
Waveforms Read Operation.
AT27C080
AT27C080
Waveforms Read Operation(1)
Notes:
Timing measurement references 0.8V 2.0V. Input drive levels 0.45V 2.4V, unless otherwise specified. specified form OE/VPP whichever occurs first. Output float defined point when data longer driven. OE/VPP delayed after falling edge without impact tCE. OE/VPP delayed tACC- after address valid without impact tACC. This parameter only sampled 100% tested.
Input Test Waveform Measurement Levels
Output Test Load
(10% 90%)
Note:
including capacitance.
Capacitance
MHz, 25°C(1) COUT
Note:
Units
Conditions VOUT
Typical values nominal supply voltage. This parameter only sampled 100% tested.
Programming Waveforms
Notes:
Input Timing reference 0.8V 2.0V VIH. tDFP characteristics device must accommodated programmer.
Programming Characteristics
5°C, 0.25V, OE/VPP 13.0 0.25V Limits Symbol ICC2 IPP2 Parameter Input Load Current Input Level Input High Level Output Voltage Output High Voltage Supply Current (Program Verify) OE/VPP Supply Current Product Identification Voltage 11.5 -400 12.5 Test Conditions VIL, -0.6 Units
AT27C080
AT27C080
Programming Characteristics
5°C, 0.25V, OE/VPP 13.0 0.25V Limits Symbol tOES tOEH tDFP tVCS tPRT
Notes:
Parameter Address Setup Time OE/VPP Setup Time OE/VPP Hold Time Data SetupTime Address Hold Time Data Hold Time High Output Float Delay Setup Time Program Pulse Width Data Valid from OE/VPP Recovery Time OE/VPP Pulse Rise Time During Programming
Test Conditions(1)
Units
Input Rise Fall Times: (10% 90%) Input Pulse Levels: 0.45V 2.4V Input Timing Reference Level: 0.8V 2.0V Output Timing Reference Level: 0.8V 2.0V
47.5 52.5
must applied simultaneously before OE/VPP removed simultaneously after OE/VPP. This parameter only sampled 100% tested. Output Float defined point where data longer driven- timing diagram. Program Pulse width tolerance
Atmel's 27C080 Integrated Product Identification Code
Pins Codes Manufacturer Device Type Data
Rapid Programming Algorithm
pulse width used program. address first location. raised 6.5V OE/VPP raised 13.0V. Each address first programmed with pulse without verification. Then verification reprogramming loop executed each address. event byte fails pass verification, successive pulses applied with verification after each pulse. byte fails verify after pulses have been applied, part considered failed. After byte verifies properly, next address selected until have been checked. OE/VPP then lowered 5.0V. bytes read again compared with original data determine device passes fails.
AT27C080
AT27C080
Ordering Information
tACC (ns) (mA) Active Standby Ordering Code AT27C080-90DC AT27C080-90JC AT27C080-90PC AT27C080-90RC AT27C080-90TC AT27C080-90DI AT27C080-90JI AT27C080-90PI AT27C080-90RI AT27C080-90TI AT27C080-10DC AT27C080-10JC AT27C080-10PC AT27C080-10RC AT27C080-10TC AT27C080-10DI AT27C080-10JI AT27C080-10PI AT27C080-10RI AT27C080-10TI Package 32DW6 32P6 32DW6 32P6 32DW6 32P6 32DW6 32P6 Operation Range Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
(continued)
Package Type 32DW6 32P6 32-Lead, 0.600" Windowed, Ceramic Dual Inline Package (Cerdip)
32-Lead,Plastic J-Leaded Chip Carrier (PLCC) 32-Lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)
32-Lead, 0.450" Wide, Plastic Gull Wing Small Outline (SOIC)
32-Lead, Plastic Thin Small Outline Package (TSOP)
Ordering Information (Continued)
tACC (ns) (mA) Active Standby Ordering Code AT27C080-12DC AT27C080-12JC AT27C080-12PC AT27C080-12RC AT27C080-12TC AT27C080-12DI AT27C080-12JI AT27C080-12PI AT27C080-12RI AT27C080-12TI AT27C080-15DC AT27C080-15JC AT27C080-15PC AT27C080-15RC AT27C080-15TC AT27C080-15DI AT27C080-15JI AT27C080-15PI AT27C080-15RI AT27C080-15TI Package 32DW6 32P6 32DW6 32P6 32DW6 32P6 32DW6 32P6 Operation Range Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Package Type 32DW6 32P6 32-Lead, 0.600" Windowed, Ceramic Dual Inline Package (Cerdip)
32-Lead,Plastic J-Leaded Chip Carrier (PLCC) 32-Lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)
32-Lead, 0.450" Wide, Plastic Gull Wing Small Outline (SOIC)
32-Lead, Plastic Thin Small Outline Package (TSOP)
AT27C080

Fast Read Access Time Power CMOS Operation max. Standby max. Acti

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