4211 Bipolar Double low-side switch, Power limitation Overte
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Intelligent Double Low-Side Switch
4211
Bipolar
Double low-side switch, Power limitation Overtemperature shutdown Status monitoring Shorted-load protection Reverse polarity protection Integrated clamp Z-Diodes Voltage proof Temperature range
P-TO220-7-1
Type 4211 Application
Ordering Code Q67000-A8118
Package P-TO220-7-1
Applications automotive electronics require intelligent power switches activated logic signals, which also shorted-load protected provide error feedback. contains these power switches (low-side switch). case inductive loads integrated power Z-diodes clamp discharging voltage. Through signals control inputs (active low) both switches activated independently another. inputs use, must applied high potential. status output (open collector) signals following malfunctions through potential:
Overload, Open load, Shorted load ground, Overvoltage.
Semiconductor Group
09.94
4211
Configuration (top view)
Semiconductor Group
4211
Definitions Functions Symbol Function Status output (open collector) both outputs; indicates overload, open load shorted load ground well overvoltage case malfunction status output switched after delay time (except overvoltage). Control input (TTL-compatible) activates output transistor case low-potential. Output Shorted-load protected, open collector output with clamp Z-diode ground. Ground Wiring must designed max. short-circuit current Output Shorted-load protected, open collector output with clamp Z-diode ground. Control input (TTL-compatible) activates output transistor case low-potential. Supply voltage case overvoltage this large sections circuit deactivated. status output indicates malfunction without delay time.
Semiconductor Group
4211
Block Diagram
Semiconductor Group
4211
Circuit Description Input Circuits control inputs comprise TTL-compatible Schmitt triggers with hysteresis. Driven these stages inverting buffer amplifiers convert logic signal driving power transistors. Switching Stages output stages comprise power transistors with open collectors. Since protective circuit allocated each stage limits power dissipation, outputs shorted-load protected supply voltage throughout entire operating range. Positive voltage peaks, which occur during switching inductive loads, limited integrated clamp Z-diodes. Monitoring Protective Functions outputs monitored open load, overload, shorted load ground (see table below). addition, large sections circuit de-activated case excessive supply voltages Linked gate information regarding these malfunctions effects status output (open collector, active low). internally determined delay time applied malfunctions overvoltage prevents output messages case short-term malfunctions. Furthermore, temperature protection circuit prevents thermal overload. integrated reverse diode protects supply voltage against reverse polarities. Similarly load circuit protected against reverse polarities within limits established maximum ratings shorted load same time!). supply voltages below operating range undervoltage detector ensures that neither status outputs activated.
Status Output Error) Undervoltage Operating Range Overvoltage
(active) Normal function Overload Open load Shorted load ground
(passive)
Semiconductor Group
4211
Circuit Diagram
Semiconductor Group
4211
Absolute Maximum Ratings
Parameter Symbol min. Limit Values max. Unit
Voltages Supply voltage (pin Supply voltage (pin Input voltage (pin Output voltage (pin
Currents Switching current (pin Current with reverse polarity (pin Output current (pin Max. current inductive load Junction temperature Storage temperature limited internally
Diagram
Tstg
Operating Range Supply voltage Supply voltage slew rate Ambient temperature Thermal resistance junction case junction ambient
dVS/dV
V/µs
Refer monitoring protective functions Lower limit previously greater than (turn-on hysteresis)
Semiconductor Group
4211
Characteristics
Parameter Symbol Limit Values min. General Characteristics Quiescent current Supply voltage Supply overvoltage shutdown threshold Open load error threshold voltage Open load error threshold current Open load error threshold current both channels active Logic Control input H-input voltage L-input voltage Hysteresis input voltage H-input current L-input current Status output (open coll.) L-saturation voltage Status delay time
Unit
Test Condition
typ.
max.
VOSat
Period from beginning disturbance channel (exception: overvoltage) until value status switching edge reached.
Semiconductor Group
4211
Characteristics (cont'd)
Parameter Symbol Limit Values min. Power Output Saturation voltage Leakage current Switch-ON time Switch-OFF time Output voltage Negative clamp typ. max. Unit Test Condition
VQSat
VIL;
Timing Diagram;
Power Clamp Diode open) Output voltage positive clamp Serial resistance
Semiconductor Group
4211
Test Circuit
Timing Diagram
Semiconductor Group
4211
Application Circuit
dimensioned such that e.g. case battery voltage failure maximum ratings exceeded recirculation energy
Semiconductor Group
4211
Output Voltage versus Output Current
Shorted Load Current versus Output Voltage
Status Signal Threshold versus Chip Temperature
Maximum Load Current versus Load Inductance
Semiconductor Group
Intelligent Double Low-Side Switch
4214
Bipolar
Double low-side switch, Power limitation Overtemperature shutdown Overvoltage shutdown Status monitoring Shorted-load protection Integrated clamp diodes Temperature range
P-DIP-8-1
P-DSO-20-7
Type 4214 4214 Application
Ordering Code Q67000-A8183 Q67000-A9094
Package P-DIP-8-1 P-DSO-20-7 (SMD)
Applications automotive electronics require intelligent power switches activated logic signals, which also shorted-load protected provide error feedback. contains these power switches (low-side switches). case inductive loads integrated clamp diodes clamp discharging voltage. "high" signal applied enable input both switches activated independently another through signals control inputs (active high). high impedance inputs must therefore left unconnected, should always connected fixed potential (noise immunity).
Semiconductor Group 10.94
4214
status output (open collector) signals following malfunctions through high potential:
Overload, Open load, Shorted load ground, Overvoltage, Overtemperature.
Configuration (top view)
4214
4214
Semiconductor Group
4214
Definitions Functions 4214 4214 Ground Design wiring max. short-circuit current Control input (TTL compatible) activates output transistor case high potential Supply voltage case overvoltage this large sections circuit deactivated. status output indicates this malfunction without delay time. Output Shorted load protected, open collector output currents with clamping diodes supply voltage. Output Shorted load protected, open collector output currents with clamping diodes supply voltage. Enable input, active high Control input (TTL-compatible) activates output transistor case high potential Status output (open collector) both outputs; indicates overtemperature, overload, open load shorted load ground well overvoltage switched high after defined delay time case malfunction (except: overvoltage) connected Symbol Function
Semiconductor Group
4214
Block Diagram
Semiconductor Group
4214
Circuit Description Input Circuits control inputs enable input consist TTL-compatible Schmitt triggers with hysteresis. Driven these stages buffer amplifiers convert logic signal necessary driving power transistors. Switching Stages output stages consist power transistors with open collectors. Since protective circuit allocated each stage limits power dissipation, outputs shorted-load protected supply voltage throughout entire operating range. Positive voltage peaks, which occur during switching inductive loads, limited integrated clamp diodes. Monitoring Protective Functions During activated status outputs monitored open load, overload, shorted load ground (see table below). addition, large sections circuit shut down case excessive supply voltages Linked gate information regarding these malfunctions effects status output (open collector, active high). internally determined delay time applied malfunctions overvoltage prevents output messages case short-term malfunctions. Furthermore, temperature protection circuit prevents thermal overload. overload occurs, outputs protected according safe operating area (SOA) mode (see diagram). voltage current outside SOA, outputs oscillate reduce power dissipation. switching frequency depends internal delay time external load (inductances capacitances). frequency low, status output follow oscillation. integrated reverse diode protects supply voltage against reverse polarities. Similarly load circuit protected against reverse polarities within limits established maximum ratings shorted load same time!). supply voltages below operating range undervoltage detector ensures that neither status outputs activated. supply voltages below operating range output stages de-activated.
Semiconductor Group
4214
Status Output Error) Undervoltage Operating Range Overvoltage
(passive)
(active)
Normal function Overload Open load Shorted load ground Overtemperature
Semiconductor Group
4214
Circuit Diagram
Semiconductor Group
4214
Absolute Maximum Ratings
Parameter Symbol min. Limit Values max. Unit
Voltages Supply voltage, Supply voltage Input voltage Output voltage (status output) Output voltage (switching stages)
Currents Output current (switching stages) Current with reverse polarity, Output current positive clamp Ground current Output current (status output) Junction temperature Storage temperature
IGND Tstg
internally limited
Operating Range Supply voltage Supply voltage slew rate Output current (switching stages) Input voltage Output current (status output) Ambient temperature
dVS/dt
V/µs
Lower limit previously greater than (turn-on hysteresis)
Semiconductor Group
Absolute Maximum Ratings (cont'd)
Parameter Symbol min. Supply voltage while 4214 shorted load 4214 Thermal resistance junction ambient 4214 4214 Limit Values max. Unit
Characteristics
(typ. (typ.
Parameter Symbol Limit Values min. typ. max. Unit Test Condition
General Characteristics Quiescent current Supply voltage Supply overvoltage shutdown threshold Hysteresis supply overvoltage shutdown threshold Open load error threshold voltage Open load error threshold current Open load error threshold current both channels active
VIH,
4214
Characteristics (cont'd)
(typ. (typ.
Parameter Symbol Limit Values min. typ. max. Unit Test Condition
Logic Control inputs H-input voltage threshold L-input voltage threshold Hysteresis input voltage
H-input voltage threshold L-input voltage threshold Hysteresis input voltage H-input current L-input current
Status Output (open collector) L-saturation voltage Status delay time
VQSat
Period from beginning disturbance channel (exception: overvoltage) until value status switching edge reached.
Semiconductor Group
4214
Characteristics (cont'd)
(typ. (typ.
Parameter Symbol Limit Values min. typ. max. Unit Test Condition
Switching Stages Saturation voltage Saturation voltage Output current Leakage current Switch-ON time Switch-OFF time Forward voltage substrate diode Forward voltage clamp diode Leakage current clamp diode
VQSat VQSat
VIH; VIH; VQSat Timing Diagram
Semiconductor Group
4214
Test Circuit
Timing Diagram
Semiconductor Group
4214
Application Circuit
Semiconductor Group
4214
Quiescent Current versus Ambient Temperature OFF-Status
Shorted Load Current versus Output Voltage
Output Voltage versus Output Current
Maximum permissible output currents, being result typical thermal power dissipation P-DIP-8-1 package, three operating modes. Difference between junction ambient temperature [K]. Max. output current (steady current) channel.
Semiconductor Group
Intelligent Sixfold Low-Side Switch
4216
Bipolar
Double low-side switch, Quad low-side switch, Power limitation Open-collector outputs Overtemperature shutdown Status monitoring Shorted-load protection Integrated clamp Z-Diodes Temperature range
P-DIP-20-3
P-DSO-24-3
Type 4216 4216 type
Ordering Code Q67000-A8237 Q67000-A9108
Package P-DIP-20-3 P-DSO-24-3 (SMD)
4216 integrated, sixfold low-side power switch with power limiting outputs, shorted load protection switches Z-diodes switches from output ground. 4216 particularly suitable automotive industrial applications.
Semiconductor Group
09.94
4216
Configuration (top view)
4216
4216
Semiconductor Group
4216
Definitions Functions 4216 4216 Inputs 50-mA switches Ground, cooling Inputs switches Status analog output Reference voltage; higher reference voltage than internal applied from exterior voltage reference status output (A/D converter). Supply voltage Preferred state (low preferred state outputs regardless inputs) Outputs (0.5 open collector Ground, cooling Outputs mA), open collector Symbol Function
VREF
13,14
PREFST
Semiconductor Group
4216
Block Diagram Semiconductor Group
4216
Circuit Description Input Circuits control inputs preferred-state input consist TTL-compatible Schmitt triggers with hysteresis. Driven these stages buffer amplifiers convert logic signal necessary driving power transistors. Switching Stages output stages consist power transistors with open collectors. Each stage protective circuit limiting power dissipation shorted-load current, which makes outputs shorted-load protected supply voltage throughout operating range. Integrated Z-diodes limit positive voltage spikes that occur when inductive loads discharged. Monitoring Protective Functions Each output monitored activated status overload. Furthermore, large parts circuitry shutdown (control, output stages). information from these malfunctions ORed applied status output. several malfunctions appear simultaneously, highest voltage level will dominate. also protected against thermal overload. chip temperature typically reached, overtemperature signalled status output. temperature continues increase, outputs turned minimum supply voltage functioning maintained, output stages become inactive. supply voltage outputs switched preferred state regardless level PREFST. preferred state maintained beyond this range, PREFST must switched potential. Above supply voltage typical (max. preferred state controlled PREFST. From logic operation outputs guaranteed, status output cannot evaluated. supply voltage full function guaranteed.
Semiconductor Group
4216
Application Description Applications automotive electronics require intelligent power switches activated logic signals, which shorted-load protected provide error feedback. contains power switches connected ground (low-side switch). inductive loads integrated Z-diodes clamp discharging voltage. means signals control inputs (active high) switches activated independently another when high level appears preferred-state input. When there level preferred-state input, switches switched switches switched regardless input level. inputs highly resistive therefore must left unconnected, should always fixed potential (noise immunity). status output signals following malfunctions analog voltage levels:
Overload Overtemperature
Possible Input Output Levels Supply Voltage PREFST
Semiconductor Group
4216
Absolute Maximum Ratings
Parameter Symbol Limit Values min. max. Unit Remarks
Voltages Supply voltage Supply voltage, load circuit Input voltage Input voltage
VQ1-6 VI1-6, VPREFST VREF
Currents Switching current Current reverse poling load circuit Current reverse poling load circuit Output current positive clamp Output current positive clamp Junction temperature Storage temperature
IQ1-IQ6 IQ5, IQ1-Q4 IZ5-Z6 IZ1-Z4 Tstg
limited internally
Thermal overload shutdown
Semiconductor Group
4216
Operating Range Parameter Symbol Limit Values min. Supply voltage max. Unit Remarks
VREF functioning
guaranteed status output cannot evaluated.
Supply voltage load circuit Ambient temperature Supply voltage load short-circuit Input current (high) Thermal resistance Junction-ambient Junction-ambient
VQ1-6
P-DSO-24-3 P-DIP-20-3
Semiconductor Group
4216
Characteristics
Parameter Symbol Limit Values min. typ. max. Unit Test Condition
General Supply current Supply current Quiescent current
VIH; VIH; VIH; VIL;
Logic (Control inputs preferred state) H-switching threshold L-switching threshold Hysteresis Input current Input current L-input current
Switching Stages Load current Saturation voltage Saturation voltage Saturation voltage Turn-ON time Turn-OFF time
IQ1-Q4 VQSat VQSat VQSat tD-ON tD-OFF
0.22
(preferred state) Diagrams Diagrams; Imax
Semiconductor Group
4216
Characteristics (cont'd)
Parameter Symbol Limit Values min. typ. max. Unit Test Condition
Temperature Protection Overtemperature (signaled status output) Overtemperature (outputs shut down)
Outputs Output voltage pos. clamp Output voltage pos. clamp Shorted-load current Leakage current Leakage current Shorted-load current Status output error Overload output Overload output Overload output Overload output Overload output Overload output Overtemperature
VQ1-4 VQ5-6 IQ1maxQ4max
25.5 25.5
Diagrams
IQ1-4 IQ5;6 IQ5maxQ6max
VREF VREF VREF VREF VREF VREF VREF VREF
limits shift proportionally higher value reference voltage.
Semiconductor Group
4216
Characteristics (cont'd)
Parameter Symbol Limit Values min. Source resistance status output Delay time status Reference voltage (internal) Input resistance reference typ. max. 14.5 Shorted load Unit Test Condition
RQSt tdst VREF RREF
VREF
Semiconductor Group
4216
Test Circuit position switches activated (position deactivated (position position preferred state
Semiconductor Group
4216
Application Circuit
capacitance depends inductance current load supply.
Semiconductor Group
4216
Diagrams Permissible Load Inductance versus Load Current Short-Circuit Current versus Output Voltage (0.5 outputs)
When switching maximum inductive loads, maximum temperature briefly exceeded. will destroyed this, restrictions concerning useful life should observed.
Semiconductor Group
Intelligent Low-Side Switch
4224
Preliminary Data
SPT-IC
Single low-side switch, Low-ON-resistance (typ. 0.25 Power limitation Overtemperature shutdown Overload shutdown Reverse polarity protection Status monitoring Shorted-load protection Integrated clamp Z-diodes Temperature range
P-TO220-7-1
Type 4224 type
Ordering Code Q67000-A9062
Package P-TO220-7-1
4224 integrated low-side power-switch with reverse-polarity protection, load interrupt shorted-load detection, temperature monitoring, error signaling status output integrated Z-diode output clamping. 4224 designed automotive applications.
Semiconductor Group
09.94
4224
Configuration (top view)
Definitions Functions Symbol IENA N.C. Function Status output (open collector) error monitoring; shorted-load protected 6.25 Control input, active high. Enable input, active high. Ground, connected internally cooling lug. connected Power output (open drain) inductive loads; shortedload protected. Supply voltage; there overvoltage this pin, major part circuitry shutdown.
Semiconductor Group
4224
Block Diagram
Semiconductor Group
4224
Application Description This specially designed drive inductive loads (relays, electromagnetic valves). integrated clamp diode limits output voltage when inductive loads discharged. detection errors there status output, which monitors following errors logic level:
Thermal overload, Open shorted load ground active inactive mode, Overload (also shorted load supply) active mode.
Circuit Description Input Circuits control enable inputs, both active high, consist Schmitt triggers with hysteresis. inputs connected with pull-down current sources. Unconnected inputs intrepreted "low". Switching Stages power output consists DMOS power transistor with open drain. output stage shorted-load-protected throughout operating range. integrated clamp-diode limits voltage spikes produced when inductive loads discharged. Protective Circuits integrated diode protects against reverse poling supply voltage within operating range. load circuit withstands reverse poling within bounds maximum ratings shorted load permissible same time). temperature protection guards against thermal overload. Error Detection status output signals status switching stage normal operation. (Low OFF; high ON). case error status output according table next page. current overload occurs, error condition stored internal register output shut down. reset this register control input switched then again. status error detection circuit directly dependent input state.
Semiconductor Group
4224
Status Monitoring Operating Condition Normal Operation Enable Input HIGH HIGH RANDOM RANDOM HIGH HIGH HIGH HIGH Control Input HIGH HIGH HIGH HIGH HIGH HIGH HIGH Power Output Status Output HIGH HIGH HIGH HIGH HIGH HIGH HIGH HIGH
Thermal Overload Open Load shorted Load Ground Overload Shorted Load
Absolute Maximum Ratings Parameter Symbol Limit Values min. max. Unit Remarks
Voltages Supply voltage Output voltage Output voltage Output voltage Input voltage
VI,F
Semiconductor Group
4224
Absolute Maximum Ratings (cont'd) Parameter Symbol Limit Values min. max. Unit Remarks
Currents Output current Current reverse poling Output current, status Discharging energy inductive load Junction temperature Junction temperature Storage temperature
IGND Tstg
limited internally
during clamping
Operating Range Supply voltage Supply voltage slew rate Output voltage Output voltage Output current Ambient temperature Thermal resistance junction case junction ambient
dVS/dt
V/µs during clamping
Semiconductor Group
4224
Characteristics (typ. (typ. Parameter Symbol Limit Values min. Quiescent current Supply current Open load current Open load shutdown voltage threshold Overload shutdown current threshold Overtemperature shutdown threshold Overtemperature shutdown hysteresis Control Enable Input H-input voltage L-input voltage Hysteresis H-input current H-input current Status Output voltage level Leakage current high typ. max. Output Output Output Unit Test Condition
IQAB
only design value only design value
Semiconductor Group
4224
Characteristics (cont'd) (typ. (typ. Parameter Symbol Limit Values min. Power Output Static drain source ON-resistance Pull-down resistance Output delay time Output fall time Output rise time Output status delay Output status delay typ. max. Unit Test Condition
RDSON RDSON
0.25
Overload delay time tDSO Clamp Diode Clamp diode clamping voltage
design value only
Time between status valid switching error detection
Semiconductor Group
4224
Test Circuit
Semiconductor Group
4224
Timing Diagram
Application Circuit
Semiconductor Group
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