Design Overview Section ATL25 Series ASIC. Description .1-1
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ATL25 Series
Design Overview
Section ATL25 Series ASIC.
Description .1-1 Design .1-3 Definition Requirements.1-5 Design Options .1-5 Logic Synthesis .1-5 ASIC Design Translation .1-5 FPGA Conversions.1-5
1.4.1 1.4.2 1.4.3
Macro Cores.1-6 8-bit RISC Microcontroller Core .1-6 ARM7TDMI32-bit RISC Microprocessor Core .1-7 ARM920T32-bit RISC Microprocessor Core .1-8 ARM946E-S32-bit RISC Microprocessor Core .1-8 OakDSPCore® Digital Signal Processing Core .1-8 MIPS645Kf64-bit RISC Microprocessor Core .1-8 Teak PalmDSPCore® Digital Signal Processing Cores .1-8
1.5.1 1.5.2 1.5.3 1.5.4 1.5.5 1.5.6 1.5.7
ATL25 Series Cell Library .1-9 Testability Techniques .1-12 Advanced Packaging .1-13
Section Design.
Design Overview .2-1 Design Flow .2-2 Kickoff Meeting: First Milestone.2-4 Underlayer Acceptance: Second Milestone.2-4 Database Acceptance: Third Milestone.2-4 Final Design Review (FDR): Fourth Milestone .2-5 Prototype Delivery: Fifth Milestone.2-5
2.2.1 2.2.2 2.2.3 2.2.4 2.2.5
Design, Translation Conversion Approaches.2-6 Logic Synthesis .2-6 ASIC Design Translation .2-6
2.3.1 2.3.2
Clock Trees .2-6 Preroute Clock Tree Estimation.2-7 Clock Tree Synthesis.2-7
2.4.1 2.4.2
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2.4.3
Clock Tree Verification .2-7
Design Testability (DFT) .2-8 Using Synopsys Compiler TetraMax .2-10 Test Generation .2-10 Techniques .2-10 Structured Scan Techniques .2-11 Boundary Scan .2-12
2.6.1 2.6.2 2.6.3 2.6.4
JTAG/IEEE 1149.1.2-13 Test Access Port (TAP) Architecture .2-13
2.7.1
Section Test.
ASIC Verification .3-1 Methodology .3-1 Vector Limits.3-3 Internal Serial Scan Vectors .3-3 Parametric Test Vector.3-3 Delay Path Test Vector (optional).3-3 JTAG Test Vectors .3-3 3.1.1 3.1.2 3.1.3 3.1.4 3.1.5 3.1.6
Functional Test Vectors .3-4 Test Vector Requirements .3-4
3.2.1
ASIC Testers.3-5 Parametric Testing .3-6
3.3.1
Static Path Analysis .3-7 Test Methodology Options.3-7 Delay Path Measurement .3-8
3.4.1 3.4.2
Conclusion .3-8
Section Packaging
Introduction .4-1
Section Quality Reliability Assurance
Executive Decision .5-1 Continuous Improvement Quality System.5-1 Atmel's Quality System .5-3 Reliability Assurance.5-4 Failure Rates .5-4 Bathtub Curve .5-4 Atmel Reliability Program .5-5
5.4.1 5.4.2 5.4.3
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5.4.4
Design Quality Reliability.5-5
Failure Analysis Capability .5-6 CMOS Reliability Data .5-7 Gate Oxide Integrity.5-7 Electromigration.5-7 Carriers .5-7 CMOS Latch-up Immunity .5-7 Construction Analysis .5-7 Sensitivity .5-7 CMOS Reliability .5-7 Statistical Process Control (SPC) .5-7 Statistical Design Experiments (DOE).5-8
5.6.1 5.6.2 5.6.3 5.6.4 5.6.5 5.6.6 5.6.7 5.6.8 5.6.9
5.6.10 Payoff .5-8
Section Military Aerospace
Designing High Reliability .6-1 Gate Array .6-2 CLASS .6-3 6.1.1 6.1.2
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ATL25 Series Design Overview
Section ATL25 Series ASIC
Description
ATL25 Series ASIC family fabricated 0.25µ CMOS process with five levels metal. This family features arrays with million routable gates pins. high density high count capabilities ATL25 family, coupled with ability embedded microprocessor cores, engines memory same silicon, make ATL25 series ASICs ideal choice system-level integration.
Figure 1-1. ATL25 Gate Array ASIC
Standard Gate Array Architecture
Figure 1-2. ATL25 Embedded Array ASIC
Standard Gate Array Architecture
Analog
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Table 1-1. ATL25 Array Organization
Device Number ATL25/44 ATL25/68 ATL25/84 ATL25/100 ATL25/120 ATL25/132 ATL25/144 ATL25/160 ATL25/184 ATL25/208 ATL25/228 ATL25/256 ATL25/304 ATL25/352 ATL25/388 ATL25/432 ATL25/484 ATL25/540 ATL25/600 ATL25/700 ATL25/800 ATL25/900 ATL25/976 Notes: Routable Gates(1) 9,535 30,096 50,410 75,472 106,278 131,670 159,778 200,998 270,663 329,281 401,010 512,398 733,635 925,815 1,133,594 1,417,125 1,651,406 2,069,052 2,567,790 3,520,954 4,231,979 5,378,257 5,765,320 Routable Gates(1) 10,727 33,858 56,712 84,906 120,449 149,226 181,081 227,797 306,751 376,321 458,298 585,598 838,440 1,068,248 1,307,994 1,635,145 1,926,640 2,413,894 2,995,755 4,107,780 5,001,430 6,356,122 6,918,384 Available Routing Sites(2) 15,892 50,161 84,018 125,788 188,940 234,080 284,050 357,330 481,179 627,203 763,830 975,998 1,397,400 1,899,108 2,325,323 2,906,925 3,669,792 4,597,895 5,706,200 7,824,344 10,259,344 13,038,200 15,374,188 Count Count Gate Speed
gate NAND2 Routing site transistors Nominal 2-input NAND gate 2.5V
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ATL25 Series ASIC
Design
Atmel supports several major software systems design with complete cell libraries, well utilities netlist verification, test vector verification accurate delay simulations Table 1-2. Design Systems Supported
System Cadence Design Systems, Inc.
Tools Opus Schematic Layout Verilog- Verilog Simulator Pearl- Static Path Verilog-XL- Verilog Simulator BuildGates- Synthesis (Ambit) ModelSim® Verilog VHDL (VITAL) Simulator Leonardo Spectrum- Logic Synthesis Design Compiler- Synthesis Compiler 1-PassTest Synthesis Compiler Boundary Scan Synthesis TetraMax® Automatic Test Pattern Generation PrimeTime- Static Path VCS- Verilog Simulator Floorplan ManagerDebussy® First Encounter®
Version 4.46 3.3-s008 4.3-s095 3.3-s006 4.0-p003 5.5e 2001.1d 01.01-SP1 01.08-SP1 01.08-SP1 01.08 01.08-SP1 01.08-SP1 v2001.2.3
Mentor Graphics® Synopsys®
Novas Software,® Inc. Silicon Perspective
Atmel's ASIC design flow structured allow designer consolidate greatest number system components onto same silicon chip, using widely available thirdparty design tools. Atmel's cell library reflects silicon performance over extremes temperature, voltage process, includes effects metal loading, interlevel capacitance, edge rise fall times. design flow includes clock tree synthesis customer-specified skew latency goals. extraction performed final design database incorporated into timing analysis. ASIC design flow, shown page provides pictorial description typical interaction between Atmel's design staff customer. Atmel will deliver design kits support customer's synthesis, verification, floorplanning scan insertion activities. Leading-edge tools from vendors such Synopsys Cadence fully supported design flow. case embedded array design, Atmel will conduct design review with customer define partition embedded array ASIC define location memory blocks and/or cores underlayer layout model created. Following database acceptance, automated test pattern generation (ATPG) performed, required, scan paths using Synopsys tools; design routed; postroute data extracted. After post-route verification final design review, design taped fabrication.
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Table 1-3. Design Flow
Deliver Design
Kickoff Meeting
Embedded Array
Define Underlayer
Synthesis/ Design Entry
Scan/JTAG
Simulation/ Static Path
Floorplan
Embedded Array (Preliminary Netlist)
Create Underlayer
Database Handoff
Tape Underlayer
Database Acceptance
Fabricate Underlayer
Place Route/ Clock Tree
Verification/ Resimulation
Final Design Review Standard Cell Embedded/Gate Array
Tape Full Mask
Tape Metal Masks
Fabricate
Fabricate Personality
Customer Atmel Joint
Proto Assembly Test Rev. 2.2-03/02
Proto Shipment
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ATL25 Series Design Overview
ATL25 Series ASIC
Definition Requirements
corner pads reserved power ground only. other pads fully programmable input, output, bidirectional, power, ground. When implementing design with 3.3V compliant buffers, appropriate number sites must reserved pins, which used distribute 3.3V power compliant buffers.
1.4.1
Design Options
Logic Synthesis Atmel accept designs Verilog VHDL formats. Atmel fully supports Synopsys Verilog VHDL simulation well synthesis. formats, Verilog VHDL, Atmel's preferred format ASIC design Verilog. Atmel successfully translated existing designs from most major ASIC vendors into Atmel ASICs. These designs have been optimized speed gate count modified logic memory, replicated pin-for-pin compatible, drop-in replacement. Atmel successfully translated existing FPGA/PLD designs from most major vendors into Atmel ASICs. There four primary reasons convert from FPGA/PLD ASIC: Conversion high-volume devices single combined design cost effective. Performance often optimized speed power consumption. Several FPGA/PLDs combined onto single chip minimize cost while reducing on-board space requirements. situations where FPGA/PLD used fast cycle time prototyping, ASIC provide lower cost answer long-term volume production.
1.4.2
ASIC Design Translation
1.4.3
FPGA Conversions
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1.5.1
Macro Cores
RISC microcontroller true 8-bit RISC architecture, ideally suited 8-bit RISC Microcontroller Core embedded control applications. offered gate level, synthesizable macro core ATL25 family. supports powerful instructions. prefetches instruction during prior instruction execution, enabling execution instruction clock cycle. Fast Access RISC register file consists general-purpose working registers. These registers eliminate data transfer delay traditional program code intensive accumulator architectures. incorporate program memory (ROM) data memory (SRAM). Among peripheral options offered are: UART, 8-bit timer/counter, 16-bit timer/counter, programmable watchdog timer SPI.
Figure 1-3. 8-bit RISC Microcontroller Core
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8-bit Data
ATL25 Series ASIC
1.5.2
ARM7TDMI32-bit RISC Microprocessor Core
ARM7TDMI powerful 32-bit processor offered hard macro core ATL25 family. ARM7TDMI member Advanced RISC Machines (ARM) family generalpurpose 32-bit microprocessors, which offer high performance with very power consumption. Additionally, ARM7T offers users "thumb" mode (for higher code density using 16-bit instructions architecture based Reduced Instruction Computer (RISC) principles, instruction related decode mechanism much simpler than those microprogrammed Complex Instruction Computers (CISC). This simplicity results high instruction throughput impressive real-time interrupt response from small cost-effective chip. Pipelining employed that parts processing memory systems operate continuously. Typically, while instruction being executed, successor being decoded, third instruction being fetched from memory. memory interface been designed allow performance potential realized without incurring high costs memory system. Speed-critical control signals pipelined allow system control functions implemented standard lowpower logic, these control signals facilitate exploitation fast local access modes offered industry standard SRAMs. ARM7TDMI core interfaces several optional peripheral macros. Among peripheral options offered real-time clock, peripheral data controller, USART, external interface, interrupt controller, timer counter watchdog timer.
Figure 1-4. ARM7TDMI 32-bit RISC Microprocessor Core
Address Incrementor Register Bank 32-bit Registers) Status Registers)
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1.5.3
ARM920T32-bit RISC Microprocessor Core ARM946E-S32-bit RISC Microprocessor Core
ARM920T extends capabilities popular ARM7TDMI, while maintaining code compatibility Thumb instruction compression. Enhancements include Harvard architecture memory management unit with virtual addressing support (allowing advanced platform operating systems such Windows CETM, LinuxTM, Symbian OSand VxWorksTM). Kbyte data instruction caches included. ARM946E-S synthesizable version ARM9E-S core, with similar features ARM920T. ARM9E-S instruction adds saturation logic enhance implementation, well double-word data moves. Additional features include single cycle Multiply Accumulate (MAC) Unit. memory protection unit provided, without full virtual memory support. result, ARM946E-S more suited deeply embedded tasks that require extended-platform support. Cache sizes tailored application, resulting (potentially) smaller size compared ARM920T. Atmel's hard macro OakDSPCore 16-bit, general-purpose, low-power, low-voltage high-speed Digital Signal Processor (DSP). designed mid-to-high-end telecommunications consumer electronics applications, where low-power portability major requirements. Among applications supported digital cellular telephones, fast modems, advanced facsimile machines hard disk drives. available core Atmel's ASIC cell library, utilized engine DSP-based ASIC. specified with several levels modularity SRAM, blocks, allowing efficient DSP-based ASIC development. aimed achieving best cost-performance factor given (small) silicon area. element system-on-chip, takes into account such requirements program size, data memory size, glue logic power management. core consists three main execution units operating parallel: Computation/Bit-Manipulation Unit (CBU), Data Addressing Arithmetic Unit (DAAU) Program Control Unit (PCU). core also contains SRAM addressing units, Program Control Logic (PCL). other peripheral blocks that application specific defined part user-specific logic implemented around core same silicon die. enhanced general microprocessor functions meet most application requirements. programming model instruction aimed straightforward generation efficient compact code.
1.5.4
1.5.5
OakDSPCore Digital Signal Processing Core
1.5.6
MIPS645Kf64-bit RISC Microprocessor Core
MIPS64 synthesizable MIPS64 family core that provides 64-bit address data paths along with onboard IEEE 754-compliant Floating Point Unit. built-in memory management unit with virtual addressing support allows platform operating systems such Windows others. Also provided configurable instruction data caches, well multiply divide unit capable single cycle Multiply Accumulate (MAC) operations. Teak Palm synthesizable dual-MAC cores from Group, Inc. Teak fixed-point 16-bit DSP, whereas Palm configured 16-bit, 20-bit 24-bit fixed-point math. Both cores optimized high MIPs with performance targeted handling filtering, voice compression/decompression modem functions portable wireless applications such digital cellular. Hardware support also provided implementing Viterbi forward error correction. Teak Palm cores both have comprehensive suite development tools that easy learn intended support rapid code development. compiler that supports in-line assembly language provides language extensions enhance
1.5.7
Teak PalmDSPCore® Digital Signal Processing Cores
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ATL25 Series ASIC
code optimization provided. assembler linker also provided. Both emulation (using test silicon) source-level simulation assembly language enhance software verification.
ATL25 Series Cell Library
Atmel's ATL25 Series ASICs make extensive library cell structures, including logic cells, buffers inverters, multiplexers, decoders options. Soft macros also available.
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These cells characterized SPICE modeling transistor level, with performance verified manufactured test silicon. Characterization performed over rated temperature voltage ranges ensure that simulation accurately predicts performance finished product.
Figure 1-5. Absolute Maximum Ratings*
Parameter Operating Ambient Temperature Storage Temperature Maximum Input Voltage: Inputs 3.3V Compliant 3.3V/5V Tolerant Maximum Operating Voltage (VDD) Maximum Operating Voltage (VDD3) Note: Rating -55°C +125°C -65°C +150°C 0.5V VDD3 0.5V 5.5V 2.7V 3.6V
Stresses beyond those listed under Absolute Maximum Ratings cause permanent damage device. This stress rating only; functional operation device these other conditions beyond those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect device reliability.
Table 1-4. 2.5-volt Characteristics Applicable over recommended operating temperature voltage range unless otherwise noted.
Symbol Parameter Buffer Test Condition
Units
Operating Temperature Supply Voltage High-level Input Current Low-level Input Current High-impedance State Output Current Output Short-circuit Current High-level Input Voltage
CMOS CMOS VDD, (max) VSS, (max) Pull-up VSS, (max), pull-up pull-down VOUT VDD, (max) VOUT VSS, (max)
0.7VDD 0.7VDD 0.3VDD 0.3VDD
PO11 PO11 CMOS CMOS Schmitt CMOS CMOS Schmitt CMOS Schmitt PO11 3.3V Tolerant PO11
VHYS
Low-level Input Voltage Hysteresis High-level Output Voltage (Standard Tolerant Low-level Output Voltage (Standard Tolerant) I/Os 2.5V Compliant
(max) (max)
0.7VDD 0.7VDD 0.3VDD
Note:
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Table 1-5. 3.3-volt Characteristics Applicable over recommended operating temperature voltage range unless otherwise noted.
Symbol VDD3 Parameter Operating Temperature Supply Voltage Supply Voltage High-level Input Current Low-level Input Current High-impedance State Output Current Buffer Except 3.3V Compliant 3.3V Compliant CMOS VDD, (max) VSS, (max) Pull-up (max) pull-up VOUT VDD, (max) VOUT VSS, (max) 0.475V 0.325VDD3 VDD3 (min) VDD3 (min) 0.8VDD3 0.9VDD3 0.2VDD 0.1VDD Test Condition Units
CMOS
Buffer Output Short-circuit Current Buffer CMOS, LVTTL High-level Input Voltage CMOS/TTL-level Schmitt CMOS Low-level Input Voltage CMOS/TTL-level Schmitt TTL-level Schmitt PO11 Low-level Output Voltage PO11 Note: I/Os 3.3V Tolerant/Compliant
VHYS
Hysteresis High-level Output Voltage
Table 1-6. Buffer Characteristics
Symbol COUT CI/O Parameter Capacitance, Input Buffer (die) Capacitance, Output Buffer (die) Capacitance, Bidirectional Test Condition 3.3V 3.3V 3.3V Typical Units
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Testability Techniques
complex designs involving blocks memory and/or cores, careful attention must given design-for-test techniques. sheer size complex designs requires more efficient testability techniques. Combinations SCAN paths, multiplexed access memory and/or core blocks, built-in self-test logic addition functional test patterns) must employed provide both user Atmel with ability test finished product. example highly complex design could include clock management synthesis, microprocessor engine both, SRAM support microprocessor engine, glue logic support interconnectivity each these blocks. design each these blocks must take into consideration fact that manufactured device will tested high-performance digital tester. Combinations parametric, functional structural tests, defined digital testers, should employed create suite manufacturing tests. type block dictates type testability technique employed. will, construction, provide access nodes that functional and/or parametric testing performed. Since digital tester must control clocks during testing ASIC, provisions must made bypassed. Atmel's PLLs include multiplexing capability just this purpose. addition pins will allow other portions isolated test without impinging upon normal functionality. similar vein, access microprocessor, SRAM blocks must provided that controllability observability inputs outputs blocks achieved with minimum amount preconditioning. MIPS microprocessors, microcontroller digital signal processors support SCAN testing. SRAM blocks need provide access both address data ports that comprehensive memory tests performed. Multiplexing pins method providing this accessibility. glue logic designed using full SCAN techniques enhance testability. should noted that almost these cases, purpose testability technique assure embedded circuit blocks functional. techniques described above should considered supplemental patterns that exercise functionality design anticipated operating modes.
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Advanced Packaging
ATL25 Series ASICs offered wide variety standard packages, including plastic ceramic quad flatpacks, thin quad flatpacks, ceramic grid arrays ball grid arrays. High-volume onshore offshore contractors provide assembly test commercial product, with prototype capability Colorado Springs. Custom package designs also available required meet customer's specific needs, supported through Atmel's package design center. standard package cannot meet customer's needs, package designed precisely customer-specific application maintain performance obtained silicon. Atmel delivered custom-designed packages wide variety configurations.
Table 1-7. Packaging Options-Partial List
Package Type PQFP Power Quad L/TQFP PLCC
CPGA CQFP PBGA Super Low-profile Mini Chip-scale Flex-tape FCBGA
Count 100, 120, 128, 132, 144, 160, 184, 208, 240, 144, 160, 208, 240, 100, 120, 128, 144, 160, 176, 100, 124, 144, 155, 180, 223, 224, 299, 100, 120, 132, 144, 160, 224, 121, 169, 208, 217, 225, 240, 256, 272, 300, 304, 313, 316, 329, 352, 388, 420, 168, 204, 240, 256, 304, 352, 432, 560, 100, 108, 128, 132, 144, 160, 176, 192, 208, 224, 100, 108, 121, 128, 144, 160, 169, 176, 192, 208, 224, 256, 288, 100, 112, 132, 144, 156, 160, 180, 192, 196, 204, 208, 220, 225, 228, 256, 416, 480, 564, 672, 788, 896, 960, 1032, 1152, 1157, 1292, 1357, 1413, 1500, 1517, 1557, 1677, 1728, 1932
Note:
Require customer design substrate.
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Section Design
Design Overview Atmel's flexible design approach enables customer develop database compatible with Atmel's design flow through number different methodologies: logic synthesis, netlist translation FPGA/PLD conversion. Atmel provides comprehensive cell, IP/core functional timing libraries characterized commercial, industrial military conditions. Supported software versions platforms major systems shown Table page addition libraries, Atmel provides several proprietary software packages. Atmel test vector checker, VectorCheck ensures that vectors acceptable format, pins functionally exercised, waveform timing relationships implemented tester hardware. Atmel netlist checker, DoubleCheckTM, identifies common design errors potential logic timing problems. also incorporates nonlinear delay calculator that accounts both preroute wireload estimation postroute back annotation when generating files supported simulators. logic synthesis approach generates gate-level netlist targeted Atmel cells Hardware Description Language (HDL) netlist. Benefits include more structured design, better adherence design rules, easier testability insertion, which lead shorter overall design cycle. Either Atmel customer perform synthesis. netlist translation approach converts existing gate array standard cell design into Atmel ASIC. Given netlist, vectors postroute timing information, Atmel translates design provides Verilog, EDIF VHDL netlist Atmel cells simulation verification customer's facility. Using this approach, Atmel deliver pin-for-pin compatible drop-in replacement, ASIC with improved performance, ASIC that combines several designs into one. should emphasized that this approach still requires customer review approve performance resultant Atmel ASIC. FPGA/PLD conversion approach creates ASIC from more FPGA/PLD designs should only used when netlist design unavailable logic synthesis. Prototype designs verified with programmable device then converted into ASIC production. with cell-based design translation, Atmel deliver pin-for-pin compatible drop-in replacement, ASIC with improved performance, single ASIC that combines several FPGA/PLDs. Like cell-based translation, this approach requires customer review approve performance resultant Atmel ASIC.
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Design
Table 2-1. Atmel Gate Array/Embedded Array Design Tools
System Cadence® Design Systems, Inc. Tools Opus- Schematic Layout Verilog- Verilog Simulator Pearl- Static Path Verilog-XL- Verilog Simulator BuildGates- Synthesis (Ambit) ModelSim® Verilog VHDL (VITAL) Simulator Leonardo Spectrum- Logic Synthesis Design Compiler- Synthesis Compiler 1-PassTest Synthesis Compiler Boundary Scan Synthesis TetraMax® Automatic Test Pattern Generation PrimeTime- Static Path VCS- Verilog Simulator Floorplan ManagerDebussy® First Encounter® Version 4.46 3.3-s008 4.3-s095 3.3-s006 4.0-p003 5.5e 2001.1d 01.01-SP1 01.08-SP1 01.08-SP1 01.08 01.08-SP1 01.08-SP1 v2001.2.3
Mentor Graphics® Synopsys®
Novas Software,® Inc. Silicon Perspective
Design Flow
Regardless approach chosen, Atmel ISO9001/QS9000 certified design flow specifies four/five major milestones: Kickoff Meeting Underlayer Tapeout (UL), required Database Acceptance (DA) Final Design Review (FDR) Prototype Delivery Atmel defined specific requirements that must accomplished each step before proceeding next milestone.
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Design
Figure 2-1. Simplified Design Flow
Customer
Kickoff Meeting
Atmel
Customer
Synthesis, Translation Conversion
Atmel
Customer
Database Submission Underlayer
Atmel
Customer
Underlayer Acceptance Tapeout
Atmel
Customer
Final Database Submission
Atmel
Customer
Database Acceptance
Atmel
Physical Design Verification
Atmel
Customer
Final Design Review
Atmel
Customer
Prototype Delivery
Notes:
Performed customer optionally Atmel ISO9001/QS9000 Milestone
Rev.2.3-04/02
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Design
2.2.1
Kickoff Meeting: First Milestone
kickoff meeting, Atmel engineers will interfacing with customer introduced; design flow, milestones checklists presented detail; Deliverable Definition List (DDL) initial design schedules reviewed agreed upon. establishes what work Atmel will perform customer when that work will completed. Electrical performance power specifications, critical path timing requirements, testability requirements, custom cells, RAMs IP/cores discussed. meeting documented Kickoff Meeting Checklist. additional Statement Work (SOW) that further defines tasks, responsibilities schedules required certain complex designs with IP/cores design that requires Atmel Design Services.
2.2.1.1
Design Services
Synthesis, translation conversion steps typically occur between kickoff meeting Database Acceptance (DA). These steps performed either Atmel customer specified result netlist Atmel cells. needed, testability insertion, preroute functional timing verification, floorplanning performed customer before optionally, Atmel after design work done Atmel prior specified documented Checklist customer approval. Additional design work performed Atmel after documented Final Design Review Checklist. Underlayer Acceptance (UA) joint review between Atmel customer which customer formally accepts timing fixed placement macro cells custom underlayer that Atmel creating. assist evaluation underlayer, customer must provide design netlist Atmel cells that closely approximates final design size architecture, proposed floorplan final pinlist. customer's responsibility establish verify target timing requirements when Atmel performing place route. Database Acceptance (DA), joint review between Atmel customer, most important milestone smooth design process. Prior Atmel verifies that design passed netlist test vector checks. During meeting, Atmel reviews updated formally accepts finalized design database test vectors. Items covered Checklist include limited following: flat hierarchical netlist Atmel cells, test vectors, system loading input transition time file(s), package assignment file, netlist checker report, test vector checker reports, clock critical path timing specifications, testability requirements. Successful completion marks start physical design work Atmel. During physical design phase, each cell placed array routed (connected together) specified netlist. needed, more clock trees added design. resulting physical database analyzed with parasitic extraction tool, which generates back annotation files that include effects networks. functional timing verification, design simulated best, nominal worst case operating conditions using back annotation information, customer-supplied system loading Automatic Test Equipment (ATE) loading. this point netlist Standard Delay Format (SDF) file provided customer additional simulations customer site. Because estimated wire capacitance used preroute simulations, performance changes between preroute postroute simulations should minimal. specified, critical path timing verified with static path analysis tool. After functional timing verification complete, physical verification performed routed design. Design Rule Checking (DRC) confirms that design meets detailed CMOS process design rules fabrication process. Layout Versus Schematic (LVS) guarantees that routed design matches final simulation netlist. These checks ensure that prototype parts will meet customer specifications.
2.2.2
Underlayer Acceptance: Second Milestone
2.2.3
Database Acceptance: Third Milestone
2.2.3.1
Physical Design
2.2.3.2
Physical Design Verification
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Design
Minor physical design corrections accommodated with Engineering Change Order (ECO) while major corrections usually require reroute. 2.2.4 Final Design Review (FDR): Fourth Milestone Final Design Review last joint review between Atmel customer before committing prototypes. Items that reviewed Checklist include limited following: changes, postroute netlist changes, DRC/LVS results, netlist test vector checker reports, buffer listing bonding diagram, electrical specifications, testability report, clock tree latency skew, postroute timing simulation static path results, power ground bounce analysis, package information. Before design taped masks made, customer must sign submit Approval Form. After been successfully completed customer signed Approval Form, tape released mask shop. Atmel tests prototype units room temperature verify functional electrical performance, then delivers packaged prototypes customer. Receipt customer-signed ASIC Prototype Approval Form completes design flow process releases Atmel start preproduction production manufacturing.
2.2.5
Prototype Delivery: Fifth Milestone
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Design
Design, Translation Conversion Approaches
Logic Synthesis
Statement Work (SOW) contains list requirements specific each approach should completed Atmel contracted perform these design functions.
2.3.1
Logic synthesis performed Atmel customer. Atmel accepts design netlists Verilog VHDL formats incorporating behavioral, data flow structural language constructs. Alternatively, Atmel provide synthesis libraries commercial, industrial military operating conditions customers synthesize their designs. Regardless performs synthesis, resulting gate-level netlist functionally verified using customer testbenches, performance further optimized using combination timing analysis synthesis tools. When Atmel performs synthesis, results reviewed with customer during ensure that design functionality performance goals achieved. result synthesis gate-level netlist Atmel cells test vectors that suitable Translation process converting existing design from different cell library Atmel's ASIC cell library. Taking functionality timing into account, each cell original design mapped equivalent cell Atmel library. order avoid race conditions, delay cells added match speed slower technology. performance improvement needed, small functional blocks implemented hard macros, drive strength selected cells increased. there buffers Atmel cell library that adequately match performance existing part, buffers designed SPICE simulations match switching characteristics. This cell mapping approach minimizes need customer engineering resources time-consuming design modifications netlist level. verify proper operation performance, netlist translated vectors used functional timing simulations best, nominal worst case conditions temperature, voltage process. direct comparison, performance original device determined simulation actual characterization sample part. Under customer direction approval, signals paths with greater than desired timing difference accelerated delayed meet specifications, improve performance create greater design margin. Given proper timing specifications, static path analysis tool used verify critical paths (input register, register register, register output), setup hold, clock latency skew. Although static path analysis tool identifies potential timing problems paths design independent test vectors, vectors still required functional verification. design verification work performed Atmel prior covered Checklist.
2.3.2
ASIC Design Translation
Clock Trees
Atmel provides special clock buffers cell library preroute simulation. Customers directed these special buffers instead attempting generate clock distribution network from buffers, inverters other cells. Atmel replaces each special clock buffer cell with clock tree verifies latency skew times during physical design. Here some guidelines achieving better clock tree results: high-drive input buffer each clock signal. Provide actual input transition times each clock signal. Specify timing requirements between different clock domains. Identify groups registers that share common clock communicate with each other. They placed near each other minimize skew.
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2.4.1
Preroute Clock Tree Estimation
logic designer instantiates special Atmel clock tree buffer cell netlist placeholder each clock tree clock subtree. This cell used create reasonable signal transition times preroute simulations, does predict clock latency skew taken into account. gated clock distribution networks, clock tree buffer cells must used before after gating logic, timing each clock subtree determined separately. Contact Atmel engineer obtain clock buffer cell estimated latency delays that inserted file preroute timing simulation specified logic synthesis tool. Atmel builds clock trees using flat net-level approach which same feeds leaf pins given tree. Multiple clock trees easily constructed grouping clock pins unique nets, each driven separate clock buffer cell. necessary that each clock tree have chip input buffer. example, inverted noninverted clock originate from same port, slower clock generated from faster clock. geometry synthesized tree determined allowable transition time, insertion delay (also called latency), skew number leaf pins. Array size floorplanning will also contribute significantly Atmel's ability meet customer clock requirements, which specified build clock tree which leaf pins exclusively clock pins, customer must provide list nonclock leaf pins. clock tree includes gating logic generated clocks, Atmel needs know desired timing relationships between subtrees.
2.4.2
Clock Tree Synthesis
2.4.3
Clock Tree Verification
Back annotation data that includes time-of-flight effects networks extracted from route used static path analysis tool verify latency skew times each generated clock tree.
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Design
Design Testability (DFT)
complexity ASIC designs increases, ability adequately test circuit using only functional pins severely limited. Atmel gate arrays range from well over input/output (I/O) pins. 60-pin array inputs sequential logic, exhaustively tested clock cycles, about seconds clock rate. Increasing input count inputs increases test time over years. Adding sequential logic (registers) increases test time exponentially with number clocked elements between input output (pipeline length). Obviously, designs must have some degree testability built into them order useful, reliable circuits that reach marketplace timely manner. Performing functional tests general functions corner cases device enough screen defective parts. Manufacturing defects such shorted ground shorted power translate functional defects that detected through functional tests. performing manufacturing tests, these physical faults detected through fault models such stuck-at-faults, which help translate physical defects detectable functional faults. Atmel provides multiplexed flip-flop type internal scan synthesis automatic test pattern generation means performing manufacturing tests. this process, Synopsys' test tools Compiler TetraMax used synthesize scan generate automatic test patterns. When using structured technique such mutiplexed flip-flop type scan synthesis, specific requirements imposed such flow must followed. Multiplexed flip-flop type scan procedure converts nonscan sequential elements that part scan architecture into their scan equivalent counterparts. scan equivalent flip-flops then formed into more serial shift registers. Serial shift registers partition combinational blocks, providing pseudo primary input (PI) pseudo primary output (PO) access combinational blocks that controllable observable through primary inputs primary outputs. ideal scenario, such conversion provides controllability observability access nodes design, leading 100% coverage stuck-at-fault type defects. metric used define such test coverage number detected faults test coverage number faults number undetectable faults Rules that govern controllability observability scan design known test design rules. avoid test design rule violations following recommended guidelines when synthesizing scan designs. Here some guidelines that, followed, will prevent test design rule violations. drive ports clock. Make sure registers that will part scan architecture controllable directly from clock. design generated gated clocks, provide test clocks muxed from bypass generated gated clocks test mode. bidirectional ports test clocks. Make sure asynchronous pins registers part scan architecture controllable directly from asynchronous control ports. design asynchronous registers part scan architecture that controllable directly from asynchronous port, provide muxed-in level asynchronous port test mode.
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make data inputs registers sensitive clocks. gate clocked register output generate another clock. Make sure design feedback loops. does they cannot removed from design, provide suitable location break loop test mode. clock signals drive multiple pins registers. make data inputs depend other clocks. multiple clocks capture data into registers latches. Make latches transparent test mode. attempt form latches combining available combinational primitive gates technology library. scan equivalent registers functional registers unless design synthesized scan ready. address testability issues designs with embedded memory blocks, additional measures such BIST shadow registers around memory blocks should considered. designs contain analog blocks IPs, they should considered other means manufacturing testing individual basis.
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Design
2.6.1
Using Synopsys Compiler TetraMax
Test Generation following guidelines allow designs efficiently enhanced using Synopsys Compiler/TetraMax software. SCAN design rules followed, these tools scan chains design generate test vectors automatically achieve high fault coverage. When design rule followed, fault coverage reduced, sometimes dramatically, unless design modified comply with rules. This approach will require least additional Test Enable (TE) least pins muxing required Test mode. Three popular types techniques have been shown improve circuit's testability. These techniques partitioning, memory array isolation, test points. these techniques practical very large scale integration (VLSI) chip designs. Partitioning: Since cost test pattern generation approximately proportionate number gates cubed, task test pattern generation greatly simplified partitioning circuitry into smaller pieces. Partitioning accomplished providing internal access through multiplexers scan register.
2.6.2
Techniques
Table 2-2. Synopsys Test Compiler/Test Generation Guidelines
Testability Rule Synchronous design Effects Infraction Associated logic untestable Workaround Break feedback path with test mode.
cross coupled gates unregistered feedback
Single edge clocking clock gating latches Single external reset Clocked device allowed scan chain; reduced fault coverage Clocked device allowed scan chain; reduced fault coverage allowed scan chain; reduced fault coverage allowed scan chain; reduced fault coverage test mode, create single edge clocking with inverters multiplexers. data disable flip-flops instead clock enables; disable gating test mode. alternate test methods; force latches transparent mode with test mode. Reset ORed with test mode.
asynchronous resets presets generated chip combinational logic reset path
internal tristate buses direct connections
Reduced fault coverage; possible tristate contention during scan test Dynamic hazard
MUXs gates; insert gating controls prevent contention.
Memory Array Isolation: Whenever memory arrays embedded within combinational logic, problems arise attempting sort faults within memory array combinational logic. including ability isolate these arrays from surrounding combinational logic, tests devised individually test array combinational logic. Test Points: Test points another method improving functional test pattern fault coverage. Test points essentially enhance controllability observability circuit providing direct access internal nodes. Specialized test equipment, such bedof-nails tester, used test circuit boards. case large scale ICs, test
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points pads become impractical because size package costs function number pads. However, scan registers viewed means inserting electrical test points into VLSI design. addition techniques described above, disciplined design rules greatly improve testability circuit design avoiding creation untestable circuits. Some examples given below. Redundant logic: Faults within redundant logic detectable. redundant logic required, test circuitry separate redundant paths test each these paths individually. Asynchronous logic: This creates potential race conditions within circuit. registered logic only. Initialization: Design circuits easy initialization allow easy stabilization sequential circuits prior test. 2.6.3 Structured Scan Techniques testability sequential circuits simplified providing means access internal registers. gain access these internal registers, standard registers within design replaced with special registers that configured normal parallel registers serial shift registers.
Figure 2-2. Scan Register Design
With access provided registers through serial scan path, problem sequential logic test pattern generation transformed into simpler problem combinational logic test pattern generation. Scan Register Design: Several variations scannable register designs have been around years, actual implementation scan design vary great deal. basic Atmel scan register design, test enable allows selection parallel data input serial data input. Atmel's macrocell library contains several cells that used basic building blocks scan register design. These cells cells. Information about these cells available from your Atmel sales representative. judicious selection these cells, designer easily build scannable register meet needs.
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Scan Path Formation: Scannable registers formed into scan paths connecting serial output signal register serial input signal next register. register control clock signals connected registers within scan path. 2.6.4 Boundary Scan Boundary scan used simplify board system testing nothing more than adaptation serial scan technique. Boundary scan involves inclusion shift-register stage (contained boundary-scan cell) adjacent each component such that signals component boundaries controlled observed using scan testing principles. boundary-scan cells connected such that they form shift-register chain around periphery design. This path provided with serial input output connections appropriate clock control signals. This allows system board designed with incorporating boundary-scan form single data path through board design. Alternatively, system boards contain several independent boundary-scan paths. This formation boundary-scan paths system level greatly level system's testability. utilizing boundary-scan registers each board (assuming each boundary-scan register), board design partitioned. setting each IC's boundary-scan register external test mode, interconnections board level tested opens shorts. Alternatively, setting each IC's boundary-scan register internal test mode, each individual isolated independently tested. Combined, these features allow original equipment manufacturers (OEMs) simplify their board level test, eventually eliminating need bed-of-nails testers.
Figure 2-3. Boundary-scannable Board Design
Serial Data
Serial Data
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JTAG/IEEE 1149.1
effort standardize boundary-scan design resulted proposed Institute Electrical Electronics Engineers, Inc. (IEEE) standard 1149.1, "Standard Test Access Port Boundary-scan Architecture." This standard evolved from work Joint Test Action Group (JTAG), informal, international group semiconductor manufacturers OEMs. Standard 1149.1 approved full IEEE standard February 1990 become industry standard system design with boundary-scan. This standardization important that allows common approach boundary-scan design from different semiconductor manufacturers. Standard 1149.1 calls each incorporate this into design. shown following figure, 1149.1 consists four pins: test clock (TCK), test data (TDI), test data (TDO), test mode select (TMS). addition, controller, Instruction register test-data registers bypass boundaryscan included. Optionally, user-defined test-data registers, test reset (TRST) pin, device identification register, parallel STATUS included. selects appropriate data path through based contents Instruction register. Together, combine control controller, which turn generates clocks controls Instruction registers test-data registers. discussed above, boundary-scan register allows system's board interconnections IC's circuitry separately tested. addition, SAMPLE mode allows IC's normal operation data flow sampled through boundary-scan register. bypass register allows individual IC's boundary-scan register bypassed "short-circuited" when test data required flow through another system's board boundary-scan path. device identification register will contain IC's manufacturer's code name, IC's part number part variation (design revision). OEMs poll this register determine which tests apply user-defined test-data registers used other purpose such internal scan path further partition IC's logic. Atmel supports boundary scan logic synthesis through Synopsys' Compiler. cost overhead designing with 1149.1 minimal. most notable impact will reduction available external pins application purposes. further information regarding design 1149.1 your application, please contact design center your area. Benefits obtained through 1149.1-compatible ICs. available 1149.1-compatible used partially partition system design, thereby simplifying overall test system. addition, each 1149.1-compatible thought building block system level used many different times different designs design revisions. Once test been developed building block, need changed when block used again. Hence, 1149.1compatible reduce overall system level test development effort reduce time-to-market product. Please note that Atmel boundary-scan synthesis flow mandates test reset pin. Therefore, total number dedicated ports required boundary-scan logic synthesis five.
2.7.1
Test Access Port (TAP) Architecture
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Figure 2-4. JTAG Architecture*
TMS: Test Mode Select TCK: Test Clock TDI: Test Data TDO: Test Data TRST: Test Reset
Boundary-scan register
Device identification register
Optional
User test data registers
Optional
Bypass register
Decoding logic
INST
Instruction register
clocks controls
Output buffer
controller
Enable
clocks controls
Select STATUS OPTIONAL TRST
Note:
JTAG must five-port.
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Section Test
ASIC Verification This chapter describes design verification process used Atmel ensure that your
ASIC first-pass silicon success. subdivided into topics discussing functional test vectors, parametric testing, static path analysis, internal serial boundary scan, ASIC verification methodologies. also includes list deliverables expected from customer each topic. Database Acceptance (DA) design milestone Atmel's ASIC flow. occurs after Design Handoff, which operation transmitting design netlist(s), specifications, vector data Atmel. design passes when Atmel design engineer verifies records Checklist that information necessary complete design been properly received Atmel netlist test vector checks have passed. customer's responsibility hand design that meets requirements Checklist. begin design process, should obtain latest version Checklist from your Atmel engineering representative. Checklist your gateway creating successful ASIC with Atmel.
3.1.1
Methodology
While much Atmel ASIC Design Overview discusses design implementation, important understand verification process that ASIC goes through data from customer enhance level design verification. flow diagram Figure details verification process from customer specification through silicon evaluation.
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Figure 3-1. Gate Array/Embedded Array Design Verification
Deliver Design
Kickoff Meeting
Embedded Array
Define Underlayer
Synthesis/ Design Entry
Scan/JTAG
Simulation/ Static Path
Floorplan
Embedded Array (Preliminary Netlist)
Create Underlayer
Database Handoff
Tape Underlayer
Database Acceptance
Fabricate Underlayer
Place Route/ Clock Tree
Verification/ Resimulation
Final Design Review Standard Cell Embedded/Gate Array
Tape Full Mask
Tape Metal Masks
Fabricate
Fabricate Personality
Customer Atmel Joint
Proto Assembly Test Rev. 2.2-03/02
Proto Shipment
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critical note that functional test vectors static path analysis performed design based entirely customer data submitted time Also, quality inserted scan function designing testability. Atmel only test verify your component level data have provided. 3.1.2 Vector Limits Atmel uses number different test vector types verify ASIC. These listed below with summary limitations recommendations. later section will describe types greater detail. vectors listed here should provided Atmel customer, with possible exception Internal Serial Scan JTAG vectors, which Atmel contracted insert create. 3.1.2.1 Functional Test Vectors least test vector pattern speeds must within tester limits. total cycle count must less than three times design's gate count. Must pass VectorChecktest vector checking tool 3.1.3 Internal Serial Scan Vectors Total vector count must meet Automatic Test Equipment (ATE) memory size limit. Cycle Count (tester cycle limit) (total functional cycle count) Scan chain length should less than 1,000 flip-flops. Must pass VectorCheck test vector checking tool 3.1.4 Parametric Test Vector test vector input pins must toggle both high low. output pins must stable high low, each least consecutive cycles. Bidirectional pins must stable input output mode, each least consecutive cycles. Must pass VectorCheck test vector checking tool 3.1.5 Delay Path Test Vector (optional) test vector set, with five paths Input timing applied customer Output sample time pass worst-case simulation results Tester accuracy must accounted for. same cycle paths tested. Must pass VectorCheck test vector checking tool 3.1.6 JTAG Test Vectors Test vectors verify JTAG design components: controller, reset mechanism, boundary scan register, test data register Must pass VectorCheck test vector checking tool
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Functional Test Vectors
Functional test vectors ensure that customer's ASIC performs designed. functional test vector defined cycle-based procedure where input values applied device, producing changes output. test cycle defined, input application output sampling done relative that cycle length. Regardless operating conditions, same inputs applied output data compared same expected output. Each test vector should begin with known reset procedure. Before delivery Atmel, customer expected have test vector sets across specified environmental conditions. Atmel will simulate functional test vector sets with both preroute postroute delay information. same test vector sets then used evaluate your prototype units eventually production components. Atmel provides tool called VectorCheck ensure that test vectors conform tester standards. VectorCheck reads vectors variety formats provides pass/fail indication tester acceptability. Reports assist engineer correcting vector formatting problems. full details tester limitations, test vector strategies, data formats suggestions creating functional test vectors, please refer VectorCheck manual distributed with VectorCheck software. Once customer provided test vector data Atmel Database Acceptance, data VectorCheck results used create Verilog test decks that emulate tester environment. Atmel runs each test vector using best, nominal, worst case voltage, temperature, process conditions under tester loading. requested, vector also simulated using system loading. These simulations must pass order device proceed through design process. Functional test vector sets foundation verifying customer's design. using same test vector sets from customer development design review through production components, constant standard applied evaluate design. providing VectorCheck, Atmel encourages customer create test vectors that both verify design executable automated test equipment. noted "Vector Limits" section, there many kinds functional test vectors. these must pass VectorCheck well meet restrictions shown section "Test Vector Requirements" (see below).
3.2.1
Test Vector Requirements
Each vector must (BC) (WC) variation junction temperature, voltage, process corners. Running under nominal conditions also recommended. Each vector must with tester loading. Running with system loading also recommended. vector should have expected output, regardless operating condition. Vector sets must independent, with dependence other vector sets. There repeatable "power-up" state ASIC; each vector must start with reset initialization cycle(s). Simultaneous switching should limited cycle. Each vector should contain external signals internal bidirectional/tristate enables single file. Vectors should data following formats: Generic Tabular: Timestamp, data (print-on-change [POC]) (OVI Compliant) (POC)
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Synopsys ".vec" format
vectors must pass VectorCheck. following data should delivered Atmel each functional test vector set: Worst case data each simulation, acceptable format VectorCheck input, output, files
ASIC Testers
order useful manufacturing process, functional test vectors must executable Automated Test Equipment (ATE). Unlike digital simulators, testers constrained physical limitations such number pins, strobe resolution, test rate, etc. Compatibility with tester limitations most critical standard test vector sets, because Atmel cannot test devices that exceed hardware constraints. These testers used Colorado Springs, Colorado, prototype verification characterization. These also same type testers used production testing. Table details basic specifications used Atmel.
Table 3-1. Basic Specifications
Capability Digital Pins Data Rate Pattern Depth Timesets Pulse Width Mixed Signal Frequency Arbitrary Waveform Generator Bandwidth Data Rate Output Range Frequency Analog Capture Port Sample Rate Input Range High Frequency Arbitrary Waveform Generator Sampling Frequency Output Range High Frequency Analog Capture Port Bandwidth Sample Rate (one channel) Vp-p (50) bits Msample 41.8 Vp-p (Differential); 20.9 Vp-p (Single Ended) bits MSample Vp-p (Differential; Vp-p (Single Ended) Credence® VistaTMLogic Credence® Quartet One
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Digital Capture Port Frequency Pulse Width Sample Rate MSamples/s
Once customer's design been produced approved design verification samples have been delivered, Atmel will characterize customer's component, varying voltage from best nominal worst each three temperature values. Inputs will applied outputs compared expected results. This will ensure Atmel's ability manufacture this component prior production release. Once device entered production, test vectors room temperature three voltage corners. Additionally, sample from each tested under conditions. results from these functional test vector sets used determine which units shipped. 3.3.1 Parametric Testing Part standard design flow parametric analysis design I/O. measurement parameters including VOH, VOL, VIH, VIL, completed parallel functional test vectors. This testing done insure that device performs Atmel specifications. Atmel does perform characterization testing, including path delay testing, input setup, hold measurement, unless specifically negotiated. During characterization prototype units, input threshold parametric tests done each pin. performing these tests, thresholds established verified production test. During production testing, threshold test performed type. addition parametric testing, static device measured. device placed into number arbitrary states, taken from functional test vector set, power plane current measured. Characterization successful components used threshold production testing. During production testing, violation that threshold failure condition. parametric testing done with parametric test vector that customer provided Atmel. order Atmel perform parametric tests, test vector must meet following conditions. 3.3.1.1 3.3.1.2 Each output bidirectional output state must maintain ("0") high ("1") state consecutive test cycles. Each input bidirectional input state must transition once from ("0") high ("1") also once from high ("1") ("0"). resulting state must held least cycle. bidirectional tristate should placed high-impedance state from both low- high-output state least cycle. VectorCheck includes checks each these requirements. summary reports inform user when conditions met. Failure meet these conditions will limit level parametric testing. Atmel strongly recommends that conditions met, since that will guarantee best component evaluation. more details these conditions rules used check them, please refer online documentation that ships with VectorCheck.
3.3.1.3
Tristate
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Static Path Analysis
feature sizes grow smaller gate counts increase, becomes increasingly apparent that functional vectors longer completely verify design. Static Path Analysis also required more complete verification, especially critical paths. Atmel will perform point-to-point static path analysis that required design. Atmel currently uses Synopsys PrimeTime perform these tasks. This analysis duplicated actual silicon. should noted that even small designs, static path analysis produce large amount data result "false" paths. These false paths appear violate limits actually insignificant design could masking real data. Atmel design engineers will provide customer with postroute static path results expect that customer will able distinguish between false paths critical paths. Once false paths eliminated, analysis rerun such that they ignored. customer should deliver static path requests following format:
Table 3-2. Static Path Request Format
Limit (ns) Best Case Limit (ns) Worst Case
Begin Point Instance/Pin Name Notes:
Point Instance/Pin Name
Instance/pin names internal external. There need specify both max, allowed. Wildcarding names allowed, e.g., Flop pins Flop Pins.
3.4.1
Test Methodology Options
have discussed functional test vectors, parametric silicon tests, static path analysis. While each these useful verifying design, implementing full scan test methodology even better. Well-implemented scan designs achieve very high fault coverage, ensuring parts shipped Atmel defect-free. Internal serial scan inserted either customer Atmel order increase fault coverage design. This technique does replace rather supplements functional test vectors provides higher fault coverage than typically possible with functional vectors alone. While functional test vectors indicate whether customer's design functions designed, internal serial scan vectors identify process faults. Internal serial scan should used part well-rounded test methodology. number test vectors limited tester memory ATE. cycle count combined functional ATPG test vector sets must less than memory limit ATE. Often, test counts reduced scan chains kept reasonable length less than 1,000 flip-flops. Please refer Atmel Test Capability Table your Atmel design representative determine your tester. Atmel supports full multiplexed registers purpose internal serial scan chains, using Synopsys Compiler full insertion. Customers planning using scan should aware that Synopsys rule-based compiler, which means designs that follow design rules often limited terms maximum achievable fault coverage. Items such gated uncontrollable clocks uncontrollable asynchronous pins will limit fault coverage test patterns generated design. enhance logic cell fault coverage, Atmel provides Synopsys Tetramax® models embedded memories. These models allow more rigorous testing logic surrounding memory. discussed following sections, memories themselves tested with BIST wrapper provided Atmel.
3.4.1.1
Internal Serial Scan ATPG
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more details serial scan insertion, please Design Testability, located Design section this overview. 3.4.2 Delay Path Measurement Atmel support single long path (>12 test vector set, where five paths measured. This test vector that tests that timing placement output sample point. This characterization rather pass/fail limit tester threshold. output strobe point must placed meet worst case simulation timing plus tester accuracy. Same-cycle critical paths measured. Generally, noncritical path outputs masked compared during this test vector set. path measurement test vector must meet same requirements standard functional test vector set, well pass VectorCheck. 3.4.2.1 JTAG Boundary Scan (IEEE 1149.1) JTAG boundary scan inserted either customer Atmel. JTAG boundary scan used facilitate board-level test device. Atmel uses Synopsys Compiler implement JTAG, utilizing standard controller provided Synopsys. Standard JTAG instructions supported, custom JTAG instructions possible. test validation analog cell features should discussed with Atmel representative well advance Database Acceptance. Test vectors embedded cores (e.g., ARM7TDMI, ARM946E-S, OakDSPCore PINE®) provided Atmel. These test vectors specific core only designed test chip logic that created interface with core. designers such chips should thoroughly discuss testing these embedded cores with design engineers Atmel.
3.4.2.2 3.4.2.3
Analog Cells (PLL, POR, etc.) Embedded Cores
Conclusion
Atmel ASIC differentiates itself being very flexible organization. Atmel supports functional vectors that automated test equipment. Atmel supports parametric evaluation device I/O. Atmel supports encourages static path analysis. There provisions Internal Serial Scan, JTAG, Embedded SRAMS Cores, well analog features.
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Section Packaging
Introduction
Atmel pairs high-performance silicon with high-performance packages, custom designed company's gate arrays. Atmel offers gate arrays ceramic plastic packages. through hole surface mount ceramic packages designed meet Military specifications. Atmel's plastic through hole surface mount packages come variety lead configurations standard footprints. Atmel's Packaging Center provide complete custom package design services. Atmel's facility been designing custom packages several years developed network specifically package design. Atmel maintains close relationships with world's leading suppliers assembly packaging services, leverages these relationships provide innovative packaging solutions variety applications. access package drawings line, http://www.atmel.com/atmel/ quality/quality13.htm Atmel also offers unique capability provide prototypes plastic TQFP packages. These design verification sample (DVS) packages assembled Colorado Springs facility shipped within hours receipt prototype dice. Table partial list Atmel package options; other package options available. Contact your local Atmel sales office. list Atmel sales offices,
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Table 4-1. Package Options (Partial List)
Package Type PQFP Power Quad L/TQFP PLCC CPGA CQFP PBGA Super Low-profile Mini Chip-scale Flex-tape FCBGA* Note: Count 100, 120, 128, 132, 144, 160, 184, 208, 240, 144, 160, 208, 240, 100, 120, 128, 144, 160, 176, 100, 124, 144, 155, 180, 223, 224, 299, 100, 120, 132, 144, 160, 224, 121, 169, 208, 217, 225, 240, 256, 272, 300, 304, 313, 316, 329, 352, 388, 420, 168, 204, 240, 256, 304, 352, 432, 560, 100, 108, 128, 132, 144, 160, 176, 192, 208, 224, 100, 108, 121, 128, 144, 160, 169, 176, 192, 208, 224, 256, 288, 100, 112, 132, 144, 156, 160, 180, 192, 196, 204, 208, 220, 225, 228, 256, 416, 480, 564, 672, 788, 896, 960, 1032, 1152, 1157, 1292, 1357, 1413, 1500, 1517, 1557, 1677, 1728, 1932
These packages require custom design substrate.
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Section Quality Reliability Assurance
Executive Decision
Atmel's corporate goal only meet customers' requirements provide them with competitive advantage through innovation, service quality. Atmel works achieve this goal developing methods building quality reliability into products, processes services. Because responsibility Atmel employees, concern quality begins with initial product inception remains constant through product completion.
Continuous Improvement Quality System
recipients Malcolm Baldrige National Quality Award stated: realize that race without finish line. [Our goal improve constantly forever system production service, improve quality productivity, thus constantly decrease costs." Atmel this continuous improvement journey well. goal ongoing improvement only products services quality assurance process itself. work improve this process benchmarking, listening customer feedback, conducting self-assessments. journey continuous improvement involves various techniques such statistical process control (SPC), statistical design experiments (DOE), maverick control statistical limits (SBL), failure mode effect analysis (FMEA), measurement system analysis (MSA) many others. Just important tools commitment employ these tools effectively support requirements continuous improvement system. responsibility every Atmel employee develop maintain this commitment. these techniques throughout corporation, just manufacturing, proof Atmel's commitment continuous improvement. Throughout entire company whether order entry, wafer fabrication, review customer specifications, government compliance testing, simply returning customer's call Atmel striving "zero defects." Atmel employees have undergone extensive training through years order implement techniques systems continuous improvement. This training included Crosby 14-step Program; Alamo Problem Solving, Decision Making Planning; SPC; DOE; FMEA; MSA; Problem Solving; various in-house programs managerial supervisory skills. Teams have been established throughout Atmel identify problems, implement solutions initiate preventative action. These teams include Corrective Action Teams
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(CATs), Preventative Action Teams (PATs), Work Area Teams (WATs) task teams. These teams work enhance Atmel's total quality program.
Figure 5-1. Continuous Improvement Process History
llenc
CUSTOMER QS-9000 ISO-14001 Pb-Free
NEXT STEPS Enhanced 6-Sigma SSQA ISO-9000: 2000
INITIATIVES
SYSTEMS ISO-9000
FMEA Maverick Control
lvin
PROCESS SPC, Sigma Impact
PREVENTION
FASTER BETTER Empower QIT's Effective Problem Solving Effective Planning
FASTER
Steering Committee CONTINUE Quality Improvement Teams (QITs) Hassle Systems
Better Defined Networks Standards Initiate
START Pilot Groups
1985
2002
Atmel improved quality assurance process giving customers more input setting direction. increase response meeting needs customers, conduct quality reviews, implement special requirements system enhancements, actively drive improvements from customer surveys. Atmel's management team integrating these quality management principles into continuous improvement system.
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Atmel's Quality System
Atmel's quality system based compliance 9001, QS9000 MIL-PRF38535 standards. Atmel achieved 9001 certification through Underwriter's Laboratories. Atmel dedicated continual training educational programs employees. employees trained, certified audited compliance specified requirements. addition, Atmel offers education programs conjunction with University Colorado other institutions.
Figure 5-2. Quality System Flow
Corporate Quality Manual (MIL- PRF38535, 9001, 9000)
Corporate Policy Specifications
General Quality Specifications
Quality Management System
Product Realization
Measurement, Analysis Improvement
Management Responsibility
Resource Management
Document Control Records Archives
Quality Planning Process Controls Design Control Purchasing Product Identification Traceability Materials Control Flowdown Customer Rqmts Product Configuration Mgmt Change Control Calibration Preventive Maint. Technology Release Product Qualification
Process Controls Control Nonconforming Product Audits Preventive Correction Action
Customer Satisfaction Management Review Site Management
Process Controls Resources Training Environmental Controls Management
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5.4.1
Reliability Assurance
Failure Rates reliability integrated circuit will vary over lifespan; therefore, failure rate units operating after specific number hours best describes product reliability. This failure rate defined Instantaneous Failure Rate (IFR). Other measures include Average Failure Rate average over period time Cumulative Failure Rate total number failures occurring during operation. Because device failures hour small, failure rates usually measured billions device hours defined Failure Units FITs. hundred failures billion device hours FITs 1000 hours. traditional "bathtub" curve used describe failure rate associated with product actually combination exponential failure rate models. first model starts with large failure rate that rapidly decays low, almost constant failure rate. This model used describe early-life reliability failures associated with this stage (Phase are, most part, process anomalies screened during Atmel's in-process final acceptance testing. second model starts with low, relatively constant failure rate climbs exponentially after some period time. This wearout stage (Phase device, where mechanisms such electromigration oxide breakdown predominate. combining these models, bathtub-shaped curve representing lifetime product formed. nearly flat portion bathtub curve result summing tails models represents Phase low, stable failure rate characteristic this stage. Failures observed during this stage random nature mixture randomly occurring process defects wearout type mechanisms. Devices shipped customer stable portion their lifetimes. Atmel's production tests, incoming material inspections, process specifications have been developed screen remove potential Phase failures before product shipped customer. test screening limits have been established through characterization qualification series gate arrays processes used fabrication. Statistical Design Experiments (DOE) Statistical Process Control (SPC) used maintain process stability repeatability through development production.
5.4.2
Bathtub Curve
Figure 5-3. Bathtub Failure Curve
Phase Infant Mortality
Phase Random
Phase Wearout
Failure Rate
Time
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ATL25 Series Design Overview
Quality Reliability Assurance
Through analysis Phase failures induced during accelerated life tests, Atmel developed techniques extend material life. effect this extend Phase time period, forestall Phase 5.4.3 Atmel Reliability Program part continuous improvement system, Atmel initiated reliability program designed measure, monitor improve product reliability while reducing cost associated with reliability testing. This program includes production data, early life failures, qualification data reliability evaluations. minimum, Atmel subjects product standard qualification tests. results these tests serve foundation reliability database. During qualification, Atmel performs failure analysis failed unit regardless impact qualification status. addition qualification activities, Atmel evaluates specific failure mechanisms such electromigration, time-dependent dielectric breakdown, ESD, latch-up, carriers stress-induced voiding. addition qualification processes, product lines packaging, Atmel performs quarterly reliability monitor testing processes. 5.4.4 Design Quality Reliability Many quality reliability concerns minimized with proper design techniques. example, Electrostatic Discharge (ESD), which contributes production yield loss latent reliability problem, reduced eliminated through establishment adequate design rules. Atmel's quality reliability assurance systems insure that data taken from actual product testing back design groups verification models design rule updates. This commitment reliability quality during design cycle resulted cell library that fully verified.
ATL25 Series Design Overview
2042A-ASIC-09/02
Quality Reliability Assurance
Failure Analysis Capability
Cross Sectioning Interconnects Diffusions Photoresist Angle Metallurgical (packaging) Packaging Failure Analysis Package X-ray Delid/Decap Leak Testing Penetrant Moisture Content Plastic Impurity Content Corrosion Analysis Electrical Failure Analysis Failure Verification/Benchtesting Liquid Crystal Analysis Mechanical Microprobing Focused Beam (FIB)
Deprocessing Chemical Chemical (plasma) Focused Beam Step Coverage Metal Polysilicon Oxide/Nitride Photoresist Outside Services Requests SIMS Auger Spreading Resistance Acoustic Microscopy Electron Beam Induced Current (EBIC) Optical Microscopy Metallurgical Microscopes Linewidth Measurement Low-power Stereoscopes 3x5, 8x10 photos available Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy Feature Identification Elemental Identification Process Characterizations Yield Enhancement
2042A-ASIC-09/02
ATL25 Series Design Overview
Quality Reliability Assurance
5.6.1
CMOS Reliability Data
Gate Oxide Integrity Expected lifetime exceeds worst-case system requirements based following assumptions: Activation Energy, 0.27 Junction Temperature, 175°C. Voltage
5.6.2
Electromigration
Atmel verified design rules maximum current density through electromigration testing straight line, contact structures. Typical operating lifetimes 600+ years have been calculated from data current density 2E5A/cm 110°C. Atmel's gate array carrier data shows that product reliability carriers concern. Accelerated tests Idsat decrease conditions showed derated operating life years. latch-up occur CMOS logic device, sustained impedance path between circuit's internal supply buses must created. This path usually induced when current pulse "turns more parasitic SCRs result over-voltage transient supply, input output pin. Atmel's epitaxial layer with substrate significantly inhibits latch-up. This combined with protection diodes gives Atmel gate arrays complete latch-up immunity.
5.6.3
Carriers
5.6.4
CMOS Latch-up Immunity
5.6.5
Construction Analysis
cross-sections routinely performed Atmel's CMOS processes. This data serves quality monitor provides early detection order affect correction process variations that could possibly have detrimental effect reliability Atmel's CMOS Gate Array/Embedded Array products. Exposure result variety problems ranging from immediate, catastrophic failure latent defects that surface field. sensitivity (ESDS) levels depend definition failure. Atmel tests categorizes product procedures specified Method 3015 MIL-STD-883D. This method requires that three devices pass both functional tests after each level exposure. This test extremely stringent: even marginal parametric failures still functional devices must defined failures. ESDS highly dependent circuit layout, every personalization characteristic ESDS level. Consequently, Atmel characterizes every product ESDS with goal 2,000V minimum ESDS sensitivity.
5.6.6
Sensitivity
5.6.7
CMOS Reliability
Semiconductor reliability measured either failure rate, usually reported FITs. Failure Unit defined number failures billion device hours operation. corresponds MTBF million device hours. This corresponds better than years operation between failures 100-piece sample size. Atmel 0.35 CMOS process, calculated confidence estimate 50°C operation activation energy. Inherent quality system define monitor critical process steps. used only monitor control parametric limits also evaluate, establish control equipment settings capabilities. Process yield monitors extensively utilized with every wafer along with periodic reliability monitoring test structures.
5.6.8
Statistical Process Control (SPC)
ATL25 Series Design Overview
2042A-ASIC-09/02
involves mathematical portrayal data graphical form allow determination whether process step control control. Through experimentation evaluation, upper lower control limits established each parametric value given process step. parametric values charted continual basis. result easy-to-read graph that operators technicians monitor. Atmel monitors over charts throughout wafer fabrication, test packaging operations. 5.6.9 Statistical Design Experiments (DOE) greatly reduce time required process qualification optimization. This especially useful wafer fabrication, where quality depends interaction hundreds different process steps materials. When coupled with computer-aided design process models, used predict relationships outcomes before running actual experiments. Actual experiments only those processes that show most promise. This turn reduces time cost designing products processes improving existing ones. 5.6.10 Payoff focus Atmel's quality reliability efforts customer their system. Through strict attention customers' component system requirements, Atmel achieved preferred supplier status. Atmel been successful establishing dock-tostock programs with several computer military customers. dock-to-stock programs, Atmel ships kitted product directly customer's production line, exact required. This reduces customers' inventory levels well incoming inspection costs. Over percent Atmel's Gate Array/Embedded Array products shipped dock-to-stock.
2042A-ASIC-09/02
ATL25 Series Design Overview
Section Military Aerospace
Designing High Reliability
Atmel committed supplying highest reliability ASIC military aerospace applications. Atmel's quality system evolved from requirements MIL-I-38535, Appendix QS9000 QS9000 Semiconductor Supplement. quality system provides design manufacturing discipline Atmel's ASIC products well standard memory products. quality system continuously improved based feedback from frequent customer audits regular audits conducted self-audit team. design manufacturing capability utilized ASIC products, Columbia Design Center, Colorado Springs Operation, approved subcontractors vendors, permits Atmel supply Commercial Shelf (COTS) products using MIL-STD-883, Class requirements performance specification. that necessary develop ASIC military Follow good design practices make sure entire circuit testable, controllable, observable documented. proper derating factors process, voltage temperature when performing timing functional simulations. Develop complete functional test vectors grade coverage accordance with Method 5012. Atmel's cell libraries design tools help achieve extremely high levels fault coverage. Atmel's facility Colorado Springs supports in-process burn-in, temperature testing, periodic Group Quality Conformance Inspection (QCI), majority tests required periodic Group QCI. Figures outline product flow military ASICs Quality Conformance Inspections.
ATL25 Series Design Overview
Rev. 2042A-ASIC-09/02
Military Aerospace
6.1.1
Gate Array
Figure 6-1. MIL-STD-883 Class Product Flow
SPC, Monitors Wafer Fabrication
SPC, Monitors
Wafer Sort Electrical Test
SPC, Monitors
Saw, Attach Wire Bond
SPC, Monitors
Internal Visual Method 2010, Condition
Monitors
Seal Topside Mark
Monitors
Environmental Preconditioning; Temperature Cycling Method 1010, Condition Constant Acceleration Method 2001, Condition Fine Gross Leak Method 1014
Monitors
Pre-burn-in Electrical Screening
Monitors
Burn-in, Method 1015
100% Final Electrical Screening +25°C, -55°C, +125°C
Monitors
100% External Visual, Method 2009
Group Inspection, Method 5005 Review Groups Quality Conformance Inspection Documentation
Pre-ship Inspection
Shipment
2042A-ASIC-09/02
ATL25 Series Design Overview
Military Aerospace
6.1.2
CLASS
Figure 6-2. MIL-STD-883 Quality Conformance Inspection Method 5005
Standard Production Screen
D-1: Physical Dimensions Meth. 2016 B-2: Resistance Solvants Meth. 2015 D-2: Lead Integrity Meth. 2004, 2028 Seal1 Meth. 1014 B-5: Bond Strength Meth. 2011 D-5: Salt Atmosphere Meth. 1009, Seal Meth. 1014 B-3: Solderability Meth. 2003/2022 D-6: Internal Water Vapor Meth. 1018
Seal Test Meth. 1014
Baseline Electrical Parameters
C-1: Lifetest Meth. 1005 Endpt. Electrical
D-7: Adhesion Lead Finish Meth. 2025
Mechanical Series: Meth. 2002, Meth. 2007, Meth. 2001, Seal Meth. 1014 Meth. 1010/1011 Endpt. Electrical
D-3: Environmental/ Thermal Series Meth. 1011, cycles Meth. 1010, cycles Meth. 1004 Meth. 1004/1010 Seal Meth. 1014 Endpt. Electrical
D-8: Torque2 Meth. 2024
Sensitivity3: Meth. 2015 Endpt. Electrical 25°C
Notes: Required when package leads exit through glass-frit-seal. Required whenever glass seal used establish integrity hermeticity. ESDS characterization only.
ATL25 Series Design Overview
2042A-ASIC-09/02
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2042A-ASIC-09/02
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