Quad Ultrahigh-Speed Driver with High-Z VTERM Modes AD53513 VCC1
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FEATURES Driver Operation Gb/s) Driver Inhibit Function Edge Matching Guaranteed Industry Specifications Output Impedance V/ns Slew Rate Variable Output Voltages ECL, TTL, CMOS High-Speed Differential Inputs Maximum Flexibility Ultrasmall 100-Lead LQFP Package with Built-In Heat Sink APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation Characterization Equipment
Quad Ultrahigh-Speed Driver with High-Z VTERM Modes AD53513
VCC1 VCC2
VCC3 VCC4 VEE3 VEE1 VEE2 VEE4
RLD1 DATA1 DATAB1 INH1 INHB1 DATA2 DATAB2 INH2 INHB2 RLD2 RLD3 DATA3 DATAB3 INH3 INHB3 DATA4 DATAB4 INH4 INHB4 RLD4
VHDCPL1 39nF ROUT VOUT1 VLDCPL1 39nF
DRIVER
VHDCPL2 39nF ROUT VOUT2 VLDCPL2 39nF
DRIVER
PRODUCT DESCRIPTION
AD53513
VHDCPL3 39nF ROUT VOUT3 VLDCPL3 39nF
AD53513 quad high-speed driver designed digital mixed-signal test systems. Combining high-speed monolithic process with convenient surface-mount package, this product attains superb electrical performance while preserving optimum packaging densities long-term reliability 100-lead, LQFP package with built-in heat sink. Featuring unity gain programmable output levels -2.5 +5.5 with output swing capability less than AD53513 designed stimulate ECL, TTL, CMOS logic families, well high-speed memory. Gb/s data rate capacity matched output impedance allow real-time stimulation these digital logic families. test devices, driver switched into high impedance state (Inhibit Mode), electrically removing driver from path. driver leakage current inhibit typically output charge transfer entering inhibit typically less than AD53513 transition from HI/LO inhibit controlled through data inhibit inputs. input circuitry uses high-speed differential inputs with common-mode range This allows direct interface precision differential timing. analog logic HI/LO inputs equally easy interface. Typically requiring bias current, AD53513 directly coupled output digitalto-analog converter. Each channel AD53513 Mode Select RLD, which single-sided logic input. logic threshold
DRIVER
VHDCPL4 39nF ROUT VOUT4 VLDCPL4 39nF
DRIVER
TVCC THERM
input which common four channels. Mode Select controls whether inhibit puts driver High-Z VTERM mode. (Refer Table digital logic inputs (DATA, DATAB, INH, INHB, RLD, VBB), must share common logic levels. threshold should midrange logic levels. example, levels -0.8 -1.8 used, should -1.3 AD53513 available 100-lead, LQFP package with built-in heat sink specified operate over ambient commercial temperature range -25°C +85°C.
REV.
Information furnished Analog Devices believed accurate reliable. However, responsibility assumed Analog Devices use, infringements patents other rights third parties that result from use. license granted implication otherwise under patent patent rights Analog Devices. Technology Way, P.O. 9106, Norwood, 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 Analog Devices, Inc., 2002
unless otherwise noted. temperature coefficients measured C-95 capacitor must connected between VHDCPL between VLDCPL.)
Parameter DIFFERENTIAL INPUT CHARACTERISTICS (Data DATA, INH), RLD, Input Voltage Differential Input Range Bias Current Threshold Input REFERENCE INPUTS (VL, Bias Currents OUTPUT CHARACTERISTICS Logic High Range Logic Range Amplitude (VH-VL) Absolute Accuracy Offset Gain Linearity Error Offset Gain Linearity Error Offset Gain Linearity Error Offset VTERM Output Resistance Output Leakage Dynamic Current Limit Static Current Limit Typ* Unit Test Conditions -1.3 Midrange -2.3 -2.5 -100 -100 -100 -1.0 +1.0 +100 +100 +5.5 +5.3 +100 Volts Volts Volts mV/°C Midrange Logic Levels DATA DATA Volts
AD53513-SPECIFICATIONS (All specifications
PSRR, Drive Mode DYNAMIC PERFORMANCE, DRIVE Propagation Delay Time Propagation Delay Delay Matching, Edge Edge Rise Fall Time Swing Swing Swing Rise Fall Time Swing Swing Swing Overshoot, Undershoot, Preshoot
DATA DATA -2.5 DATA +4.5 DATA +5.5 +4.5 Term Mode, Term Mode, -2.0 +5.0 DATA IOUT VOUT CBYP Output -2.5 +5.5 -2.5 DATA Output +5.5 -2.5 DATA
ps/°C
Measured 50%, Load, -800 Measured 50%, Load, -800 Measured 50%, Load, -800 Measured 20%-80%, Measured 10%-90%, Measured 10%-90%, Measured 20%-80%, Measured 10%-90%, Measured 10%-90%, +0.5 +0.5 Pulsewidth/Period ns/4.0 ns/120 Input, 10%/90% Output, Terminated -1.8 -0.8 VOUT Terminated
ps/°C ps/°C ps/°C Step
Settling Time Delay Change Pulsewidth Minimum Pulsewidth Swing Toggle Rate
REV.
AD53513
Parameter DYNAMIC PERFORMANCE, INHIBIT Delay Time, Active Inhibit Delay Time, Inhibit Active Spike Output Capacitance DYNAMIC PERFORMANCE, VTERM Delay Time, Active VTERM Delay Time, VTERM Active Overshoot, Undershoot, Preshoot VTERM POWER SUPPLIES Total Supply Range Positive Supply Negative Supply Positive Supply Current Negative Supply Current Total Power Dissipation Temperature Sensor Gain Factor <200 0.50 0.45 6%/± 1.30 1.25 Typ* Unit Test Conditions Measured 50%, Measured 50%, Driver Inhibited Measured 50%, +0.8 -0.8 Terminated -0.8 +0.8 Output Terminated
µA/K
RLOAD VSOURCE
NOTES Connecting shorting decoupling capacitors ground will result destruction device. *Typical parameters production tested guaranteed through characterization. Specifications subject change without notice.
ABSOLUTE MAXIMUM RATINGS
Power Supply Voltage Inputs DATA, DATA, INH, INH, RLD, DATA DATA, INH, RLD, Outputs VOUT Short Circuit Duration Indefinite2 VOUT Range Inhibit Mode VHDCPL Connect Except Capacitor VLDCPL Connect Except Capacitor THERM
Environmental Operating Temperature (Junction) 175°C Storage Temperature -65°C +150°C Lead Temperature (Soldering, sec)3 260°C
NOTES Stresses above those listed under Absolute Maximum Ratings cause permanent damage device. This stress rating only; functional operation device these other conditions above those indicated operational sections this specification implied. Absolute maximum limits apply individually, combination. Exposure absolute maximum rating conditions extended periods affect device reliability. Output short circuit protection guaranteed long proper heat sinking employed ensure compliance with operating temperature limits. ensure lead coplanarity 0.002 inches) solderability, handling with bare hands should avoided device should stored environments (75°F 10°F) with relative humidity exceed 65%.
ORDERING GUIDE Package Description 100-Lead LQFP-CDQUAD Shipment Method, Quantity Shipping Container Tray, Pieces Package Option SQ-100
Model AD53513JSQ
CAUTION (electrostatic discharge) sensitive device. Electrostatic charges high 4000 readily accumulate human body test equipment discharge without detection. Although AD53513 features proprietary protection circuitry, permanent damage occur devices subjected high-energy electrostatic discharges. Therefore, proper precautions recommended avoid performance degradation loss functionality.
WARNING!
SENSITIVE DEVICE
REV.
AD53513
CONFIGURATION
VHDCPL1 PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND
THERM
TVCC
RLD1
RLD2
HQGND1 HQGND1 OUT1 HQGND1 VLDCPL1 PWRGND VHDCPL2 HQGND2 OUT2 HQGND2 HQGND2 VLDCPL2 PWRGND VLDCPL3 HQGND3 HQGND3 OUT3 HQGND3 VHDCPL3 PWRGND VLDCPL4 HQGND4 OUT4 HQGND4 HQGND4
IDENTIFIER
DATAB1 INH1 INB1
HEAT SLUG
PWRGND INHB2 INH2 DATAB2
AD53513
VIEW (Not Scale)
DATA2 PWRGND DATA3 DATAB3 INH3 INHB3 PWRGND INHB4 INH4 DATAB4 DATA4
CONNECT
NOTE THAT MOUNTED BACK HEAT SLUG. PACKAGE MOUNTED BOARD HEAT SLUG
DATA
VHDCPL4 PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND PWRGND RLD4 RLD3
Table Driver Truth Table
DATA
Output State VTERM
OUTLINE DIMENSIONS
Dimensions shown inches (mm).
100-Lead LQFP_ED Package (SQ-100)
0.063 (1.60) 0.030 (0.75) 0.024 (0.60) 0.018 (0.45) SEATING PLANE 0.630 (16.00) 0.551 (14.00) 0.472 (12.00)
0.551 (14.00) VIEW
(PINS DOWN)
0.057 (1.45) 0.055 (1.40) 0.053 (1.35)
0.008 (0.20) 0.004 (0.09)
0.472 (12.00) 0.630 (16.00)
0.006 (0.15) 0.002 (0.05)
VIEW
0.003 (0.08)
ROTATED
VIEW
0.020 (0.50) LEAD PITCH
0.011 (0.27) 0.009 (0.22) 0.007 (0.17)
REV.
PRINTED U.S.A.
C01540-0-1/02(0)
DATA1
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