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BF1100; BF1100R Dual-gate MOS-FETs Product specification File und
Top Searches for this datasheetBF1100; BF1100R Dual-gate MOS-FETs Product specification File under Discrete Semiconductors, SC07 1995 Philips Semiconductors Philips Semiconductors Product specification Dual-gate MOS-FETs FEATURES Specially designed supply voltage Short channel transistor with high forward transfer admittance input capacitance ratio noise gain controlled amplifier Superior cross-modulation performance during AGC. APPLICATIONS applications such television tuners professional communications equipment. DESCRIPTION Enhancement type field-effect transistor plastic microminiature SOT143 SOT143R package. transistor consists amplifier MOS-FET with source BF1100; BF1100R substrate interconnected internal bias circuit ensure good cross-modulation performance during AGC. CAUTION device supplied antistatic package. gate-source input must protected against static discharge during transport handling. PINNING SYMBOL source drain gate gate DESCRIPTION handbook, halfpage handbook, halfpage view MAM125 MAM124 view BF1100 marking code: M56. BF1100R marking code: M57. Fig.1 Simplified outline (SOT143) symbol. Fig.2 Simplified outline (SOT143R) symbol. QUICK REFERENCE DATA SYMBOL Ptot Cig1-s 1995 drain current total power dissipation operating junction temperature forward transfer admittance input capacitance gate reverse transfer capacitance noise figure PARAMETER drain-source voltage CONDITIONS MIN. TYP. MAX. UNIT Philips Semiconductors Product specification Dual-gate MOS-FETs LIMITING VALUES accordance with Absolute Maximum Rating System (IEC 134). SYMBOL Ptot PARAMETER drain-source voltage drain current gate current gate current total power dissipation BF1100 BF1100R Tstg Note Device mounted printed-circuit board. storage temperature operating junction temperature Fig.3 Tamb note Tamb note CONDITIONS BF1100; BF1100R MIN. MAX. +150 +150 UNIT MLD155 MLD156 handbook, halfpage (mS) Ptot (mW) BF1100R BF1100 Tamb Fig.4 Fig.3 Power derating curves. Forward transfer admittance function junction temperature; typical values. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs THERMAL CHARACTERISTICS SYMBOL BF1100 BF1100R thermal resistance from junction soldering point BF1100 BF1100R Notes Device mounted printed-circuit board. temperature soldering point source lead. STATIC CHARACTERISTICS unless otherwise specified. SYMBOL V(BR)G1-SS V(BR)G2-SS V(F)S-G1 V(F)S-G2 VG1-S(th) PARAMETER gate 1-source breakdown voltage gate 2-source breakdown voltage forward source-gate voltage forward source-gate voltage gate 1-source threshold voltage CONDITIONS VG2-S IG1-S VG1-S IG2-S VG2-S IS-G1 VG1-S IS-G2 VG2-S VG2-S VG2-S(th) gate 2-source threshold voltage VG1-S VG1-S IDSX drain-source current VG2-S note VG2-S note IG1-SS IG2-SS Notes connects gate Fig.27. connects gate Fig.27. gate cut-off current gate cut-off current VG2-S VG1-S VG1-S VG2-S note PARAMETER thermal resistance from junction ambient CONDITIONS note BF1100; BF1100R VALUE UNIT MIN. 13.2 13.2 MAX. UNIT 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs DYNAMIC CHARACTERISTICS Common source; Tamb VG2-S unless otherwise specified. SYMBOL PARAMETER forward transfer admittance CONDITIONS pulsed; Cig1-s input capacitance gate Cig2-s input capacitance gate drain-source capacitance reverse transfer capacitance noise figure MHz; GSopt; BSopt BF1100; BF1100R MIN. TYP. MAX. UNIT MLD157 handbook, halfpage gain handbook, halfpage MLD158 reduction (dB) Vunw (dBµV) VAGC gain reduction (dB) MHz. MHz; funw MHz; Tamb Fig.6 Fig.5 Gain reduction function voltage; typical values. Unwanted voltage cross-modulation function gain reduction; typical values; Fig.27. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R MLD159 handbook, halfpage handbook, halfpage MLD160 (mA) (mA) VG2-S Fig.7 Output characteristics; typical values. Fig.8 Transfer characteristics; typical values. handbook, halfpage MLD161 MLD162 (µA) handbook, halfpage (mS) (mA) Fig.9 Gate current function gate voltage; typical values. Fig.10 Forward transfer admittance function drain current; typical values. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R handbook, halfpage MLD163 MLD164 handbook, halfpage (mA) (mA) (µA) VG2-S VG2-S connected VGG. Fig.11 Drain current function gate current; typical values. Fig.12 Drain current function gate supply voltage VGG) drain supply voltage; typical values; Fig.27. handbook, halfpage MLD165 handbook, halfpage MLD166 (mA) (mA) VG2-S (connected VGG); VG2-S (connected VGG); Fig.13 Drain current function gate voltage VGG); typical values; Fig.27. 1995 Fig.14 Drain current function gate voltage; VGG); typical values; Fig.27. Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R handbook, halfpage MLD167 (µA) handbook, halfpage MLD168 (µA) (connected VGG). (connected VGG). Fig.15 Gate current function gate voltage; typical values. Fig.16 Gate current function gate voltage; typical values. MLD169 MLD170 handbook, halfpage handbook, halfpage (mA) (mA) (connected VGG). (connected VGG). Fig.17 Drain current function gate voltage; typical values; Fig.27. Fig.18 Drain current function gate voltage; typical values; Fig.27. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R handbook, halfpage (mS) MLD172 (µS) MLD173 (deg) (MHz) (MHz) Tamb Tamb Fig.19 Input admittance function frequency; typical values. Fig.20 Reverse transfer admittance phase function frequency; typical values. MLD174 MLD175 handbook, halfpage (mS) (deg) (mS) (MHz) (MHz) Tamb Tamb Fig.21 Forward transfer admittance phase function frequency; typical values. Fig.22 Output admittance function frequency; typical values. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R handbook, halfpage (mS) MLD176 (µS) MLD177 (deg) (MHz) (MHz) Tamb Tamb Fig.23 Input admittance function frequency; typical values. Fig.24 Reverse transfer admittance phase function frequency; typical values. MLD178 MLD179 handbook, halfpage (mS) (deg) (mS) (MHz) (MHz) Tamb Tamb Fig.25 Forward transfer admittance phase function frequency; typical values. Fig.26 Output admittance function frequency; typical values. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs BF1100; BF1100R handbook, full pagewidth VAGC MGC420 Fig.27 Cross-modulation test set-up. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs Table (MHz) 1000 Table Scattering parameters: VG2-S MAGNITUDE (ratio) 0.986 0.983 0.974 0.960 0.953 0.933 0.915 0.895 0.880 0.864 0.839 ANGLE (deg) -3.6 -7.4 -14.7 -21.8 -28.7 -35.4 -42.0 -47.9 -53.5 -59.6 -65.0 MAGNITUDE (ratio) 2.528 2.531 2.490 2.446 2.412 2.341 2.283 2.205 2.146 2.087 1.998 ANGLE (deg) 174.4 169.8 159.5 149.8 139.8 130.1 120.4 111.6 102.9 93.4 84.4 MAGNITUDE (ratio) 0.001 0.001 0.002 0.002 0.003 0.003 0.004 0.003 0.003 0.003 0.003 BF1100; BF1100R ANGLE (deg) 63.7 80.7 81.0 80.3 76.3 76.5 79.0 81.5 90.8 106.6 135.4 MAGNITUDE (ratio) 1.000 1.000 0.996 0.994 0.992 0.987 0.984 0.981 0.978 0.974 0.971 ANGLE (deg) -2.0 -4.2 -8.1 -11.9 -15.7 -19.4 -23.0 -26.7 -30.3 -33.9 -37.6 Noise data: VG2-S (MHz) Fmin (dB) 2.00 (ratio) 0.67 (deg) 43.9 0.89 Table (MHz) 1000 Table Scattering parameters: VG2-S MAGNITUDE (ratio) 0.986 0.984 0.974 0.960 0.953 0.933 0.915 0.894 0.879 0.863 0.838 ANGLE (deg) -3.7 -7.4 -14.6 -21.8 -28.7 -35.3 -41.9 -47.8 -53.5 -59.5 -65.0 MAGNITUDE (ratio) 2.478 2.480 2.440 2.400 2.371 2.306 2.255 2.183 2.131 2.080 1.999 ANGLE (deg) 174.7 170.3 160.6 151.4 141.9 132.7 123.6 115.3 107.2 98.2 89.7 MAGNITUDE (ratio) 0.001 0.001 0.002 0.002 0.003 0.003 0.004 0.004 0.003 0.003 0.003 ANGLE (deg) 72.2 80.9 82.7 79.9 77.7 77.1 77.1 79.3 83.9 95.1 115.8 MAGNITUDE (ratio) 1.000 1.000 0.997 0.996 0.994 0.991 0.989 0.986 0.984 0.982 0.980 ANGLE (deg) -1.6 -3.5 -6.6 -9.7 -12.8 -15.8 -18.7 -21.7 -24.6 -27.5 -30.4 Noise data: VG2-S (MHz) Fmin (dB) 2.00 (ratio) 0.66 (deg) 43.3 0.97 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs PACKAGE OUTLINES BF1100; BF1100R handbook, full pagewidth 0.75 0.60 0.150 0.090 0.88 0.48 MBC845 VIEW Dimensions Fig.28 SOT143. handbook, full pagewidth 0.40 0.25 0.150 0.090 0.48 0.38 0.88 0.78 MBC844 VIEW Dimensions Fig.29 SOT143R. 1995 Philips Semiconductors Product specification Dual-gate MOS-FETs DEFINITIONS Data Sheet Status Objective specification Preliminary specification Product specification Limiting values BF1100; BF1100R This data sheet contains target goal specifications product development. This data sheet contains preliminary data; supplementary data published later. This data sheet contains final product specifications. Limiting values given accordance with Absolute Maximum Rating System (IEC 134). Stress above more limiting values cause permanent damage device. These stress ratings only operation device these other conditions above those given Characteristics sections specification implied. Exposure limiting values extended periods affect device reliability. Application information Where application information given, advisory does form part specification. LIFE SUPPORT APPLICATIONS These products designed life support appliances, devices, systems where malfunction these products reasonably expected result personal injury. Philips customers using selling these products such applications their risk agree fully indemnify Philips damages resulting from such improper sale. 1995 Other recent searchesUNR421x - UNR421x UNR421x Datasheet ST10F272M - ST10F272M ST10F272M Datasheet SOT78 - SOT78 SOT78 Datasheet OPF395A - OPF395A OPF395A Datasheet OPF395B - OPF395B OPF395B Datasheet OPF395C - OPF395C OPF395C Datasheet OPF395D - OPF395D OPF395D Datasheet ML60851C - ML60851C ML60851C Datasheet LA211 - LA211 LA211 Datasheet
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