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100302 Power Quint 2-Input Gate 100302 monolithic quint 2-input g


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100302 Power Quint 2-Input Gate
100302 Power Quint 2-Input Gate
100302 monolithic quint 2-input gate with common enable inputs have pull-down resistors outputs buffered
Features
power reduction 100102 2000V protection function compatible with 100102 Voltage compensated operating range Available MIL-STD-883 Available industrial grade temperature range
Logic Symbol
Names -Dne
Description Data Inputs Enable Input Data Outputs Complementary Data Outputs
Truth Table
10580
HIGH Voltage Level Voltage Level
Connection Diagrams
24-Pin SOIC 28-Pin 24-Pin Quad Cerpak
10580
10580
10580-2
C1995 National Semiconductor Corporation
10580
RRD-B30M105 Printed
Absolute Maximum Ratings
Above which useful life impaired (Note Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic Potential Ground Input Voltage (DC) Output Current Output HIGH) (Note
Recommended Operating Conditions
Case Temperature (TC) Commercial Industrial Military Supply Voltage (VEE)
2000V
Note Absolute maximum ratings those values beyond which device damaged have useful life impaired Functional operation under these conditions implied Note testing conforms MIL-STD-883 Method 3015
Commercial Version Electrical Characteristics
VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input HIGH Current Power Supply Current
1165 1830
1025 1830 1035
1705
1620
Units
Conditions VIH(Max) VIL(Min) Loading with Loading with
VIH(Min) VIL(Max)
1610 1475
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs VIL(Min) VIH(Max) Inputs Open
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions
Figures (Note
Figures
Note propagation delay specified single output switching Delays vary with multiple outputs switching
Commercial Version (Continued) SOIC Cerpak Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL tOSHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Maximum Skew Common Edge Output-to-Output Variation Data Output Path Maximum Skew Common Edge Output-to-Output Variation Enable Output Path Maximum Skew Common Edge Output-to-Output Variation Data Output Path Maximum Skew Common Edge Output-to-Output Variation Enable Output Path Maximum Skew Opposite Edge Output-to-Output Variation Data Output Path Maximum Skew Opposite Edge Output-to-Output Variation Enable Output Path Maximum Skew (Signal) Transition Variation Data Output Path Maximum Skew (Signal) Transition Variation Enable Output Path Units Conditions
Figures (Note Figures
Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note
tOSHL
tOSLH
tOSLH
tOST
tOST
Note Output-to-Output Skew defined absolute value difference between actual propagation delay outputs within same packaged device specifications apply outputs switching same direction either HIGH (tOSHL) HIGH (tOSLH) opposite directions both (tOST) Parameters tOST guaranteed design Note propagation delay specified single output switching Delays vary with multiple outputs switching
Industrial Version Electrical Characteristics
VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input HIGH Current Power Supply Current
1170 1830
1085 1830 1095 1565 1480
1025 1830 1035 1610 1165 1830 1475
Units VIH(Max) VIL(Min) VIH(Min) VIL(Max)
Conditions Loading with Loading with
1575
1620
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs VIL(Min) VIH(Max) Inputs Open
Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions
Industrial Version (Continued) Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions
Figures (Note
Figures
Note propagation delay specified single output switching Delays vary with multiple outputs switching
Military Version Electrical Characteristics
VCCA (Note Symbol Parameter Output HIGH Voltage
1025 1085
1620 1555
Units
Conditions
Notes
Output Voltage
1830 1830
VIH(Max) (Min)
Loading with
VOHC
Output HIGH Voltage
1035 1085
VOLC
Output Voltage
1610 1555
VIH(Max) (Min)
Loading with
Input HIGH Voltage Input Voltage Input Current Input HIGH Current
1165 1830
1475
Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Max) VIL(Min) Inputs Open
Power Supply Current
Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately without allowing junction temperature stabilize heat dissipation after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroups Note Sample tested (Method 5005 Table each manufactured Subgroups Note Guaranteed applying specified input condition testing
Military Version (Continued) Electrical Characteristics
VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions Notes
Figures
Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device temperature only Subgroup Note Sample tested (Method 5005 Table each manufactured Subgroup temperatures Subgroups Note tested temperature (design characterization data) Note propagation delay specified single output switching Delays vary with multiple outputs switching
Test Circuitry
10580
Notes VCCA equal length impedance lines terminator internal scope Decoupling from unused outputs loaded with Fixture stray capacitance
FIGURE Test Circuit
Switching Waveforms
10580
FIGURE Propagation Delay Transition Times
Ordering Information
device number used form part simplified purchasing code where package type temperature range defined follows 100302 Device Number (Basic) Package Code Ceramic Quad Cerpak Plastic Chip Carrier (PCC) Plastic Small Outline (SOIC) Special Variation Military grade device with environmental burn-in processing Temperature Range Commercial Industrial (b40 (PCC only) Military (b55
Physical Dimensions inches (millimeters)
24-Lead Ceramic Dual-In-Line Package Wide) Package Number J24E
24-Lead Molded Package Wide) Package Number M24B
Physical Dimensions inches (millimeters) (Continued)
24-Lead Plastic Dual-In-Line Package Package Number N24E
28-Lead Plastic Chip Carrier Package Number V28A
100302 Power Quint 2-Input Gate
Physical Dimensions inches (millimeters) (Continued)
114901
24-Lead Quad Cerpak Package Number W24B
LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
National Semiconductor Europe (a49) 0-180-530 Email cnjwge tevm2 Deutsch (a49) 0-180-530 English (a49) 0-180-532 Fran (a49) 0-180-532 Italiano (a49) 0-180-534
National Semiconductor Hong Kong 13th Floor Straight Block Ocean Centre Canton Tsimshatsui Kowloon Hong Kong (852) 2737-1600 (852) 2736-9960
National Semiconductor Japan 81-043-299-2309 81-043-299-2408
National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

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