CY7B9910-SC CY7B9920-SC Programable Skew Clock Buffer Driver (TTL) Pro
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PROGRAMMABLE SKEWCLOCK BUFFER
CY7B9910-SC CY7B9920-SC Programable Skew Clock Buffer Driver (TTL) Programable Skew Clock Buffer Driver (CMOS)
PRODUCT DESCRIPTION (for qualification)
Information provided this document intended generic qualification technically describes Cypress part supplied: Marketing Part Device Description: Cypress Division: Size (stepping): CY7B9910 CY7B9920 PROGRAMMABLE SKEW CLOCK BUFFER (PSCB) Pins SOIC Package Cypress Semiconductor Corporation, DataCom Division Rev. 7B991A/7B992A April, 1995 mils mils What markings Die:
Overall Mask) Level (pre-requisite qualification): Cypress Qualification completion/Marketing Availability Dates (Current REV):
TECHNOLOGY/FAB PROCESS DESCRIPTION
Number Metal Layers: Passivation Type Materials: Free Phosphorus contents glass layer(%): Coating(s), used: Gate Oxide Material/Thickness (MOS): Name/Location (prime) Facility: Line ID/Wafer Process Single Poly, Double Metal 0.8µm BiCMOS SiO2 Control gate Cypress Semiconductor, Round Rock, (Fab 2/STARM13 Generic Process Technology/Design Rule (µ-drawn): Metal Composition: Metal TiW, 1%SiAl Metal SiAl None
3,000A TEOS 15,000A Oxynitride
PLASTIC PACKAGE/ASSEMBLY DESCRIPTION
Package Outline, Type, Name: Package edge clearance: Mold Compound Name/Manufacturer: Lead Frame material: Lead Finish, composition: Attach Area Plating: Attach Method: Wire Bond Method: Assembly Line Process Name/Location Assembly (prime) facility: Epoxy Thermocompression Silver Copper Solder Plated, 85%Sn, 15%Pb Attach Dim: Attach Material: Wire Material/Size: Omedata, Indonesia INDNS-O/S243 mils mils Silver Epoxy Gold 24-Pins Plastic Small Outline (SOIC) mils side; mils side Sumitomo EME-6300H(R)
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OTHER INFORMATION
approval similarity, identify other devices using same basic with bonding metal mask options test selections explain: CY7B9910/CY7B9920 TTL/CMOS Level Options Cypress planning changes near future, identify change (Qtr/Yr) 4Q93 Design Rev./Shrink: Fab/Assembly site change: Other Packages qualified this device: Voltage Rating (per STD-008, Method 3018): Flammability Classification (UL-94V): Alternate Fab/Assembly Locations: Plastic: UL-94VO Assembly: Anam, Korea 4,400V None None Process Change: Cross Licensee/Licensor: None None
Other Devices qualified this technology:
Please attach following Qualification Reliability data revision Package type, assembly sites identified above (mark included): HAST (5.5V, 140°C, 85%RH, 15psig) Temperature Cycles (-40°C 125°C) Temperature Cycles (-65°C 150°C) Data Retention Bake, Plastic (185°C) Data Retention Bake, Hermetic (250°C) Autoclave (PCT, 121°C, 100%RH) Tests (MIL-STD 883, method 3015) Operating Life (temp): 150/125°C Steady State Life (HTSSL, 5.75V, 150°C/125°C) Temperature Humidity Bias (5.5V, 85°C, 85%RH) Latchup Testing Other: Other: Other: Internal Water Vapor ESD-CDM
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PRODUCT INFORMATION QUALIFICATION SIMILARITY
Product Family: Division: BiCMOS Clock (CY7C9910/9920) Cypress Semiconductor Rated Speed Size/ Type Revision Size (stepping) Design Rule Fabrication Passivation Mold Type Compound Assembly Line Location Volt Rating
Supplier's Part Number
Process Line CY7B9910/ -**SC CY7B9220 24-Pin SOIC 0.8µ SM13B Plasma Oxynitride Sumitomo Anam-Korea >2,200V Alphatec-Thailand Omedata, Indonesia
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DEVICE RELIABILITY SUMMARY
Device Type(s): Description: 24-pins SOIC Wafer Fab: Assembly: Round Rock, Anam Korea Omedata Indonesia Alphatec Thailand
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C) Early Failure Rate Device CY7B991-JC CY7B991-JC CY7B991-JC CY7B992-LMB Assy 49304967 49304968 49306462 21930627 2332696 2332696 2334877 2334877 Hours 0/322 0/426 0/143 0/539 Cumulative 0/1430
High Temperature Dynamic Operating Life (HTOL, 5.5V, 125°C) Early Failure Rate Device CY7B991-JC CY7B991-JC CY7B991-JC Assy 89719 89719 96360 1222664 1222664 1246520 Hours Hours 0/250 0/284 0/900 Cumulative 0/1234
0/900
High Temperature Dynamic Operating Life (HTOL, 6.6V, 125°C) Early Failure Rate Device CY7B992-LC Assy 89490 1228851 Hours 0/325 Cumulative 0/325
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C) Latent Failure Rate Device CY7B991-JC CY7B992-LMB Assy 49304968 219306627 2332696 2334877 Hours 0/139 0/116 Hours 0/139 0/116 Cumulative 0/255
High Temperature Dynamic Operating Life (HTOL, 5.5V, 125°C) Latent Failure Rate Device CY7B991-JC CY7B992-LC Assy 89719 89490 1222664 1228851 Hours Hours 0/250 0/322 1000 Hours 0/250 0/210 2000 Hours 0/250 Cumulative 0/572
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DEVICE RELIABILITY SUMMARY
Device Type(s): Description: 24-pins SOIC Wafer Fab: Assembly: Round Rock, Anam Korea Omedata Indonesia Alphatec Thailand
Group Subgroup Life Test (HTOL, 5.5V, 150°C) Device CY7B991-LMB CY7B991-LMB CY7B992-LMB CY7B992-LMB Assy Lot# 97739 219305442 89490 219306627 Lot# 1228852 2332696 1228851 2334877 Hours 0/50 0/77 0/48 0/77 Cumulative 0/252
High Temperature Steady State Life Test (HTSSL, 5.75V, 150°C) Device CY7B991-JC CY7B992-LC Assy Lot# 49304968 219306627 Lot# 2332696 2334877 Hours 0/96 0/76 Hours 0/96 Cumulative 0/172
High Temperature Steady State Life Test (HTSSL, 5.75V, 125°C) Device CY7B991-JC CY7B992-LC Assy Lot# 89719 89490 Lot# 1222664 1228851 Hours 0/76 0/722 Hours 0/751 0/713 Cumulative 0/148
Pressure Cooker Test (PCT, 121°C, 100%RH) Precondition Temperature Cycles, cond. Device CY7B991-JC
Assy Lot# 89719
Lot# 1222664
Hours 0/46 0/46
Cumulative 0/46
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DEVICE RELIABILITY SUMMARY
Device Type(s): Description: 24-pins SOIC Wafer Fab: Assembly: Round Rock, Anam Korea Omedata Indonesia Alphatec Thailand
Temperature Cycles Condition -65°C Device CY7B991-LC Assy Lot# 89490 Lot# 1228851 Hours 0/45 1000 Hours 0/444 Cumulative 0/45
Temperature Cycles JEDEC22, Cond. -40°C 125°C) Device CY7B991-JC Assy Lot# 89719 Lot# 1222664 Hours 0/46 1000 Hours 0/46 Cumulative 0/46
High Accelerated Saturation Test (HAST, 5.5V, 140°C, RH)-Precondition Hrs. PCT. Device CY7B991-JC Assy Lot# 89719 Lot# 1222664 Hours 0/46 Cumulative 0/46
EOS.
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DEVICE RELIABILITY SUMMARY
Device Type(s): Description: 24-pins SOIC Wafer Fab: Assembly: Round Rock, Anam Korea Omedata Indonesia Alphatec Thailand
PROGRAMMABLE CLOCK SKEW BUFFER (FAB CY7B9910/9920 Human Body Model Circuit 883, Method 3015 +4400V +4400V +4400V +2000V +2000V +2000V Unit Unit Unit Charge Device Model Unit Unit Unit -4400V -4400V -4400V -2000V -2000V 2000V
Latchup (FAB2) Testing Cypress Internal Latch-up Procedure Tests: Current Injection 200mA Trigger Socket Temp 125°C
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