CY2254 CY2255 CY2257 Clock Synthesizer/Driver Clock Synthesizer/Driver

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CY2254 CY2255 CY2257 Clock Synthesizer/Driver Clock Synthesizer/Driver

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PentiumProcessor Compatible Clock Synthesizer/Driver, 3.3V Operation
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PRODUCT DESCRIPTION (for qualification)
Information provided this document intended generic qualification technically describes Cypress part supplied: Marketing Part Package: Device Description: Cypress Division: Size (stepping): CY2254 Pins, SOIC Clock Synthesizer/Driver Cypress Semiconductor Corporation Division Rev. 7C82540A mils mils What markings Die:
Overall Mask) Level (pre-requisite qualification):
TECHNOLOGY/FAB PROCESS DESCRIPTION LG27
Number Metal Layers: Passivation Type Materials: Free Phosphorus contents glass layer(%): Coating(s), used: Gate Oxide Material/Thickness (MOS): Name/Location (prime) Facility: Line ID/Wafer Process CMOS, Double Poly, Double Metal /0.65 SiO2 Cypress Semiconductor Bloomington, Fab3/LG27 Generic Process Technology/Design Rule (µ-drawn): Metal Composition: Metal 500A Ti/1,200A TiW/6,000A Al/1,200A Metal 1,500A TiW//10,000A Al/150A 7000A TEOS 6000A Si2N4
CYPRESS SEMICONDUCTOR Clock Synthesizer/Driver 95065,
PLASTIC PACKAGE/ASSEMBLY DESCRIPTION
Package Outline, Type, Name: Mold Compound Name/Manufacturer: Lead Frame material: Lead Finish, composition: Attach Area Plating: Attach Method: Wire Bond Method: JESD22-A12 Moisture Sensitivity Level Name/Location Assembly (prime) facility: Paste Thermosonic Copper Solder Plated, 85%Sn, 15%Pb Silver Spot Attach Material: Wire Material/Size: Level Anam, Philippines (PHIL-M) Silver Epoxy Gold Pins, SOIC Sumitomo EME-6300H(R)
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CYPRESS SEMICONDUCTOR Clock Synthesizer/Driver 95065,
RELIABILITY TESTS PERFORMED
Stress/Test High Temperature Operating Life Early Failure Rate High Temperature Operating Life Latent Failure Rate Read Record Life Test High Temperature Steady State Life High Accelerated Saturation Test Temperature Cycle, Plastic package Electrostatic Discharge Human Body Model (ESD-HMB) Electrostatic Discharge Charge Device Model (ESD-CDM) Latchup Sensitivity
Test Condition (Temp/Bias) Dynamic Operating Condition, 3.5V, 150°C Dynamic Operating Condition, 3.5V, 150°C Dynamic Operating Condition, 3.5V, 150°C Static Operating condition, 3.5, 150°C 140°C, 85%RH, 3.5V bias Pre-condition: (121°C, 100% MIL-STD-883C, Method 1010, Condition -65°C 150°C Pre-condition: (121°C, 100% MIL-STD-883C, Method 3015.7 Cypress Spec. 25-00020 accordance with JEDEC Positive injection 8.0V, Negative injection -5.0V, Post test, Power Supply Overvoltage test temperature 125°C
Result 1,000V 200V
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CYPRESS SEMICONDUCTOR Clock Synthesizer/Driver 95065,
RELIABILITY FAILURE RATE SUMMARY
Stress/Test High Temperature Operating Life Early Failure Rate High Temperature Operating Life1,2 Long Term Failure Rate
Device Tested/ Device Hours Devices 116,000 DHRs
Fails
Activation Energy
Thermal3
Failure Rate FITs
Assuming ambient temperature 55°C junction temperature rise 15°C. Chi-squared estimations used calculate failure rate. Thermal Acceleration Factor calculated from Arrhenius equation
where: =The Activation Energy defect mechanism. Boltzmann's constant 8.62x10-5 eV/Kelvin. junction temperature device under stress junction temperature device conditions.
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CYPRESS SEMICONDUCTOR Clock Synthesizer/Driver 95065,
RELIABILITY TEST DATA
QTP#: 95065 DEVICE ASSY-LOC FABLOT# ASSYLOT# DURATION FAIL MODE ==================== ======== ======== ============== ======== ==== STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 3.5V) CY2254 PHIL-M 3505265 CY2254 PHIL-M 3506332 -STRESS: HI-ACCEL SATURATION TEST (140C, 85%RH, 3.5V), PRECONDITION CY2254 PHIL-M 3505265 -STRESS: HI-ACCEL SATURATION TEST (140C, 85%RH, 5.5V), PRECONDITION CY2254 PHIL-M 3506332 -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 3.5V) CY2254 PHIL-M 3505265 CY2254 PHIL-M 3505265 -STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 3.5V) CY2254 PHIL-M 3506332 CY2254 PHIL-M 3505265 CY2254 PHIL-M 3505265 CY2254 PHIL-M 3506332 -STRESS: PRESSURE COOKER TEST (121C, 100%RH) CY2254 PHIL-M 3505265 CY2254 PHIL-M 3506332 -STRESS: READ RECORD LIFE TEST (150C, 3.5V) CY2254 PHIL-M 3505265 CY2254 PHIL-M 3505265 -STRESS: COND. 150C CY2254 PHIL-M 3505265 CY2254 PHIL-M 3506332 CY2254 PHIL-M 3505265 1000 CY2254 PHIL-M 3506332 1000
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CY2254 CY2255 CY2257 Clock Synthesizer/Driver Clock Synthesizer/Driver

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