100398 Quad Differential Translating Transceiver with Latch 10039
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100398 Quad Differential Translating Transceiver with Latch
100398 Quad Differential Translating Transceiver with Latch
100398 quad latched transceiver designed convert logic levels differential F100K logic levels vice versa This device designed with capability driving differential load with cutoff capability will sink load 100398 ideal mixed technology applications utilizing either backplane direction translation direction control (DIR) 100398 accepts logic levels sets pins inputs pins outputs HIGH sets pins inputs pins outputs output enable input (OE) holds output cut-off state outputs high impedance level HIGH latch enable input (LE) latches data both inputs even though only output enabled time makes latch transparent cut-off state designed more negative than normal level This allows output emitter-followers turn when termination supply presenting high impedance data This high impedance reduces termination power prevents loss state noise margin when several loads share 100398 designed with FAST output buffers featuring optimal drive capable quickly charging discharging highly capacitive loads Inputs have pull-down resistors
Features
Differential input output structure FAST outputs differential outputs with cut-off Bi-directional translation 2000V protection Latched outputs TRI-STATE outputs Voltage compensated operating range
Logic Symbol
10970
Connection Diagrams
24-Pin 28-Pin
10970 10970
FAST TRI-STATE registered trademarks National Semiconductor Corporation C1995 National Semiconductor Corporation 10970 RRD-B30M115 Printed
Functional Diagram
Detail
10970 10970-5
Note logic levels
Truth Table
Names GNDECL GNDECLO GNDS VEED GNDTTL GNDTTLD VTTL VTTLD Description Data Complementary Data Data Output Enable Input Levels Latch Enable Input Levels Direction Control Input (TTL levels) Ground Output Ground Ground-to-Substrate Quiescent Power Supply Dynamic Power Supply Quiescent Ground Dynamic Ground Quiescent Power Supply Dynamic Power Supply Port (Cut-Off) Input (Cut-Off) Output Input Latched (Cut-Off) Latched Port Output Input Input Notes
HIGH Voltage Level Voltage Level Don't Care High Impedance Note input output mode Note input output mode Note Retains data present before HIGH Note Latch transparent
Absolute Maximum Ratings (Note
Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic Potential Ground VTTL Potential Ground Input Voltage (DC) Output Current Output HIGH) Input Voltage (Note Input Current (Note
Voltage Applied Output HIGH State TRI-STATE Output Current Applied Output State (Max) (Note
Twice Rated (mA)
2000V
Recommended Operating Conditions
Case Temperature (TC) Commercial Industrial Military Supply Voltage (VEE) Supply Voltage (VTTL)
Note Absolute maximum ratings those values beyond which device damaged have useful life impaired Functional operation under these conditions implied Note testing conforms MIL-STD-883 Method 3015
Commercial Version TTL-to-ECL Electrical Characteristics
VTTL (Note Symbol Parameter Output HIGH Voltage Output Voltage Cutoff Voltage
2000 1950
1025 1830
1705
1620
Units
Conditions VIH(Max) VIL(Min) Loading with High VIH(Max) VIL(Min) Loading with VIH(Min) VIL(Max) Loading with
VOHC VOLC
Output HIGH Voltage Corner Point High Output Voltage Corner Point Input HIGH Voltage Input Voltage Input HIGH Current Breakdown Test
1035 1610
Over VTTL Range Over VTTL Range High Inputs Open High Inputs Open
VFCD IEEZ
Input Current Input Clamp Diode Voltage Supply Current Supply Current
Note Either voltage limit current limit sufficient protect inputs Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Commercial Version (Continued) ECL-to-TTL Electrical Characteristics
VTTL (Note Symbol VDIFF IOZHT IOZLT ICEX ITTL Parameter Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Voltage Differential Common Mode Voltage Input HIGH Current Input Current TRI-STATE Current Output High TRI-STATE Current Output Output Short-Circuit Current Output HIGH Leakage Current Drainage Test VTTL Supply Current
1165 1830
Units
Conditions VTTL VTTL VTTL Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs Required Full Output Swing
1475
GNDECL GNDECL
(Max) (Min) VOUT VOUT VOUT VTTL VOUT VOUT Outputs Outputs HIGH Outputs TRI-STATE
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
TTL-to-ECL Electrical Characteristics
VTTL Symbol Fmax tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tTLH tTHL Parameter Toggle Frequency (Transparent) (Cutoff High) (High Cutoff) (High Cutoff) Transition Time Units Conditions
Figures
Figures Figures Figures Figures Figures Figures Figures
Commercial Version (Continued) ECL-to-TTL Electrical Characteristics
VTTL Symbol Fmax tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ Parameter Toggle Frequency (Transparent) (Enable Time) (Disable Time) (Disable Time) Units Conditions
Figures Figures Figures Figures Figures Figures Figures
Industrial Version TTL-to-ECL Electrical Characteristics
VTTL (Note Symbol Parameter Output HIGH Voltage Output Voltage Cutoff Voltage
2000 1900
1085 1830
1705
1575
Units
Conditions VIH(Max) VIL(Min) Loading with High VIH(Max) VIL(Min) Loading with VIH(Min) VIL(Max) Loading with
VOHC VOLC
Output HIGH Voltage Corner Point High Output Voltage Corner Point Input HIGH Voltage Input Voltage Input HIGH Current Breakdown Test
1095 1565
Over VTTL Range Over VTTL Range High Inputs Open
VFCD
Input Current Input Clamp Diode Voltage Supply Current
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Industrial Version (Continued) ECL-to-TTL Electrical Characteristics
VTTL (Note Symbol VDIFF IOZHT IOZLT ICEX ITTL Parameter Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Voltage Differential Common Mode Voltage Input HIGH Current Input Current TRI-STATE Current Output High TRI-STATE Current Output Output Short-Circuit Current Output HIGH Leakage Current Drainage Test VTTL Supply Current
1170 1830
Units
Conditions VTTL VTTL VTTL Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs Required Full Output Swing
1480
GNDECL GNDECL
VIH(Max) VIH(Min) VOUT VOUT VOUT VTTL VOUT VOUT Outputs Outputs HIGH Outputs TRI-STATE
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
TTL-to-ECL Electrical Characteristics
VTTL Symbol Fmax tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tTLH tTHL Parameter Toggle Frequency (Transparent) (Cutoff High) (High Cutoff) (High Cutoff) Transition Time Units Conditions
Figures Figures Figures Figures Figures Figures Figures Figures
Industrial Version (Continued) ECL-to-TTL Electrical Characteristics
VTTL Symbol Fmax tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ Parameter Toggle Frequency (Transparent) (Enable Time) (Disable Time) (Disable Time) Units Conditions
Figures Figures Figures Figures Figures Figures Figures
Military Version Preliminary TTL-to-ECL Electrical Characteristics
VTTL Symbol Parameter Output HIGH Voltage
1025 1085
1620 1555 1950 1850
Units
Conditions
Notes
Output Voltage
1830 1830
(Max) (Min) Loading with
Cutoff Voltage
VOHC
Output HIGH Voltage
1035 1085
VOLC
Output Voltage
1610 1555
(Min) (Max)
Loading with
Input HIGH Voltage Input Voltage Input HIGH Current Breakdown Test
Over VTTL Range Over VTTL Range
High Inputs Open
VFCD
Input Current Input Clamp Diode Voltage Supply Current
Military Version
Preliminary (Continued)
ECL-to-TTL Electrical Characteristics
VTTL Symbol IOZHT IOZLT ITTL Parameter Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input HIGH Current Input Current TRI-STATE Current Output High TRI-STATE Current Output Output Short-Circuit Current VTTL Supply Current
Units
Conditions VTTL VTTL VTTL Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs VIH(Max) VIL(Min) VOUT VOUT VOUT VTTL Outputs Output High Output TRI-STATE
Notes
1165 1830 1475
Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately without allowing junction temperature stabilize heat dissipation after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroups Note Sample tested (Method 5005 Table each manufactured Subgroups Note Guaranteed applying specified input condition testing
TTL-to-ECL Electrical Characteristics
VTTL Symbol tPLH tPHL tPLH tPHL tPZH tPHZ tPHZ tPW(H) tTLH tTHL Parameter (Transparent) (Cutoff HIGH) (HIGH Cutoff) (HIGH Cutoff) Pulse Width Transition Time Units Conditions Notes
Figures
Figures Figures Figures Figures Figures Figures Figures Figures
Military Version
Preliminary (Continued)
ECL-to-TTL Electrical Characteristics
VTTL Symbol tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPHZ tPLZ tPW(H) Parameter (Transparent) (Enable Time) (Disable Time) (Disable Time) Pulse Width Units Conditions Notes
Figures
Figures Figures Figures Figures Figures Figures Figures
Test Circuitry
10970
10970
FIGURE TTL-to-ECL Test Circuit
Test Circuitry (Continued)
10970
including stray capacitance Note ground termination must included pins monitored scope prevent oscillatory feedback
FIGURE ECL-to-TTL Test Circuit
Switching Waveforms
10970
FIGURE TTL-to-ECL Transition
Propagation Delay Transition Times
Switching Waveforms (Continued)
10970
Note HIGH
FIGURE ECL-to-TTL Transition
Propagation Delay Transition Times
Note HIGH
10970
FIGURE ECL-to-TTL Transition Output Enable Disable Times
Note HIGH HIGH
10970
FIGURE ECL-to-TTL Transition Output Disable Time
Applications
10970
FIGURE Applications Diagram
SRAM Interface Using 100398 Latched Translator
Ordering Information
device number used form part simplified purchasing code where package type temperature range defined follows 100398 Device Type (Basic) Package Code Ceramic Plastic Leaded Chip Carrier (PCC) Plastic Dual-In-Line Special Variations Commercial grade device with burn-in Military grade device with environmental burn-in processing Temperature Range Commercial Industrial (b40 only Military (b55
Physical Dimensions inches (millimeters)
24-Lead Ceramic Dual-In-Line Package Wide) Package Number J24E
24-Lead Plastic Dual-In-Line Package Wide) Package Number N24E
100398 Quad Differential Translating Transceiver with Latch
Physical Dimensions inches (millimeters) (Continued)
28-Lead Plastic Chip Carrier Package Number V28A
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National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications
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