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74LCX00 Voltage Quad 2-Input NAND Gate with Tolerant Inputs LCX00


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74LCX00 Voltage Quad 2-Input NAND Gate with Tolerant Inputs
74LCX00 Voltage Quad 2-Input NAND Gate with Tolerant Inputs
LCX00 contains four 2-input NAND gates inputs tolerate voltages allowing interface systems systems 74LCX00 fabricated with advanced CMOS technology achieve high speed operation while maintaining CMOS power dissipation
Features
tolerant inputs ICCQ
Power down high impedance inputs outputs Supports live insertion withdrawal supply operation output drive Implements patented Quiet Seriesnoise reduction circuitry Functionally compatible with series Latch-up performance exceeds performance Human body model 2000V Machine model 200V
Logic Symbol
IEEE
Connection Diagram
Assignment SOIC TSSOP
12408
12408
Names
Description Inputs Outputs
SOIC JEDEC Order Number Package Number 74LCX00M 74LCX00MX M14A
SOIC EIAJ 74LCX00SJ 74LCX00SJX M14D
TSSOP 74LCX00MTC 74LCX00MTCX MTC14
Quiet Seriesis trademark National Semiconductor Corporation C1996 National Semiconductor Corporation
12408
RRD-B30M17 Printed
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national
Absolute Maximum Ratings (Note
Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Symbol IGND TSTG Parameter Supply Voltage Input Voltage Output Voltage Input Diode Current Output Diode Current Output Source Sink Current Supply Current Supply Ground Current Ground Storage Temperature Value
Conditions
Units
Output High State (Note
Note Absolute Maximum Ratings those values beyond which safety device cannot guaranteed device should operated these limits parametric values defined ``Electrical Characteristics'' table guaranteed Absolute Maximum Ratings ``Recommended Operating Conditions'' table will define conditions actual device operation Note Absolute Maximum Rating must observed
Recommended Operating Conditions
Symbol Supply Voltage Input Voltage Output Voltage Output Current Free-Air Operating Temperature Input Edge Rate 8V-2 HIGH State
Parameter Operating Data Retention
Units
Electrical Characteristics
Symbol Parameter HIGH Level Input Voltage Level Input Voltage HIGH Level Output Voltage b100 Level Output Voltage IOFF DICC Input Leakage Current Power-Off Leakage Current Quiescent Supply Current Increase Input Conditions
Units
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national
Electrical Characteristics (Preliminary)
Symbol Parameter tPHL tPLH tOSHL tOSLH Propagation Delay Output Output Skew (Note Units
Note Skew defined absolute value difference between actual propagation delay separate outputs same device specification applies outputs switching same direction either HIGH (tOSHL) HIGH (tOSLH)
Dynamic Switching Characteristics
Symbol VOLP VOLV Parameter Quiet Output Dynamic Peak Quiet Output Dynamic Valley Conditions Typical
Unit
Capacitance
Symbol COUT Parameter Input Capacitance Output Capacitance Power Dissipation Capacitance Conditions Open Typical Units
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74LCX00 Ordering Information
device number used form part simplified purchasing code where package type temperature range defined follows
12408
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national
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Package JEDEC Order Number 74LCX00M 74LCX00MX Package Number M14A
14-Lead Small Outline Package EIAJ (SJ) Order Number 74LCX00SJ 74LCX00SJX Package Number M14D
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74LCX00 Voltage Quad 2-Input NAND Gate with Tolerant Inputs
Physical Dimensions millimeters (Continued)
14-Lead Thin Shrink Small Outline Package JEDEC Order Number 74LCX00MTC 74LCX00MTCX Package Number MTC14 LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation Americas 1(800) 272-9959 1(800) 737-7018 Email support
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
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National Semiconductor Europe 180-530 Email europe support Deutsch 180-530 English 180-532 Fran 180-532 Italiano 180-534
National Semiconductor Southeast Asia (852) 2376 3901 Email support
National Semiconductor Japan 81-3-5620-7561 81-3-5620-6179
National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

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