ensure traceability specific assembly test operations, clearly brands

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Brand Traceability with NVRAM Products
ensure traceability specific assembly test operations, clearly brands date code every device, well encapsulation code CAPHATproducts. STMicroelectronics implementing marking traceability scheme sizes packages well increases number fabrication, assembly, test sites. devices marked with trace code which provides tracking exact versions. current device marking formats package options shown Figures Figure page Table Current Packages Marking Information
Package Type 8-Lead SOIC TSSOP 16-Lead SOIC 24-/28-Pin CAPHATTM, 24-/44-Pin SOIC, 18-/28-Pin SOX, 32-/36-Pin Hybrid CAPHATEncapsulation SNAPHAT® Figure Marking Information 1-digit Year, 2-digit Work Week 1-character Assembly Site, 1-digit Year, 2-digit Work Week 2-digit Assembly Site, 1-digit Year, 2-digit Work Week 3-digit Part Number, 1-digit Work Week 2-digit Assembly Site, 3-digit Number, 2-digit Wafer Site 3-character Country Origin, 2-digit Test Site, 1-digit Year, 2-digit Work Week Assembly, Test Temperature, Julian Date, Sequential 2-digit Assembly Site, 3-digit Number 3-character Country Origin, 2-digit Test Site, 1-digit Year, 2-digit Work Week 2-digit Assembly Site, 1-digit Year, 2-digit Work Week, 3-digit Number
Shipping Traceability
August 2004
AN926 APPLICATION NOTES
TABLE CONTENTS
INTRODUCTION Table Current Packages Marking Information MARKING ILLUSTRATIONS. Figure Figure Figure Figure Figure Figure Figure Figure Package Date Code 8-Lead SOIC TSSOP Date Assembly Site Code. 16-Lead SOIC Date Assembly Site Code. Date Part Number Code. 24-/28-Pin CAPHATTM, 24-/44-Pin SOIC, 18-/28-Pin SOX, 32-/36-Pin Hybrid Code. Encapsulation Code (CAPHATonly) SNAPHAT® Shipping Traceability Date Code Format
PREVIOUS (OBSOLETE) MARKING INFORMATION. Figure Date Code Figure 10.Fab Number Figure 11.SNAPHAT® REVISION HISTORY. Table Document Revision History
AN926 APPLICATION NOTES
MARKING ILLUSTRATIONS
Figure Package Date Code
1-digit Year 2004). 2-digit Work Week 52).
Figure 8-Lead SOIC TSSOP Date Assembly Site Code
AI02442b
Assembly site Muar, Bouskoura, Amkor). 1-digit Year 2004). 2-digit Work Week 52).
Figure 16-Lead SOIC Date Assembly Site Code
Assembly site Muar). 1-digit Year 2004). 2-digit Work Week 52).
AI02442c
Figure Date Part Number Code
AI02442d
3-digit Part Number. 1-digit Work Week WW01 WW03 04).
AI02442e
Figure 24-/28-Pin CAPHATTM, 24-/44-Pin SOIC, 18-/28-Pin SOX, 32-/36-Pin Hybrid Code
Assembly site Muar, Cirtek, Bouskoura-SPG, Bouskoura 2000). 3-digit Number. 2-digit Wafer Site Carrollton, Phoenix).
Country Origin (MYS Malaysia, Morocco, Philippines). 2-digit Test Site Muar, Bouskoura-SPG). 1-digit Year 2004); 2-digit Work Week 01).
AI02442f
AN926 APPLICATION NOTES
Figure Encapsulation Code (CAPHATonly)
1117
Assembly Automatic (machine) Welded process blank: Manual process
Test Temperature blank: Standard test temp.
Julian Date (when underwent Encapsulation process) e.g. 1117 111th 1997
Sequential Product Type
AI02443
Note: 8-character encapsulation code (CAPHATonly; Figure positioned device placed perpendicularly date code. summarizes details encapsulation process.
Figure SNAPHAT®
Assembly site Muar). 3-digit Number.
Country Origin (MYS Malaysia). 2-digit Test Site Muar). 1-digit Year 2004); 2-digit Work Week 01).
AI09666
Figure Shipping Traceability Date Code Format
2-digit Assembly site Muar, Cirtek, Amkor ATP, Carsem, Bouskoura-SPG, Bouskoura 2000). 1-digit Year 2004). 2-digit Work Week 52). 3-digit Number.
AI09647
AN926 APPLICATION NOTES
PREVIOUS (OBSOLETE) MARKING INFORMATION
9-character date code (Figure positioned label, beside logo. This presents complete facility identification, well final-test time-line device's manufacturing process. 7-character code (SOIC only; Figure positioned bottom line closest device. represents lots' overall fabrication history. Figure Date Code
Wafer Work Week Started Assembly Assembly Site Year Started Assembly double digit: single digit: Test Site Designator
AI02442
Figure Number
Wafer
Individual Numbers
Year Start Fabrication last digit year, single digit:
Work Week Started Fabrication double digits:
AI06379
AN926 APPLICATION NOTES
Figure SNAPHAT®
Manufacturer Site Work Week Started Assembly Assembly Site Year Started Assembly double digit: single digit: Test Site Designator
AI09667
AN926 APPLICATION NOTES
REVISION HISTORY
Table Document Revision History
Date February 2002 26-Jul-02 03-Feb-03 14-Mar-03 02-Jul-04 26-Aug-04 Version First Issue Updated date code (Figure Updated date code, number (Figure Clarify number terminology (Figure Reformatted; marking formats updated (Figure Updated (Figure Table Revision Details
AN926 APPLICATION NOTES
have questions suggestions concerning matters raised this document, please send them following electronic mail addresses: ask.memory@st.com (for general enquiries) Please remember include your name, company, location, telephone number number.
Information furnished believed accurate reliable. However, STMicroelectronics assumes responsibility consequences such information infringement patents other rights third parties which result from use. license granted implication otherwise under patent patent rights STMicroelectronics. Specifications mentioned this publication subject change without notice. This publication supersedes replaces information previously supplied. STMicroelectronics products authorized critical components life support devices systems without express written approval STMicroelectronics. logo registered trademark STMicroelectronics. other names property their respective owners 2004 STMicroelectronics rights reserved STMicroelectronics group companies Australia Belgium Brazil Canada China Czech Republic Finland France Germany Hong Kong India Israel Italy Japan Malaysia Malta Morocco Singapore Spain Sweden Switzerland United Kingdom United States America www.st.com

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