Effectivity Expected Device Shipment Date: 5/10/2004 Earliest Year/Wor

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Effectivity Expected Device Shipment Date: 5/10/2004 Earliest Year/Wor

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This inform that design and/or process change will made following product(s). This notification your information concurrence. This preliminary notification. final will issued when qualification complete data available. require data samples qualify this change, please contact Fairchild Semiconductor within days receipt this notification. have questions concerning this change, please contact: Name: Chow, E-Mail: Phone: 2520 Originator Name: Laylo, Noel E-mail: Phone: 63-32-3400534 Engineer Name: Jose, Maggie E-mail: Phone: 1-408-822-2329 Type: Alternate Assembly/Test Location/Qualification
Effectivity Expected Device Shipment Date: 5/10/2004 Earliest Year/Work Week Changed Product: 0420 (Note: Package marking differ from this format) Product (Description): Affects ANALOG devices TO220/263 -5lds packages. FSID list below detailed list devices affected.
Description Change: Fairchild Semiconductor intends qualify Fairchild Cebu, Philippines facility additional assembly site build Analog TO220/263 -5lds packages. This will provide Fairchild Semiconductor ability respond quickly customer demand these products with additional flexibility manufacturing locations. These products currently produced assembly test facility subcontractor Enoch, South Korea.
Effect Change: product test conditions limit performance will remain unchanged.
Qualification: qualification plan written intended meet criteria qualifying assembly test location overall reliability product.
Qual/REL Plan Numbers Additional Qualification Data Qual/REL Plan Numbers Qual Plan: From: GMARCUS Date: 5/1/2004 Requestor Qualification: Chow Device: FAN1581T Product Line: Analog Q20030094 Qual Plan: Q20030094
Qualification Stress Test Sample Size Detail
DeviceA: Package: Leads:
FAN1581T TT220/263
Environmental Stress Detail: Stress ACLV HAST1 HTSL TMCL1 Standard Conditions 100%RH, 121C 85%RH, 130C, 150C -65C, 150C Readpoints Sample
1000
WLR/ALR Stress Detail: Stress BPULL BSHR DSHR Standard Conditions Readpoints Sample
Affected FSIDs FAN1581MX FAN1582MX
FAN1581T
FAN1582M25X

Effectivity Expected Device Shipment Date: 5/10/2004 Earliest Year/Wor

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