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ADE-208-438 9th. Edition June 1997 Features on-resistance Capable
Top Searches for this datasheetHAT2016R ADE-208-438 9th. Edition June 1997 Features on-resistance Capable gate drive drive current High density mounting Outline SOP-8 Source Gate Drain MOS1 MOS2 HAT2016R Absolute Maximum Ratings 25°C) Item Drain source voltage Gate source voltage Drain current Drain peak current Body-drain diode reverse drain current Channel dissipation Channel dissipation Channel temperature Storage temperature Note: Symbol VDSS VGSS D(pulse) Tstg Note2 Note3 Note1 Ratings +150 Unit 10µs, duty cycle Drive operation When using glass epoxy board (FR4 mm), Drive operation When using glass epoxy board (FR4 mm), HAT2016R Electrical Characteristics 25°C) Item Drain source breakdown voltage Gate source breakdown voltage Gate source leak current Zero gate voltege drain current Gate source cutoff voltage Static drain source state resistance Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Body-drain diode forward voltage Body-drain diode reverse recovery time Note: Pulse test Symbol V(BR)DSS V(BR)GSS VGS(off) RDS(on) RDS(on) |yfs| Ciss Coss Crss d(on) d(off) 0.03 0.05 0.045 0.08 Unit 6.5A, Note4 6.5A, diF/ =20A/µs Test Conditions 10mA, ±100µA, ±16V, 10V, Note4 Note4 Note4 1MHz HAT2016R Main Characteristics Power Temperature Derating Test Condition When using glass epoxy board (FR4 40x40x1.6 mm), Maximum Safe Operation Area Channel Dissipation Drain Current (°C) Ambient Temperature Operation this area limited DS(on) 0.03 shot Pulse Drive Operation 0.01 Drain Source Voltage Typical Output Characteristics Pulse Test Note When using glass epoxy board (FR4 40x40x1.6 Typical Transfer Characteristics Drain Current Drain Source Voltage Drain Current Pulse Test Gate Source Voltage HAT2016R Drain Source Saturation Voltage Gate Source Voltage DS(on) Pulse Test Drain Source State Resistance DS(on) Static Drain Source State Resistance Drain Current Pulse Test Drain Source Voltage 0.05 0.02 0.01 ID=5A Gate Source Voltage 0.005 Drain Current Static Drain Source State Resistance DS(on) Forward Transfer Admittance |yfs| Static Drain Source State Resistance Temperature 0.10 Pulse Test 0.08 Forward Transfer Admittance Drain Current 0.06 0.04 0.02 Pulse Test Drain Current Case Temperature (°C) HAT2016R Body-Drain Diode Reverse Recovery Time Typical Capacitance Drain Source Voltage Reverse Recovery Time (ns) 10000 3000 1000 Capacitance (pF) Ciss Drain Source Voltage Coss Crss di/dt A/µs 25°C Reverse Drain Current Dynamic Input Characteristics Reverse Drain Current Reverse Drain Current Souece Drain Voltage Pulse Test Drain Source Voltage Gate Source Voltage Gate Charge (nc) Source Drain Voltage HAT2016R 1000 Switching Characteristics duty Switching Time (ns) d(off) d(on) Drain Current Switching Time Test Circuit Monitor D.U.T. Vout Monitor Switching Time Waveform td(on) td(off) Vout HAT2016R Normalized Transient Thermal Impedance Pulse Width Drive Operation) Normalized Transient Thermal Impedance 0.05 0.01 0.02 0.01 f(t) °C/W, When using glass epoxy board (FR4 40x40x1.6 0.001 0.0001 1000 1000 Pulse Width Normalized Transient Thermal Impedance Normalized Transient Thermal Impedance Pulse Width Drive Operation) 0.05 0.01 0.02 0.01 f(t) °C/W, When using glass epoxy board (FR4 40x40x1.6 0.001 0.0001 1000 1000 Pulse Width HAT2016R Package Dimensions Unit: 1.75 0.25 1.27 0.51 0.25 1.27 0.15 0.25 Hitachi code EIAJ JEDEC FP-8DA MS-012AA HAT2016R Cautions Hitachi neither warrants grants licenses rights Hitachi's third party's patent, copyright, trademark, other intellectual property rights information contained this document. Hitachi bears responsibility problems that arise with third party's rights, including intellectual property rights, connection with information contained this document. Products product specifications subject change without notice. Confirm that have received latest product standards specifications before final design, purchase use. Hitachi makes every attempt ensure that products high quality reliability. However, contact Hitachi's sales office before using product application that demands especially high quality reliability where failure malfunction directly threaten human life cause risk bodily injury, such aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment medical equipment life support. Design your application that product used within ranges guaranteed Hitachi particularly maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions other characteristics. Hitachi bears responsibility failure damage when used beyond guaranteed ranges. Even within guaranteed ranges, consider normally foreseeable failure rates failure modes semiconductor devices employ systemic measures such failsafes, that equipment incorporating Hitachi product does cause bodily injury, fire other consequential damage operation Hitachi product. This product designed radiation resistant. permitted reproduce duplicate, form, whole part this document without written approval from Hitachi. Contact Hitachi's sales office questions regarding this document Hitachi semiconductor products. Hitachi, Ltd. Semiconductor Div. 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Group (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Tsui, Kowloon, Hong Kong Tel: <852> 9218 Fax: <852> 0281 Telex: 40815 HITEC Copyright Hitachi, Ltd., 1998. rights reserved. Printed Japan. Other recent searchesVQON20 - VQON20 VQON20 Datasheet T7024 - T7024 T7024 Datasheet T7026 - T7026 T7026 Datasheet PC372 - PC372 PC372 Datasheet MR27V801D - MR27V801D MR27V801D Datasheet M32R - M32R M32R Datasheet M32R-FPU - M32R-FPU M32R-FPU Datasheet DR-75-24-4603 - DR-75-24-4603 DR-75-24-4603 Datasheet CLC111 - CLC111 CLC111 Datasheet
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