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FLASH-ROM MODULE 4MByte 32-Bit), 72pin-SIMM, Part HMF1M32M8P HMF1
Top Searches for this datasheetHMF1M32M8P FLASH-ROM MODULE 4MByte 32-Bit), 72pin-SIMM, Part HMF1M32M8P HMF1M32M8P high-speed flash read only memory (FROM) module containing 1,048,576 words organized x32bit configuration. module consists eight 512K FROM mounted -pin, single-sided, FR4-printed circuit board. Commands written command register using standard microprocessor write timings. Register contents serve input internal state-machine, which controls erase programming circuitry. Write cycles also internally latch addresses data needed programming erase operations. Reading data device similar reading from 12.0V flash EPROM devices. Eight chip enable inputs, (/CE_UU1, /CE_UM1, /CE_LM1, /CE_LL1, /CE_UU2, /CE_UM2, /CE_LM2, /CE_LL2) used enable module's bytes independently. Output enable (/OE) write enable (/WE) memory input output.When FROM module disable condition module becoming power standby mode, system designer power design. module components powered from single power supply inputs outputs TTL-compatible. FEATURES Access time: 120ns High-density 4MByte design High-reliability, low-power design Single 0.5V power supply Easy memory expansion inputs outputs TTL-compatible FR4-PCB design profile 72-pin SIMM Minimum 1,000,000 write/erase cycle Sector erases architecture Sector group protection Temporary sector group unprotection -120 120ns access Packages 72-pin SIMM SYMBOL /CE_LL2 /CE_LL1 ASSIGNMENT SYMBOL DQ10 /CE_LM2 /CE_LM1 DQ15 DQ14 DQ13 DQ12 DQ11 /CE_UM2 /CE_UM1 DQ23 DQ16 SYMBOL DQ17 DQ18 DQ22 DQ21 DQ20 DQ19 DQ24 DQ25 DQ26 /CE_UU2 /CE_UU1 DQ31 DQ30 DQ29 DQ28 DQ27 OPTIONS Timing 55ns access 70ns access 90ns access MARKING www.hbe.co.kr REV.02(August,2002) 72-PIN SIMM VIEW HANBit Electronics Co., Ltd. FUNCTIONAL BLOCK DIAGRAM 0-DQ31 A0-A18 HMF1M32M8P A0-18 A0-18 DQ0-7 /CE-LL2 A0-18 DQ0-7 /CE-LL1 A0-18 DQ8-15 A0-18 DQ8-15 /CE-LM1 /CE-LM2 A0-18 16-23 /CE-UM2 A0-18 DQ16-23 /CE-UM1 A0-18 DQ24-31 A0-18 24-31 /CE-UU2 /CE-UU1 TRUTH TABLE MODE STANDBY SELECTED READ WRITE ERASE NOTE: means don't care HIGH-Z HIGH-Z POWER STANDBY ACTIVE ACTIVE ACTIVE www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. ABSOLUTE MAXIMUM RATINGS PARAMETER Voltage with respect ground other pins Voltage with respect ground Storage Temperature SYMBOL VIN,OUT TSTG HMF1M32M8P RATING -2.0V +7.0V -2.0V +7.0V -65oC +125oC Operating Temperature -55oC +125 Stresses greater than those listed under Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions those indicated operating section this specification implied. Exposure absolute maximum rating conditions extended periods affect reliability. RECOMMENDED OPERATING CONDITIONS PARAMETER device Supply Voltages device Supply Voltages Ground SYMBOL 4.75V 4.5V TYP. 5.25V 5.5V OPERATING CHARACTERISTICS (0oC 0.5V PARAMETER Input Leakage Current Output Leakage Current Output High Voltage Output Voltage Active Current Read(1) Active Current Program VIL, /OE=VIH Erase(2) Standby Current Lock-Out Voltage Notes: current listed typically less than 2mA/MHz, with active while embedded algorithm (program erase) progress Maximum current specifications tested with Vcc=Vcc /CE= ICC3 VLKO ICC2 TEST CONDITIONS Vcc=Vcc max, Vcc=Vcc max, VOUT= -2.5mA, 12mA, =Vcc VIL, /OE=VIH, SYMBOL ICC1 0.45 ±1.0 ±1.0 UNITS www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. ERASE PROGRAMMING PERFORMANCE LIMITS PARAMETER MIN. Sector Erase Time TYP. MAX. UNIT HMF1M32M8P COMMENTS Excludes programming prior erasure Excludes system-level overhead Excludes system-level Byte Programming Time Chip Programming Time 10.8 overhead CAPACITANCE PARAMETER SYMBOL COUT CIN2 PARAMETER TEST SETUP DESCRIPTION Input Capacitance Output Capacitance Control Capacitance TYP. UNIT VOUT Notes Test conditions f=1.0 MHz. CHARACTERISTICS Read Only Operations Characteristics PARAMETER SYMBOLS JEDEC tAVAV tAVQV STANDARD tACC Address Output Delay tELQV tGLQV tEHQZ tGHQZ tAXQX /OE, Whichever Occurs First Chip Enable Output Delay Chip Enable Output Delay Chip Enable Output High-Z Output Enable Output High-Z Output Hold Time From Addresses, Read Cycle Time DESCRIPTION TEST SETUP UNIT Notes Test Conditions Output Load 1TTL gate Output Load Capacitance case 55ns-30pF Input rise fall times case 55ns-5ns Input pulse levels .45V 2.4V, case 55ns- 0.0V-3.0V Timing measurement reference level www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Input 0.8V, Incase 55ns-1.5V Output 2.0V, case 55ns-1.5V 5.0V HMF1M32M8P 2.7k Device Under Test IN3064 Equivalent 6.2k Diodes IN3064 Equivalent Note 100pF including capacitance Erase/Program Operations PARAMETER SYMBOLS DESCRIPTION JEDEC tAVAV tAVWL tWLAX tDVWH tWHDX STANDARD tOES tGHWL tELWL tWHEH tWLWH tWHWL tWHWH1 tWHWH2 tGHWL tWPH tWHWH1 tWHWH2 tVCS Notes This does include preprogramming time This timing only Sector Protect operations Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write Setup Time Hold Time Write Pulse Width Write Pulse Width High Byte Programming Operation Sector Erase Operation (Note1) time UNIT www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Erase/Program Operations Alternate Controlled Writes PARAMETER SYMBOLS DESCRIPTION JEDEC tAVAV tAVEL tELAX tDVEH tEHDX STANDARD tOES tGHEL tWLEL tEHWH tELEH tEHEL tWHWH1 tWHWH2 tGHEL tCPH tWHWH1 tWHWH2 Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write Setup Time Hold Time Pulse Width Pulse Width High Byte Programming Operation Sector Erase Operation (Note) HMF1M32M8P UNIT Notes This does include preprogramming time. www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. READ OPERATIONS TIMING HMF1M32M8P RESET TIMING www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. PROGRAM OPERATIONS TIMING HMF1M32M8P CHIP/SECTOR ERASE OPERATION TIMINGS www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. DATA# POLLING TIMES(DURING EMBEDDED ALGORITHMS) HMF1M32M8P TOGGLE# TIMINGS (DURING EMBEDDED ALGORITHMS) www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. SECTOR PROTECT UNPROTECT TIMEING DIAGRAM HMF1M32M8P ALTERNATE CONTROLLED WRITE OPERATING TIMINGS www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. PACKAGE DIMENSIONS HMF1M32M8P 2.54 0.25 1.29±0.08 Gold: 1.04±0.10 1.27 Solder: 0.914±0.10 (Solder Gold Plating) ORDERING INFORMATION Part Number Density Org. Package Component Number SPEED HMF1M32M8P-55 HMF1M32M8P-70 HMF1M32M8P-90 HMF1M32M8P-120 4MByte 4MByte 4MByte 4MByte 72pin-SIMM 72pin-SIMM 72pin-SIMM 72pin-SIMM 5.0V 5.0V 5.0V 5.0V 55ns 70ns 90ns 120ns www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Other recent searchesSS5806 - SS5806 SS5806 Datasheet PI3A2268 - PI3A2268 PI3A2268 Datasheet MCF5329DS - MCF5329DS MCF5329DS Datasheet HT71XX - HT71XX HT71XX Datasheet CX5032SB - CX5032SB CX5032SB Datasheet BC635 - BC635 BC635 Datasheet BC637 - BC637 BC637 Datasheet BC639 - BC639 BC639 Datasheet BC639-16 - BC639-16 BC639-16 Datasheet
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