| The Datasheet Archive - 100 Million Datasheets from 7500 Manufacturers. |
Flash-ROM Module 8MByte (2Mx32Bit), 72Pin-SO-DIMM, 3.3V Design Part HM
Top Searches for this datasheetHMF2M32B4V Flash-ROM Module 8MByte (2Mx32Bit), 72Pin-SO-DIMM, 3.3V Design Part HMF2M32B4V GENERAL DESCRIPTION HMF2M32B4V high-speed flash read only memory (FROM) module containing 4,194,304 words organized x32bit configuration. module consists four FROM mounted 72-pin SO-DIMM type, single sided, FR4printed circuit board. Commands written command register using standard microprocessor write timings. Register contents serve input internal state-machine, which controls erase programming circuitry. Write cycles also internally latch addresses data needed programming erase operations. Reading data device similar reading from 12.0V flash EPROM devices. Output enable (/OE) write enable (/WE) memory input output. host system detect program erase operation complete observing Ready Pin, reading DQ7(Data Polling) DQ6(Toggle) status bits. When FROM module disable condition module becoming power standby mode, system designer low-power design. module components powered from single 3.0V power supply inputs outputs LVTTLcompatible. FEATURES Access time: 120ns High-density 8MByte design High-reliability, low-power design Single 3.0V 0.5V power supply in/outputs LVTTL-compatible FR4-PCB design Minimum 1,000,000 write/erase cycle Sector erases architecture Symbol /RESET /CE_1L /CE_2L DQ10 DQ11 DQ12 DQ13 DQ14 ASSIGNMENT Symbol DQ15 (/CE_4L) (/CE_3H) DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 /CE_1H /CE_2H DQ24 DQ25 DQ26 DQ27 DQ28 Symbol DQ29 DQ30 DQ31 (/CE_4H) (/CE_3H) Symbol OPTIONS Timing 70ns access 80ns access 90ns access 120ns access Packages 72-pin SO-DIMM MARKING -120 :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. FUNCTIONAL BLOCK DIAGRAM HMF2M32B4V DQ31 A0-19 0-15 /CE_IL RY-BY /Reset A0-19 15-31 /CE_IH RY-BY /Reset A0-19 0-15 /CE_2L RY-BY /Reset A0-19 15-31 /CE_2H /RY_BY /RESET RY-BY /Reset :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. TRUTH TABLE MODE STANDBY SELECTED READ WRITE ERASE NOTE: means don't care /RESET Vcc±0.3V HMF2M32B4V /BYTE=L HIGH-Z HIGH-Z DOUT POWER STANDBY ACTIVE ACTIVE ACTIVE ABSOLUTE MAXIMUM RATINGS PARAMETER Voltage with respect ground other pins Voltage with respect ground Storage Temperature SYMBOL VIN,OUT TSTG RATING -0.5V Vcc+0.5V -0.5V +4.0V -65oC +150oC Operating Temperature -55oC +125 Stresses greater than those listed under Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions above those indicated operating section this specification mplied. Exposure absolute maximum rating conditions extended periods affect reliability. RECOMMENDED OPERATING CONDITIONS PARAMETER device Supply Voltages Ground SYMBOL 2.7V TYP. 3.6V OPERATING CHARACTERISTICS PARAMETER Input Load Current Output Leakage Current Output High Voltage Output Voltage Active Read Current VIH, Active Write Current Standby Current Lock-Out Voltage Notes: current listed typically less than 2mA/MHz, with active while embedded algorithm (program erase) progress Maximum current specifications tested with Vcc=Vcc VIL, /OE=VIH /CE, /RESET=Vcc±0.3V 1MHZ ICC2 ICC3 VLKO TEST CONDITIONS Vcc=Vcc max, Vcc=Vcc max, OUT= -2.0mA, 4.0mA, =Vcc VIL, 5MHZ ICC1 SYMBOL 0.45 ±1.0 ±1.0 UNIT :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. ERASE PROGRAMMING PERFORMANCE PARAMETER MIN. Sector Erase Time Chip Erase Time Byte Programming Time Chip Programming Time LIMITS TYP. MAX. UNIT HMF2M32B4V COMMENTS Excludes programming prior erasure Excludes system-level overhead TSOP CAPACITANCE PARAMETER SYMBOL COUT CIN2 PARAMETER DESCRIPTION Input Capacitance Output Capacitance Control Capacitance TEST SETUP VOUT UNIT Notes Test conditions f=1.0 MHz. CHARACTERISTICS Read Only Operations Characteristics PARAMETER SYMBOLS DESCRIPTION JEDEC STANDARD tAVAV tAVQV tELQV tGLQV tEHQZ tGHQZ tAXQX tACC Read Cycle Time Address Output Delay Chip Enable Output Delay Chip Enable Output Delay Chip Enable Output High-Z Output Enable Output High-Z Output Hold Time From Addresses, /OE, Whichever Occurs First TEST SETUP -70R -120 Speed Options UNIT TEST SPECIFICATIONS TEST CONDITION Output load Output load capacitance,CL (Including capacitance) Input rise full times Input pulse levels Input timing measurement reference levels Output timing measurement reference levels 0.0-3.0 70R, 1TTL gate UNIT :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. 5.0V HMF2M32B4V 2.7k Device Under Test IN3064 Equivalent 6.2k Diodes IN3064 Equivalent Note 100pF including capacitance Erase/Program Operations PARAMETER SYMBOLS DESCRIPTION JEDEC tAVAV tAVWL tWLAX tDVWH tWHDX STANDARD tOES tGHWL tELWL tWHEH tWLWH tWHWL tWHWH1 tWHWH2 tGHWL tWPH tWHWH1 tWHWH2 tVCS Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write Setup Time Hold Time Write Pulse Width Write Pulse Width High Byte Programming Operation Sector Erase Operation (Note1) time Speed Options UNIT Notes This does include preprogramming time This timing only Sector Protect operations :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Erase/Program Operations Alternate Controlled Writes PARAMETER SYMBOLS DESCRIPTION JEDEC tAVAV tAVWL tWLAX tDVWH tWHDX STANDARD tOES tGHWL tELWL tWHEH tWLWH tWHWL tWHWH1 tWHWH2 tGHWL tWPH tWHWH1 tWHWH2 Write Cycle Time Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write Setup Time Hold Time Write Pulse Width Write Pulse Width High Byte Programming Operation Sector Erase Operation (Note1) -70R HMF2M32B4V Speed Options UNIT Notes This does include preprogramming This timing only Sector Protect operations READ OPERATIONS TIMING :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. RESET TIMING HMF2M32B4V PROGRAM OPERATIONS TIMING Alternate Controlled Writes :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Alternate Controlled Writes HMF2M32B4V CHIP/BLOCK ERASE OPERATION TIMINGS :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. HMF2M32B4V DATA# POLLING TIMES DURING INTERNAL ROUTINE OPERATION TIMEING DURING ERASE PROGRAM OPERATION :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. TOGGLE# DURING INTERNAL ROUTINE OPERATION HMF2M32B4V :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. HANBit PACKAGE DIMENSIONS <TOP VIEW> HMF2M32B4V 0.1mm :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. ORDERING INFORMATION Component Number HMF2M32B4V Part Number Density Org. Package SPEED HMF2M32B4V-70 HMF2M32B4V-80 HMF2M32B4V-90 HMF2M32B4V-120 8MByte 8MByte 8MByte 8MByte 72Pin SODIMM 72Pin SODIMM 72Pin SODIMM 72Pin SODIMM 3.3V 3.3V 3.3V 3.3V 70ns 80ns 90ns 120ns :www.hbe.co.kr REV.02(August,2002) HANBit Electronics Co., Ltd. Other recent searchesTMS320UC5405 - TMS320UC5405 TMS320UC5405 Datasheet SN74ABT543A - SN74ABT543A SN74ABT543A Datasheet SN54ABT543A - SN54ABT543A SN54ABT543A Datasheet SA07 - SA07 SA07 Datasheet NX3L2267 - NX3L2267 NX3L2267 Datasheet MX806A - MX806A MX806A Datasheet MIL-PRF38534 - MIL-PRF38534 MIL-PRF38534 Datasheet MIL-PRF19500 - MIL-PRF19500 MIL-PRF19500 Datasheet MC56F8323 - MC56F8323 MC56F8323 Datasheet M74HC693 - M74HC693 M74HC693 Datasheet ELF0607 - ELF0607 ELF0607 Datasheet
Privacy Policy | Disclaimer |