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July 1992 100323 Power Driver 100323 monolithic device conta
Top Searches for this datasheet100323 Power Driver July 1992 100323 Power Driver 100323 monolithic device containing drivers capable driving terminated lines with terminations reduce crosstalk each output respective ground connection Transition times were designed longer than other F100K devices driver itself performs positive logic data input select inputs either DE3) Enabling data possible multiples paths inputs have pull-down resistors output voltage level designed more negative than normal outputs (cut state) This allows emitter-follower output transistor turn when termination supply thus present high impedance data Features power reduction 100123 2000V protection operating range Drives load Logic Symbol Names -DE3 9877 Description Data Inputs Dual Enable Inputs Common Enable Input Data Outputs Connection Diagrams 24-Pin 24-Pin Quad Cerpak 28-Pin 9877 9877 9877-3 C1995 National Semiconductor Corporation 9877 RRD-B30M115 Printed Logic Diagram 9877 Truth Table Cutoff Cutoff Cutoff Cutoff Cutoff Cutoff Cutoff Cutoff Cutoff Cutoff High Cutoff Lower-than-LOW state Don't Care Absolute Maximum Ratings (Note Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Storage Temperature Maximum Junction Temperature Ceramic Plastic Potential Ground Input Voltage (DC) Output Current Output High) 2000V Recommended Operating Conditions Case Temperature Commercial Military Supply Voltage (VEE) Note Absolute maximum ratings values beyond which device damaged have useful life impaired Functional operation under these conditions implied Note testing conforms MIL-STD-883 Method 3015 Commercial Version Electrical Characteristics VCCA (Note Symbol VOHC VOLZ Parameter Input HIGH Voltage Input Voltage Output HIGH Voltage Output HIGH Voltage Cut-Off Voltage Input Current Input HIGH Current Power Supply Current 1165 1830 1025 1035 1475 Units Conditions Guaranteed High Signal Inputs Guaranteed Signal Inputs (max) (min) (min) (max) (min) (max) (min) (max) Inputs Open Loading with Loading with Loading with 1950 Note specified limits represent ``worst case'' values parameter Since these values normally occur temperature extremes additional noise immunity guardbanding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions Electrical Characteristics VCCA Symbol tPZH tPHZ tPZH tPHZ tPZH tPHZ tTZH tTHZ Parameter Propagation Delay Data Output Propagation Delay Dual Enable Output Propagation Delay Common Enable Output Transition Time Units Conditions Figures Commercial Version (Continued) Cerpak Electrical Characteristics VCCA Symbol tPZH tPHZ tPZH tPHZ tPZH tPHZ tTZH tTHZ Parameter Propagation Delay Data Output Propagation Delay Dual Enable Output Propagation Delay Common Enable Output Transition Time Units Conditions Figures Note specified limits represent ``worst case'' value parameter Since these values normally occur temperature extremes additional noise immunity guard banding achieved decreasing allowable system operating ranges Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions Military Version Preliminary Electrical Characteristics VCCA Symbol Parameter Units 1610 1555 Conditions (max) (min) Loading with Notes Output HIGH Voltage b1025 b870 1085 VOHC Output HIGH Voltage b1035 1085 VOLC Output Voltage (min) (max) Loading with VOLZ Cut-Off Voltage 1950 1850 (min) (max) Guaranteed HIGH Signal Inputs Guaranteed Signal Inputs Loading with Input HIGH Voltage Input Voltage Input Current Input HIGH Current 1165 1830 1475 (min) (max) Power Supply Current Inputs Open Note F100K Series cold temperature testing performed temperature soaking guarantee junction temperature equals then testing immediately without allowing junction temperature stabilize heat dissipation after power-up This provides ``cold start'' specs which considered worst case condition cold temperatures Note Screen tested 100% each device Subgroups Note Sample tested (Method 5005 Table each manufactured Subgroups Note Guaranteed applying specified input condition testing Military Version Preliminary (Continued) Packages Units Conditions Electrical Characteristics VCCA Symbol tPZH tPHZ tPZH tPHZ tPZH tPHZ tTZH tTHZ Parameter Propagation Delay Data Output Propagation Delay Data Enable Output Propagation Delay Common Enable Output Transition Time Figures Note specified limits represent ``worst case'' value parameter Since these ``worst case'' values normally occur temperature extremes additional noise immunity guard banding achieved decreasing allowable system operating ranges Note Conditions testing shown tables chosen guarantee operation under ``worst case'' conditions Test Circuitry Notes VCCA equal length impedance lines terminator internal scope Decoupling from unused outputs loaded with Fixture stray capacitance numbers shown flatpak logic symbol 9877 FIGURE Test Circuit Timing Waveform 9877 FIGURE Propagation Delay Transition Times Ordering Information device number used form part simplified purchasing code where package type temperature range defined follows 100323 Device Number (Basic) Package Code Ceramic Quad Cerpak Plastic Plastic-Leaded Chip Carrier (PLCC) Special Variation Military grade device with environmental burn-in processing Temperature Range Commercial Military (b55 Physical Dimensions inches (millimeters) Lead Ceramic Dual-In-Line Package Wide) Package Number J24E Physical Dimensions inches (millimeters) (Continued) Lead Plastic Dual-In-Line Package Package Number N24E Lead Plastic Chip Carrier Package Number V28A 100323 Power Driver Physical Dimensions inches (millimeters) (Continued) 114909 Lead Quad Cerpak Package Number W24B LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018 critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness National Semiconductor Europe (a49) 0-180-530 Email cnjwge tevm2 Deutsch (a49) 0-180-530 English (a49) 0-180-532 Fran (a49) 0-180-532 Italiano (a49) 0-180-534 National Semiconductor Hong Kong 13th Floor Straight Block Ocean Centre Canton Tsimshatsui Kowloon Hong Kong (852) 2737-1600 (852) 2736-9960 National Semiconductor Japan 81-043-299-2309 81-043-299-2408 National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice 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