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QUALITY SEMICONDUCTOR, INC. 3.3V SYNC DRAM Clock Driver QS52
Top Searches for this datasheetQS52509A ADVANCE INFORMATION QUALITY SEMICONDUCTOR, INC. 3.3V SYNC DRAM Clock Driver QS52509A ADVANCE INFORMATION DESCRIPTION QS52509A high performance, skew, jitter, multiple output phase lock loop clock driver. designed interface with high-speed SDRAM application range 25MHz 160MHz. provides precise phase frequency alignment between incoming clock output clocks. With spread spectrum tracking capabilities, fully compliant PC-100 guideline specifications. provide excellent jitter characteristics with minimum board space cost, loop filter been integrated chip. Unlike some competitors, QS52509A chip resistor reduce ground bounce noise, provide impedance matching traces. part different output enable (OE) pins different banks outputs which independently controlled connecting them VCC. affected pins. QS52509A offered 24-pin TSSOP package industrial temperature grade. Intel PC-100/spread spectrum compliant outputs: bank bank dedicated output feedback Balanced drive outputs: ±12mA Separate output enable (OEx) each bank External feedback (FB), internal loop filter skew guaranteed between outputs Supports 25MHz 160MHz SDRAM JEDEC compatible LVTTL 3.3V supply voltage Industrial temperature range Inputs tolerant compatible with CDC2509B Integrated damping resistor noise Available 24-pin TSSOP package Figure Logic Block Diagram CLKIN OUTPUT LOGIC MDSC-00033-03 SEPTEMBER 1998 QUALITY SEMICONDUCTOR, INC. QS52509A ADVANCE INFORMATION Figure Configuration (All Pins View) TSSOP AGND CLKIN AVCC VCC/PLL_EN Table Description Name CLKIN A0.A4 B0.B3 Functional Description Clock input Bank clock outputs. Each output effective damping resistor. Bank clock outputs. Each output effective damping resistor. feedback input normally connected user. connected output strapped HIGH. Dedicated clock output (non-disable). effective damping resistor. Output enable. Asserted HIGH normal operation. When asserted LOW, bank clock outputs forced LOW. Output enable. Asserted HIGH normal operation. When asserted LOW, bank clock outputs forced LOW. When HIGH, normal operation. When LOW, disables CLKIN goes outputs. Includes pull VCC. Power supply output buffers Power supply (quiet) Ground supply output buffers Ground supply (quiet) PLL_EN VCCQ Table Absolute Maximum Ratings Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 0.5V Input Voltage -0.5V 7.0V Input Diode Current with -20mA Maximum Power Dissipation 70°C 0.75W 85°C, 0.55W TSTG Storage Temperature -65° 150°C Note: Stresses greater than those listed under absolute maximum ratings cause permanent damage devices that result functional reliability type failures. QUALITY SEMICONDUCTOR, INC. MDSC-00033-03 SEPTEMBER 1998 QS52509A ADVANCE INFORMATION Table Capacitance 25°C, 1MHz, TSSOP CLKIN/FB Units Note: Capacitance characterized tested. Table Recommended Operating Conditions Symbol Parameter Power Supply Voltage Input Voltage Ambient Operating Temperature Unit 3.15 3.45 Table Electrical Characteristics Over Operating Range Symbol Parameter Input HIGH Voltage Input Voltage Clamp Diode Voltage Test Condition Guaranteed Logic HIGH inputs Guaranteed Logic inputs Min., -18mA |IPU| Note: Typical values indicate 3.3V 25°C. Table Power Supply Characteristics Symbol Parameter ICCQ Quiescent Power Supply Current -0.7 -1.2 Output HIGH Voltage Output Voltage Min., -12mA Min., -100µA Min., 12mA Min., 100µA PLL_EN Pull Current Input Leakage Current Max., PLL_EN Max., DULOW, Max., PLL_EN==HIGH,ZA CLKIN LOW, outputs unloaded Max., 3.0V Power Supply Current Input HIGH Dynamic Power Supply Max., Current Output Total Power Supply Current 3.3V, 66MHz Typ(1) Unit Test Conditions Unit ICCD CLKIN Total Power Supply Current(1) 3.3V, fCLKIN 166MHz(2) Notes: Guaranteed characterization production tested. outputs each loaded with 15pF. MDSC-00033-03 SEPTEMBER 1998 QUALITY SEMICONDUCTOR, INC. QS52509A ADVANCE INFORMATION Table Switching Characteristics Over Operating Range Symbol Description(1) TPWC FCLKIN TSK1 TOPW TLOCK TR,TF TDEV Input clock pulse, high Input frequency CLKIN input delay (2,3) 100MHz Unit TSK2(SSC) Spread spectrum clock induced skew Output duty cycle distortion, 100MHz Output pulse width distortion CLKIN phase lock Output rise fall times (0.8V 2.0V)(2,3) (2,3,4) Notes: timing parameters measured 100MHz with reference levels 0.5VCC. This parameter guaranteed design verified during production statistical correlation. Output Loading: 500. (See Figure Output signal nominally duty cycle: maximum error period 0.65ns, whichever greater. tDEV applies device operating under identical conditions (VCC, ambient temperature, package, flow, etc.) Spread spectrum clock induced skew measured under PC-100 conditions 30kHz 50kHz modulation with peak deviation -0.5%. TION Output-Output skew, outputs, same transition(2,3), 100MHz Cycle-cycle jitter(2,3), 100MHz -100 (2,6) -200 (2,3,4) TCYCLE/2 0.65 TCYCLE/2 0.65 1.75 Skew between outputs different devices(2,5) QUALITY SEMICONDUCTOR, INC. MDSC-00033-03 SEPTEMBER 1998 QS52509A ADVANCE INFORMATION Figure Test Loads Waveforms Output 30pF Test Load 1.0ns 3.0V 2.0V 0.5Vcc 0.8V tPWC 1.0ns 2.0V 0.5VCC 0.8V TCYCLE LVTTL Output Waveform LVTTL Input Test Waveform Figure Timing Diagram CLKIN tSK1 Output tSK1 ORDERING INFORMATION 509A Clock Management Product Prefix (QS5) Resistor Option Part Number MDSC-00033-03 SEPTEMBER 1998 QUALITY SEMICONDUCTOR, INC. Package (170-mil wide TSSOP) QS52509A ADVANCE INFORMATION 170-Mil TSSOP Package Code Thin Shrink Small Outline Package Plastic Small Outline Gull-Wing Notes: Dimensions measured maximum material condition include mold flash. Allowable mold flash 0.006in. side. Lead coplanarity 0.004in. maximum. SEATING PLANE JEDEC# Unit Symbol INCHES 0.046 0.004 0.010 0.005 0.307 0.173 0.047 0.006 0.012 0.006 0.311 0.177 MO-153AD MO-153AD MILLIMETERS 1.14 0.05 0.19 0.09 1.17 0.10 0.25 0.13 0.65 0.50 0.18 0.60 0.75 0.22 1.20 0.15 0.30 0.16 0.045 0.002 0.007 0.004 0.303 0.169 0.0256 0.238 0.020 0.007 0.252 0.024 0.008 0.269 0.030 0.009 QUALITY SEMICONDUCTOR, INC. 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