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FLASH-ROM MODULE 2MByte (512K 32-Bit) Part HMF51232M4G GENERAL DESCRIP
Top Searches for this datasheetHMF51232M4G FLASH-ROM MODULE 2MByte (512K 32-Bit) Part HMF51232M4G GENERAL DESCRIPTION HMF51232M4G high-speed flash read only memory (FROM) module containing 524,288 words organized x32bit configuration. module consists four 512Kx FROM mounted 72-pin, single-sided, FR4-printed circuit board. Commands written command register using standard microprocessor write timings. Register contents serve input internal state-machine, which controls erase programming circuitry. Write cycles also internally latch addresses data needed programming erase operations. Reading data device similar reading from 12.0V flash EPROM devices. Four chip enable inputs, (/CE_UU1, /CE_UM1, /CE_LM1, /CE_LL1) used enable module's bytes independently. Output enable (/OE) write enable (/WE) memory input output. When FROM module disable condition, module becoming power standby mode, system designer low-power design. module components powered from single power supply inputs outputs TTL-compatible. FEATURES Access time 55,70, 120ns High-density 2MByte design High-reliability, low-power design Single 0.5V power supply Easy memory expansion wAll inputs outputs TTL- compatible FR4-PCB design profile 72-pin SIMM Minimum 1,000,000 write/erase cycle Sector erases architecture Sector group protection Temporary sector group unprotection Part Identification HMF51232M4G: Gold Plate Lead ASSIGNMENT SYMBOL /CE_LL1 SYMBOL DQ10 /CE_LM1 DQ15 DQ14 DQ13 DQ12 DQ11 /CE_UM1 DQ23 DQ16 SYMBOL DQ17 DQ18 DQ22 DQ21 DQ20 DQ19 DQ24 DQ25 DQ26 /CE_UU1 DQ31 DQ30 DQ29 DQ28 DQ27 OPTIONS Timing 55ns access 70ns access 90ns access 120ns access Package 72-pin SIMM MARKING 72-PIN SIMM VIEW FUNCTIONAL BLOCK DIAGRAM URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. HMF51232M4G DQ31 A0-18 /CE_LL1 A0-18 /CE_LM1 A0-18 /CE_UM1 A0-18 /CE_UU1 DQ24-31 DQ16-23 8-15 TRUTH TABLE MODE STANDBY SELECTED READ WRITE Note means don't care HIGH-Z HIGH-Z Dout POWER STANDBY ACTIVE ACTIVE ACTIVE ABSOLUTE MAXIMUM RATINGS URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. PARAMETER Voltage with respect ground other pins Voltage with respect ground Storage Temperature SYMBOL VIN,OUT TSTG HMF51232M4G RATING -2.0V +7.0V -2.0V +7.0V -65oC +125oC Operating Temperature -55oC +125oC Stresses greater than those listed under Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions above those indicated operating section this specification implied. Exposure absolute maximum rating conditions extended periods affect reliability. RECOMMENDED OPERATING CONDITIONS PARAMETER device Supply Voltages device Supply Voltages Ground SYMBOL 4.75V 4.5V TYP. 5.25V 5.5V OPERATING CHARACTERISTICS (0oC 0.5V PARAMETER Input Leakage Current Output Leakage Current Output High Voltage Output Voltage Active Current Read(1) Active Current Program VIL, /OE=VIH Erase(2) Standby Current Lock-Out Voltage Notes: current listed typically less than 2mA/MHz, with VIH. active while embedded algorithm (program erase) progress Maximum current specifications tested with Vcc=Vcc /CE= ICC3 VLKO ICC2 TEST CONDITIONS Vcc=Vcc max, VIN= Vcc=Vcc max, VOUT= -2.5mA, 12mA, =Vcc VIL, /OE=VIH, SYMBOL ICC1 0.45 ±1.0 ±1.0 UNITS ERASE PROGRAMMING PERFORMANCE URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. LIMITS PARAMETER MIN. Sector Erase Time TYP. MAX. UNIT HMF51232M4G COMMENTS Excludes programming prior erasure Excludes system-level Byte Programming Time overhead Excludes system-level Chip Programming Time 10.8 overhead CAPACITANCE PARAMETER SYMBOL COUT CIN2 PARAMETER TEST SETUP DESCRIPTION Input Capacitance Output Capacitance Control Capacitance VOUT TYP. UNIT Notes Test conditions f=1.0 MHz. TEST CONDITIONS TEST CONDITION Output load Output load Capacitance, Input Rise Fall Times Input Pulse Levels Input timing measurement reference levels Output timing measurement reference levels gate 0.45~2.4 OTHERS UNIT CHARACTERISTICS Read Only Operations Characteristics PARAMETE TEST SYMBOLS tACC Address Output Delay URL: www.hbe.co.kr REV.02(August,2002) DESCRIPTION SETUP Read Cycle Time -120 UNIT HANBit Electronics Co., Ltd. Chip Enable Output Delay Chip Enable Output Delay Chip Enable Output High-Z Output Enable Output High-Z Output Hold Time From Addresses, /OE, Whichever Occurs First HMF51232M4G 5.0V 2.7k Device Under Test IN3064 Equivalent 6.2k Diodes IN3064 Equivalent Note 100pF including capacitance Erase/Program Operations PARAMETE SYMBOLS tOES tGHWL Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write Setup Time Hold Time Write Pulse Width DESCRIPTION -120 UNIT URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. tWPH tWHWH1 tWHWH2 tVCS Notes This does include preprogramming time This timing only Sector Protect operations Write Pulse Width High Byte Programming Operation Sector Erase Operation (Note1) time HMF51232M4G Erase/Program Operations Alternate Controlled Writes PARAMETE SYMBOLS tGHEL tCPH tWHWH1 tWHWH2 Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Read Recover Time Before Write Setup Time Hold Time Pulse Width Pulse Width High Byte Programming Operation Sector Erase Operation (Note) DESCRIPTION -120 UNIT Notes This does include preprogramming time. URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. READ OPERATIONS TIMING HMF51232M4G RESET TIMING URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. PROGRAM OPERATIONS TIMING HMF51232M4G CHIP/SECTOR ERASE OPERATION TIMINGS URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. DATA# POLLING TIMES(DURING EMBEDDED ALGORITHMS) HMF51232M4G TOGGLE# TIMINGS (DURING EMBEDDED ALGORITHMS) URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. SECTOR PROTECT UNPROTECT TIMEING DIAGRAM HMF51232M4G ALTERNATE CONTROLLED WRITE OPERATING TIMINGS URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. PACKAGE DIMENSIONS HMF51232M4G 0.25 2.54 1.27 Gold: 1.04±0.10 Solder: 0.914±0.10 1.27±0.08mm (Solder Gold Plating) ODERING INFORMATION Part Number Density Org. Package Component Number SPEED HMF51232M4G-55 HMF51232M4G-70 HMF51232M4G-90 HMF51232M4G-120 2MByte 2MByte 2MByte 2MByte Pin-SIMM Pin-SIMM Pin-SIMM Pin-SIMM 5.0V 5.0V 5.0V 5.0V 55ns 70ns 90ns 120ns URL: www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Other recent searchesLC503TBG1-30H-A - LC503TBG1-30H-A LC503TBG1-30H-A Datasheet FM200TU-3A - FM200TU-3A FM200TU-3A Datasheet CDLE-100-003 - CDLE-100-003 CDLE-100-003 Datasheet ASC02M2-12 - ASC02M2-12 ASC02M2-12 Datasheet AAT1160 - AAT1160 AAT1160 Datasheet
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