Dynamic Early Fail Study (EFR) Test Condition Condition: Dyn
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Process Related Reliability Test Data
Dynamic Early Fail Study (EFR)
Test Condition
Condition: Dynamic operating condition with 4.6V 3.3V products, 125°C, MHz/125 synchronous DRAMs Dynamic operating condition with 6.5V/4.3V 5V/3.3V products, 125°C, MHz/100 synchronous/asynchronous SRAMs Duration: Spec: hours. Failure Rate 0.2%.
Dynamic Products
Design Rule Technology 0.175 CMOS/SPQ4, CMOS/SPQ4, Period Sample Size 1000 24690 38523 2000 3000 3000 Total Failure/Failure Mode Function Others Failure Rate 0.03 0.04 0.06 0.03
Static Products
Design Rule Technology 0.35 CMOS/DPDM CMOS/SPDM Period Sample Size 3000 3107 3000 3000 3000 6000 Total Failure/Failure Mode Function Others Failure Rate 0.06 0.06 0.06 0.03 0.06
CMOS/DPDM
3000 3000 3000 3000
0.06 0.06
CMOS/DPSM
Non-Volatile Memory Products
Design Rule Technology CMOS/DPSM Period Sample Size 6000 3000 3000 Total Failure/Failure Mode Function Others Failure Rate 0.03 0.03 0.03
High-Temperature Operating Life Test (HTOL)
Test Condition
Condition: Dynamic operating condition with 4.6V 3.3V products, 125°C, MHz/125 synchronous DRAMs Dynamic operating condition with 5.5V/3.3V 5V/3.3V products, 125°C, MHz/100 synchronous/asynchronous SRAMs Duration: Test time points hrs, hrs, 1000 hrs.
Dynamic Products Device Type
Product Type Part W982516AH Design Rule 0.175 Period W981216BH 0.175 W946432AF 0.175 W981616AH Samples Fails Reject Information
Process
Design Rule Technology 0.175 CMOS/SPPeriod Samples Fails Reject Information
CMOS/SP
Static Products Device Type
Product Type 3.3V Part W26L010A Design Rule 0.35 Period 128K 3.3V W24L011A 0.35 W24100S70 W24258S70LL W24257A15 Samples Fails Reject Information
Process
Design Rule Technology 0.35 CMOS/DPDM Period Samples Fails Reject Information
CMOS/SPDM
CMOS/DPDM
Non-Volatile Memory Products Device Type
Product Type FLASH W29C020 Part Design Rule Period FLASH W49F102Q Samples Fails Reject Information
Process
Design Rule Technology CMOS/DPSM Period Samples Fails Reject Information
Logic Products Device Type
Product Type Decoder W9925QF Part Design Rule 0.35 Period 8-bit W78C54 W83627HF Samples Fails Reject Information
Process
Design Rule Technology 0.35µm CMOS/SPPeriod Samples Fails Reject Information
CMOS/SPDM
CMOS/SPDM
High-Temperature Storage Life Test (HTSL)
Test Condition
Condition: Duration: 150°C Test time points hrs, hrs, 1000 hrs.
Dynamic Products Device Type
Product Type Part W982516AH Design Rule 0.175 Period W946432AF 0.175 W981216BH 0.175 W981616AH Samples Fails Reject Information
Process
Design Rule Technology 0.175 CMOS/SPPeriod Samples Fails Reject Information
CMOS/SP
Static Products Device Type
Product Type 128K 3.3V Part W24L011A Design Rule 0.35 Period W24100S70 W2425870LL W24257A15 Samples Fails Reject Information
Process
Design Rule Technology 0.35 CMOS/DPDM Period Samples Fails Reject Information
CMOS/SPDM
CMOS/DPDM
Non-Volatile Memory Products Device Type
Product Type FLASH W29C020 Part Design Rule Period FLASH W49F102Q Samples Fails Reject Information
Process
Design Rule Technology CMOS/DPSM Period Samples Fails Reject Information
Logic Products
Device Type
Product Type Part Design Rule 0.35 Decoder W9925QF Period W78C32BP 8-bit W78C54 W83627HF Samples Fails Reject Information
Process
Design Rule Technology 0.35 CMOS/SPPeriod Samples Fails Reject Information
CMOS/SPDM
CMOS/SPDM
Bias Life Test
Test Condition
Condition: Duration: 125°C, Maximum operating voltage Test time points hrs, hrs, 1000 hrs.
Dynamic Products Device Type
Product Type Part W982516AH Design Rule 0.175 Period W981216BH 0.175 W946432AF 0.175 Samples Fails Reject Information
Process
Design Rule Technology 0.175 CMOS/SPPeriod Samples Fails Reject Information
Static Products Device Type
Product Type 128K 3.3V Part W24L011A Design Rule 0.35 Period W24100S70 W24258S32 W24257A15 70LL Samples Fails Reject Information
Process
Design Rule Technology 0.35 CMOS/DPDM Period Samples Fails Reject Information
CMOS/SPDM
CMOS/DPDM
Non-Volatile Memory Products Device Type
Product Type FLASH W29C020 Part Design Rule Period FLASH W49F102Q Samples Fails Reject Information
Process
Design Rule Technology CMOS/DPSM Period Samples Fails Reject Information
Logic Products Device Type
Product Type Decoder W9925QF Part Design Rule 0.35 Period W83627HF W78C32BP 8-bit W78C54 Samples Fails Reject Information
Process
Design Rule Technology 0.35µm CMOS/SPPeriod Samples Fails Reject Information
CMOS/SPDM
Electrostatic Discharge (ESD) Test
Test Condition
Human Body Mode. According MIL-STD-883C-3015.
Dynamic Products
Product Type Design Rule (µm) 0.175 0.175 0.25 Pass Voltage (HBM)
(3.3 (3.3 (3.3 (3.3 (3.3 (3.3 (3.3
Static Products
Product Type Design Rule (µm) 0.45 (6T) 0.45 Pass Voltage (HBM)
(3.3 (3.3
0.45 0.35(6T) 0.4(6T)
(3.3
(3.3 (3.3 (3.3
0.35 0.35
Non-Volatile Memory Products
Product Type Design Rule (µm) Pass Voltage (HBM)
Logic Products
Product Type Decoder(W9925QF) MPEG-1 Video Decoder (W9920IF) Design Rule (µm) 0.35 Pass Voltage (HBM)
Super W83C553FG Super W83977TF Super W83977TF Super W83877F Dialer W91340 MPEG-1 Audio Decoder (W9910IF) 8-bit W78C354 8-bit W78C32BP 8-bit W78C154 Monitor Controller W83C43 Monitor Controller W82C610 ADPCM Codes W62000S CD-ROM Decorder
Latch-Up Test
Test Condition
According JEDEC-STD-78.
Dynamic Products
Product Type Design Rule (µm) 0.175 0.175 0.25 Pass Current
(3.3 (3.3 (3.3 (3.3 (3.3 (3.3
Static Products
Product Type Design Rule (µm) 0.45 0.4(6T) 0.45 (3.3 (3.3 0.45 0.35(6T) Pass Voltage
0.4(6T)
(3.3
(3.3V) (3.3V) (3.3
0.35 0.35
Non-Volatile Memory Products
Product Type Design Rule (µm) Pass Voltage
Logic Products
Product Type Design Rule (µm) 0.35 Pass Voltage
Decoder (W9925QF) MPEG-1 Video Decoder (W9920IF) Super W83C553FG Super W83977TF Super W83977TF Super W83877F Dialer W91340 MPEG-1 Audio Decoder (W9910IF) 8-bit W78C354 8-bit W78C32BP 8-bit W78C154 Monitor Controller W83C43 Monitor Controller W82C610 ADPCM Codes W62000S CD-ROM Decorder
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