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July 1992 100313 Power Quad Driver 100313 monolithic quad dr
Top Searches for this datasheet100313 Power Quad Driver July 1992 100313 Power Quad Driver 100313 monolithic quad driver with outputs common enable common input buffered minimize input loading inputs used Enable used drive sixteen lines inputs have pull-down resistors outputs buffered Features power reduction 100113 2000V protection function compatible with 100113 100112 Voltage compensated operating range Available MIL-STD-883 Available industrial grade temperature range Logic Symbol Names -Ond -Ond Description Data Inputs Enable Input Data Outputs Complementary Data Outputs 10249 Connection Diagrams 24-Pin SOIC 28-Pin 24-Pin Flatpak 10249 10249-1 10249 C1995 National Semiconductor Corporation 10249 RRD-B30M105 Printed Absolute Maximum Ratings Above which useful life impaired (Note Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic Potential Ground Input Voltage (DC) Output Current Output HIGH) (Note Recommended Operating Conditions Case Temperature (TC) Commercial Industrial Military Supply Voltage (VEE) 2000V Note Absolute maximum ratings those values beyond which device damaged have useful life impaired Functional operation under these conditions implied Note testing conforms MIL-STD-883 Method 3015 Commercial Version Electrical Characteristics VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input HIGH Current Data Enable Power Supply Current 1165 1830 1025 1830 1035 1705 1620 Units Conditions (Max) (Min) (Min) (Max) Loading with Loading with 1610 1475 Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Min) (Max) Inputs Open Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions Electrical Characteristics VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions Figures (Note Figures Note propagation delay specified single output switching Delays vary with multiple outputs switching Commercial Version (Continued) SOIC Cerpak Electrical Characteristics VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL tOSHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Maximum Skew Common Edge Output-to-Output Variation Data Output Path Maximum Skew Common Edge Output-to-Output Variation Enable Output Path Maximum Skew Common Edge Output-to-Output Variation Data Output Path Maximum Skew Common Edge Output-to-Output Variation Enable Output Path Maximum Skew Opposite Edge Output-to-Output Variation Data Output Path Maximum Skew Opposite Edge Output-to-Output Variation Enable Output Path Maximum Skew (Signal) Transition Variation Data Output Path Maximum Skew (Signal) Transition Variation Enable Output Path Units Conditions Figures (Note Figures Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note Only (Note tOSHL tOSLH tOSLH tOST tOST Note Output-to-Output Skew defined absolute value difference between actual propagation delay outputs within same packaged device specifications apply outputs switching same direction either HIGH (tOSHL) HIGH (tOSLH) opposite directions both (tOST) Parameters tOST guaranteed design Note propagation delay specified single output switching Delays vary with multiple outputs switching Industrial Version Electrical Characteristics VCCA (Note Symbol VOHC VOLC Parameter Output HIGH Voltage Output Voltage Output HIGH Voltage Output Voltage Input HIGH Voltage Input Voltage Input Current Input HIGH Current Data Enable Power Supply Current 1170 1830 1085 1830 1095 1565 1480 1025 1830 1035 1610 1165 1830 1475 Units VIH(Max) VIL(Min) VIH(Min) VIL(Max) Conditions Loading with Loading with 1575 1620 Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs VIL(Min) VIH(Max) Inputs Open Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions Industrial Version (Continued) Electrical Characteristics VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions Figures (Note Figures Note propagation delay specified single output switching Delays vary with multiple outputs switching Military Version Electrical Characteristics VCCA Symbol Parameter Output HIGH Voltage 1025 1085 1620 1555 Units Conditions Notes Output Voltage 1830 1830 (Max) VIL(Min) Loading with VOHC Output HIGH Voltage 1035 1085 VOLC Output Voltage 1610 1555 (Min) (Max) Loading with Input HIGH Voltage Input Voltage Input Current Input HIGH Current Data Enable Data Enable 1165 1830 1475 Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs (Min) (Max) Power Supply Current Inputs Open Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately without allowing junction temperature stabilize heat dissipation after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroups Note Sample tested (Method 5005 Table each manufactured Subgroups Note Guaranteed applying specified input condition testing Military Version (Continued) Electrical Characteristics VCCA Symbol tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay Data Output Propagation Delay Enable Output Transition Time Units Conditions Notes Figures Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroup Note Sample tested (Method 5005 Table each manufactured Subgroup temperatures Subgroups Note tested temperature (design characterization data) Note propagation delay specified single output switching Delays vary with multiple outputs switching Test Circuitry Notes VCCA equal length impedance lines terminator internal scope Decoupling from unused outputs loaded with Fixture stray capacitance numbers shown flatpak logic symbol 10249 FIGURE Test Circuit Switching Waveforms 10249 FIGURE Propagation Delay Transition Times Ordering Information device number used form part simplified purchasing code where package type temperature range defined follows 100313 Device Type (Basic) Package Code Ceramic Quad Cerpak Plastic Leaded Chip Carrier (PCC) Plastic Small Outline (SOIC) Special Variation Military grade device with environmental burn-in processing Temperature Range Commercial Industrial (b40 (PCC only) Military (b55 Physical Dimensions inches (millimeters) 24-Pin Ceramic Dual-In-Line Package Package Number J24E 24-Lead Molded Package Wide) Package Number M24B Physical Dimensions inches (millimeters) (Continued) 24-Lead Plastic Dual-In-Line Package Package Number N24E 28-Lead Plastic Chip Carrier Package Number V28A 100313 Power Quad Driver Physical Dimensions inches (millimeters) (Continued) 114904 24-Pin Quad Cerpak Package Number W24B LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018 critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness National Semiconductor Europe (a49) 0-180-530 Email cnjwge tevm2 Deutsch (a49) 0-180-530 English (a49) 0-180-532 Fran (a49) 0-180-532 Italiano (a49) 0-180-534 National Semiconductor Hong Kong 13th Floor Straight Block Ocean Centre Canton Tsimshatsui Kowloon Hong Kong (852) 2737-1600 (852) 2736-9960 National Semiconductor Japan 81-043-299-2309 81-043-299-2408 National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications Other recent searchesSiP11203 - SiP11203 SiP11203 Datasheet SiP11204 - SiP11204 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