MARKETING PART NUMBER CY7C194 CY7C195 CY7C199 DEVICE DESCRIPTION Stati

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MARKETING PART NUMBER CY7C194 CY7C195 CY7C199 DEVICE DESCRIPTION Stati

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256K SRAM, TECHNOLOGY, QUAL
MARKETING PART NUMBER CY7C194 CY7C195 CY7C199 DEVICE DESCRIPTION Static Static Static
PRODUCT DESCRIPTION (for qualification)
Information provided this document intended generic qualification technically describes Cypress part supplied: Marketing Part Device Description: Cypress Division: Size (stepping): CY7C199 Static Cypress Semiconductor Corporation Rev. 7C199C July/1995 mils mils What markings Die:
Overall Mask) Level (pre-requisite qualification): Cypress Qualification completion/Marketing Availability Dates (Current REV):
TECHNOLOGY/FAB PROCESS DESCRIPTION
Number Metal Layers: Passivation Type Materials: Free Phosphorus contents glass layer(%): Coating(s), used: Gate Oxide Material/Thickness (MOS): Name/Location (prime) Facility: Line ID/Wafer Process Polyimide CMOS, Double Poly, Double Metal /0.65 SiO2 Cypress Semiconductor Bloomington, Fab4/R28 Generic Process Technology/Design Rule (µ-drawn): Metal Composition: Metal Ti/TiW/Al-Si/TiW, 500A/1.2KA/6KA/1.2KA Metal TiW/Al-Si/Ti, 1.2KA/10KA/150A
7000A TEOS 6000A Si2N4
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CYPRESS SEMICONDUCTOR
PLASTIC PACKAGE/ASSEMBLY DESCRIPTION
Package Outline, Type, Name: Package edge clearance: Mold Compound Name/Manufacturer: Lead Frame material: Lead Finish, composition: Attach Area Plating: Attach Method: Wire Bond Method: Name/Location Assembly (prime) facility: Assembly Line Process Paste Thermosonic Copper Solder Plated, 85%Sn, 15%Pb Silver Spot Attach Dim: Attach Material: Wire Material/Size: Omedata, Indonesia INDNS-O V28317AGB mils mils Silver Epoxy Gold 28-pin, 300-mil mils side Sumitomo EME-6300H(R)
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CYPRESS SEMICONDUCTOR
OTHER INFORMATION
approval similarity, identify other devices using same basic with bonding metal mask options test selections explain: CY7C194/CY7C195/CY7C199 Cypress planning changes near future, identify change (Qtr/Yr) Design Rev./Shrink: Fab/Assembly site change: Other Devices qualified this technology: Other Packages qualified this device: Voltage Rating (per STD-008, Method 3018): Flammability Classification (UL-94V): Alternate Fab/Assembly Locations: None Assembly Alphatec, Thailand 2,200V Process Change: Cross Licensee/Licensor:
Please attach following Qualification Reliability data revision Package type, assembly sites identified above (mark included): HAST (5.5V, 140°C, 85%RH, 15psig) Temperature Cycles (-65°C 150°C) Long Life Verification (5.75V, 150°C) Cold Life Test (6.5V, -45°C) Read Record Life Test (5.5V, 150°C) Autoclave (PCT, 121°C, 100%RH) Operating Life (temp): Steady State Life (HTSSL, 5.75V, 150°C) Latchup Testing ESD-HMB Tests (MIL-STD 883, method 3015) ESD-CDM Tests Other: 150°C
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CYPRESS SEMICONDUCTOR
PRODUCT INFORMATION QUALIFICATION SIMILARITY
Product Family: Division: Supplier's Part Number 256K SRAM, Technology Cypress Semiconductor Rated Speed (ns) Size/ Type Rev. Size (stepping) Design Rule Fabrication Mold Compound Assembly Line Location Volt Rating
Process Line CY7C194-**PC CY7C194-**VC CY7C195-**PC CY7C195-**VC CY7C199-**PC CY7C199-**VC 28.3 PDIP 28.3 PDIP 28.3 PDIP 0.65µ 0.65µ 0.65µ CMOS CMOS CMOS Sumitomo Sumitomo Sumitomo Omedata, Indonesia Omedata, Indonesia Omedata, Indonesia 2,200V 2,200V 2,200V
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CYPRESS SEMICONDUCTOR
Marketing Part: Description:
CY7C199 28-pin, 300-mil
DEVICE RELIABILITY SUMMARY
Wafer Fab: Assembly:
Bloomington, Omedata, Indonesia
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C) Early Failure Rate Device CY7C199-VC Assy Lot# 34950889 Lot# 4511035 Hours 0/3501 Cumulative 0/350
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C) Latent Failure Rate Device Assy Lot# Lot# 4511035 Hours 0/120 Hours 0/120 Cumulative 0/120
CY7C199-VC 349508890
High Temperature Steady State Life Test (HTSSL, 5.75V, 150°C) Device CY7C199-VC Assy Lot# 349508890 Lot# 4511035 Hours 0/782 Hours 0/78 Cumulative 0/78
Temperature Cycle (Condition -65°C 150°C), precondition Hrs. (121°C, 100%RH) Device CY7C199-VC Assy Lot# 349508890 Lot# 4511035 0/54 1000 0/54 Cummulative 0/54
Autoclave (PCT, bias, 121°C, 100%RH, 15psig), Precondion Cys. (-65°C 150°C) Device CY7C199-VC Assy Lot# 349508890 Lot# 4511035 Hours 0/54 Cumulative 0/54
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CYPRESS SEMICONDUCTOR
Marketing Part: Description:
CY7C199 28-pin, 300-mil
DEVICE RELIABILITY SUMMARY
Wafer Fab: Assembly:
Bloomington, Omedata, Indonesia
High Accelerated Saturation Test (HAST, 5.5V, 140°C, 85%RH, 15psig), Precondition Hrs. (121°C, 100% Device CY7C199-VC Assy Lot# 349508890 Lot# 4511035 Hours 0/54 Cumulative 0/54
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CYPRESS SEMICONDUCTOR
Marketing Part: Description:
CY7C199 28-pin, 300-mil
DEVICE RELIABILITY SUMMARY
Wafer Fab: Assembly:
Bloomington, Omedata, Indonesia
Electrostatic Discharge Human Body Model Circuit 883, Method 3015 >+2,200V >+2,200V >+2,200V Unit Unit Unit >-2,200V >-2,200V >-2,200V
Latchup Testing Cypress Internal Latch-up Procedure Tests: Current Injection 200mA Trigger Socket Temp 125°C

MARKETING PART NUMBER CY7C194 CY7C195 CY7C199 DEVICE DESCRIPTION Stati

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