July 1992 100304 Power Quint NAND Gate 100304 monolithic qui

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July 1992 100304 Power Quint NAND Gate 100304 monolithic qui

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100304 Power Quint NAND Gate
July 1992
100304 Power Quint NAND Gate
100304 monolithic quint NAND gate Function output wire-NOR five gate outputs inputs have pull-down resistors
Features
Power Operation 2000V protection function compatible with 100104 Voltage compensated operating range Available industrial grade temperature range Available MIL-STD-883
Logic Symbol
Logic Equation
(D1a D2a) (D1b D2b) D2c) (D1d D2d) (D1e D2e)
Names
Description Data Inputs Function Output Data Outputs Complementary Data Outputs
10581-1
Connection Diagrams
24-Pin 28-Pin 24-Pin Quad Cerpak
10581
10581
10581-2
C1995 National Semiconductor Corporation
10581
RRD-B30M105 Printed
Absolute Maximum Ratings
Above which useful life impaired (Note Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic Potential Ground Input Voltage (DC) Output Current Output HIGH) (Note
Recommended Operating Conditions
Case Temperature (TC) Commercial Industrial Military Supply Voltage (VEE)
2000V
Note Absolute maximum ratings those values beyond which device damaged have useful life impaired Functional operation under these conditions implied Note testing conforms MIL-STD-883 Method 3015
Commercial Version Electrical Characteristics
VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input High Current Power Supply Current
1165 1830
1025 1830 1035
1705
1620
Units
Conditions (Max) (Min) VIH(Min) (Max) Loading with Loading with
1610 1475
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Min) VIH(Max) Inputs open
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Electrical Characteristics
Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Propagation Delay Data Transition Time
VCCA Units Conditions
Figures
Commercial Version (Continued) Cerpak Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Propagation Delay Data Transition Time Units Conditions
Figures
Industrial Version Electrical Characteristics
VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input HIGH Current Power Supply Current
1170 1830
1085 1830 1095 1565 1480
1025 1830 1035 1610 1165 1830 1475
Units
Conditions (Max) (Min) VIH(Min) (Max) Loading with Loading with
1575
1620
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Min)
(Max) Inputs Open
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Industrial Version (Continued) Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Propagation Delay Data Transition Time Units Conditions
Figures
Military Version Electrical Characteristics
VCCA Symbol Parameter Output HIGH Voltage
1025 1085
1620 1555
Units
Conditions
Notes
Output Voltage
1830 1830
(Max) (Min)
Loading with 50X0
VOHC
Output HIGH Voltage
1035 1085
VOLC
Output Voltage
1610 1555
(Min) (Max)
Loading with
Input HIGH Voltage Input Voltage Input Current Input High Current
1165 1830
1475
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Min)
Power Supply Current
(Max)
Inputs Open
Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately without allowing junction temperature stabilize heat dissipation after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroups Note Sample tested (Method 5005 Table each manufactured Subgroups Note Guaranteed applying specified input condition testing
Military Version (Continued) Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Propagation Delay Data Transition Time Units Conditions Notes
Figures
Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device temperature only Subgroup Note Sample tested (Method 5005 Table each Subgroup temperatures Subgroups Note tested temperature (design characterization data)
Test Circuitry
Switching Waveforms
10581
Notes VCCA equal length impedance lines terminator internal scope Decoupling from unused outputs loaded with Fixture stray capacitance
10581
FIGURE Propagation Delay Transition Times
FIGURE Test Circuit
Ordering Information
device number used form part simplified purchasing code where package type temperature range defined follows 100304 Device Type (Basic) Package Code Ceramic Quad Cerpak Plastic Leaded Chip Carrier (PCC) Plastic Special Variation Military grade device with environmental burn-in processing Temperature Range Commercial Industrial (b40 (PCC only) Military (b55
Physical Dimensions inches (millimeters)
24-Pin Ceramic Dual-In-Line Package Package Number J24E
Physical Dimensions inches (millimeters) (Continued)
24-Pin Plastic Dual-In-Line Package Package Number N24E
24-Pin Quad Cerpak Package Number W24B
100304 Power Quint NAND Gate
Physical Dimensions inches (millimeters) (Continued)
114902
28-Pin Plastic Leaded Chip Carrier Package Number V28A
LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
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National Semiconductor Japan 81-043-299-2309 81-043-299-2408
National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

July 1992 100304 Power Quint NAND Gate 100304 monolithic qui

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