ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED. SHEET SHEET STATU
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REVISIONS DESCRIPTION Redrawn with changes. Added device types cage code 32116. Made changes table figures Delete CAGE code 32116. Made changes table Inactivate device types design. device type DATE (YR-MO-DA) 94-04-08 95-06-02 98-06-05 APPROVED Cottongim Cottongim Cottongim
ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED.
SHEET SHEET STATUS SHEETS SHEET
PREPARED Donald Osborne
PMIC
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS 3990 COLUMBUS, OHIO 43216-5000
CHECKED Robert Heber
APPROVED William Heckman
MICROCIRCUIT, HYBRID, DIGITAL, DUAL CHANNEL, VOLT, DRIVER-RECEIVER, RECEIVER IDLE NORMALLY HIGH
DRAWING APPROVAL DATE 90-11-26 SIZE CAGE CODE REVISION LEVEL
AMSC
SHEET
67268
5962-89447
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E097-98
SCOPE Scope. This drawing documents five product assurance classes, class (lowest reliability), class (exceptions), class (lowest high reliability), class (high reliability), class (highest reliability) choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice radiation hardness assurance levels reflected PIN. PIN. shall shown following example: 5962
89447
Federal stock class designator
designator (see 1.2.1) Drawing number
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
1.2.1 Radiation hardness assurance (RHA) designator. Device classes marked devices shall meet MIL-PRF-38534 specified levels shall marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) shall identify circuit function follows: Device types Generic number ARX3416, ARX3436 NHI-1501 FC1553622 BUS63135II, BUS63136II CT1487-DI ARX3416-002 CT1487-DFI ACT4436-DI, ACT4487-DI Circuit function Dual channel, driver-receiver, receiver idle normally high Coupling transformer turns ratio: Direct Transformer 1.4:1 1.4:1 1.4:1 1.4:1 1.4:1 1.4:1 1.4:1
1.2.3 Device class designator. This device class designator shall single letter identifying product assurance level follows: Device class Device performance documentation Certification qualification MIL-PRF-38534
1.2.4 Case outline(s). case outline(s) shall designated MIL-STD-1835 follows: Outline letter Descriptive designator figure figure figure figure Terminals Package style Dual-in-line Dual-in-line Flat package Flat package
Device types inactive design. Device type replaces device types Device type generic number CT1892-500 obsolete date revision generic number 3416-511 obsolete date revison
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1.2.5 Lead finish. lead finish shall specified MIL-PRF-38534. Absolute maximum ratings. Supply voltage range: (devices (devices VCC1 (all devices) Logic input voltage Receiver differential voltage Receiver common mode voltage range Driver peak output current Power dissipation (PD) +125C: (devices (device (device (device (devices Storage temperature range Lead temperature (soldering, seconds) Junction temperature (TJ): (devices (device (device (devices Thermal resistance, junction-to-case (JC): (devices (device (device (device (devices Recommended operating conditions. Supply voltage range: (devices (devices VCC1 (all devices) Logic input voltage Receiver differential voltage: (devices (devices Receiver common mode voltage range: (devices (devices Driver peak output current (all devices) Serial data rate Case operating temperature range (TC) +14.25 +15.75 -14.25 -15.75 +4.5 +5.5 VP-P VP-P maximum -55C +125C -0.3 +0.3 -0.3 -0.3 VCC1 VP-P 0.96 1.65 -65C +150C +300C +167C +145C +160C +150C 88C/W 8.8C/W 18C/W 7.0C/W 60C/W
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. channel transmitting percent duty cycle second channel standby. Worst case operating junction temperature when case held +125C. Maximum junction temperature rise above case temperature hottest 100% transmitting duty cycle shall 42C. Maximum junction temperature rise above case temperature hottest 100% transmitting duty cycle shall 20C. Maximum junction temperature rise above case temperature hottest 100% transmitting duty cycle shall 21C.
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APPLICABLE DOCUMENTS Government specification, standards, handbook. following specification, standards, handbook form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38534 Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 Test Methods Procedures Microelectronics. MIL-STD-973 Configuration Management. MIL-STD-1835 Microcircuit Case Outlines. HANDBOOK DEPARTMENT DEFENSE MIL-HDBK-780 Standard Microcircuit Drawings. MIL-HDBK-1553 Multiplex Applications Handbook. (Unless otherwise indicated, copies specification, standards, handbook available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item performance requirements device classes shall accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 include performance tests herein designated device manufacturer's Quality Management (QM) plan designated applicable device class. Therefore, tests inspections herein performed applicable device class (see MIL-PRF-38534). Futhermore, manufacturers take exceptions alternate methods tests inspections herein perform them. However, performance requirements defined MIL-PRF-38534 shall applicable device class. modification plan shall affect form, fit, function described herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38534 herein. 3.2.1 Case outline(s). case outline(s) shall accordance with 1.2.4 herein figure 3.2.2 Terminal connections. terminal connections shall specified figure
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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SHEET
3.2.3 Timing waveforms. Timing waveforms shall specified figure 3.2.4 Typical transformer connection. typical transformer connection shall specified figure Electrical performance characteristics. Unless otherwise specified herein, electrical performance characteristics specified table shall apply over full specified operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking Device(s). Marking device(s) shall accordance with MIL-PRF-38534. device shall marked with listed herein. addition, manufacturer's vendor similar also marked listed QML-38534. Data. addition general performance requirements MIL-PRF-38534, manufacturer device described herein shall maintain electrical test data (variables format) from initial quality conformance inspection group sample, each device type listed herein. Also, data should include summary parameters manually tested, those which, any, guaranteed. This data shall maintained under document revision level control manufacturer made available preparing activity (DSCC-VA) upon request. Certificate compliance. certificate compliance shall required from manufacturer order supply this drawing. certificate compliance (original copy) submitted DSCC-VA shall affirm that manufacturer's product meets performance requirements MIL-PRF-38534 herein. Certificate conformance. certificate conformance required MIL-PRF-38534 shall provided with each microcircuits delivered this drawing. QUALITY ASSURANCE PROVISIONS Sampling inspection. Sampling inspection procedures shall accordance with MIL-PRF-38534 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. Screening. Screening shall accordance with MIL-PRF-38534. following additional criteria shall apply: Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available either DSCC-VA acquiring activity upon request. Also, test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. specified accordance with table method 1015 MIL-STD-883.
Interim final electrical test parameters shall specified table herein, except interim electrical parameter tests prior burn-in optional discretion manufacturer.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical performance characteristics.
Test Receiver Input level Input common mode voltage range Output voltage Output high voltage Transmitter Input voltage Input high voltage Input current Input high current Output voltage Output noise voltage Symbol VICM Conditions -55C +125C unless otherwise specified Differential input, Independent xfmr accordance with MIL-HDBK-1553 section 5.1.2.2 -0.4 Across load Across load Device types 01,03,04, 02,05,07 01,02,03, 04,05,07 Group subgroups -0.4 -1.0 0.04
Limits
Unit
VP-P
V(pk)
VP-P mVP-P
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical performance characteristics Continued.
Receiver Input strobe Input Input Input Transmitter Input inhibit Input Input Input
Test
voltage high voltage current
high current voltage high voltage current
high current
Symbol VSIL VSIH ISIL ISIH VIIL VIIH IIIL IIIH
Conditions -55C +125C unless otherwise specified VSIL VSIH VSIL VSIH
Device types 01,06,08 02,04 05,07 01,02,03, 06,08 05,07 01,02,03, 04,06,08 05,07
Group subgroups
Limits
-0.4 -0.72 -0.7 -1.0 0.04 -0.4 -0.72 -1.0 0.04 0.08
Unit
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical performance characteristics Continued.
Test Total current Symbol ICC-SB IEE-SB ICC1-SB ICC-25 IEE-25 ICC1-25 ICC-50 IEE-50 ICC1-50 ICC-100 IEE-100 Conditions -55C +125C unless otherwise specified (standby mode) (25% duty cycle into load (50% duty cycle into load) (100% duty cycle into load) Device types 01,08 05,06,07 01,03,08 05,06,07 01,08 04,05,06, 01,08 05,06,07 01,08 05,06,07 01,08 03,04,05, 06,07 01,08 05,06,07 01,08 03,04 05,06,07 01,08 03,04,05, 06,07 01,08 05,06,07 01,08 03,04 05,06,07 Group subgroups Unit 16.5
Limits
Power supply
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical performance characteristics Continued.
Test Power Total current supply Receiver Input resistance Input capacitance Threshold voltage Transmitter Output resistance (transmitter off) Output capacitance (transmitter off) Output offset voltage Peak amplitude variation Zero cross stability Symbol ICC1-100 ROUT COUT Conditions -55C +125C unless otherwise specified (100% duty cycle into load) sine wave sine wave +25C sine wave sine wave +25C Across (See figure Device types 01,08 04,05,06, 01,02,08 03,04 05,06,07 01,06,08 05,07 01,02,03, 04,06,08 05,07 Group subgroups 9,10,11 Limits 1.05 1.10 1.15 0.56 1975 2025 1025 1475 1525
Unit
VP-P
mV(pk)
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical performance characteristics Continued.
Test Receiver Delay time, input output Strobe delay Transmitter Rise time Fall time Delay time inhibiting Inhibit delay inhibiting Inhibit delay active Symbol tDI-H tDI-L Conditions -55C +125C unless otherwise specified Delay time from dif- ferential input zero crossing DATA DATA (See figure Delay time from strobe rising falling edge DATA DATA (See figure Output load (See figure (See figure (See figure (See figure Device types 01,02,03, 04,06,08 05,07 01,03,05, 06,07,08 02,04 01,02,03, 04,05,07, 01,02,03, 04,05,07, 01,03,06, 02,04 05,07 01,02,06, 03,04 05,07 01,02,06, 03,04 05,07 Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11
Limits
Unit
VCC1 specifications limits single channel with connections made other channel. This parameter tested initially after process design change which might affect this parameter. Threshold measured direct coupled mode including transformer. Threshold maximum level which there pulses either receiver output. Divide obtain threshold transformer coupled mode. Measured across load, after parity mid-bit zero crossing message. Measured across load, variation average peak amplitude.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outline
Inches .002 .005 .010 .018 .060 .100 .210 .250 .600 .770 1.470
0.05 0.13 0.25 0.46 1.52 2.54 5.33 6.35 15.24 19.56 37.34
NOTES: Dimensions inches. Metric equivalents given general information only. Lead indentification numbers reference only. Lead spacing dimensions apply only seating plane.
FIGURE Case outline(s).
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outline
Inches .005 .015 .018 .055 .086 .100 .600 .775 1.700 1.895
0.13 0.38 0.46 1.40 2.18 2.54 15.24 19.68 43.18 48.13
NOTES: Dimensions inches. Metric equivalents given general information only. Lead identification numbers reference only. Lead spacing dimensions apply only seating plane. FIGURE Case outline(s) Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outline
Inches .002 .010 .015 .100 .165 .250 .785 1.700 1.905
0.05 0.25 0.38 2.54 4.19 6.35 19.94 43.18 48.39
NOTES: Dimensions inches. Metric equivalents given general information only. Lead indentification numbers reference only. Lead spacing dimensions apply only seating plane. FIGURE Case outline(s) Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outline
Inches .002 .003 .010 .015 .035 .065 .097 .100 .180 1.50
0.05 0.08 0.25 0.38 0.89 1.65 2.46 2.54 4.51 10.16 19.81 38.10
NOTES: Dimensions inches. Metric equivalents given general information only. Lead identification numbers reference only. Lead spacing dimensions apply only seating plane. FIGURE Case outline(s) Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outlines
Channel
Function data data data Strobe data Case data data data Strobe data VCC, data data VCC1 Inhibit data data VCC, data data VCC1 Inhibit data data
NOTE: pins should connected externally. case outlines only, pins device types connects (NC's) device types Also, case outlines only, pins device types connects (NC's) device type
FIGURE Terminal connections.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outlines (Device types 08).
Function data out/RX data data out/RX data strobe data data Case data out/RX data data out/RX data strobe data data connect VCC1 inhibit data data VCC1 Inhibit data data
Channel
NOTE: pins should connected externally.
FIGURE Terminal connections Continued.
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FIGURE Timing waveforms.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TRANSMISSION ZERO CROSS STABILITY
NOTE: Abbreviated waveform. Above relationships apply during entire transmission.
FIGURE Timing waveforms Continued.
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NOTES: Device types N1:N2 1.4:1 N1:N3 Device type N1:N2 N1:N3
FIGURE Typical transformer connection.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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TABLE Electrical test requirements. MIL-PRF-38534 test requirements Subgroups accordance with MIL-PRF-38534, group test table) -1*,2,3,4,5,6,9,10,11 1,2,3,4,5,6,9,10,11 1,2,3 Subgroups** accordance with method 5005, group test table)
Interim electrical parameters Final electrical parameters Group test requirements Group end-point electrical parameters MIL-STD-883, group end-point electrical parameters devices
applies subgroup When applicable this standard microcircuit drawing, subgroups shall defined. Conformance periodic inspections. Conformance inspection (CI) periodic inspection (PI) shall accordance with MIL-PRF-38534 specified herein. 4.3.1 Group inspection (CI). Group inspection shall accordance with MIL-PRF-38534 follows: Tests shall specified table herein. Subgroups shall omitted.
4.3.2 Group inspection (PI). Group inspection shall accordance with MIL-PRF-38534. 4.3.3 Group inspection (PI). Group inspection shall accordance with MIL-PRF-38534 follows: End-point electrical parameters shall specified table herein. Steady-state life test, method 1005 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available either DSCC-VA acquiring activity upon request. Also, test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. specified accordance with table method 1005 MIL-STD-883. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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SHEET
4.3.4 Group inspection (PI). Group inspection shall accordance with MIL-PRF-38534. 4.3.5 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). levels device classes shall quality conformance inspection sample tests shall performed level specified acquisition document. tests device classes levels shall performed through each level determine what levels devices meet requirements. These tests shall performed initial qualification after design process changes which affect performance device. End-point electrical parameters shall specified table herein. Prior total dose irradiation, each selected sample shall assembled qualified package. shall pass specified group electrical parameters table subgroups specified table herein. device classes devices shall subjected radiation hardness assured tests specified MIL-PRF-38534 level being tested, meet postirradiation end-point electrical parameter limits defined table +25C percent, after exposure. Prior during total dose irradiation testing, devices shall biased establish worst case condition specified radiation exposure circuit. device classes subgroups table method 5005 MIL-STD-883 shall tested appropriate device construction. When specified purchase order contract, copy delta limits shall supplied.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38534. NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor-prepared specification drawing. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished accordance with MIL-STD-973 using Form 1692, Engineering Change Proposal. Record users. Military industrial users shall inform Defense Supply Center Columbus when system application requires configuration control applicable SMD. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-7603. Comments. Comments this drawing should directed DSCC-VA, 3990, Columbus, Ohio 43216-5000, telephone (614) 692-0676. Sources supply. Sources supply listed QML-38534. vendors listed QML-38534 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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SHEET
STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 98-06-05 Approved sources supply 5962-89447 listed below immediate acquisition only shall added QML-38534 during next revision. QML-38534 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision QML-38534.
Standard microcircuit drawing 5962-8944701HUX 5962-8944701HXX 5962-8944701HYX 5962-8944701HZX 5962-8944702HXA 5962-8944702HXC 5962-8944702HYA 5962-8944702HYC 5962-8944703HXA 5962-8944703HXC 5962-8944703HYA 5962-8944703HYC 5962-8944704HXC 5962-8944704HYC 5962-8944705HXX 5962-8944706HXA 5962-8944706HXC 5962-8944707HYX
Vendor CAGE number 57363 57363 57363 57363 U4388 U4388 U4388 U4388 19645 19645 88379 88379
Vendor similar ARX3436-502 ARX3416-001-3 ARX3416FP-001-3 ARX3436FP-502 NHI-1501/883 NHI-1501/883 NHI-1501FP/883 NHI-1501FP/883 FC1553622 FC1553622 FC1553622FP FC1553622FP BUS63135II BUS63136II CT1487-DI ARX3416-002-2 ARX3416-002-2 CT1487-DFI
lead finish shown each PIN, representing hermetic package, most readily available from manufacturer listed that part. desired lead finish listed contact Vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from QML-38534 source. Device type replaces device types
STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN Continued. DATE: 98-06-05
Standard microcircuit drawing 5962-8944708HUA 5962-8944708HUC 5962-8944708HXA 5962-8944708HXC 5962-8944708HYA 5962-8944708HYC 5962-8944708HZA 5962-8944708HZC
Vendor CAGE number 88379 88379 88379 88379 88379 88379 88379 88379
Vendor similar ACT4436-DI ACT4436-DI ACT4487-DI ACT4487-DI ACT4487-DFI ACT4487-DFI ACT4436-DFI ACT4436-DFI
lead finish shown each PIN, representing hermetic package, most readily available from manufacturer listed that part. desired lead finish listed contact Vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from QML-38534 source. Device type replaces device types Vendor CAGE number U4388 Vendor name address C-MAC Microcircuits Limited South Denes Great Yarmouth Norfolk NR30 England Data Device Corporation Wilbur Place Bohemia, 11716-2482 National Hybrid, Incorporated 2200 Smithtown Avenue Ronkonkoma, 11779-7359 Aeroflex Circuit Technology Corporation South Service Road Plainview, 11803-4193
19645
57363
88379
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies this information bulletin.
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